光学介质薄膜优化的宽带消色差λ/4相位延迟器

根据全反射相变理论设计了菲涅耳菱体型相位延迟器延迟量对入射角变化不敏感的结构角。根据薄膜的偏振效应,从薄膜的特征矩阵出发,通过在菱体的两个全反射面蒸镀光学介质膜的方法拓宽了菲涅耳菱体型相位延迟的消色差宽度。在ML_EB900型镀膜机上适当控制沉积条件制备了消色差相位延迟膜,实验测试结果表明:在530~700 nm的波长范围内,可以获得90°的相位延迟量,且最大偏差小于0.7°。     

双菱体λ/4消色差相位延迟器的设计

根据菲涅尔全内反射相变理论,给出了双菱体λ/4消色差器的结构设计、性能分析和测量方法.由有效通光孔径和光线追迹设计出BK7玻璃在波长532 nm时相位延迟λ/4的双菱体的结构,用作532 nm至1 064 nm波长范围的标准λ/4相位延迟器.理论分析了入射角变化和波长变化对双菱体相位延迟的影响,当入射角变化限制在±4.3°以内时,其影响得到补偿;波长从532 nm到1 064 nm产生的误差为－0.65°.采用椭偏法中的消光技术,分别实测了双菱体在532 nm和1 064 nm波长下的相位延迟为：90.08±0.14°和88.99±0.1°,可知两不同波长产生的相位延迟误差为－1.09°.     

菱体型消色差相位延迟器延迟相位的方位效应

菱体型相位延迟器是高度消色差的λ/4相位延迟器.由于材料折射率色散的影响,在可见光范围内,仍存在2°的延迟偏差.为满足精确应用和测量的需求,从相位延迟的全反射相变理论出发,阐述了斜入射相位延迟原理,以菲涅耳菱体为例,分析了菱体型相位延迟器相位延迟随其入射角变化的规律性,结果表明:当光线非严格准直时,光的入射角对相位延迟量有明显的影响,延迟量不但对入射角变化敏感,而且还与入射光线的入射方位密切相关,呈不对称形式.当入射光的波长改变时,只需改变菱体延迟器的方位,让光线在菱体的前端面上斜入射,适当选取入射角,就可以补偿相位延迟的色散偏差,使同一菱体达到对不同波长都满足λ/4相位延迟.当角度调整精度Δi=±0.01°时,引入的延迟偏差不超过±0.009°,这一精度是其它石英波片或云母波片所不能比的.     

纯相位菲涅尔全息图的反馈迭代算法及其硅基液晶显示

研究了纯相位菲涅尔计算全息图的制作方法,给出了一种生成纯相位菲涅尔计算全息图的算法.首先研究了菲涅尔衍射的数值模拟算法,分析了两种数值模拟算法的计算速度.将计算速度较快的菲涅尔衍射数值模拟算法和迭代算法相结合,并引入比例反馈,得到纯相位菲涅尔计算全息图的反馈迭代算法.其次,对比例反馈系数的选取进行了实验研究,得到其最优经验值范围,然后进行了仿真实验.仿真结果表明,该算法降低了重构误差,提高了全息图重构质量.最后基于新型空间光调制器反射型硅基液晶,建立了全息显示光电实验系统,对该算法进行了验证.     

270°反射式相位延迟器的设计及温度特性研究

根据薄膜的偏振效应,运用TFCALC膜系设计软件,通过在菲涅耳菱体的2个全反射面蒸镀光学介质膜的方法设计了270°反射式相位延迟器.运用归一化测量方法得到出射光相位延迟量与温度的关系,发现出射光相位延迟量随温度的变化而发生扰动,扰动的出现影响了透射偏振光的质量.研究结果表明,透射光的相位延迟量与膜料的折射率、基底与膜料之间的应力以及膜料之间的应力等因素有关.     

消色差谱相位延迟器的光谱特性测试研究

本文应用归一化偏振调制原理建立的测试系统，对常规菲涅耳菱体，改进型菲涅菱体，斜入射型以及直角棱镜组合型的消色差相位延迟的光谱特性进行了测试研究，得到了各延迟器的消色差特性曲线，并对测试结果进行了分析。结果表明改进型菲涅耳菱体以及直色棱镜组合型型消色差相位延迟器，是目前较理想的实用型消色相位延迟器。     

菲涅尔菱体在确定1/4波片快慢轴中的应用

设计了一种新的测定 1/4波片快慢轴的实验。从菲涅尔公式出发 ,根据两次全反射后反射波和入射波各分量的位相变化 ,分析了菲涅尔菱体用于光的偏振态转换的相变理论 ,并提出利用菲涅尔菱体确定 1/4波片快慢轴的新方法。由于菲涅尔菱体的消色散作用 ,从而解决了通常测定 1/4波片快慢轴中的入射光波长受到限制的问题。     

