Re‐Investigation of the Structure of 7Bi2O3 · 2WO3 by Single‐Crystal X‐ray Diffraction

The structure of the oxygen‐deficient compound 7Bi₂O₃ · 2WO₃, a fluorite‐derivative phase considered a candidate for electronic applications because of its high ionic conductivity, is investigated by singlecrystal X‐Ray diffraction employing Ag‐Kα radiation (λ = 0.5608 Å) to minimize the effect of the absorption by the heavy metals. The space‐group type is I4₁, the acentric subgroup of I4₁/a that was previously suggested from powder‐diffraction data and precession‐camera photographs. Lattice parameters are a = 12.513(2), c = 11.231(4) (Z = 2.5). The sample is twinned by syngonic merohedry, class I, with volume ratio of the individuals 0.58/0.42. The ordering of W partly confirms previous models, with one W fully occupying one of the sites on special position. However, the remaining W goes in a site on general position, which shares with Bi, resulting thus more diluted in the structure. The oxygen vacancies are partly ordered in three of the ten anion sites.     

Crystal structure refinement of the ternary compound Cu2SnTe3 by X‐ray powder diffraction

The ternary compound Cu₂SnTe₃ crystallizes in the Imm2 (Nº 44) space group, Z = 2, with a = 12.833(4) Å, b = 4.274(1) Å, c = 6.043(1) Å, V = 331.5(1) ų. Its structure was refined from X‐ray powder diffraction data using the Rietveld method. The refinement of 25 instrumental and structural variables led to R_p = 10.2%, R_wp = 11.8%, R_exp = 7.7%, R_B = 10.6%, S = 1.6 and χ² = 2.6, for 5501 step intensities and 163 independent reflections. This compound is isostructural with Cu₂GeSe₃, and consists of a three‐dimensional arrangement of slightly distorted CuTe₄ and SnTe₄ tetrahedra connected by common corners. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Synthesis and X‐ray powder diffraction studies of semiconducting alloys in the system AgCd2‐xZnxGaS4

X‐ray powder technique was used in the investigation of AgCd₂GaS_4–'AgZn₂GaS₄' section to determine the region of AgCd₂GaS₄‐based solubility. It was established that the solid solution forms up to 75 mol.% 'AgZn₂GaS₄'. The refinement of AgCd_0.5Zn_1.5GaS₄ structure was performed. This alloy crystallizes in orthorhombic structure (space group Pmn2₁ ) with unit cell parameters a =0.78772(2), b =0.67221(2), c =0.64019(2) nm, V =0.33899(3) nm³. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

X‐ray powder diffraction study of the semiconducting alloy Cu2Cd0.5Mn0.5GeSe4

The structure of the semiconducting alloy Cu₂Cd_0.5Mn_0.5GeSe₄ was refined from an X‐ray powder diffraction pattern using the Rietveld method. The present alloy crystallizes in the wurtz‐stannite structure, space group Pmn2₁ (N^o 31), and unit cell parameters values of a = 8.0253(2) Å, b = 6.8591(2) Å, c = 6.5734(2) Å and V = 361.84(2) ų. The structure exhibits a three‐dimensional arrangement of slightly distorted CuSe₄, Cd(Mn)Se₄ and GeSe₄ tetrahedras connected by corners. © 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim     

X‐ray Rotation‐Tilt‐Method — First Results of a new X‐ray Diffraction Technique

That from us as X‐ray Rotation‐Tilt Technique (XRT Method) designated procedure principle represents a world innovation and overcomes essential disadvantages of comparable diffraction techniques known up to now. Starting from the origin and the informational content of the XRT interferences a realization of a special equipment and selected examples of some first applications are presented.     

