高折射率玻璃微珠折射率的测量

用激光作为测量光源,利用激光经玻璃微珠一次或多次内部反射后出射,形成最小偏转角的原理,对高折射率玻璃微珠折射率的测量进行了理论分析和实验测试.比较了不同内反射次数对测量精度的影响.该测量方法尤其适用于已在微珠列阵逆向反光膜上大量使用的、折射率位于1.8～2.4之间的高折射率玻璃微珠折射率的测量,较传统方法具有简便、快捷和安全的特点.经分析和对不同类型微珠样品的实测比较,获得了测量精度优于1%的结果.     

定向回归反射玻璃微珠折射率研究

从理论上分析了玻璃微珠定向回归反射原理,利用近轴光线球面折射理论分析了玻璃微珠实现回归反射的折射率,并结合实际使用情况,在最大可能增加回归反射的基础上,讨论了入射光线到主光轴的距离与回归光线和入射光线夹角之间的关系,从而确定出了实现最大反射时玻璃微珠的折射率范围为1.80~1.95,研究结果对回归反射标志牌的开发具有重要的理论意义。     

影响玻璃微珠回向反射性能的主要因素分析

从理论和实验两方面分析了玻璃微珠的回向反射特性,主要讨论了玻璃微珠的折射率和其反射层面积这两个因素对回向反射性能的影响. 研究结果表明,折射率增大, 折射率小于2时,回向反射性能逐渐增强, 相反, 在折射率大于2时, 回向反射性能减弱; 反射层面积的大小会影响入射光线的完整回向反射过程; 最后定义了有效回向反射角度, 并给出了玻璃微珠在激光照射下的二维回向反射光照度分布.     

彩虹法和成像法测量玻璃微珠折射率对比研究

基于几何光学原理,彩虹法使用激光作为光源,利用激光在玻璃微珠中进行一次或者多次内反射后出射形成最小偏向角,在最小偏向角附近形成彩虹条纹,通过测量彩虹条纹来反演计算玻璃微珠的折射率。然而,成像法则根据厚透镜的成像原理,对玻璃微珠所成的像经过显微物镜放大后使用CCD相机进行接收,获得玻璃微珠的焦距,进而测得对应玻璃微珠的折射率。较传统方法来说,彩虹法和成像法具有安全、简便和快捷的优点。对型号不同的玻璃微珠,分别使用彩虹法和成像法测量其折射率,并对它们的测量结果进行了对比分析,都获得相对于名义值的误差小于1%的结果。     

二次彩虹法测量高折射率玻璃微珠折射率研究

基于米氏散射理论解释了激光照明下玻璃微珠的二次彩虹精细结构的成因,发现折射率的差异将直接影响二次彩虹精细结构的位置.对于实验中玻璃微珠半径变化引起二次彩虹精细结构间距变化的现象亦用米氏散射理论进行了模拟分析和实验研究.利用米氏散射的近似理论——艾里理论对玻璃微珠的折射率进行了测量.在对玻璃微珠二次彩虹精细结构所计算得到的折射率的统计分析基础上,通过校正测量误差后得到了玻璃微珠折射率的准确数据.     

高折射玻璃微珠粒径与折射率关系的研究

利用激光照射高折射率玻璃微珠下形成的二次彩虹现象,以艾里的虹理论为基础对玻璃微珠折射率进行了测量。推导了玻璃微珠尺寸对折射率影响的计算公式,表明半径差异在10μm时,折射率的测量误差为10^-3数量级。此外,通过软件模拟计算玻璃微珠的二次彩虹现象,并对微珠的折射率进行了测量,验证了二次彩虹方法的正确性,同时也表明玻璃微...     

取样光栅各参量变化对反射谱影响规律的研究

基于耦合模理论,采用传输矩阵法,模拟分析了均匀取样光栅的长度L、周期LA、折射率调制量δneff、啁啾系数f等参量对其反射谱的影响规律,研究了其在多信道色散补偿中的应用.研究和分析表明,取样光栅具有极好的波长选择性,在它的反射谱中通道多且通道间隔稳定,带通窄.在多信道色散补偿中,啁啾取样光栅各个信道的反射谱和时延曲线具有很好的一致性,色散量比较均匀,可以达到1 300 ps/nm,时延抖动小于50 ps.     