消色差相位延迟器的光谱特性测试研究

本文应用归一化偏振调制原理建立的测试系统 ,对常规菲涅耳菱体、改进型菲涅耳菱体、斜入射型以及直角棱镜组合型的消色差相位延迟器的光谱特性进行了测试研究 ,得到了各延迟器的消色差特性曲线 ,并对测试结果进行了分析。结果表明改进型菲涅耳菱体以及直角棱镜组合型消色差相位延迟器 ,是目前较理想的实用型消色差相位延迟器。     

菲涅尔透镜的透射率优化方法

本文采用菲涅尔公式,分析了光线在穿过不同介质时入射角透射率的影响,发现光线中s偏振光的透射率总小于p偏振光,且随入射角的增大下降较快,故以s偏振光的透射率作为菲涅尔透镜的优化目标。依据斯托克斯倒逆关系推导出三棱镜对s偏振光的"最优透射条件",并以此为依据,对平板式菲涅尔透镜进行了优化。最后,对不同曲面菲涅尔透镜的透光率做了比较分析,发现圆柱面和抛物面是比较理想的用于设计曲面菲涅尔透镜的曲面。     

基于SolTrace的线性菲涅尔式聚光器建模与仿真

利用几何光学原理推导了线性菲涅尔式聚光器在SolTrace软件中建模所需参数的计算公式，给出了建模方法。结果表明，对于反射镜列数为21列、宽度为0.38 m、长度为4 m，复合抛物面聚光器(CPC)最大接受半角为45°，接收器距反射镜所在平面5.3 m的线性菲涅式聚光器，随着太阳入射角的增大，集热管表面能流密度逐渐增大且分布更均匀；当太阳入射角大于40°后，能流密度和均匀度趋于稳定；CPC为渐开线+cusp reflector曲线比渐开线+抛物线的集热管表面能流密度更大且分布更均匀。该结果对线性菲涅尔式聚光器的推广应用具有指导意义。     

聚敛光下的Wollaston棱镜光强分束比研究

从棱镜的结构特点出发,利用折射定律和菲涅耳公式,推导了Wollaston棱镜对聚敛光的光强分束比随方位角的变化关系式。在入射角给定的情况下,分析了方位角对光强分束比的影响。结果表明:在入射角取定值时,方位角对光强分束比的影响基本呈二次曲线型变化;当方位角在160°～180°时,光强分束比最小。     

双沃拉斯顿棱镜光强分束比精确分析

利用折射定律,介质膜两侧折射率不同时多光束干涉理论和菲涅耳公式,精确推导了双沃拉斯顿棱镜的光强分束比的具体表达式。以公式为基础,通过Matlab软件数值模拟作图分析光强分束比随入射角、入射波长和结构角的变化关系曲线。结果表明:在棱镜为介质胶合型时,光强分束比随入射角和入射波长的变化很小,光强分束比基本为1;棱镜为空气胶合型时,光强分束比随入射角,结构角和波长的变化很大。两种情况下,光强分束比随各参量的变化基本呈周期性变化。     

hcp结构的Co磁性膜表面和界面的非线性克尔旋转及SHG的研究

本文基于对称性理论、磁性表面的菲涅耳反射和折射定律,研究了hcp(密排六方体)Co结构的χ⁽²⁾、SHG(二次谐波振荡)信号强度和非线性磁光克尔旋转角Φ_k,α⁽²⁾与入射角、偏振角及光子能量的关系.结果表明,Φ_k,α⁽²⁾比线性克尔角有巨大的增强;当接近垂直入射时,Φ_k,α⁽²⁾接近90°;Φ_k,α⁽²⁾灵敏地依赖于M的影响,从而可以通过Φ_k,α⁽²⁾来决定薄膜中的晶轴方向和磁化强度的取向.     

Improvement of quantum efficiency using surface texture of solar cell in the form of pyramid

The work presented in this paper is concerned a detailed study about the light transmission through textured surfaces in a surface made up of pyramids [1, 2]. We investigate to what extent and under what conditions we want to take advantage of ray incidence five times and more [3, 4]. It is found that these analyses can be used to determine the optimal surface texture which provides the best light trapping for solar cells in terms of the total internal reflection occurring in the high-index medium at incidence angles larger than the nominal critical angle [5–11]. One of the main contributions of this paper is the analysis and quantification of the influence of the opening between the heads of the two closest pyramids in textured surface for solar cells and its application on the photovoltaic parameters such as the quantum efficiency. In this model we show that the material can have five and more successive incident ray absorptions instead of three currently, where we changed the direction of the reflected ray, by varying the angle between the two neighbouring pyramids, the incidence angle, the opening between the heads of the two closest pyramids and their height. Thus, with an angle between the two neighbouring pyramid varying between 20° and 12° and for angle of incidence varying between 80° and 84°. For these values of the angle between the two neighbouring pyramids and incidence angle, the opening between the heads of the two closest pyramids varied respectively from 3.53 to 2.10 µm for a pyramid height of 10 µm. This lead to a substantial increase of the quantum efficiency thus the photovoltaic efficiency.     

