氧化处理多孔硅的光致发光和发光衰减

用沸硫酸对多孔硅进行了处理,测量了它们的红外吸收光谱、光致发光光谱和发光衰减.对氢、氧的作用进行了讨论,发现氧的加入可使发光强度增加两个数量级,发光衰减变快.用三层发光模型对结果进行了讨论.     

多孔硅结构与发光机理的非线性光学研究

最近的研究中,采用1.06μm超短脉冲光激发,在多孔硅表面观察到了有效的红外多光子激发的荧光发射.研究表明,这是一个增强的三阶非线性光学过程.本文利用其三阶非线性特性对具有强可见光发射的多孔硅结构进行了研究,结果显示晶体硅的各向异性特征在多孔硅中几乎被保留;此外,较强的激光激发导致的红外上转换荧光信号衰减过程被归结为与多孔硅表面氢的脱附有关.     

发光不衰减的多孔硅

用一种新的方法制备出了具有不同衰减的光致发光特性的多孔硅。如此制备的多孔硅新鲜样品,其发光峰位强度比普通多孔硅高２￣２．５倍,将样品在室温下暴露于空气中,其发光强度在前４个月中单调增加,然后达到饱和。在随后的８个月中,没有观察到发光衰减,发光峰位也没有发生变化,这种发光稳定性被归因子于多孔硅表面所形成的稳定的Ｆｅ－Ｓｉ键。文章探讨了发光不衰减、峰位不蓝移的机理,并为多孔硅发光的量子限域模型提供了强     

多孔硅发光峰温度行为的研究

实验研究了多孔硅（Ｐｏｒｏｕｓ Ｓｉｌｉｃｏｎ）光致发光峰随测量温度的变化,发现发光峰位随温度的移动与发光峰的能量有关。随温度升高,发光峰波长较长的样品它们的发光峰都移向高能,面发光峰能量较高的样品它们的发光峰都移向低能,发光峰波长位于７４０ｎｍ附近的样品,它们的发光峰与测量温度无关。对上术结果的起源作了讨论。     

多孔硅发光稳定性的改进

采用在热ＨＮＯ₃中对多孔度较低的多孔硅样品进行氧化的方法，我们获得了稳定性和均匀性都较好的多孔硅样品。这是一种不同于快速热氧化且更方便易行的方法。另外还用ＳＥＭ和ＦＴＩＲ对其特性进行了研究。 关键词：     

水蒸气退火多孔硅发光性能的正电子谱学研究

使用正电子湮没寿命谱和正电子寿命-动量关联谱对水蒸气和真空条件下退火的多孔硅样品的微观缺陷结构进行表征,结合发射光谱测量结果,对影响多孔硅发光性能的因素进行了讨论.实验结果表明,水蒸气退火后样品孔壁表面的悬挂键减少,并出现新的E′γ和EX类缺陷.水蒸气退火后样品中两种缺陷数量发生变化是导致多孔硅样品发光增强的直接原因;真空退火未使样品中发光相关缺陷发生变化,样品的发光性能没有显著改变.     

多孔硅紫外发光性质的研究

采用水热刻蚀技术制备多孔硅粉末。紫外激光244 nm激发时,多孔硅呈现出310 nm的强紫外发光。随着研磨时间的延长,多孔硅结构消失,紫外发光带也随之消失。氧气热处理后,多孔硅表面被氧化生成氧化硅薄层,同样造成紫外发光带的消失。我们认为310 nm紫外发光来源于硅纳米结构中电子和空穴的直接禁带结构辐射复合。     

一种模拟多孔硅结构的新方法

以界面电化学反应动力学和离子输运动力学为基础,构造了一种多孔硅形成与结构的动态计算机模拟模型,模型中采用了电势的指数形式来表示化学反应概率。文中给出了与多孔硅的横断面透射电子显微镜(TEM)图谱和高分辨透射电子显微镜(HRTEM)照片十分接近的形貌图示。 关键词：     

Irreversible quenching of luminescence in porous silicon

The influence of applied voltage on photoluminescence (PL) in porous silicon was studied. A strong PL band around 680 nm was observed when excited by a 300 nm ultraviolet light with no voltage applied, but upon increasing the bias voltage, a strong and progressive decrease of the PL intensity was observed leading finally to a complete quenching of the emitted light at 1.80 V. The peak position of the emission appears to be stable. This effect is completely irreversible, and the spectra depend on the increased voltage to the sample and corresponding temperature increase. Nonradiative recombination resulting from the thermal oxidation was suggested to be responsible for the quenching.     

Luminescence properties of Er in SiN/PS : Er

The decrease in luminescence from host porous silicon (PS) by thermal annealing prevents the optical activation of Er ions. We prepared a SiN layer on erbium-doped porous silicon (PS : Er) as the capping layer by photo-chemical vapor deposition (photo-CVD). After deposition of SiN, the sample was annealed in pure Ar atmosphere for optical activation. We observed an Er-related emission at 1532 nm with a full-width at half-maximum (FWHM) of 10 nm at 18 K from the sample with the SiN layer. In contrast, no emission was observed from the sample without the SiN layer. At 300 K, the peak intensity of Er³⁺-related photoluminescence (PL) for the sample annealed at 1100°C decreased to 40.0% of that observed at 18 K. From these results, it was found that the SiN layer on PS:Er is useful for both host PS and Er-related 1.5 μm luminescences.     

