共查询到19条相似文献,搜索用时 109 毫秒
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为了给金刚石膜与硬质合金基体之间中间层的选用和设计提供有益的参考,采用三维热.力耦合有限元方法,研究了中间层对界面处热残余应力的影响.分别对有与没有中间层、以及不同的中间层材料和不同的中间层厚度(0.2~2μm)条件下界面处的热残余应力进行了模拟计算和比较.模拟结果表明,当选取热膨胀系数较小、弹性模量较低、厚度在1μm左右的中间层时,可使热残余应力的减小幅度增大,有利于金刚石膜在界面处的结合. 相似文献
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《人工晶体学报》2010,(Z1)
X射线sin2φ法是薄膜残余应力分析中比较理想的测量手段,但择优取向的存在导致薄膜各向异性,从而会影响测试曲线2~sin2φ的线性关系,表现为曲线的震荡现象。本文利用化学气相沉积(CVD)技术制备(110)择优取向金刚石膜样品,采用X射线sin2φ法对样品残余应力进行测试,通过合理选择衍射晶面和φ角避免择优取向对测量结果的影响,使测试曲线保持良好的线性。然后基于双金属和薄片弯曲理论模型对膜内热应力进行计算,进而得出样品内本征应力状态和大小。结果表明:金刚石薄膜内热应力总为压应力,择优取向使得晶粒排布的有序程度大大提高,本征应力主要来源于杂质的压应力,二者综合作用使得总残余应力表现为受压;随薄膜厚度增加,总应力绝对值变大,其中热压应力绝对值变小甚微,本征压应力绝对值增加显著。 相似文献
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金刚石涂层的纳米压痕力学性能研究 总被引:3,自引:1,他引:2
用HFCVD法在硬质合金刀具上制备了CVD金刚石涂层,利用纳米压痕仪研究了CVD金刚石涂层的硬度和弹性模量等力学性能.结果表明,反应室气压、衬底温度、反应气体中CH4含量、沉积时间等参数改变了CVD金刚石膜中sp2成分含量、晶界数量及晶界上缺陷,从而影响CVD金刚石涂层的纳米硬度和弹性模量.较高或较低的衬底温度都会导致硬质合金刀具上CVD金刚石涂层的纳米硬度、弹性模量降低;随着反应室气压、反应气体中CH4含量的增加,硬质合金刀具上CVD金刚石涂层的纳米硬度、弹性模量降低;沉积时间低于6 h时,沉积时间对硬质合金刀具上CVD金刚石涂层的纳米硬度、弹性模量影响显著,沉积时间超过6 h后,沉积时间对硬质合金刀具上CVD金刚石涂层的纳米硬度、弹性模量逐渐趋向稳定. 相似文献
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金刚石织构体及其纳米级亚晶 总被引:1,自引:0,他引:1
在冲击合成的金刚石中存在一种织构体组织.织构是由沿[110]cd和[12-10]hd方向排列的金刚石纳米级亚晶组成的.除常见的立方金刚石结构外,还存在一种罕见的六方金刚石结构.它们通常共存在一个金刚石织构体中,形成共生晶体. 相似文献
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运用有限元程序ABAQUS/Standard,建立了纳米压痕的有限元模型,并对一般薄膜/基底体系进行了数值模拟.结果表明:在压入相同深度时,薄膜的厚度越大,卸载后的残余深度越浅.薄膜的厚度越大,基底对薄膜的影响越小.对于同一厚度薄膜在不同最大压痕深度时,残余深度和基底的内应力会随着最大压痕深度的增加而增大.最后,采用前面论述的薄膜/基底体系,利用有限元方法模拟不同弹性模量对纳米压痕的影响,并将模拟结果和实验结果进行了对比. 相似文献
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直流电弧等离子体喷射化学气相沉积高质量金刚石膜残余应力分布的垃曼谱分析 总被引:3,自引:1,他引:2
不同工艺条件下在钼衬底(φ60mm)上用100 kW直流电弧等离子体喷射化学气相沉积设备进行金刚石膜的制备.金刚石膜用扫描电镜(SEM)、拉曼谱(激光激发波长为488nm)和X射线衍射来表征.研究结果表明,在直流电弧等离子体喷射化学气相沉积金刚石膜的过程中,内应力大小从金刚石膜的中央到边缘是增加的,并且应力形式是压应力.这说明了在金刚石膜中存在明显的应力不均.甲烷浓度和衬底温度都影响金刚石膜中的内应力.随着甲烷浓度和衬底温度的提高,金刚石膜中的内应力呈增加的趋势. 相似文献
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I. A. Prokhorov V. G. Ralchenko A. P. Bolshakov A. V. Polskiy A. V. Vlasov I. A. Subbotin K. M. Podurets E. M. Pashaev E. A. Sozontov 《Crystallography Reports》2013,58(7):1010-1016
Structural features of diamond single crystals synthesized under high pressure and homoepitaxial films grown by chemical vapor deposition (CVD) have been analyzed by double-crystal X-ray diffractometry and topography. The conditions of a diffraction analysis of diamond crystals using Ge monochromators have been optimized. The main structural defects (dislocations, stacking faults, growth striations, second-phase inclusions, etc.) formed during crystal growth have been revealed. The nitrogen concentration in high-pressure/high-temperature (HPHT) diamond substrates is estimated based on X-ray diffraction data. The formation of dislocation bundles at the film-substrate interface in the epitaxial structures has been revealed by plane-wave topography; these dislocations are likely due to the relaxation of elastic macroscopic stresses caused by the lattice mismatch between the substrate and film. The critical thicknesses of plastic relaxation onset in CVD diamond films are calculated. The experimental techniques for studying the real diamond structure in optimizing crystal-growth technology are proven to be highly efficient. 相似文献
