Moving beyond molecules: patterning solid-state features via dip-pen nanolithography with sol-based inks

Herein, we described a new dip-pen nanolithography (DPN)-based method for the direct patterning of organic/inorganic composite nanostructures on silicon and oxidized silicon substrates. The approach works by the hydrolysis of metal precursors in the meniscus between an AFM tip and a surface according to the reaction 2MCln + nH2O --> M2On + 2nHCl; M = Al, Si, and Sn. The inks are hybrid composites of inorganic salts with amphiphilic block copolymer surfactants. Three proof-of-concept systems involving Al2O3, SiO2, and SnO2 nanostructures on silicon and silicon oxide surfaces have been studied. Arrays of dots and lines can be written easily with control over feature size and shape on the sub-200 nm level. The structures have been characterized by atomic force microscopy, scanning electron microscopy, transmission electron microscopy, and energy-dispersive X-ray analysis. This work is important because it opens up the opportunity for using DPN to deposit solid-state materials rather than simple organic molecules onto surfaces with the resolution of an AFM without the need for a driving force other than chemisorption (e.g., applied fields).     

Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy

With the aim of investigating the effect of the surface properties on the friction behavior of self-assembled monolayers, we have modified tipless atomic force microscopy (AFM) cantilevers with a poly(dimethylsiloxane) (PDMS) lens. The friction coefficient using the silicon tip is strongly influenced by the mechanical properties of the substrate monolayer because hard, sharp silicon tips penetrate the surface of organic monolayers. However, the friction coefficient obtained for the PDMS-modified AFM cantilever is mostly due to the surface properties of the monolayer functional end group, rather than the viscoelastic deformation of the monolayer. The use of the PDMS tip was demonstrated as a novel means to investigate the effect of surface properties on the frictional behavior of self-assembled monolayers with various functional groups with less mechanical deformation.     

Pressure-induced restructuring of a monolayer film nanojunction produces threshold and power law conduction

The electrical conduction of metal-molecule-metal junctions formed between Au-supported self-assembled monolayers of structurally different 1-hexanethiol, 1-decanethiol, and ferrocenyl-1-undecanethiol and a Pt-coated atomic force microscope (AFM) tip has been measured under different compression forces using conducting-probe AFM. The observed junction resistance had two distinct power law scaling changes with the compression force. Different scaling regions were assigned to the change in the contact area, tunneling distance, number of conduction pathways, and structure of the film under compression.     

Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: an atomic force microscopy investigation

We report, for the first time, the native oxide decomposition/etching and direct local oxide growth on 6H-SiC (0001) surface induced by atomic force microscopy (AFM). Surface native oxide was decomposed and assembled into protruded lines when the negatively biased AFM tip was scanned over surface areas. The mechanism of decomposition was found to be governed by the Fowler-Nordheim emission current enhanced by the negatively biased AFM tip. Direct oxide growth on the SiC surface was achieved when the AFM tip was immobilized and longer bias duration applied. In particular, the aspect ratio of oxide grown on SiC was found to be several times higher than that on the Si surface. The improved aspect ratio on SiC was attributed to the anisotropic OH(-) diffusion involved in vertical and lateral oxidation along the polar and nonpolar directions such as [0001] and [110] axis in SiC crystal. The electron transport in the above AFM grown oxide on SiC was further investigated by I-V characteristics. The dielectrical strength of AFM oxide against degradation and breakdown under electrical stressing was evaluated.     

Alternative method for fabricating chemically functionalized AFM tips: silane modification of HF-treated Si3N4 probes

An alternative method for fabricating functionalized, atomic force microscopy (AFM) tips is presented. This technique is simple and requires only minimal preparation and tip modification to generate chemically sensitive probes that have a robust organic monolayer of flexible terminal chemistry attached to the surface. Specifically, commercially microfabricated Si3N4 AFM tips were modified with self-assembled monolayers (SAMs) of octadecyltrichlorosilane and (11-bromoundecyl)trichlorosilane after removing the native silicon oxide surface layer with concentrated hydrofluoric acid. The structure of these SAM films on solid silicon nitride surfaces was studied using contact angle goniometry and Fourier transform infrared spectroscopy. Pull-off force measurements on various bare (mica, graphite, and silicon) and SAM-functionalized substrates confirm that mechanically robust, long-chain organic silane SAMs can be formed on HF-treated Si3N4 tips without the presence of an intervening oxide layer. Adhesion experiments show that the integrity of the organic film on the chemically modified tips is maintained over repeated measurements and that the functionalized tips can be used for chemical sensing experiments since strong discrimination between different surface chemistries is possible.     

Nanoscale patterning of alkyl monolayers on silicon using the atomic force microscope

Self-assembled monolayers (SAMs) of 1-alkenes on hydrogen-passivated silicon substrates were successfully patterned on the nanometer scale using an atomic force microscope (AFM) probe tip. Nanoshaving experiments on alkyl monolayers formed on H-Si(111) not only demonstrate the flexibility of this technique but also show that patterning with an AFM probe is a viable method for creating well-defined, nanoscale features in a monolayer matrix in a reproducible and controlled manner. Features of varying depths (2-15 nm) were created in the alkyl monolayers by controlling the applied load and the number of etching scans made at high applied loads. The patterning on these SAM films is compared with the patterning of alkyl siloxane monolayers on silicon and mica.     

