Optical properties of pentacene and perfluoropentacene thin films

The optical properties of pentacene (PEN) and perfluoropentacene (PFP) thin films on various SiO(2) substrates were studied using variable angle spectroscopic ellipsometry. Structural characterization was performed using x-ray reflectivity and atomic force microscopy. A uniaxial model with the optic axis normal to the sample surface was used to analyze the ellipsometry data. A strong optical anisotropy was observed, and enabled the direction of the transition dipole of the absorption bands to be determined. Furthermore, comparison of the optical constants of PEN and PFP thin films with the absorption spectra of the monomers in solution shows significant changes due to the crystalline environment. Relative to the monomer spectrum, the highest occupied molecular orbital to lowest unoccupied molecular orbital transition observed in PEN (PFP) thin film is reduced by 210 meV (280 meV). A second absorption band in the PFP thin film shows a slight blueshift (40 meV) compared to the spectrum of the monomer with its transition dipole perpendicular to that of the first absorption band.     

XRD and AFM studies of ZnS thin films produced by electrodeposition method

The structure and morphology of ZnS thin films were investigated. ZnS thin films have been grown on an indium tin oxide glass substrate by electrodeposition method using zinc chloride and sodium thiosulfate solutions at room temperature. The X-ray diffraction patterns confirm the presence of ZnS thin films. From the AFM images, grain size decreases as the cathodic potential becomes more negative (from ?1.1 to ?1.3 V) at various deposition periods. Comparison between all the samples reveals that the intensity of the peaks increased, indicating better crystalline phase for the films deposited at ?1.1 V. These films show homogeneous and uniform distribution according to AFM images. On the other hand, XRD analysis shows that the number of ZnS peaks increased as deposition time was increased from 15 to 30 min at ?1.1 V. The AFM images show thicker films to be formed at ?1.1 V indicating more favourable condition for the formation of ZnS thin films.     

GIUSAXS and AFM studies on surface reconstruction of latex thin films during thermal treatment

The structural evolution of a single-layer latex film during annealing was studied via grazing incidence ultrasmall-angle X-ray scattering (GIUSAXS) and atomic force microscopy (AFM). The latex particles were composed of a low-Tg (-54 degrees C) core (n-butylacrylate, 30 wt %) and a high-Tg (41 degrees C) shell (t-butylacrylate, 70 wt %) and had an overall diameter of about 500 nm. GIUSAXS data indicate that the q(y) scan at q(z) = 0.27 nm(-1) (out-of-plane scan) contains information about both the structure factor and the form factor. The GIUSAXS data on latex films annealed at various temperatures ranging from room temperature to 140 degrees C indicate that the structure of the latex thin film beneath the surface changed significantly. The evolution of the out-of-plane scan plot reveals the surface reconstruction of the film. Furthermore, we also followed the time-dependent behavior of structural evolution when the latex film was annealed at a relatively low temperature (60 degrees C) where restructuring within the film can be followed that cannot be detected by AFM, which detects only surface morphology. Moreover, compared to AFM studies GIUSAXS provides averaged information covering larger areas.     

Structural order in perfluoropentacene thin films and heterostructures with pentacene

Synchrotron x-ray diffraction reciprocal space mapping was performed on perfluoropentacene (PFP) thin films on SiO2 in order to determine the crystal structure of a novel, substrate-induced thin film phase to be monoclinic with unit cell parameters of a = 15.76 +/- 0.02 A, b = 4.51 +/- 0.02 A, c = 11.48 +/- 0.02 A, and beta = 90.4 +/- 0.1 degrees . Moreover, layered and co-deposited heterostructures of PFP and pentacene (P) were investigated by specular and grazing-incidence x-ray diffraction, atomic force microscopy, and Fourier-transform infrared spectroscopy. For a ca. three-monolayers-thick PFP film grown on a P underlayer, slightly increased lattice spacing was found. In contrast, co-deposited P/PFP films form a new mixed-crystal structure with no detectable degree of phase separation. These results highlight the structural complexity of these technically relevant molecular heterojunctions for use in organic electronics.     

Crystallographic and morphological characterization of thin pentacene films on polycrystalline copper surfaces

The degree of crystallinity, the structure and orientation of crystallites, and the morphology of thin pentacene films grown by vapor deposition in an ultrahigh vacuum environment on polycrystalline copper substrates have been investigated by x-ray diffraction and tapping-mode scanning force microscopy (TM-SFM). Depending on the substrate temperature during deposition, very different results are obtained: While at 77 K a long-range order is missing, the films become crystalline at elevated temperatures. From a high-resolution x-ray-diffraction profile analysis, the volume-weighted size of the crystallites perpendicular to the film surface could be determined. This size of the crystallites increases strongly upon changing temperature between room temperature and 333 K, at which point the size of individual crystallites typically exceeds 100 nm. In this temperature region, three different polymorphs are identified. The vast majority of crystallites have a fiber texture with the (001) net planes parallel to the substrate. In this geometry, the molecules are oriented standing up on the substrate (end-on arrangement). This alignment is remarkably different from that on single-crystalline metal surfaces, indicating that the growth is not epitaxial. Additionally, TM-SFM images show needlelike structures which suggest the presence of at least one additional orientation of crystallites (flat-on or edge-on). These results indicate that properties of thin crystalline pentacene films prepared on technologically relevant polycrystalline metal substrates for fast electronic applications may be compromised by the simultaneous presence of different local molecular aggregation states at all temperatures.     