The role of surface oxidation on luminescence degradation of porous silicon

This study reports a comparative analysis on time dependent degradation of photoluminescence (PL) spectra of porous silicon (PS) during dark-aging (DA) and photo-aging (PA). Fourier Transform Infrared (FTIR) spectroscopy studies have been performed to get an insight on possible chemical changes in the PS surface. It has been found that SiH_x bonds decrease progressively while SiO_x bonds increase. FTIR and PL measurements revealed presence of blue shifts in the PL spectra during the aging stages (PA and DA). While the PL intensity of dark aged PS shows a decrease during the first 3 weeks and an increase afterwards, the PL intensity decreases continuously for photo-aged PS. The change in the PL spectra has been investigated by overlapping of two different PL bands which are reflective of oxidation of PS surface and size of Si naonocrystallites. A possible bond configuration model about the oxidation of PS surface has also been proposed. The results are interpreted in terms of quantum size effects in PS and the influence of the surface composition.     

Variation of double-peak structure in photoluminescence spectra from porous silicon with excitation wavelength

We have systematically observed at room temperature the variations of photoluminescence(PL) from porous silicon(PS) with excitation wavelength in a range from 260 to 460nm at 20nm intervals. In the range from 260 to 320nm, the PL spectra for one of the two studied samples show clear double-peak structure. Each spectrum can be fitted by two Gaussian functions with their peaks centered at about 610nm and 710nm, respectively. The peak position and the full width at half maximum of the two Gaussian functions change little with excitation wavelength. The above phenomena seem hard to interpret using the quantum confinement model, but can be understood in the quantum confinement/luminescence centers model (G.G.Qin and Y.Q.Jia, Solid State Commun. 86, 559(1993)), if we suppose that there are two kinds of luminescence centers adsorbed on the surfaces of nane-scale silicon (NS) units or situated in the SiO_x layers covering the NS units in PS.     

Improvement of the luminescence in p-type as-prepared or dye impregnated porous silicon microcavities

We have realized distributed Bragg reflectors and microcavities with a remarkable optical quality (R_max.=99.5% at 850 nm, FWHM=5 nm at 772 nm) with low doped p-type silicon. This is due to a strong decrease of the porous Si/bulk Si interface roughness that was obtained by low-temperature anodization. The properties of porous silicon microcavities are investigated by photoluminescence and reflection measurements. We also have filled porous silicon with Rhodamine 800 dye. The spontaneous emission spectrum of the optically excited Rhodamine 800 is drastically modified by microcavity effect: the peak emission intensity is increased, the line width is narrowed. The results demonstrate that using all porous silicon or dye-filled microcavities provides new possibilities to improve the properties of photonic devices.     

Steric and electronic effects in the molecular quenching of porous silicon luminescence

In this review, the effects of molecular exposure on the luminescent centers in porous silicon (PS) are described. The primary focus here is an attempt to understand how a variation in the size and electronic properties of a molecular absorbate can affect the quenching of porous Si light emission from different substrates. Results from our laboratories employing Lewis bases such as amines as quenchers of PS luminescence are stressed, as well as an overview of other relevant approaches using organic solvents, aromatic hydrocarbons, Brønsted acids/bases, and transition metal ions is presented.     

Exciton structure in luminescence excitation spectra of ZnS phosphors

Dips and peaks in luminescence excitation spectra of ZnS phosphors at 75 K have been identified as due to intrinsic exciton formation. Excitation spectra for Mn²⁺ emission exhibit an oscillatory structure due to hot exciton creation.     

Strongly nonlinear luminescence in oxidized porous silicon films

Partially oxidized free-standing porous silicon films show a strongly superlinear increase in photoluminescence (PL) intensity above a threshold cw excitation intensity of 10 W/cm². The PL-intensity increase can be expressed by a power law with n9 as a function of the excitation intensity. The PL-peak wavelength of this emission is slightly redshifted from that at low-excitation levels. These changes are fully reversible and reproducible, but not observed in samples on substrate. We attribute this behavior to thermal reexcitation of carriers trapped at the dangling bond states in initially nonluminescent Si nanocrystallites.     

Effect of finely dispersed platinum on the structure of luminescence spectra of the adsorbates of magnesium phthalocyanine on silicon dioxide

The luminescence and excitation spectra and kinetic characteristics of the luminescence of the adsorbates of magnesium phthalocyanine (MgPhc) on SiO₂ and the effect on them of surface hydration and finely dispersed platinum are studied. It is found that a structure that improves hydration of the adsorbent surface appears on the platinized surface in the luminescence and excitation spectra. It is assumed that the spectral structure is due to the complexes of MgPhc formed with water molecules, the hydroxyl cover of the surface, and the surface centers of SiO₂ modified by a Pt-catalyst. Reported at the VIIIth International Conference on Spectroscopy of Porphyrins and Their Analogs, Minsk, September 22–26, 1998. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 66, No. 4, pp. 552–555, July–August, 1999.     

Ellipsometric study of refractive index anisotropy in porous silicon

Porous Si layers of different thicknesses were prepared by anodising p⁺-type Si substrates with a resistivity of 0.01 Ω cm. The porosity of the samples ranged from 23% to 62%. The refractive index values for the ordinary and extraordinary rays were determined by multiple angle of incidence ellipsometry, from which an optical anisotropy parameter varying from 13% to 20% was obtained. The porous Si layers were modelled as uniaxially anisotropic films on an isotropic substrate, with an optical axis perpendicular to the sample surface. The morphological anisotropy which is typical for the p⁺-type porous Si with a predominating cylindrical geometry is responsible for these optical properties. All the porous Si layers studied were found to be optically negative.