Langmuir-Blodgett film of hydrophobin protein from Pleurotus ostreatus at the air-water interface

We present results concerning the formation of Langmuir-Blodgett (LB) films of a class I hydrophobin from Pleurotus ostreatus at the air-water interface, and their structure as Langmuir-Blodgett (LB) films when deposited on silicon substrates. LB films of the hydrophobin were investigated by atomic force microscopy (AFM). We observed that the compressed film at the air-water interface exhibits a molecular depletion even at low surface pressure. In order to estimate the surface molecular concentration, we fit the experimental isotherm with Volmer's equation describing the equation of state for molecular monolayers. We found that about (1)/ 10 of the molecules contribute to the surface film formation. When transferred on silicon substrates, compact and uniform monomolecular layers about 2.5 nm thick, comparable to a typical molecular size, were observed. The monolayers coexist with protein aggregates, under the typical rodlet form with a uniform thickness of about 5.0 nm. The observed rodlets appear to be a hydrophilic bilayer and can then be responsible for the surface molecular depletion.     

XPS and AFM characterization of the self‐assembled molecular monolayers of a 3‐aminopropyltrimethoxysilane on silicon surface,and effects of substrate pretreatment by UV‐irradiation

The self‐assembled (SA) molecular monolayers of a 3‐aminopropyltrimethoxysilane (3‐APTS) on a silicon (111) surface, and the effects of ultraviolet (UV) pre‐treatment for substrates on the assembling process have been studied using XPS and atomic force microscopy (AFM). The results show that the SA 3‐APTS molecules are bonded to the substrate surface in a nearly vertical orientation, with a thickness of the monolayer of about 0.8–1.5 nm. The SA molecular monolayers show a substantial degree of disorder in molecular packing, which are believed to result from the interactions of amine tails in the silane molecules used with surface functionalities of the substrates, and the oxygen‐containing species from the ambient. UV irradiation for silicon substrates prior to the self‐assembly reaction can enhance the assembly process and hence, significantly increase the coverage of the monolayer assembled for the substrates. Copyright © 2010 John Wiley & Sons, Ltd.     

Nanografting of alkanethiols by tapping mode atomic force microscopy

Nanografting, an atomic force microscopy (AFM) based nanolithography technique, is becoming a popular method for patterning self-assembled monolayers (SAMs). In this technique, a nanoscale patch of a thiol-on-gold SAM is exchanged with a different thiol by the action of an AFM tip operated in contact mode at high load. The results are then imaged in topographic or lateral force microscopy again at low values of the load. One of the problems of contact mode nanografting is that monolayers of large molecules such as proteins are likely to be deformed, damaged, or even removed from the surface by contact mode imaging even when small loads are used. Furthermore, we need to note that the stiffness of the cantilevers used in contact mode is different than that of the cantilevers used in tapping mode and that tip changing in the course of an experiment can be quite inconvenient. Here, we show that a monolayer on a gold substrate can be nanografted using tapping mode AFM (also referred to as amplitude modulation AFM) rather than the commonly used contact mode. While the grafting parameters are somewhat trickier to choose, the results demonstrate that nanografting in tapping mode can make patches of the same quality as those made by contact mode, therefore allowing for gentle imaging of the grafted molecules and the whole SAM without changing the microscope tip.     

"Click-functional" block copolymers provide precise surface functionality via spin coating

There are few existing methods for the quantitative functionalization of surfaces, especially for polymeric substrates. We demonstrate that alkyne end-functional diblock copolymers can be used to provide precise areal densities of reactive functionality on both hard (e.g., glass and silicon oxide) and soft (i.e., polymeric) substrates. Alkyne functionality is extremely versatile because the resultant functional surfaces are reactive toward azide functional molecules by Sharpless click chemistry. Spin-coated films of alpha-alkyne-omega-Br-poly( tert-butylacrylate- b-methylmethacrylate) (poly( tBA-MMA)) spontaneously self-assemble on the aforementioned substrates to present a surface monolayer of PtBA with a thickness in the range of 1 to 9 nm. The PMMA block physisorbs to provide multivalent anchoring onto hard substrates and is fixed onto polymer surfaces by interpenetration with the substrate polymer. The areal density of alkyne functional groups is precisely controlled by adjusting the thickness of the block copolymer monolayer, which is accomplished by changing either the spin coating conditions (i.e., rotational speed and solution concentration) or the copolymer molecular weight. The reactivity of surface-bound alkynes, in 1,3-dipolar cycloaddition reactions or by so-called "click chemistry", is demonstrated by covalent surface immobilization of fluorescently labeled azides. The modificed surfaces are characterized by atomic force microscopy (AFM), contact angle, ellipsometry, fluorescent imaging and angle-dependent X-ray photoelectron spectroscopy (ADXPS) measurements. Microarrays of covalently bound fluorescent molecules are created to demonstrate the approach and their performance is evaluated by determining their fluorescence signal-to-noise ratios.     

