Ellipsometry and x-ray reflectometry characterization of self-assembly process of polystyrenesulfonate and polyallylamine

Self-assembly of polyelectrolytes-polystyrenesulfonate (PSS) and polyallylamine (PAH) with added salts of MnCl and NaBr was studied by x-ray reflectometry and ellipsometry technique. The thickness of PSS-PAH bilayer was measured to be 5.1±0.2 nm according to reflectometry and 6.1±0.7 nm according to ellipsometry. The discrepancy in data is attributed to the difference in the interaction of the interfaces with x-rays and visible light. The films are found to be rather homogeneous and the deposition process regular. The refraction indices of the deposited films were found to ben ₀=1.50±0.05,k ₀=0.07±0.05,n _e=1.53±0.05k _e=0, optical axis being perpendicular to the surface. The values of refractivity characterize the whole film (up to seven bilayers) and do not vary with increasing thickness.     

Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nm

We report on a comparative measurement of SiO₂/Si dielectric film thickness (t < 10 nm) using grazing‐incidence x‐ray photoelectron spectroscopy, neutron reflectometry and spectroscopic ellipsometry. Samples with nominal thicknesses of 3–7 nm were characterized by XPS with grazing‐incidence x‐rays at 1.8 keV, by cold neutron reflectometry (λ = 0.475 nm) and by spectroscopic ellipsometry over 1.5 eV < E < 6.0 eV. The results show good agreement between the ellipsometry and grazing‐incidence XPS, with slightly lower values for the neutron reflectometry. The role of surface contamination in each type of measurement is discussed. Published in 2004 by John Wiley & Sons, Ltd.     

Morphological studies of spin-coated films of poly(styrene-block-methyl methacrylate) copolymers by atomic force microscopy

The surface structure of very thin (15–20 nm) spin-coated films of a symmetrical poly(styrene-b-methyl-methacrylate) block copolymer on silicon and mica is analyzed by atomic force microscopy (AFM). The films show a surface corrugation of a very regular 100 nm lateral periodicity and 6–8 nm amplitude. Film thickness is measured by AFM at induced film defects and checked by ellipsometry. XPS shows that both blocks are at the film surface. Selective degradation of the methyl methacrylate block is used for contrast enhancement and allows to assign poly(styrene) to the elevated surface regions and poly(methyl methacrylate) to the substrate/film interface.Friction interactions of the AFM tip with the film surface may be used to induce high orientational ordering of the morphological pattern perpendicular to the fast scan direction.     

Spectroscopic Ellipsometry for Characterization of Thin Films of Polymer Blends

Morphology, composition, miscibility, interdiffusion, and interactions at interfaces are important quantities of polymer blends. Many of these parameters can be probed with spectroscopic ellipsometry. Ellipsometry in the visible spectral range is very suitable for determination of thicknesses and the high frequency refractive indices of thin organic films. However the spectral contrast is low for many polymers in comparison to infrared spectroscopic ellipsometry (IRSE) where specific contributions of the molecular vibrations are probed. In the presented study the infrared optical constants of a double layer (206.6 nm in total) of poly(n-butyl methacrylate) (PnBMA) and poly(vinyl chloride) (PVC) and of the films of the single compounds have been determined with optical simulations using layer models. The multiple layer model served for simulation of the ellipsometric spectra taken after an annealing induced mixing process in a polymeric double layer. The ellipsometric spectra of a not completely mixed sample could be fitted in a three-layer model, in which a mixed interphase in between the two layers of the polymers is formed due to interdiffusion.     

Patterning Effect of a Sol-Gel TiO2 Overlayer on the Photocatalytic Activity of a TiO2/SnO2 Bilayer-Type Photocatalyst

TiO₂ films with a thickness of 75 ± 5 nm (anatase) were formed on SnO₂-film (580 ± 80 nm) coated soda-lime glass substrates (SnO₂/SL-glass) by a sol-gel method. Although the photocatalytic activity for CH₃CHO oxidation (_ex > 300 nm) significantly exceeded that of a standard TiO₂/quartz sample, it decayed with illumination time (t) at t > 0.75 h. Stripes of anatase TiO₂ films of 40 nm in thickness and 1 mm in width were prepared on the SnO₂/SL-glass substrate in a 1-mm pitch by photolysis of an organically modified sol-gel film. The TiO₂ patterning further increased the photocatalytic activity by a factor of 4.1 as compared to the non-patterned sample, and it was also maintained at 0 < t < 2 h. The flat band potentials of the TiO₂ and SnO₂ films are determined to be –0.34 and +0.07 V (vs. SHE), respectively, at pH = 7 by the Mott-Schottky plots. On the basis of the results, the outstanding patterning effects could be rationalized in terms of the vectorial charge separation at the interface between TiO₂ and SnO₂.     