Crystal structure refinement of CuxAg1‐xInTe2 bulk material determined from X‐ray powder diffraction data using the Rietveld method

The influence of the Cu‐content in the quaternary compounds Cu_xAg_1‐xInTe₂ (0 ≤ x ≤1) on the structural properties of the bulk material was discussed. Bulk ingot materials of Cu_xAg_1‐xInTe₂ solid solutions (x = 0.0, 0.25, 0.50, 0.75 and 1.0) have been synthesized by fusion of the constituent elements in the stoichiometric ratios in vacuum‐sealed silica tubes. The materials compositions were confirmed by using energy dispersive analysis of X‐rays (EDAX). X‐ray powder diffraction measurements were performed for all the prepared samples at 300 K in step scanning mode. The analysis of X‐ray data has indicated that the crystal structure of the prepared materials with different compositions is single‐phase polycrystalline materials corresponding to the tetragonal chalcopyrite structure with space group I 2d. The crystal structural parameters were refined by Rietveld method using the Full Prof program. The refined lattice constants (a and c), anion positional parameter, u, and the determined bond distances and angles were found to vary with composition, x, attaining zero tetragonal distortion at x ≈ 0.75, which corresponds to an ideal tetragonal unit cell. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

An Investigation on the Lattice Distortion in Urea and KCl Doped KDP Single Crystals by X‐ray Diffraction Studies

Potassium dihydrogen phosphate (KDP) doped with different mole concentrations of Urea and KCl were grown using low temperature solution growth technique. X‐ray diffraction studies were carried out on the grown crystals using a Shimadzu X‐ray diffractometer with CuKD radiation. X‐ray study revealed that the structures of the doped crystals are slightly distorted compared to the pure KDP crystal. This may be attributed to strains on the lattice by the adsorption of urea and KCl.     

Crystal structure and optical properties of 4‐nitrophenyl 4‐butoxybenzoate

The title compound, C₁₇H₁₇N₁O₅, has been synthesized and characterized by single crystal X‐ray analysis and UV‐Vis spectra. The crystals are monoclinic, P 2₁/c, a = 17.994 (5) Å, b = 4.0592 (9) Å, c = 21.625 (5) Å, β = 99.634 (5)°, V = 1557.2 (6) ų and Z = 4. The molecule has an almost stretched form with a molecular length of 17.505 Å and an imbricated structure known for liquid crystals. The structure contains no direction‐specific intermolecular interactions like aromatic π‐π stacking and C‐H… π(arene) other than two weak C‐H…O hydrogen bonds. Good optical transmittance in the entire visible region of the UV‐Vis spectrum suggests that it is a potential candidate for optoelectronic applications. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Synthesis and X‐ray crystal structure investigations of the complexes of a proton sponge with selected inorganic acids: Crystal structure of DMAN.HI complex

A series of ionic complexes of 1,8–bis(dimethylamino)naphthalene with selected inorganic acids such as HCl, HBr, HI, HSCN and HBF₄ were synthesised and thoroughly investigated by means of powder diffractometry and analytical methods. The crystallographic data for these compounds as well as the results of the structure solution by powder diffraction methods of the 1,8–bis(dimethylamino)naphthalene.HI complex, which crystallizes in the monoclinic system, S.G. P2₁/c (14), a=7.999(2)Å, b=23.053(3)Å, c=7.948(1)Å, β=99.63°, R_F=17.1%, R_wp=15.5%, are discussed and presented in this work. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Grazing Incidence In‐plane Diffraction Measurement of In‐plane Mosaic with Microfocus X‐ray Tubes

The in‐plane mosaic structure of Au/Fe and GaN‐based epitaxial layers has been determined directly by laboratory‐based grazing incidence in‐plane x‐ray diffraction in which Bragg reflections normal to the plane of the wafer are probed. High intensity and acceptable signal‐to‐noise can be obtained with no modifications to commercially available equipment. Excellent agreement is obtained between measurements of the same Au/Fe multilayer samples at the European Synchrotron Radiation Facility in Grenoble and with the laboratory system employing a focused x‐ray beam from a microfocus generator. The technique is particularly important for the GaN‐based systems as it uniquely provides a measure of the so‐called twist mosaic independent of the out‐of plane (tilt) mosaic.     

