转换屏背底散射对图像对比度的影响研究

分析了高能X光照相中转换屏的背底散射（对可见光的散射）对图像对比度的影响,建立了相应散射影响的计算模型;同时还通过计算模拟给出了相应的结果,理论和实验研究表明对转换屏背底的处理是极为重要的。     

转换屏背底散射对图像对比度的影响

在X光图像探测系统中，通常采用把X光转换为可见光、对可见光进行探测的方法来完成对X光的探测。在转换过程中，一般采用各种类型、结构的荧光屏来完成将X光转换为可见光的过程，而在高能X光的探测系统中，则常采用量子效率高、原子序数大的材料如CsI：T1晶体作为转换屏。由于转换屏存在一定的厚度，所发出的可见光将会在转换屏内部进行全方位的传播，一部分照射到转换屏背底的可见光被散射后进入图像记录系统，     

摄影技术及其装置

TB853.21 2004010490 转换屏背底散射对图像对比度的影响研究=Study on image contrast affected by scattering from the back side of aconvertor[刊,中]/江孝国(中物院流体物理研究所.四川,绵阳(621900)),谭肇…∥强激光与粒子束.—2003,15     

发光玻璃转换屏空间分辨率研究

根据康普顿散射原理,建立了康普顿散射导致发光玻璃屏模糊的简化模型,并通过数值模拟计算,给出了转换屏厚度对屏空间分辨的影响,数值计算结果与12 MeV 加速器上发光玻璃屏空间分辨率的实验测量值基本吻合。     

发光玻璃转换屏空间分辨率研究

根据康普顿散射原理 ,建立了康普顿散射导致发光玻璃屏模糊的简化模型 ,并通过数值模拟计算 ,给出了转换屏厚度对屏空间分辨的影响 ,数值计算结果与 1 2 Me V加速器上发光玻璃屏空间分辨率的实验测量值基本吻合。     

中子照相数值模拟与实验的对比

介绍了热中子照相的MCNP数值模拟方法,模拟了300＃反应堆Maxwell谱热中子束穿透样品射到转换屏的过程,给出了热中子对铝、铅、铁、铜的穿透能力,分析了引起模拟与实验结果不同的原因。通过模拟得到了清晰的图像,对比数值模拟与在300#反应堆中子照相装置上的实验结果,数值模拟结果图像与实验结果图像非常相似;散射中子对图像的影响也符合相同的规律,随着样品与转换屏之间的距离的增大,散射中子对结果图像的影响越来越小,当样品与转换屏之间的距离为样品尺寸的2倍时可以忽略散射中子的影响。     

中子照相数值模拟与实验的对比

 介绍了热中子照相的MCNP数值模拟方法,模拟了300＃反应堆Maxwell谱热中子束穿透样品射到转换屏的过程,给出了热中子对铝、铅、铁、铜的穿透能力,分析了引起模拟与实验结果不同的原因。通过模拟得到了清晰的图像,对比数值模拟与在300#反应堆中子照相装置上的实验结果,数值模拟结果图像与实验结果图像非常相似;散射中子对图像的影响也符合相同的规律,随着样品与转换屏之间的距离的增大,散射中子对结果图像的影响越来越小,当样品与转换屏之间的距离为样品尺寸的2倍时可以忽略散射中子的影响。     

中子照相CCD成像系统反射镜引入本底分析

在基于CCD相机的中子照相系统中,反射镜距离闪烁屏太近就会将部分荧光反射回闪烁屏,将闪烁屏照亮,入射中子束的少部分还会被反向散射回闪烁屏,形成图像本底叠加在图像上,对定量分析和CT重建结果产生影响。为此建立了反射镜所引入反射分量的计算方法,可根据闪烁屏受照分布和反射镜参数计算反射分量的分布,并对中子反向散射进行了蒙特卡罗模拟,计算结果与实验测量的本底分布规律相符。     