The effect of water or salt solution on thin hydrophobic films

Hydrophobic films of polystyrene synthesized in bulk (PS) and by emulsion polymerization in the presence of the cationic surfactant cetyltrimethylammonium bromide (PS-CTAB) or the anionic surfactant sodium dodecyl sulfate (PS-SDS) were characterized by means of ellipsometry, contact angle measurements, and atomic force microscopy. Thin (approximately 65 nm) and thick (approximately 300 nm) films were spin-coated on hydrophilic silicon wafers. PS films presented scarcely tiny holes, while PS-CTAB and PS-SDS films presented holes and protuberances. The former were attributed to dewetting effects and the latter to surfactant clusters. The films were exposed to water or to a 0.1 mol/L NaCl solution for 24 h. Ex situ measurements evidenced strong topographic alterations after the exposure to the fluid. A model based on the diffusion of water (or electrolyte) molecules to the polymer/silcon dioxide interface through holes or defects on the film edges was proposed to explain the appearance of wrinkles and protuberances. In situ ellipsometric measurements were performed and compared with simulations, which considered either a water layer between a polymer and a silcon dioxide layer or an air layer between a polymer and water (medium). In the case of thin PS films, the ellipsometric angles evidenced a very thin (0.5-1.0 nm) air layer between water and the PS films. Upon increasing the PS film thickness, no air layer could be observed by ellipsometry. Regardless of the thickness, the ellipsometric data obtained for PS-CTAB and PS-SDS films did not indicate the presence of an air layer between them and the aqueous media. The dramatic changes in the topography of PS, PS-CTAB, and PS-SDS after immersion in salt solution were explained with proposed models. From a practical point of view, this study is particularly relevant because many hydrophobic polymers are used as substrates for biomedical purposes, where the physiological ionic strength is 0.15 mol/L NaCl.     

Impact of chain architecture (branching) on the thermal and mechanical behavior of polystyrene thin films

The modulus and glass transition temperature (T_g) of ultrathin films of polystyrene (PS) with different branching architectures are examined via surface wrinkling and the discontinuity in the thermal expansion as determined from spectroscopic ellipsometry, respectively. Branching of the PS is systematically varied using multifunctional monomers to create comb, centipede, and star architectures with similar molecular masses. The bulk‐like (thick film) T_g for these polymers is 103 ± 2 °C and independent of branching and all films thinner than 40 nm exhibit reductions in T_g. There are subtle differences between the architectures with reductions in T_g for linear (25 °C), centipede (40 °C), comb (9 °C), and 4 armed star (9 °C) PS for ≈ 5 nm films. Interestingly, the room temperature modulus of the thick films is dependent upon the chain architecture with the star and comb polymers being the most compliant (≈2 GPa) whereas the centipede PS is most rigid (≈4 GPa). The comb PS exhibits no thickness dependence in moduli, whereas all other PS architectures examined show a decrease in modulus as the film thickness is decreased below ～40 nm. We hypothesize that the chain conformation leads to the apparent susceptibility of the polymer to reductions in moduli in thin films. These results provide insight into potential origins for thickness dependent properties of polymer thin films. © 2011 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys, 2012     

Glass transition of polymer/single-walled carbon nanotube composite films

The glass-transition temperatures (T_g's) of nanocomposites of polystyrene (PS) and single-walled carbon nanotubes were measured in the bulk and in thin films with differential scanning calorimetry and spectroscopic ellipsometry, respectively. The bulk T_g of the nanocomposites increased by approximately 3 °C and became much broader than that of PS. For the nanocomposite films thinner than 45 nm, T_g decreased with decreasing film thickness [i.e., ΔT_g(nano) < 0]. This phenomenon also occurred in thin PS films, the magnitude of the depression in PS [ΔT_g(PS)] being somewhat larger. The film thickness dependence and the differences in the magnitude of ΔT_g in the two systems were examined in light of current theory, and a quantitative comparison was made. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 3339–3345, 2003     

