Band-reject-filtering X-ray spectra by mosaic structures of pyrolytic graphite

The possibility of effective band-reject filtration of intense spectral lines in X-ray spectra and the creation of deep spectral valleys in the continuous spectrum by diffraction extinction was shown. Optimum material for band-reject filters in the energy range E > 6 keV is highly oriented pyrolytic graphite (HOPG). The filtering scheme in the form of an echelon arrangement of HOPG films is proposed, which suppresses the negative effect of multiple reflections due to diffraction extinction. The full width at half minimum of the spectral valleys can vary from tens of electronvolt to several kiloelectron volt depending on the HOPG mosaic spread, HOPG filters arrangement, and rejected energy region. At the energy range E of ~10 keV, the spectral density attenuation value may be of order 10⁻³ and lower. The obtained results can be used in various fields of X-ray spectrometry, as well as in static energy dispersive diffractometry and reflectometry.     

Sxaps spectra of pyrolytic graphite as a function of the angle of incidence of the incoming electrons

Soft X-ray appearance potential (SXAPS) spectra of pyrolytic graphite as a function of the angle of incidence of the incoming electrons have been measured to obtain information about surface plasmon excitation. Plasmons can be coupled with a core hole and two slow electrons above the Fermi level or with a fast incoming electron. In the last case angular dependent plasmon excitation can be observed. Coupling with the fast incoming electron is observed, but band structure effects cannot be neglected to explain the observed structure. Measurements were performed on clean and hydrogen-contaminated pyrolytic graphite. A signal increase over the whole spectrum was observed after hydrogen contamination, probably due to a rearrangement of the surface lattice structure. Bombardment of the surface with electrons of 2 keV gave a decrease in spectral intensity probably due to surface damage.     

Electron spectroscopy measurements on hydrogen implanted graphite and comparison to amorphous hydrogenated carbon films (a-C:H)

Highly oriented pyrolytic graphite (HOPG) as well as polycrystalline graphite (pc-graphite) were bombarded with 3.5 keV H⁺ ions by means of a Penning ion source. The implanted graphite was characterized by in situ electron spectroscopy techniques such as UPS, XPS and EELS. Our UPS valence band measurements of the hydrogen saturated graphite reveal it to be an insulating phase, and XPS measurements show a shift of the C1s core level to higher binding energy with respect to pristine graphite. This behavior is explained by a Fermi energy shift upon hydrogen bombardment of graphite.In addition, a close resemblance in the electronic structure of hydrogen bombarded graphite and amorphous hydrogenated carbon films (a-C:H) is shown which suggests the modification of pristine graphite to an amorphous network [1] of mostly tetrahedrally bonded carbon atoms by hydrogen implantation.     

CsI光阴极在10-100 keV X射线能区的响应灵敏度计算

为了满足10-100 keV高能X射线光电探测器研究的需要,对CsI光阴极在该能量范围的响应灵敏度进行了研究.基于高能量X射线光子与材料相互作用的物理过程,分析了康普顿散射等效应对CsI响应灵敏度的影响.推导了CsI的响应灵敏度与二次电子平均逃逸深度和光阴极厚度的关系式和二次电子平均逃逸深度与入射光子能量的关系式,计算了CsI在10-100 keV范围内的响应灵敏度,计算结果与实验测试数据相符,验证了分析与推导的可靠性.根据计算可以获得不同入射X射线能量下CsI光阴极的最佳厚度,从而为高能X射线光电探测器的设计优化提供了理论参考.     

高反射效率高定向性的热解石墨晶体X射线谱仪

基于高定向热解石墨晶体(highly oriented pyrolitic graphite,HOPG)研制了一种新型反射式X射线谱仪.该谱仪具有高反射效率、较高能谱分辨率及相对较宽的能谱测量范围.根据计算,在相同的入射条件下,该谱仪的效率比一般X射线弯晶谱仪高3个量级;谱仪能谱分辨率理论值最高达350;理论探测范围是6.891keV至9.193 keV.我们将该谱仪应用在高功率密度激光与固体靶相互作用的实验中,发现在普通弯晶谱仪无法采到信号的实验条件下,HOPG谱仪依然采集到清晰的Cu K谱线.分析发现在8.048 keV(Cu的Kα光子能量)附近的能谱分辨能力最高达到40 eV,分辨率大于200.     