圆形三芯微结构色散补偿光纤的色散特性分析

设计了一种圆形三芯微结构色散补偿光纤,并采用频域有限差分法(FDFD)对其色散特性进行了分析.结果表明:在保持电磁参数不变的情况下,分别变化中心高折射率区半径,第一包层、第二包层层数,第三层、第六层和其它层空气洞的直径或沿水平直径方向相邻空气洞中心点间的距离,都会影响到这种光纤的有效模折射率和色散随波长的变化关系.控制这些几何参数的大小,在1.55μm处,这种光纤的负色散值可以达到-2100 ps/(nm·km),色散曲线的半高全宽可以达到240 nm.所得结果对色散补偿光纤的设计、制作和应用具有一定的指导意义.     

超宽带减反射膜的设计和制备

设计了400～900 nm波段上的超宽带减反射膜,在410～850 nm范围内的平均残余反射率设计值约为0.2%,在设计的全波段上约为0.24%.讨论了初始膜系结构的选择原则,分析了带宽、膜层折射率差、最外层折射率和膜层总厚度等因素对宽带减反射特性的影响.对特定的带宽.增加两种薄膜材料的折射率差和选择尽可能低的最外层折射率对获得优良的减反射特性是非常重要的.实验制备了K9玻璃上TiO2/MgF2两种材料组成的8层结构的超宽带减反射膜,实测结果表明,在带宽520 nm范围内的平均残余反射率约为0.44%,说明用二种材料设计超宽带减反射膜是成功的,对垂直入射的减反射膜.多种材料的膜系并不比两种材料更具优越性.     

1.2到1.8μm光波导材料的光学性质

本文将评述三种损耗机制,并报导至今为止已经获得的最好衰减结果,分析瑞利散射、O-H吸收带和红外吸收边与组分之间的关系。玻璃成分也影响波导玻璃的折射率色散,将用可采用的折射率数据来讨论关于波导设计的折射率色散,为说明这些效应的重大意义,也将引用相关波长带宽测量。     

Properties of a Thin-Film Optical Waveguide Using Fluorinated Silicon Oxide and Organic Spin-on-Glass Films

A thin-film optical waveguide using a fluorinated silicon oxide (SiOF) as a core layer was investigated. An organic spin-on-glass (SOG) film was used for a cladding layer. The SiOF films were formed at 23°C by a liquid-phase deposition (LPD) technique using a supersaturated hydrofluosilicic acid (H₂SiF₆) aqueous solution. A thin-film optical waveguide structure for single mode was designed and fabricated, based on the dispersion properties of refractive indices for the LPD-SiOF and organic SOG films. The refractive indices at a wavelength of 632.8 nm were 1.430 and around 1.400 for the LPD-SiOF and organic SOG films, respectively. The thickness of LPD-SiOF films deposited was 1.18 μm. Thicknesses of cladding organic SOG films cured at 300 and 400°C were 1.28 and 1.31μm, respectively. The effective refractive indices for single mode were 1.4169 and 1.4158 at a wavelength of 632.8 nm for the cladding organic SOG films cured at 300 and 400°C, respectively, and differences between the measured and calculated incident angles were 0.84° and 1.29° for the cladding organic SOG films cured at these respective temperatures. A streak of guided-light was observed for the LPD-SiOF/SOG structure optical waveguide. The transmission loss was 7.6-7.9 dB/cm.     

基于透射光谱确定溶胶凝胶ZrO2薄膜的光学常数

基于溶胶凝胶ZrO₂薄膜的紫外/可见/近红外透射实验光谱,采用Swanepoel方法结合Wemple-DiDomenico色散模型,方便地导出了ZrO₂薄膜在200—1200nm波长范围内的光学常数,包括折射率、色散常数、膜层厚度、吸收系数及能量带隙.研究发现,溶胶凝胶ZrO₂薄膜具有高折射率(1.63—1.93,测试波长为632.8nm)、低吸收和直接能量带隙(4.97—5.63eV) 等光学特性,而且其光学常数对薄膜制备过程中的重要工艺 关键词： 光学常数 Swanepoel方法 2薄膜')" href="#">ZrO₂薄膜 热处理     