Stimuli-responsive mixed grafted polymer films with gradually changing properties: direct determination of chemical composition

Infrared spectroscopic ellipsometry (IRSE) and visible monochromatic ellipsometry (VISE) approaches were applied to investigate the chemical structure and thickness of ultrathin polymer films. Mixed polystyrene-poly(2-vinylpyridine) and polystyrene-poly(tert-butyl acrylate) polymer grafted films (mixed brushes) with gradually changing composition (1D gradient mixed brush) along the sample were prepared on a temperature gradient stage via two subsequent "grafting to" reactions. The films were characterized by high-precision mapping VISE at a single wavelength (632.8 nm) and IRSE. The set of 1D IRSE spectra of the polymer brush films obtained by mapping the 1D gradient brush were used to estimate the thickness and the local composition of the film and to construct the 1D map of the film in terms of the chemical composition of the brush. The results were compared with the data obtained using monochromatic ellipsometry where the brush composition was estimated from the results of two subsequent measurements followed each grafting step. The measurements of the brush thickness and composition with both methods were found to be in gratifying agreement. The results demonstrate the high potential of IRSE methods for the one-step characterization (by thickness and chemical composition) of ultrathin polymer films of complex composition.     

Comparison of protein surface attachment on untreated and plasma immersion ion implantation treated polystyrene: protein islands and carpet

Surface attachment of the enzyme horseradish peroxidase (HRP) was studied on untreated and ion beam implanted polystyrene (PS) films. The PS films of 100 nm thickness on a silicon wafer were treated using the plasma immersion ion implantation (PIII) technique, with argon ions of energy 20 keV and fluences of up to 2 x 10(16) ions/cm2. Differential transmittance Fourier transform infrared (FTIR) spectra confirmed the presence of proteins on the PS surfaces by detection of the amide A, I, and II protein vibrations. Spectroscopic ellipsometry over the UV-vis spectral region provided the optical constants and thickness of the protein layer, while tapping mode atomic force microscopy (AFM) was used to image the protein distribution on the surface. The combination of AFM, ellipsometry, and FTIR analysis showed that, on the untreated PS surface, HRP formed islands 8 nm in height and 30 nm in lateral size, covering approximately 27% of the PS surface. After PIII modification of the PS surface, the protein covered 100% of the surface area.     

Direct spincasting of polystyrene thin films onto poly(methyl methacrylate)

The low vapor pressure solvent 1‐chloropentane was used to directly spincast polystyrene (PS) films onto poly(methyl methacrylate) (PMMA) with smooth surfaces and sharp interfaces. Interface roughness after removal of the PS layer with cyclohexane was determined with scanning force microscopy to be <1 nm. Dynamic secondary mass spectroscopy revealed an interfacial width below the resolution limit of ～10 nm. Large area bilayers with smooth surfaces could be created. In addition, direct spincasting with 1‐chloropentane allows the production of thin PS films (<15 nm) and films of low molecular weight (<5 kDa) PS, all of which would be impossible to produce for this important model system by the traditional water‐transfer method. 1‐chloropentane was confirmed to be a sufficiently selective solvent for PS by measuring the Flory–Huggins χ parameters of 1‐chloropentane with PS and PMMA, respectively, with inverse gas chromatography. In the search for a suitable selective solvent, the authors have also examined the role of vapor pressure in spin casting smooth films over a wider molecular weight (4.3–190 kDa) and thickness range (～5–500 nm) than previously reported. Only solvents with low vapor pressure produced high quality PS films. Methylcyclohexene can also be used to produce excellent, directly cast PS/PMMA bilayers, but with a smaller molecular weight and thickness window compared with 1‐chloropentane. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 3234–3244, 2006     

Polystyrene with different topologies: Study of the glass transition temperature in confined geometry of thin films