Spectral distribution of X-Ray yield of the M-shell emission fromlaser produced gold plasma

Experimental measurements of the spectral distribution of keV X-ray energy conversion of the M-shell emission from gold plasma produced by a 4 GW, 5 nS Nd:glass laser are presented. At a laser intensity of 2×10¹³ W/cm², the overall X-ray yield for 2.0 ⩽hv⩽3.6 keV is determined to be 0.1% of the laser energy. The effect of the keV X-ray spectral distribution on radiation preheat is discussed     

杂质元素特征X射线对氢气放电源打靶新谱线的影响

 在氢气放电源打靶的实验中,测到了系列能量恒定不变的低能X射线新谱线,这些新谱线的能量分别为(1.70±0.10) keV, (2.25±0.07) keV,(2.56±0.08) keV,(3.25±0.10) keV和（3.62±0.11） keV,与Si,Ta,S,Cl,K和Ca等元素的特征X射线能量相近,但靶中所含的杂质或来自放电室的杂质元素可能会产生这些能量的X射线谱峰,证实新谱线是否由这些元素的特征X射线干扰所致显得尤为重要。分析了本实验系统中各种杂质的可能来源,论证了放电室端杂质对新谱线的影响,及靶材料中体杂质和面杂质对新谱线的影响;用X射线光电子能谱仪对靶做了表面分析。研究结果表明：杂质元素的特征X射线不会对氢气放电源打靶产生的新谱线有影响。这些新谱线的性质有待进一步的实验研究。     

Manifestation of auger processes in C1s-satellite spectra of single-walled carbon nanotubes

Using the equipment of the Russian-German beamline of the synchrotron radiation at the BESSY II electron storage ring, satellite spectra accompanying the C1s core lines in the cases of single-walled carbon nanotubes and highly ordered pyrolytic graphite have been measured with a high energy resolution. The Auger spectra corresponding to shaking of the valence system of carbon by the core vacancy have been found and investigated. The Auger spectra of the studied single-walled carbon nanotubes and highly ordered pyrolytic graphite are caused by annihilation of the excited π* electron with a hole in the π subband. It has been established that the electron states in the conduction band have 3π* (gT, K, M) symmetry; i.e., they correspond to flat 3π* subband, which is localized by 12–13 eV above the Fermi level. It has been revealed that the general regularities of the distribution of electron states in the valence system insignificantly change during its shake-up by the excited core.     

X-ray source based on a compact electron linear accelerator with a thin anode

An experiment confirming the possibility of extracting a narrow energy band from a wide spectrum produced by a compact electron linear accelerator with a thin transmission anode is described. A flat crystal of pyrolytic graphite was used as a monochromator.     

The effect of radiation damage on microstructure and ion electron emission of pyrolytic graphites

The influence of radiation damage on the microstructure of pyrolytic graphites was analyzed. The correlation between the temperature dependences of ion-induced electron emission and structural modification of UPV-1 pyrolytic graphite and highly oriented UPV-1T pyrolytic graphite under neutron and high-fluence (10¹⁷–10¹⁹ cm⁻²) (30 keV) Ar⁺ irradiation was experimentally studied and discussed.     

Electronic structure of lithium graphite

X-ray photoemission spectra of vacuum cleaved LiC₆, prepared from highly oriented pyrolytic graphite, provide a direct measure of the filling of the graphite π bands by electrons from Li. The resulting Fermi energy shift is in agreement with recent band structure calculations and indicates near unity charge transfer from Li. Core level spectra exhibit shifts compatible with the expected charge transger and line shapes showing strong asymmetries resulting from the metallic character of this compound.     

