Ar16+和Ar17+离子与Zr作用产生的X射线谱

将超导离子源提供的10—20keV/q Ar¹⁶⁺和Ar¹⁷⁺离子入射到Zr金属表面,在相互作用中产生的X射线谱表明,高电荷态Ar¹⁶⁺离子在金属表面中性化过程中有可能存在多电子激发,使Ar¹⁶⁺的K壳层电子被激发形成空穴,在退激过程中发射特征Kα-X射线.空心原子Ar的K层发射X射线强度随入射离子的动能而减弱,靶原子Zr的L壳层发射X射线强度随入射离子动能的增加而增强.Ar¹⁷⁺的单离子的Kα- 关键词： 高电荷态离子 空心原子 X射线     

高电荷态离子Arq+与不同金属靶作用产生的X射线

研究了高电荷态离子Ar^q+(q=16，17，18)入射金属Be，Al，Ni，Mo，Au靶表面产生的X射线谱.实验结果表明，Ar的Kα-X射线是离子在与固体表面相互作用过程中固体表面之下形成空心原子发射的.电子组态1s²的高电荷态Ar¹⁶⁺离子在金属表面中性化过程中，存在的多电子激发过程使Ar¹⁶⁺的K壳层电子激发产生空穴，级联退激发射Ar的Kα 特征X射线.Ar¹⁷⁺离子在金属表面作用过程中产生的X射线谱形与靶材料没有明显的关联,入射离子的Kα-X射线产额与其最初的电子组态有关，靶原子的X射线产额与入射离子的动能有关. 关键词： 高电荷态离子 空心原子 多电子激发 X射线     

Ar16+和Ar17+离子与Zr作用产生的X射线谱

将超导离子源提供的10-20keV/q Ar16 和Ar17 离子入射到Zr金属表面,在相互作用中产生的X射线谱表明,高电荷态Ar16 离子在金属表面中性化过程中有可能存在多电子激发,使Ar16 的K壳层电子被激发形成空穴,在退激过程中发射特征Kα-X射线.空心原子Ar的K层发射X射线强度随入射离子的动能而减弱,靶原子Zr的L壳层发射X射线强度随入射离子动能的增加而增强.Ar17 的单离子的Kα-X射线产额比Ar16 单离子的Kα-X射线产额大5个数量级.     

高电荷态离子Arq+与不同金属靶作用产生的X射线

研究了高电荷态离子Arq+(q=16,17,18)入射金属Be,Al,Ni,Mo,Au靶表面产生的X射线谱.实验结果表明,Ar的Kα-X射线是离子在与固体表面相互作用过程中固体表面之下形成空心原子发射的.电子组态1s2的高电荷态Ar16+离子在金属表面中性化过程中,存在的多电子激发过程使Ar16+的K壳层电子激发产生空穴,级联退激发射Ar的Kα特征X射线.Ar17+离子在金属表面作用过程中产生的X射线谱形与靶材料没有明显的关联,入射离子的Kα-X射线产额与其最初的电子组态有关,靶原子的X射线产额与入射离子的动能有关.     

Ar16+和Ar17+离子与Zr作用产生的X射线谱

将超导离子源提供的10—20keV/q Ar¹⁶⁺和Ar¹⁷⁺离子入射到Zr金属表面，在相互作用中产生的X射线谱表明，高电荷态Ar¹⁶⁺离子在金属表面中性化过程中有可能存在多电子激发，使Ar¹⁶⁺的K壳层电子被激发形成空穴，在退激过程中发射特征Kα-X射线.空心原子Ar的K层发射X射线强度随入射离子的动能而减弱，靶原子Zr的L壳层发射X射线强度随入射离子动能的增加而增强.Ar¹⁷⁺的单离子的Kα-     

高电荷态离子129Xe29+与不同金属表面作用产生的X射线谱

研究了高电荷态离子129Xe29+入射金属Au、Mo、Be表面产生的特征X射线谱。实验结果表明,在入射离子的动能相同时,Au的Mα1-X射线产额比Mo的Lα1-X、Lα2-X、Lβ 1-X射线总产额高,特征X射线的产额随入射离子动能的增加而显著增加;不同动能的Xe29+入射金属Au、Mo、Be表面均未产生Xe的特征X射线。     

Eu$lt;sup$gt;20+$lt;/sup$gt;入射Au靶发射Eu L-X射线产额与动能的相关性

探测了动能为3.0–6.0 MeV的Eu²⁰⁺离子入射Au靶激发Eu的L-X射线谱,获得了射线产额与离子入射动能的实验关系. 采用有心保守力作用下的两体碰撞模型,并考虑了离子的能损,计算了Eu离子与Au 原子碰撞过程中单离子L壳层空穴的产额. 根据离子L 壳层空穴退激的荧光产额,给出了碰撞过程Eu单离子L-X 射线产额与离子入射动能的理论关系. 结果表明,射线产额的理论值与实验数据符合得较好. 关键词： 离子动能 荧光产额 单离子X射线产额     