The glass transition behaviour of polystyrene (PS) with systematically varied topologies (linear, star-like and hyperbranched) confined in nanoscalic films was studied by means of spectroscopic vis-ellipsometry. All applied PS samples showed no or only a marginal depression in glass transition temperature T_g in the order hyperbranched PS (5 K) > star-like PS (3 K) > linear PS (0 K) for the thinnest films analyzed. The T_g behaviour was accompanied by the observation of the film density in dependence of film thickness. A maximum decreased density of about 7% for hyperbranched PS and 5% for star-like PS and again no deviation in density of bulk was found for linear PS. Accordingly, we deduce from these results considering an experimental accuracy of about ± 2 K for T_g and up to ±3% for film density, that the polymer topology only barely influences T_g in the confinement of thin films.     

Spectroellipsometric Characterization of Multilayer Sol-Gel Fe2O3 Films

Multilayer Fe₂O₃ films were deposited by the sol-gel method on glass substrates using three successive deposition procedures. The films were thermally treated for 1 h at 300°C.The optical and microstructural properties of these films were investigated by spectroscopic ellipsometry (SE) in the 500–1000 nm range. The optical gap was found by fitting the dispersion of the film refractive index (n) with the Wemple-DiDomenico (WDD) formula.The ellipsometric measurements showed also that the Fe₂O₃ films are anisotropic. The birefringence values (n) of the sol-gel films (0.05–0.08) are smaller than the large values of the Fe₂O₃ (which are around 0.28) but increase with the crystalization of the films. AFM mesurements showed that the films treated at 300°C start to crystallize.     

Sub‐glass‐transition temperature interface formation between an immiscible glass rubber pair

We used neutron reflectivity to measure the interfacial width in the immiscible system polystyrene/poly(n‐butyl methacrylate) (PS/PnBMA). Measurements were made on the same samples at temperatures ranging from below the glass‐transition temperature (T_g) of PS to slightly above. We observed significant broadening of the interface at temperatures below the T_g of PS, indicating chain mobility below the bulk T_g value. The interfacial width exhibited a plateau at a value of 20 Å in the temperature range of 365 K < T < 377 K. A control experiment involving hydrogenated and deuterated PS films (hPS/dPS) showed no such broadening over the same temperature region. The results are consistent with a reduction of the T_g of PS in the interfacial region of ～20 K. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 2664–2670, 2001     

Structures of P(S‐block‐BMA) diblock copolymers in thin films

Symmetrical diblock copolymers (P(S(D)‐b‐nBMA)) of deuterated poly(styrene) (PS(D)) and poly(nbutylmethacrylate) (PnBMA) were investigated by neutron reflectometry with respect to periodicity and interfacial width. Four different molecular weight P(S(D)‐b‐nBMA) samples were used to prepare thin films by spin coating on glass substrates. Two of the samples were in the intermediate segregated state. The other two samples were in the bulk disordered state, however, due to thin film geometry a surface and substrate induced ordering could be revealed. Utilizing the respective theories (Matsen and Bates for intermediate segregated samples and Fredrickson for a surface and substrate induced ordering), the product of interaction parameter χ and chain length N was calculated. Taking account for the different molecular weights, an interaction parameter was obtained which is the same for all of the four samples, within the experimental error. Using the strong segregation theory from Semenov to calculate χ for the intermediate segregated samples, the interaction parameters for the four samples are not consistent.     

Surface characterization of 3-glycidoxypropyltrimethoxysilane films on silicon-based substrates

Silane coupling agents are commonly used to activate surfaces for subsequent immobilization of biomolecules. The homogeneity and surface morphology of silane films is important for controlling the structural order of immobilized single-stranded DNA probes based on oligonucleotides. The surfaces of silicon wafers and glass slides with covalently attached 3-glycidoxypropyltrimethoxysilane (GOPS) have been characterized by using angularly dependent X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF–SIMS), atomic force microscopy (AFM), scanning electron microscopy (SEM), and monochromatic and spectroscopic ellipsometry. XPS and ToF–SIMS data provided evidence of complete surface coverage by GOPS. Data from angularly resolved XPS and ellipsometry methods suggested that the GOPS films were of monolayer thickness. AFM and SEM data indicated the presence of films that consisted of nodules approximately 50–100 nm in diameter. Modeling suggested that the nodules may lead to a nanoscale structural morphology that might influence the hybridization kinetics and thermodynamics of immobilized oligonucleotides.     