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K. Fabisiak M. Szreiber C. Uniszkiewicz T. Runka D. Kasprowicz 《Crystal Research and Technology》2010,45(2):167-172
Thin polycrystalline diamond films were synthesized on silicon substrate by Hot Filament Chemical Vapor Deposition (HF CVD) technique from a mixture of hydrogen and different content of methyl alcohol. A comparative study on the Electron Paramagnetic Resonance (EPR), Raman spectroscopy and Scanning Electron Microscopy (SEM) were performed. It was shown that EPR signal, Raman spectra and morphology, studied by SEM, strongly depend on the ratio of CH3OH/H2 in the HF CVD reactor. The peak‐to‐peak line‐width in EPR signal varies from 0.09 to 0.8 mT depending on diamond quality. The Raman spectra of our diamond film showed, except well defined diamond Raman lines positioned at 1332 cm‐1 with different Full Width at Half Maximum (FWHM), a broad band having maximum at around 1530 cm‐1 which is characteristic for amorphous carbon phase. The obtained results show that EPR, SEM and Raman spectroscopy yield complementary results about the defects present in CVD diamond films. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) 相似文献
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直流等离子体法中脱膜开裂的金刚石膜组织结构分析 总被引:2,自引:0,他引:2
为了解决用直流等离子体喷射法制备金刚石膜在脱膜过程中膜体开裂的问题,本文对3组脱膜开裂的金刚石膜组织结构进行了分析,发现由热应力作用产生的裂纹形貌随沉积温度的不同而呈现网状、河流状和环状,裂纹尖端的膜体具有最小的Raman 谱峰半高宽值.在所研究的温度范围内,膜体断口都是穿晶断裂和沿晶断裂的混合断口,而且断口面中的占优晶面都是{111}晶面.X射线和Raman谱结果还表明沉积温度愈高,膜体中的残余应力愈大. 相似文献
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采用DC Arc Plasma Jet CVD方法沉积微/纳米复合自支撑金刚石膜 总被引:1,自引:0,他引:1
在30kW级直流电弧等离子体喷射化学气相沉积(DC Arc P lasm a Jet CVD)设备上,采用Ar-H2-CH4混合气体,通过调节甲烷浓度以及控制其他沉积参数,在Mo衬底上沉积出微/纳米复合自支撑金刚石膜。实验表明,当微米金刚石膜层沉积结束后,在随后的沉积中,随着甲烷浓度的增加,金刚石膜表面的晶粒大小是逐渐减小的。当甲烷浓度达到20%以上时,金刚石膜生长面晶粒呈现菜花状的小晶团,膜体侧面已经没有了粗大的柱状晶,而是呈现出光滑的断口,对该层进行拉曼谱分析显示,位于1145 cm-1附近有一定强度的散射峰出现。这说明所沉积的晶粒全部变为纳米级尺寸。 相似文献
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氩气对直流弧光放电PCVD金刚石薄膜晶体特征的影响 总被引:1,自引:0,他引:1
本文采用自主研制的直流弧光放电等离子体CVD设备,在YG6硬质合金基体上进行了不同氩气流量下金刚石薄膜的制备研究.采用SEM对金刚石薄膜的晶体特征进行了观察.结果表明,氩气对直流弧光放电等离子体CVD金刚石薄膜的晶体特征有明显影响.在CH_4/H_2恒定时(0.8;),硬质合金基体上制备的金刚石薄膜表面形貌随Ar流量增加而变化的规律,即从以(111)八面体晶面为主→(111)和(100)立方八面体混杂晶面→以(100)立方体晶面为主→菜花状的顺序转变;当Ar流量为420~700 mL/min时,金刚石晶粒的平均尺寸由1.5 μm 逐步增大到7 μm;Ar流量为700~910 mL/min时,金刚石晶粒的平均尺寸由7 μm急剧减小到纳米尺度,约50 nm. 相似文献
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X-ray diffraction studies of diamond films obtained by chemical transport reactions at the concentrations of 2% methane and 98% hydrogen under pressures of 10.7 and 21.3 kPa showed that they are textured. The character of the texture depends on the substrate temperature. The films have {110}, {311}, or double {110} + {311} textures. It is established that the dependence of the growth rate of diamond films on the substrate temperature has maxima. The diamond films are finely dispersed and are characterized by pronounced micro-deformations and high dislocation densities. The temperature dependence of the growth rate correlates with the parameters of the real structure of the films. 相似文献