杂质元素特征X射线对氢气放电源打靶新谱线的影响

在氢气放电源打靶的实验中,测到了系列能量恒定不变的低能X射线新谱线,这些新谱线的能量分别为(1.70±0.10) keV, (2.25±0.07) keV,(2.56±0.08) keV,(3.25±0.10) keV和（3.62±0.11） keV,与Si,Ta,S,Cl,K和Ca等元素的特征X射线能量相近,但靶中所含的杂质或来自放电室的杂质元素可能会产生这些能量的X射线谱峰,证实新谱线是否由这些元素的特征X射线干扰所致显得尤为重要。分析了本实验系统中各种杂质的可能来源,论证了放电室端杂质对新谱线的影响,及靶材料中体杂质和面杂质对新谱线的影响;用X射线光电子能谱仪对靶做了表面分析。研究结果表明：杂质元素的特征X射线不会对氢气放电源打靶产生的新谱线有影响。这些新谱线的性质有待进一步的实验研究。     

土壤重金属铅元素的X射线荧光光谱测量分析

在实验室条件下,利用NITON XLt793型便携式X射线荧光光谱重金属分析仪测量并分析土壤中铅元素的X射线荧光光谱特性。分别以铅的L_α(10.55 keV)和L_β(12.61 keV)特征谱线作为分析线,分析了不同基体元素对分析线的影响;测定在不同铅浓度下的特征谱线强度变化。结果表明铅的质量分数在10×10-6～1 800×10-6范围内,元素的光谱强度与浓度之间呈现较好的线性关系;建立了铅元素的定标曲线,并计算得到铅的检出限为7.89×10-6。     

Hard X-ray photoelectron spectroscopy from 5-14.5 keV

Photoemission spectroscopy at high energies can be used to probe bulk electronic states. We used a specially designed high-voltage retarding lens and a commercial Perkin-Elmer PHI 10-360 hemispherical electron analyzer to investigate the core and valence band region of Au, YBa₂Cu₃O_7−δ and highly oriented pyrolytic graphite samples with hard X-rays in the energy range 5-14.5 keV. The overall instrumental resolution obtained at 8 keV was 218 meV. The photo ionization cross-sections for Au 5d and 6s excitations were determined experimentally. In comparison with published calculations for atomic cross-sections neglecting corrections for angular anisotropy, the values we find are twice as large for the 5d and an order of magnitude larger for the 6s (conduction band) level. Our results demonstrate the feasibility of bulk sensitive valence band spectroscopy with high resolution at high brilliance X-ray sources such as the ESRF. The measured cross-sections provide important input for improving current theoretical models.     

X-ray absorption intensity at high-energy region

We theoretically discuss X-ray absorption intensity in high-energy region far from the deepest core threshold to explain the morphology-dependent mass attenuation coefficient of some carbon systems, carbon nanotubes (CNTs), highly oriented pyrolytic graphite (HOPG) and fullerenes (C₆₀). The present theoretical approach is based on the many-body X-ray absorption theory including the intrinsic losses (shake-up losses). In the high-energy region the absorption coefficient has correction term dependent on the solid state effects given in terms of the polarization part of the screened Coulomb interaction W_p. We also discuss the tail of the valence band X-ray absorption intensity. In the carbon systems C 2s contribution has some influence on the attenuation coefficient even in the high energy region at 20 keV.     