Photoinitiated polymerization of styrene from self‐assembled monolayers on gold. II. Grafting rates and extraction

Ultrathin films of polystyrene (PS) were grown from self‐assembled monolayers by the “grafting‐from” technique. The initiating system consisted of a dithiol azobisisobutyronitrile‐type free‐radical initiator that was activated by irradiation at 300 nm. The thickness of the PS films ranged from 7 to 190 nm and could be controlled by varying the reaction time or the monomer concentration. The films were characterized by ellipsometry and Fourier transform‐reflection absorption infrared spectroscopy after Soxhlet extraction of residual physisorbed polymer. These films were unstable above 60 °C, and a water‐jacketed Soxhlet extractor was designed to maintain solvent temperatures below 45 °C during extraction. © 2002 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 40: 3284–3291, 2002     

Quantitative chemical composition of thin films with infrared spectroscopic ellipsometry: application to hydrated oxide films on aluminium

A method to quantify the composition of thin films using infrared spectroscopic ellipsometry (IRSE), supplemented by visible spectroscopic ellipsometry (VISSE), is proposed. Because ellipsometry measures the thickness and optical constants of a surface layer simultaneously, the absorption coefficient of the film as a function of wavelength can be obtained. Using values of the absorption coefficients for the pure components of the film, the percentages (mol.% or wt.%) of each component in the film can be calculated. The method is demonstrated in a study of the hydration of oxide films on electropolished aluminium and the anodically formed barrier oxide film. The IRSE technique shows that hydration of the films by immersion in boiling water results in the conversion of aluminium oxide to pseudoboehmite. Copyright © 2003 John Wiley & Sons, Ltd.     

基底界面效应对聚苯乙烯薄膜分子运动行为的影响

本文研究了Si／Si02、Si／Si—H基底与聚苯乙烯（Ps）之间的界面相互作用对Ps薄膜的玻璃化转变及相关力学性能的影响．结果显示,无论何种基底,Ps薄膜的玻璃化转变温度（L）都随其厚度降低而降低．但相同厚度（〈110nm）下,以Si／Si-H为基底时Ps薄膜的瓦比以Si／Si02为基底的PS薄膜高．Si／Si02表面Ps薄膜疋开始下降的临界厚度为110nm,远高于以Si／Si—H为基底时的40nm．对Ps薄膜的膨胀系数和弹性模量进行研究,也得到相似的临界厚度．另外,与Si／Si02基底相比,在Si／Si-H上的Ps薄膜具有更低的膨胀系数以及较高弹性模量．可能原因是Si／Si-H与Ps具有较强的相互作用,限制了该界面分子的运动能力,导致基底／PS界面效应对薄膜分子运动的影响力增强,造成该薄膜瓦的厚度依赖性下降,并呈现出相对较硬的力学特征．     

Optical Nanocomposite Planar Waveguides Doped with Rare-Earth and Noble Metal Elements

The present paper is focused on multilayer Er³⁺-doped silica-titania planar waveguides, co-doped with silver, which were prepared by spin-coating on silica glass, or buffered single crystal silicon substrates. The single layer thickness (0.4 m) and refractive index (1.60–1.63) were measured by spectroscopic ellipsometry at 715 nm. The thickness of the waveguides (measured by mechanical profilometry) was 1 m and their optical propagation losses were measured at different laser wavelengths (488 nm, 514 nm and 633 nm), exhibiting an approximately Rayleigh-like behavior. The thermal precipitation of silver nanocrystallites was achieved, both in air and under a controlled atmosphere (dry nitrogen) and these were characterized by visible absorption spectroscopy, which clearly showed the development of a plasmon absorption band near 415 nm, by X-ray diffraction (XRD) and Transmission Electron Microscopy (TEM). The Er³⁺ metastable level lifetimes for the emission at ca. 1.54 m were found to be ca. 4–6 ms, for Er³⁺ concentrations varying between 0.2–2.0 mol% (or (0.4–4.4) × 10²⁰ ions/cm³), but no significant variation was observed with the Ag concentration added (up to 2.5 mol%).