中子照相CCD成像系统反射镜引入本底分析

在基于CCD相机的中子照相系统中,反射镜距离闪烁屏太近就会将部分荧光反射回闪烁屏,将闪烁屏照亮,入射中子束的少部分还会被反向散射回闪烁屏,形成图像本底叠加在图像上,对定量分析和CT重建结果产生影响。为此建立了反射镜所引入反射分量的计算方法,可根据闪烁屏受照分布和反射镜参数计算反射分量的分布,并对中子反向散射进行了蒙特卡罗模拟,计算结果与实验测量的本底分布规律相符。     

高能闪光照相中影响光程确定的几个因素

 利用闪光照相基本原理和成像原理，在直接记录法和转换屏记录法的情况下，研究了闪光照相中影响X射线在材料中光程确定的主要因素。结果表明，影响光程确定的几个因素是：散射效应、光源角分布效应、立体角效应和能谱效应。对于高能闪光照相，散射效应是影响光程确定的最主要因素，散射的存在使光程的测量值比实际值降低20%～40%。因此必须在做CT之前，对散射的影响进行修正。     

Full‐field X‐ray reflection microscopy of epitaxial thin‐films

Novel X‐ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full‐field hard X‐ray microscope uses the surface scattering signal, in a reflectivity or diffraction experiment, to spatially resolve the local structure with 70 nm lateral spatial resolution and sub‐nanometer height sensitivity. Sub‐second X‐ray exposures can be used to acquire a 14 µm × 14 µm image with an effective pixel size of 20 nm on the sample. The optical configuration and various engineering considerations that are necessary to achieve optimal imaging resolution and contrast in this type of microscopy are discussed.     

Quantitative phase retrieval in X‐ray Zernike phase contrast microscopy

In recent years, increasing attention has been devoted to X‐ray phase contrast imaging, since it can provide high‐contrast images by using phase variations. Among the different existing techniques, Zernike phase contrast microscopy is one of the most popular phase‐sensitive techniques for investigating the fine structure of the sample at high spatial resolution. In X‐ray Zernike phase contrast microscopy, the image contrast is indeed a mixture of absorption and phase contrast. Therefore, this technique just provides qualitative information on the object, which makes the interpretation of the image difficult. In this contribution, an approach is proposed for quantitative phase retrieval in X‐ray Zernike phase contrast microscopy. By shifting the phase of the direct light by π/2 and 3π/2, two images of the same object are measured successively. The phase information of the object can then be quantitatively retrieved by a proper combination of the measured images. Numerical experiments were carried out and the results confirmed the feasibility of the proposed method. It is expected that the proposed method will find widespread applications in biology, materials science and so on.     

Feasibility of in‐line instruments for high‐resolution inelastic X‐ray scattering

Inelastic X‐ray scattering instruments in operation at third‐generation synchrotron radiation facilities are based on backreflections from perfect silicon crystals. This concept reaches back to the very beginnings of high‐energy‐resolution X‐ray spectroscopy and has several advantages but also some inherent drawbacks. In this paper an alternate path is investigated using a different concept, the `M⁴ instrument'. It consists of a combination of two in‐line high‐resolution monochromators, focusing mirrors and collimating mirrors. Design choices and performance estimates in comparison with existing conventional inelastic X‐ray scattering instruments are presented.     

塑料多层靶丸X射线照相技术

从理论上分析了高增益ICF实验燃料容器的塑料多层微球材料对X射线吸收机理,给出了适当的X射线照相条件,即工作电压取10kV,照像时间为1.5h,获得了壳层反差较为理想的靶丸X光图像。照相实验所得底片具有很高的横向分辨率,经显微镜放大,微球图像界面清晰可辨,用CCD将图像输入计算机,使用一般图像软件即可较为精确读出壳层厚度像素,为塑料靶丸制备工艺提供了方便有效的跟踪测量手段。     