类钴氙离子入射Ni表面激发的红外光谱线和X射线谱

当高电荷态类钴氙离子（cobalt like -Xe, Xe²⁷⁺）入射金属Ni表面过程中,共振电子俘获释放势能完成中性化,形成多激发态的Xe原子,其外壳层电子退激辐射红外光谱线.入射离子特殊的势能释放方式、离子动能和金属表面引起离子增益的能量在极短的时间（飞秒量级）沉积靶平方纳米尺度的空间范围,引起靶表面原子激发和电离,形成复杂组态之间的跃迁,特别是偶极禁戒跃迁（电四极跃迁、磁偶极跃）和X射线发射.单离子X射线产额随入射离子的动能增加而增加. 关键词： 高电荷态离子 红外光谱线 X射线 禁戒跃迁     

H+和Ar11+激发Si的K壳层X射线发射研究

测量了50–250 keV H⁺和1.0–3.0 MeV Ar¹¹⁺ 轰击Si表面过程中辐射的X射线. 结果表明, 在Ar¹¹⁺入射的情况下, 引起了Si的L壳层上3, 4个电子的多电离.计算了Si的K壳层X射线产生截面, 并将两体碰撞近似(BEA), 平面波恩近似, ECPSSR理论计算与实验值进行了对比. ECPSSR理论与质子产生的截面数据能够很好地符合; 而考虑多电离后, BEA理论与Ar¹¹⁺的实验结果符合较好. 关键词： X射线 高电荷态重离子 多电离     

空心原子的K-x射线谱

报道了利用兰州重离子加速器国家实验室ECR离子源首次引出的全裸Ar离子和类氢、类氦、类锂Ar离子与Be固体表面相互作用形成的空心原子x射线实验测量结果.结果发现，同样条件下，由于K壳层电子的剥离，Ar的K-x射线单离子发射产额增加了5个量级，约为36×10-3每原子；而当L壳层存在电子时，Ar的K-x射线几乎观测不到. 关键词： 高电荷态离子 空心原子 x射线 单离子产额     

X-ray spectra induced by slow highly charged Ar q + ions in collision with Nb surface

The X-ray spectra of Nb surface induced by Ar ^q+ (q = 16,17) ions with the energy range from 10 to 20 keV/q were studied by the optical spectrum technology. The experimental results indicate that the multi-electron excitation occurred as a highly charged Ar¹⁶⁺ ion was neutralized below the metal surface. The K shell electron of Ar¹⁶⁺ was excited and then de-excited cascadly to emit K X-ray. The intensity of the X-ray emitted from K shell of the hollow Ar atom decreased with the increase of projectile kinetic energy. The intensity of the X-ray emitted from L shell of the target atom Nb increased with the increase of projectile kinetic energy. The X-ray yield of Ar¹⁷⁺ is three magnitude orders larger than that of Ar¹⁶⁺. Supported by the National Natural Science Foundation of China (Grant Nos.10774149 and 10405025)     

L-Shell X-Ray Yields and Production Cross Sections of Zr and Mo Bombarded by Slow Highly Charged Ar16+ Ions

The L-shell x-ray yields of Zr and Mo bombarded by slow Ar16＋ ions are measured. The energy of the Ar^16＋ ions ranges from about 150 keV to 350 keV. The L-shell x-ray production cross sections of Zr and Mo are extracted from these yields data. The explanation of these experimental results is in the framework of the adiabatic direct- ionization and the binding energy modified BEA approximation. We consider, in the slow asymmetric collisions such as Ar and Mo/Zr, the transient united atoms （UA） are formed during the ion-surface interaction and the direct-ionization is the main mechanism for the inner-shell vacancy production. Generally, the theoretical results are in good agreement with the experimental data.     

The characteristic spectral lines of target atoms in the impact of<Superscript>40</Superscript>Ar<Superscript><Emphasis Type="Italic">q</Emphasis>+</Superscript> ions on metal surfaces

We report the measured results of the 200 nm—1000 nm characteristic spectral lines of target atoms when highly charged ions⁴⁰Ar ^q+(6≤q≤14) with the same kinetic energy and⁴⁰Ar⁶⁺ with different kinetic energies are incident upon Al, Ti, Ni, Ta and Au surfaces, respectively. The results for¹²⁹Xe⁶⁺,¹²⁹Xe¹⁰⁺ and¹²⁹Xe¹⁵⁺ with the same kinetic energy (150 keV) incident upon a Ta surface are also reported. These results show that when the projectile and target are properly selected (⁴⁰Ar¹²⁺ impinges on Al,¹²⁹Xe⁶⁺ impinges on Ta), the spectral intensity of characteristic spectral lines of the target atom is effectively enhanced, and is not strongly dependent on the kinetic energy of the incident ions.     