棱镜非线性波导耦合光学双稳理论

利用菲涅耳公式计算了棱镜非线性光波导耦合.从理论上分析了该双稳器件的调制和反馈特性,模拟出不同偏置角的光学双稳曲线,能定量地分析双稳最小偏置角,双稳阈值功率等.     

TE-TE mode coupling at oblique incidence in a periodic dielectric waveguide

The characteristics of reflection of a TE mode into another TE mode in a planar dielectric waveguide with a sinusoidally modulated index are investigated for the general case in which the wavevectors are not aligned with the grating vector. A singular perturbation procedure is used to deduce the asymptotically exact coupled mode equations which govern the interaction. An analysis of the coupled-mode equations has shown the existence of the Brewster phenomenon at the angle of incidence θ_iB=45°. For angles of incidence sufficiently greater than the Brewster angle, the reflection coefficient can be considerably larger than that for the normal incidence. In the spectral response curves of the reflection coefficient, a higher maximum and a smaller base bandwidth are possible for the oblique incidence as compared to that for the normal incidence. The angular sensitivity of the reflection characteristics increases as the angle of incidence changes from the normal incidence to the grazing incidence.     

A Simple Model for Measuring Refractive Index of a Liquid Based upon Fresnel Equations

Due to many experimental data required and a lot of calculations involved, it is very complex and cumbersome to model prism-based liquid-refractive-index-measuring methods. We develop a new method of mathematical modelling for measuring refractive index of a liquid based upon the Fresnel formula and prism internal reflection at an incident angle less than the critical angle. With this method, only two different concentrations measurements for a kind of solution can lead to the determination of computational model. Measurements are performed to examine the validity of the theoretical model. Experimental results indicate the feasibility of the theoretical model with an error of 1%. The method is also capable of measuring even smaller changes in the optical refractive index of the material on a metal surface by the surface plasma resonance sensing techniques.     

亚微米光栅型导光板设计

提出了利用亚微米光栅制作导光板的方法,给出亚微米光栅型导光板的初始结构.用严格耦合波理论计算分析了在满足基底全反射条件的45°入射角下红(700 nm)、绿(555 nm)、蓝(465 nm)三色光垂直出射的亚微米光栅(0.651μm、0.516μm、0.433μm)在槽深0.05~0.9μm之间变化时,透射衍射效率在2%~43%之间变化.分析了亚微米光栅的作用,做出性能评价,并研究了特定范围入射角引起的衍射角变化.     

Phase measurements of surface electromagnetic waves on silver with excitation through the substrate

Surface electromagnetic waves are excited in the visible and near-IR regions of the spectrum, and interference measurements are performed. Their excitation is effected by a helium-neon laser (3.39, 1.15, and 0.63 μm) on the interface between air and a silver film of thickness 100 μm deposited on a substrate in the form of a prism of fused quartz. The exciting radiation is supplied from the substrate side in a regime of total internal reflection in the prism on the edge of the silver film. The wave vector of the surface electromagnetic wave investigated is determined from the results of phase measurements. The dependence of the efficiency of the excitation of surface electromagnetic waves on the angle of incidence of the exciting radiation onto the substrate is investigated. The real part of the dielectric function of the silver film is calculated. Zh. Tekh. Fiz. 68, 64–68 (March 1998)     

Use of thermal imaging to characterize laser light reflection from thermoplastics as a function of thickness,laser incidence angle and surface roughness

Laser light reflection during the laser transmission welding (LTW) of thermoplastics has the potential to overheat and/or cause unintentional welding of adjacent features of the part being welded. For this reason, and in order to assess how much light is being absorbed by the transparent part (after measurement of the light transmitted through the transparent part), it is important to be able to quantify the magnitude and distribution of reflected light. The magnitude and distribution of the reflected light depends on the total laser input power as well as its distribution, the laser incidence angle (angle between the normal to the transparent part surface and the laser beam), the laser light polarization as well as the surface and optical properties of the transparent part. A novel technique based on thermal imaging of the reflected light was previously developed by the authors. It is used in this study to characterize the magnitude and distribution of reflected light from thermoplastics as a function of thickness (1–3.1 mm), laser incidence angle (20–40°) and surface roughness (0.04–1.04 μm). Results from reflection tests on nearly polished nylon 6 (surface roughness between 0.04 and 0.05 μm) have shown that, for the various thicknesses tested (1–3.1 mm), the total reflection was larger than the specular top surface reflection predicted via the Fresnel relation. From these observations, it is conjectured that, in addition to top surface reflection, the bulk and/or bottom surface also contribute to the total reflection. The results also showed that reflection decreased slightly with increasing thickness. As expected, for the p-polarized light used in this study, the reflection decreased with increasing angle of incidence for the range of angles studied. It was also found that when the surface roughness was close to zero and when it was close to the wavelength of the input laser beam (i.e. 940 nm), the reflectance values were close and reached a minimum between these two roughness values.