Synthesis and single crystal X‐ray structure of the tetragonal tungsten bronze Pb0.91K1.72Li1.46Nb5O15

Crystals of Pb_0.91K_1.72Li_1.46Nb₅O₁₅, belonging to tetragonal tungsten bronze materials, were grown by the slow cooling technique, and characterized by means of single crystal X‐ray diffraction: the structure was solved in the P4bm tetragonal space group, with the following unit cell parameters: a = 12.548(5), c = 4.042(5) Å, V = 636.4(9) ų. The three‐dimensional framework can be described as a layered structure down crystallographic axis c, with arrays of NbO₆ octahedra, whose corner sharing makes up the formation of tunnels filled up by Li, Pb and K displaying complex cation‐oxygen coordinations. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Observation of individual dislocations in 6H and 4H SiC by means of back‐reflection methods of X‐ray diffraction topography

SiC crystals of high structural perfection were investigated with several methods of X‐ray diffraction topography in Bragg‐case geometry. The methods included section and projection synchrotron white beam topography and monochromatic beam topography. The investigated 6H and 4H samples contained in large regions dislocations of density not exceeding 10³ cm^‐2. Most of them cannot be interpreted as hollow core dislocations (micro‐ or nano‐pipes). The concentration of the latter was lower than 10² cm^‐2. The present investigation confirmed the possibility of revealing dislocations with all used methods. The quality of presently obtained Bragg‐case multi‐crystal and section images of dislocation enabled analysis based on comparison with numerically simulated images. The analysis confirmed the domination of screw‐type dislocations in the investigated crystals. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Quantitative Determination of Crystalline Na5P3O10 –I (Form‐I) in Commercial Tripolyphosphate using X‐ray Diffraction Patterns

An x‐ray diffraction method (XRD) for quantitative determination of the crystalline Na₅P₃O₁₀‐I (Form‐I) in a mixture of Form‐I/Form‐II was applied for commercial pentasodium tripolyphosphate analysis. The XRD pattern of the Form‐I shows the unique non‐overlapping 2θ peak at a position of ≈ 21.8 deg. and also at ≈ 29.0 deg. (Cu radiation). The area (integral of the intensity) under the peaks is proportional to the amount of the Form‐I in the mixture covering the range up to 100 wt.%. That enables one to obtain a calibration line and to determine the amount of Form‐I in the mixture of Form‐I/Form‐II and also in commercial pentasodium tripolyphosphate. Commercial samples with high Form‐I concentration, in case they are contaminated with sodium pyrophosphate (Na₄P₂O₇), should be diluted with Form‐II to bring the concentration of the Form‐I below 50 wt.% in the analysed sample.     

Crystal and molecular structure of 1‐allyl‐5‐(4‐methylbenzoyl)‐4‐(4‐methylphenyl)pyrimidine‐2(1H)‐thione

The crystal structure of 1‐allyl‐5‐(4‐methylbenzoyl)‐4‐(4‐methylphenyl)pyrimidine‐2(1H)‐thione (C₂₂H₂₀N₂OS) has been determined from three dimensional single crystal X‐ray diffraction data. The title compound crystallizes in the monoclinic space group P 2₁/c, with a = 10.6674(13), b = 10.1077(7), c = 17.9467(19) Å, β = 98.460(9)°, V = 1914.0(3) ų, D_calc = 1.251 g cm^–3, Z = 4. In the title compound, the allyl group shows positional disorder. Molecules are linked by C‐H···O, C‐H···N and C‐H···S intermolecular interactions forming two‐dimensional network. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Synthesis,spectroscopic studies and ab‐initio structure determination from X‐ray powder diffraction of bis‐(N‐3‐acetophenylsalicylaldiminato)copper(II)