Measuring the refractometric characteristics of optical plastics

Ten types of American, Japanese, and German optical plastic (OP) materials are examined. The principal OPs are analysed: polymethyl methacrylate, polystyrene, polycarbonate, and styrene acrylonitrile. Refractive indices are measured and calculated for the principal and some new applicable OPs, namely NAS-21 Novacor, CTE-Richardson, Zeonex E48R, Optorez 1330 and Bayer for wavelengths from 435.8 to 1052 nm. A theoretical examination was made for computer modelling of OPs indices using Cauchy's dispersion formula. The dispersion coefficients and Abbe constants are calculated. The OPs indices computed for numerous laser wavelengths 442–1060 nm are presented. A more effective device and technology for the measurement of refractive index of OPs is realized with an accuracy of ±0.001.     

Fused silica as a composite nanostructured material

A method for calculating the refractive index of optical fused silica by applying the model of effective permittivity of composite homogeneous media is proposed and realized. The calculation was performed using the tabular data of the refractive index of crystalline α quartz and the ratio of the quartz glass and α quartz densities. It was suggested that fused silica contains nanosized pores with a glass filling number q immersed in a matrix with a density differing from the α quartz density by a factor of κ, where κ is slightly less than unity. It was established that the Maxwell-Garnett model makes it possible to calculate the refractive index of quartz glass and its dispersion in the transparency range (404 nm ≤ λ ≤ 671 nm) with a deviation less than 0.0002 from the tabular values. The calculated and experimental values coincide at q = 0.155 and κ = 0.986.     

A spectrophotometric method for determining linear and predicting nonlinear optical properties of glass substrates

In this work, an expression for the interface reflectance in terms of both the total transmittance and the total reflectance of the glass substrate is derived. Using this expression a nondestructive procedure for deducing the complex refractive index of glass bulk material is suggested. Complex refractive indices of four glassy substrates with different thicknesses and compositions are experimentally measured across a spectral range 200–2000 nm. The errors of measurements for the suggested procedure depend on the reflectance and transmittance errors. They are calculated to be of about ±2.751 × 10^?8 for imaginary and ±0.008 for real refractive indices. Dispersive parameters of the real refractive indices and optical energy gaps for direct and indirect allowed optical transitions are deduced. Predicted nonlinear refractive indices and susceptibilities are evaluated.     

Influence of temperature annealing on optical properties of SrTiO3/BaTiO3 multilayered films on indium tin oxide

We have prepared SrTiO₃/BaTiO₃ thin films with multilayered structures deposited on indium tin oxide (ITO) coated glass by a sol-gel deposition and heating at 300-650 °C. The optical properties were obtained by UV-vis spectroscopy. The films show a high transmittance (approximately 85%) in the visible region. The optical band gap of the films is tunable in the 3.64-4.19 eV range by varying the annealing temperature. An abrupt decrease towards the bulk band gap value is observed at annealing temperatures above 600 °C. The multilayered film annealed at 650 ° C exhibited the maximum refractive index of 2.09-1.91 in the 450-750 nm wavelength range. The XRD and AFM results indicate that the films annealed above 600 ° C are substantially more crystalline than the films prepared at lower temperatures which were used to change their optical band gap and complex refractive index to an extent that depended on the annealing temperature.     

Structural and optical properties of low temperature synthesized Nanostructured BiFeO3 thin films

Nanostructured bismuth ferrite (BiFeO₃) thin films were deposited on glass substrate by the sol-gel process. The as-fired film at 250 °C was found to be amorphous crystallizing to pure rhombohedral phase after annealing at 450 °C for 2 h in air. The XRD pattern shows that the sample is polycrystalline in nature. The average grain size of the film calculated from the XRD data was found to be 16 nm. The as-fired film show high transmittance that decreases after crystallization. The absorption edge of the films was found to be sharper and shifting towards the lower energy as the annealing temperature increases. The optical energy band gaps of the amorphous and crystalline films were found to be 2.63 and 2.31 eV, respectively. The refractive indices of the amorphous and crystalline films were 2.05 and 2.26, respectively.