Ubiquitous pentacene monolayer on metals deposited onto pentacene films

Photoelectron spectroscopy (XPS and UPS) was used to study the deposition of metal layers (Ag, Cu, and Au) onto pentacene films. Very low work functions were measured (PhiAg = 3.91 eV, PhiCu = 3.93 eV, and PhiAu = 4.3 eV) for all of the metals, in agreement with results from the literature. The intensities of the C 1s core-level signals from pentacene that were monitored during stepwise metal deposition leveled off at a value of about 30% of a thick pentacene film. This C 1s intensity is comparable to that of one monolayer of pentacene deposited onto the respective metal. The valence band spectra of metals deposited onto pentacene and spectra collected for pentacene deposited onto bare metal surfaces are very similar. These findings lead to the conclusion that approximately one monolayer of pentacene is always present on top of the freshly deposited metal film, which explains the very low work function of the metals when they are deposited onto organic films. We expect similar behavior with other nonreactive metals deposited onto stable organic layers.     

Thermal and mechanical cracking in bis(triisopropylsilylethnyl) pentacene thin films

Bis(triisopropylsilylethnyl) pentacene (TIPS pentacene) was synthesized to increase its solubility in common liquid solvents and, at the same time, enhance the π–π stacking between neighboring acenes in the crystallized state in comparison with unmodified pentacene. Hot-stage microscopy experiments revealed that during heating voids develop along the long axis of the TIPS pentacene films {along the [210] direction/parallel to the (120 ) planes} and crystals overlap along the short axis {along the [120 ] direction/parallel to the (210) planes}. From molecular mechanics simulations, the predominant twin boundaries of (120 ) and commonly observed cracking planes of (120), (120 ), and (210) had relatively low surface energies in comparison with planes with similar Miller indices. Organic thin-film transistors with TIPS pentacene as the active layer were fabricated, and the mobility values decreased from 0.4–1.0 cm²/V s before cracking to ∼0.2 cm²/V s after cracking. To maintain the high charge carrier mobility of TIPS pentacene devices, these cracks should be avoided. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 3631–3641, 2006     

Photoluminescence spectroscopy of pure pentacene, perfluoropentacene, and mixed thin films

We report detailed temperature dependent photoluminescence (PL) spectra of pentacene (PEN), perfluoropentacene (PFP), and PEN:PFP mixed thin films grown on SiO(2). PEN and PFP are particularly suitable for this study, since they are structurally compatible for good intermixing and form a model donor/acceptor system. The PL spectra of PEN are discussed in the context of existing literature and compared to the new findings for PFP. We analyze the optical transitions observed in the spectra of PEN and PFP using time-dependent density functional theory calculations. Importantly, for the mixed PEN:PFP film we observe an optical transition in PL at 1.4 eV providing evidence for coupling effects in the blend. We discuss a possible charge-transfer (CT) and provide a tentative scheme of the optical transitions in the blended films.     

Fabrication of a gas sensor using pentacene thin films as a detector

Highly sensitive gas sensors for both acidic and basic gases were fabricated based on conducting thin films of polyacene compounds. Gas sensors formed with pentacene thin films deposited on various kinds of substrates were found to exhibit high sensitivity in detecting subppm concentrations of NO₂ or Cl₂ by monitoring the conductivity of the thin film. Improvements in the conductance and duration period for detection were achieved by changing the shape of electrodes and substrate. The sensors with PEN thin films initially doped with iodine could detect ppm concentrations of ammonia gas, since iodine molecules were dedoped upon exposure to ammonia, causing the reduction of the conductivity.     

AFM analysis of organic silane thin films for bioMEMS applications

Designing surfaces that elicit the desirable response is essential for bioMEMS (biological microelectromechanical systems) applications. To this end, we have developed two different types of silane film—hydrophobic and hydrophilic—using vinyltrichlorosilane and poly(ethylene glycol) silane, respectively. As the surface topography plays a very important role in governing protein or cell interactions, these films were characterized extensively using atomic force microscopy. All the films developed were found to have a very low root‐mean‐square roughness value (<1.3 nm). Furthermore, the topography of protein‐adsorbed silane‐modified surfaces was investigated because cell adhesion is mediated primarily by proteins. Three‐dimensional and section plots were able to differentiate the way in which protein interacts with hydrophobic and hydrophilic surfaces. Copyright © 2003 John Wiley & Sons, Ltd.     