The synthesis, spectroscopic studies and crystal structure determination from X‐ray powder diffraction have been carried out for bis‐(N‐3‐acetophenylsalicylaldiminato)copper(II). The structure is triclinic, space group P1 with unit cell dimensions a = 11.817(1) Å, b = 12.087(1) Å, c = 9.210(1) Å, α = 102.62(1)°, β = 111.16(1)°, γ = 86.15(1)°, V = 1197.0(2)ų, Z = 2. The structure has been solved by Monte Carlo simulated annealing approach and refined by GSAS package. The final Rp value was 8.68%. The coordination geometry around the copper atom in the complex is intermediate between square‐planar and tetrahedral with two salicylaldimine ligands in trans arrangement. Intermolecular C–H…O hydrogen bonds between molecules related by translation generate infinite chains along [010] direction. The molecular chains are linked via additional C–H…O hydrogen bonds to form a three‐dimensional supramolecular network. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

X‐ray Diffraction Topography at a Synchrotron Radiation Source Applied to the Study of Bonded Silicon on Insulator Material

New possibilities of X‐ray diffraction topography offered by the modern synchrotron radiation sources for the investigation of wafer‐bonded material are demonstrated. They allowed detecting defects and long‐range strain fields at and close to the bonding interface. A quantitative estimation of the deformation of the region near to the bonding interface was possible e.g. by investigating focussing distances and dominant spatial frequencies of contrast patterns (often in the order of 200 μm). In typical wafer bonded material the maximum bonding‐induced inclination of the lattice planes was in the order of 10 arcsec and the approximate amplitude of the deformation in the order of 1.5 nm. The sensitivity of the presented methods to characterize the influence of various process parameters was demonstrated.     

Observation of the δ to ε Zr‐hydride transition by in‐situ synchrotron X‐ray diffraction

We investigate the formation and dissolution of hydrides in commercially pure zirconium powder in‐situ using high‐energy synchrotron X‐ray radiation. Experimental results showed a continuous phase transition between the δ and ε zirconium hydride phases with indication of a second order phase transformation.     

Crystallographic Analysis of Acetyl β ‐boswellic acid

The crystal structure of the title compound (3 α ‐acetoxy‐urs‐12‐en‐24‐oic acid, C₃₂H₅₀O₄) has been determined by X‐ray crystallographic techniques. The compound crystallizes into orthorhombic space group P2₁2₁2₁ with unit cell parameters : a = 12.773(2), b=16.381(4), c=27.929(7)Å. The structure has been solved by direct methods and refined to R = 0.054 for 4930 observed reflections. The structure contains two crystallographically independent molecules in the asymmetric unit which are almost identical in geometry. Rings A, B, D and E have chair conformations while ring C assumes a sofa conformation in both the molecules. The molecules in the structure are linked together by intra‐ and intermolecular O‐H…= and C‐H…O hydrogen bonds.     

Change of the X‐Ray Polarisation State by Diffraction

An introduction to polarisation phenomena observed at X‐ray diffraction is given. Using an arrangement being analogous to optics of visible light, the polarisation state of the diffracted beam has been investigated using quarter wave plates. Depolarisation phenomena at the excitation of a noncoplanar many‐beam geometry are shown for lithium fluoride samples. The results are explained in terms of incoherent diffraction, as known from light optics.     

Growth imperfections in oriented grown KDP crystals by X‐ray topographic analysis

Potassium dihydrogen phosphate (KDP) crystals were restrained to grow in two dimensions only, using a specially designed platform. This enables us to grow the blanks of frequency conversion elements that satisfy type‐II phase matching direction out of a type‐II phase‐matched seed crystal. Synchrotron radiation topography was used to study the growth mechanism of these profiling grown KDP crystals. It is found that both dislocation growth mechanism and layer growth mechanism were involved in the growing process. Inclusions, growth striations and dislocations were the main defects that influenced the crystalline quality of these crystals. High‐resolution X‐ray diffraction was employed to study the lattice integrality of the crystal.