样品厚度对薄膜法X射线荧光光谱测量的影响研究

分别以富集有Cr,Pb和Cd三种元素的尼龙薄膜样品及玻璃纤维滤膜为研究对象,采用滤膜叠加的方式,通过XRF光谱仪测量不同样品厚度下薄膜样品的XRF光谱,根据测得的尼龙薄膜样品中Cr,Pb,Cd元素及玻璃纤维滤膜中Ca,As和Sr元素特征XRF性质的变化,研究样品厚度对薄膜法XRF光谱测量的影响。结果表明：薄膜样品厚度对不同能量区间上元素特征谱线荧光性质的影响并不相同。元素特征谱线能量越大,元素特征X射线荧光穿透滤膜到达探测器的过程中损失越少;但由薄膜样品厚度增加引起的基体效应却越强,相应特征谱线位置处的背景荧光强度就越大,因此样品厚度增加所引起的基体效应对薄膜法XRF光谱测量的灵敏度影响就越大。对于特征谱线能量较低(能量小于7 keV)的元素,以增加薄膜样品厚度的方式来增加待测组分的质量厚度浓度,并不能有效地提高薄膜法XRF光谱测量的灵敏度;对于特征谱线能量较高的元素(能量＞7 keV),可以通过适当增加样品厚度以增加被测组分的质量厚度浓度的方式来提高XRF光谱测量的灵敏度,薄膜样品厚度在0.96～2.24 mm内,更有利于XRF光谱的测量与分析。该研究为大气及水体重金属薄膜法XRF光谱分析中薄样制备及富集技术提供了重要的理论依据。     

Large-area phoswich balloon experiment for hard-X-ray astronomy

Summary We describe a balloon experiment, currently in the marking, devoted to the observation of celestial X-ray sources. The main features of the X-ray telescope are summarized as follows. It operates in the energy band from 20 to 300 keV. Its energy resolution is about 17% at 60 keV. Under the hypothesis of 10⁴ s of observing time, 3 mbar of residual atmospheric pressure and 3σ of statistical significance, the expected sensitivity of the instrument is 2·10⁻⁶ photons/cm² s keV in the (20÷200) keV energy band, corresponding to about 1 milliCrab. Its high sensitivity allows us to detect both time variability in the flux and cyclotron lines in the spectra of X-ray sources. It has a field of view of 3° FWHM and has the possibility of resolving complex fields by using multipitch modulation collimators. With such a configuration its angular resolution is about 10′. Paper presented at the 2° Convegno Nazionale di Fisica Cosmica, held at L'Aquila, 29 May–2 June 1984.     

Formation of Spectral Valleys in the Hard X-Ray Spectrum by Diffraction Band Reject Filtering

JETP Letters - The possibility of forming deep spectral valleys in the polychromatic spectrum of X rays with an energy of E ≥ 15 keV using diffraction band rejection is demonstrated....     

氢气放电源打靶的较完整新谱系实验测量

 为了能够实现明确和清晰地同时测出氢气放电源打靶的较完整新谱系,使用氢气放电中的电子和X射线等直接打靶,在衍射角和测量角均为45°时,测量氢气放电源打靶的较完整新谱系。实验同时测到了3组6条氢气放电源打靶的新谱系,它们是：（2.25±0.07）和（2.56±0.08） keV;（3.25±0.10）和（3.62±0.11） keV;（4.42±0.13）和（4.79±0.15） keV。这6条新谱线表征了未知粒子的能级特性,是未知粒子存在的标志。未知粒子在靶中能储存一年以上,测得的未知粒子能级谱线能量为keV量级,氢气放电源中粒子为已知粒子,据此可以认为未知粒子是一种新原子态氢原子。     

Appearance potential spectroscopy of layer materials

It has been shown that soft X-ray appearance potential spectroscopy (SXAPS) can be used as a probe of the conduction band density of states in several of the layer transition metal dichalcogenides, where the pronounced structure seen for TiS₂ agrees well with X-ray absorption data. In contrast, the complex structure seen in the SXAPS of pyrolytic graphite has previously been interpreted in terms of strong plasmon coupling. However, we find that the SXAP spectrum for vacuum cleaved pyrolytic graphite shows details not readily explicable by such an argument but which agree well with what would be expected on the basis of a conduction band self-convolution model. Further strong support for this interpretation is derived from XPS and SXAPS studies of the isostructural, isoelectronic boron nitride.