X-ray spectra induced in highly charged 40Arq+ interacting with Au surface

By use of optical spectrum technology, the spectra of X-ray induced by highly charged ⁴⁰Ar ^q+ ions interacting with Au surface have been studied. The results show that the argon Kα X-ray were emitted from the hollow atoms formed below the surface. There is a process of multi-electron exciting in neutralization of the Ar¹⁶⁺ion, with electronic configuration 1s² in its ground state below the solid surface. The yield of the projectile Kα X-ray is related to its initial electronic configuration, and the yield of the target X-ray is related to the projectile kinetic energy.     

Ion storage in Kingdon trap

Abstract

The characteristics of stored ions in a Kingdon trap have been investigated. The charge distribution of stored ions was measured by a time of flight (TOF) mass spectrometer. Storage of Ar^q+ (q = 1, 2, 3, 4) produced by electron beam irradiation has been confirmed. The dependences of Ar ion yields on the trapping potential and storage time have been systematically studied.

Applying a voltage to end plates is very important for the storage of ions. Remarkable oscillations of the ion yields are found in the decay curves as a function of storage time for Ar⁺, Ar²⁺ and Ar³⁺ indicating periodical motion of each ion group about the central wire. The three dimensional orbits of ions in the trap are analysed by a computer calculation to understand the experimental results.     

CH4或CH4+Ar介质阻挡放电中的离子能量和类金刚石膜制备

实验上，利用纯CH₄及CH₄+Ar在几百帕量级气压下的介质阻挡放电 制备类金刚石膜，研究了气压p与放电间隙d乘积(pd值)以及Ar的体积百分比R_Ar 对膜硬度的影响.理论上，从离子与气体分子的双体碰撞出发，利用较高折合电场强度E/n( 电场强度与粒子数密度之比)下离子及中性粒子速度分布的双温模型、离子在其他气体中运 动时遵守的朗之万方程及离子在混合气体中运动时遵守的布兰克法则，对CH⁺4和Ar⁺离子能量进行了分析.结果表明：1)CH₄介质阻挡 放电中，pd值由1.862×10³Pa mm降低至2.66×10²Pa mm时，CH+₄能量由5.4eV增加到163eV，类金刚石膜硬度由2.1GPa提高到17.6GPa ; 2) 保持总气压p=100Pa,放电间距d=5mm不变，在CH₄中加入Ar气，当R_Ar 由20％增加至83%时，CH⁺₄的能量由69eV增加到92eV,而Ar＋能量由93eV降低至72eV.虽然CH⁺₄能量增加有助于提高 沉积膜硬度，但当R_Ar大于67%，高强度Ar⁺轰击会导致膜表面石墨 化，膜硬度降低.为了验证离子能量理论模型的正确性，实验测量了H₂介质阻挡 放电中离子能量，测量结果与理论计算之间最大相对误差为16%. 关键词： 离子能量 介质阻挡放电 类金刚石膜     

Kinetic energy and charge state effects in the X-ray emission of Mo surface induced by Xe q + ( q = 25, 29) ions

L-shell X-ray spectra of Mo surface induced by Xe²⁵⁺ and Xe²⁹⁺ were measured. The X-ray intensity was obtained in the kinetic energy range of the incident ions from 350 to 600 keV. The relationship of X-ray intensity with kinetic energy of the projectile and its charge state were studied, and the simple explanation was given. Supported by the Science and Technology Ministry Foundation of China (Grant No. 2002CCA00900) and the Foundation of National Key Laboratory of Vacuum & Cryogenics Technology and Physics     

反冲原子对低速离子轰击Si表面时电子发射产额的影响

在兰州重离子加速器国家实验室电子回旋共振离子源高电荷态原子物理实验平台上,用低能(0.75keV/u≤EP/MP≤10.5keV/u,即3.8×105m/s≤vP≤1.42×106m/s)He2+,O2+和Ne2+离子束正入射到自清洁Si表面时二次电子发射产额的实验结果.结果表明电子发射产额γ近似正比于入射离子动能EP/MP.在相同动能下,γ(O)γ(Ne)γ(He),对于原子序数ZP比较大的O2+和Ne2+离子,ZP大者反而γ小,这与较高入射能量时的结果截然不同.通过计算不同入射能量下入射离子的阻止能损S,发现反冲原子对激发二次电子的作用随入射离子能量的降低显著增大,这正是导致在较低能量范围内二次电子发射产额与较高入射能量时存在差异的主要原因.