Imaging of crystal morphology and molecular simulations of surface energies in pentacene thin films

We have investigated the crystal growth of the organic semiconductor pentacene by complementing molecular simulations of surface energies with experimental images of pentacene films. Pentacene thin films having variations in thickness and grain size were produced by vacuum sublimation. Large (approximately 20 microm) faceted crystals grew on top of the underlying polycrystalline thin film. The films were characterized using optical microscopy (OM), X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Single crystals most commonly grew in a truncated diamond shape with the largest crystal face, (001), growing parallel to the substrate. Crystal morphologies and surface energies were calculated using force field-based molecular simulations. The (001) surface was found to have the lowest energy, at 76 mJ/m(2), which was consistent with experimental observations of crystal face size. It was demonstrated that the morphology of the large faceted crystals approached the equilibrium growth shape of pentacene. From contact angle measurements, the critical surface tension of textured pentacene thin films in air was determined to be 34 mJ/m(2).     

Microscopic description of elementary growth processes and classification of structural defects in pentacene thin films

Elementary growth processes such as kink initiation, adding a molecule to a kink, and adding a molecule between two neighboring kinks and between two grains are theoretically studied in pentacene films by adding one molecule at a time to a predefined aggregate. For each molecule, the potential energy surface is calculated using the MM3 molecular mechanics force field, which allowed one to identify useful parameters like the energy barrier for diffusion and the energy to create kinks, as well as defect configurations. Depending on the properties of the potential energy surface and the resulting growth-condition-dependent probabilities of initiating defect configurations in the film, three types of pentacene defects are identified: a thermally activated defect, an intrinsic defect, and a kinetic defect. Upon film growth, most defects relax into the ideal crystal configuration. Bulk defects that resist relaxation have densities lower than 10(16) defects/cm3 at typical growth conditions. Grain boundary defects, on the other hand, are very stable. Moreover, interstitial molecules at grain boundaries are identified as a source of compressive stress.     

Epitaxial growth of pentacene films on Cu110

The molecular structure of thin pentacene (C(22)H(14)) films grown on a Cu(110) surface has been studied by means of He atom scattering, low energy electron diffraction, thermal desorption spectroscopy, x-ray photoelectron spectroscopy, and x-ray absorption spectroscopy. Depending on the actual film thickness three different crystalline phases have been identified which reveal a characteristic reorientation of the molecular plane relative to the substrate surface. In the monolayer regime the molecules form a highly ordered commensurate (6.5x2) structure with a planar adsorption geometry. For thin multilayers (thickness <2 nm) a second phase is observed which is characterized by a lateral ((-0.65 5.69) ( 1.90 1.37)) structure and a tilting of the molecular plane of about 28 degrees around their long axis which remains parallel to the surface. Finally, when exceeding a thickness of about 2 nm subsequent growth proceeds with an upright molecular orientation and leads to the formation of crystalline films which are epitaxially oriented with respect to the substrate. The present study thus demonstrates that also on metal substrates highly ordered pentacene films with an upright orientation of the molecular planes can be grown. Photoelectron spectroscopy data indicate further that thick films do not grow in a layer-by-layer mode but reveal a significant degree of roughness.     

Nanostructural modifications of V2O5 thin films during Li intercalation studied in situ by AFM

EC-AFM was used to study in situ the surface nanostructure of V₂O₅ thin films grown on vanadium metal and its changes during lithium electrochemical intercalation corresponding to the reversible α-to-δ phase transition. The results evidence the lateral extension and contraction of the oxide nanograins and the flattening of the oxide film surface. The increase and decrease of the lateral dimensions of the grains show that the surface reflects the volume expansion and contraction resulting from the dimensional changes of the oxide structure when lithium is inserted and de-inserted. An increase of ∼10% and ∼15% with respect to pristine oxide film was observed after the formation of the ε and δ phases, respectively. The lateral extension of the grains (∼7%) and surface flattening subsist after de-intercalation showing the non-fully reversible change of the oxide nanostructure at the interface with the electrolyte. Repeated cycling causes aging characterized by the amplification of the lateral extension of the grains (∼17%) and flattening of the oxide surface with respect to the pristine oxide film. It also modifies the surface of the oxide grains by creating new planes indicative of surface reconstruction and/or the emergence of slip planes.     

An atomic force microscope (AFM) and tapping mode AFM study of the solvent-induced crystallization of polycarbonate thin films

Thin films of bisphenol-A polycarbonate (PC) were progressively crystallized in a controllable manner under the action of an appropriate plasticizing agent. No conducting layer was applied to the polymer surface, so that imaging with the atomic force microscope (AFM) left the sample exposed for additional plasticizer treatment. The PC sample was observed many times throughout the crystallization process using the AFM in both the contact and tapping modes. Data regarding the growth process for spherulites in addition to high-resolution morphology studies were achieved. © 1996 John Wiley & Sons, Inc.     

XPS studies of thin polycyanurate films on silicon wafers

Thin films of a diandicyanato bisphenol A (DCBA) prepolymer on silicon substrates have been investigated. Angle dependent X-ray photoelectron spectroscopy reveals some thickness-dependent features, which lead to an adsorption model for the DCBA prepolymer molecules. The adsorption of the first layer is governed by the interaction of the triazine rings with the substrate surface.