FTO客体3m闪光照相的Monte Carlo研究

研究了客体模型FTO的闪光照相系统X光输运过程,给出了直穿照射量、散射照射量、直散比、直穿照射量能谱、散射照射量能谱、直穿X光通量能谱和散射X光通量能谱在记录平面的空间分布。结果表明：后锥是照射量散射成分的主要来源,后锥照射量占总散射量97%;后锥也是造成散射的空间分布不均匀的主要器件,这一不均匀性高达58%。照相系统的最小直散比非常小,表明锥造成的散射已经严重地淹没了直穿（轫致辐射）信号。计算中使用高空间分辨率记录法进行分点,合成图像对吸收系数的复原结果与国外报道的结果相符。     

Enhanced renal image contrast by ethanol fixation in phase‐contrast X‐ray computed tomography

Phase‐contrast X‐ray imaging using a crystal X‐ray interferometer can depict the fine structures of biological objects without the use of a contrast agent. To obtain higher image contrast, fixation techniques have been examined with 100% ethanol and the commonly used 10% formalin, since ethanol causes increased density differences against background due to its physical properties and greater dehydration of soft tissue. Histological comparison was also performed. A phase‐contrast X‐ray system was used, fitted with a two‐crystal X‐ray interferometer at 35 keV X‐ray energy. Fine structures, including cortex, tubules in the medulla, and the vessels of ethanol‐fixed kidney could be visualized more clearly than that of formalin‐fixed tissues. In the optical microscopic images, shrinkage of soft tissue and decreased luminal space were observed in ethanol‐fixed kidney; and this change was significantly shown in the cortex and outer stripe of the outer medulla. The ethanol fixation technique enhances image contrast by approximately 2.7–3.2 times in the cortex and the outer stripe of the outer medulla; the effect of shrinkage and the physical effect of ethanol cause an increment of approximately 78% and 22%, respectively. Thus, the ethanol‐fixation technique enables the image contrast to be enhanced in phase‐contrast X‐ray imaging.     

A high‐energy‐resolution resonant inelastic X‐ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

An end‐station for resonant inelastic X‐ray scattering and (resonant) X‐ray emission spectroscopy at beamline ID20 of ESRF – The European Synchrotron is presented. The spectrometer hosts five crystal analysers in Rowland geometry for large solid angle collection and is mounted on a rotatable arm for scattering in both the horizontal and vertical planes. The spectrometer is optimized for high‐energy‐resolution applications, including partial fluorescence yield or high‐energy‐resolution fluorescence detected X‐ray absorption spectroscopy and the study of elementary electronic excitations in solids. In addition, it can be used for non‐resonant inelastic X‐ray scattering measurements of valence electron excitations.     

A multiplexed high‐resolution imaging spectrometer for resonant inelastic soft X‐ray scattering spectroscopy

The optical design of a two‐dimensional imaging soft X‐ray spectrometer is described. A monochromator will produce a dispersed spectrum in a narrow vertical illuminated stripe (～2 µm wide by ～2 mm tall) on a sample. The spectrometer will use inelastically scattered X‐rays to image the extended field on the sample in the incident photon energy direction (vertical), resolving the incident photon energy. At the same time it will image and disperse the scattered photons in the orthogonal (horizontal) direction, resolving the scattered photon energy. The principal challenge is to design a system that images from the flat‐field illumination of the sample to the flat field of the detector and to achieve sufficiently high spectral resolution. This spectrometer provides a completely parallel resonant inelastic X‐ray scattering measurement at high spectral resolution (～30000) over the energy bandwidth (～5 eV) of a soft X‐ray absorption resonance.     

X光探伤电视的微机图像处理系统的研究

Ｘ光探伤电视系统虽然具备节省Ｘ光软片和可在线探伤等优点以外，还存在着图像分辨率不很高的问题。其图像分辨率不很高的主要原因是由于Ｘ光所激发的二次射线造成的，这是一种随机的噪声干扰。利用在计算机图像处理中的叠加平均法可有效的去除这种噪声干扰，从而提高Ｘ光探伤电视的图像分辨率。电视图像的数字化需要高速的信号采集系统。用硬件构成的图像存贮体可实现高速的图像信号采集，并结合开窗口技术使得Ｘ光探伤电视的成本降低，为高分辨率Ｘ光探伤电视的广泛应用创造了有利的条件。这些对保证产品质量具有十分重要的意义。