Physically self-assembled monolayers (PSAMs) of lecithin lipids at hydrophilic silicon oxide interfaces

A new method of making physically self-assembled monolayers (PSAMs) on hydrophilic solid surfaces is presented. This method uses a mixture of a nonpolar solvent, such as hexane, and a strong polar solvent, such as ethanol, to dissolve the lipids. The deposition of two lecithin lipids, dipalmitoylphosphatidylcholine (DPPC) and dilauroylphosphatidylcholine (DLPC), has been studied. These lipids physically self-assemble, or adsorb, onto hydrophilic silicon oxide/silicon surfaces when such surfaces are in contact with the lipid solution. The adsorbed layers were probed with ex-situ attenuated total reflection infrared (ATR-IR) spectroscopy, ellipsometry, contact angle measurements, and atomic force microscopy (AFM). The thicknesses of the adsorbed monolayers are about 2.8 +/- 0.2 nm for DPPC and 2.0 +/- 0.2 nm for DLPC, as determined by ellipsometry and AFM. Smooth, uniform monolayers of controlled surface density are formed. The surface density of adsorbed layers is comparable to those of close-packed lipid monolayers, as calculated from the ellipsometry and ATR-IR results. Producing controlled-thickness monolayers has applications in boundary lubrication, biomaterials, sensor technologies, and electronics. The method can be used for depositing many biological surfactants or lipids without the need to modify these surfactants chemically to form chemical bonds with the surfaces, as required by the usual chemical SAMs. Moreover, the new method has several advantages compared to the Langmuir-Blodgett (LB) method.     

Electrochemical immobilization of a benzylic film through the reduction of benzyl halide derivatives: deposition onto highly ordered pyrolytic graphite

The reactivity of electrogenerated benzyl radicals at carbon surfaces was examined through the cathodic reduction of the corresponding bromide derivatives. 4-Nitrobenzyl bromide and benzyl bromide were reduced in N,N-dimethylformamide (DMF) on highly ordered pyrolytic graphite (HOPG) surfaces. Electroproduced films were examined using electrochemistry, scanning electron microscopy (SEM), and atomic force microscopy (AFM). Experiments show the formation of strongly adherent deposits and the occurrence of electrografting processes. They are based on radical generation and the reaction of the radical with the substrate. As expected, the thickness of the organic film increases with deposition time but the deposit displays a lower compactness than previously reported for the electroreduction of aryl diazonium salts. Interestingly for benzyl derivatives, the reduction potential required for the electrografting could be rendered much more positive by simply using an iodide-type supporting electrolyte.     

Phase state effect on adhesion behavior of self-assembled monolayers

The effect of phase state of self-assembled monolayers (SAMs) on adhesion behavior was studied using a combination of atomic force microscopy (AFM) and Johnson-Kendall-Roberts (JKR) methods. The phase state of SAMs was controlled by adjusting the reaction temperature. Order-to-disorder structural transitions in monolayers of n-alkyltrichlorosilanes resulted in dramatic increases in adhesion force and adhesion hysteresis, which represents the first report of alterations in adhesion properties due to phase changes of monolayers without any effect of chain length and surface heterogeneity. This increase in mechanical deformation of the disordered monolayer is understood to be caused by increases in (1) molecular contact between the AFM tip and a disordered monolayer due to the more deformable state of the latter and (2) monolayer deformation during unloading by the JKR probe lens. Adhesion hysteresis was found to have greater sensitivity toward the unloading rate for disordered monolayers. The occurrence of maximum hysteresis at faster rates proves that monolayer chain mobility increases with structural disorder, resulting in increased mechanical deformation.     

Cleaning and hydrophilization of atomic force microscopy silicon probes

The silicon surface of commercial atomic force microscopy (AFM) probes loses its hydrophilicity by adsorption of airborne and package-released hydrophobic organic contaminants. Cleaning of the probes by acid piranha solution or discharge plasma removes the contaminants and renders very hydrophilic probe surfaces. Time-of-flight secondary-ion mass spectroscopy and X-ray photoelectron spectroscopy investigations showed that the native silicon oxide films on the AFM probe surfaces are completely covered by organic contaminants for the as-received AFM probes, while the cleaning methods effectively remove much of the hydrocarbons and silicon oils to reveal the underlying oxidized silicon of the probes. Cleaning procedures drastically affect the results of adhesive force measurements in water and air. Thus, cleaning of silicon surfaces of the AFM probe and sample cancelled the adhesive force in deionized water. The significant adhesive force values observed before cleaning can be attributed to formation of a bridge of hydrophobic material at the AFM tip-sample contact in water. On the other hand, cleaning of the AFM tip and sample surfaces results in a significant increase of the adhesive force in air. The presence of water soluble contaminants at the tip-sample contact lowers the capillary pressure in the water bridge formed by capillary condensation at the AFM tip-sample contact, and this consequently lowers the adhesive force.     

Imaging surfaces of nano‐scale roughness by atomic force microscopy with carbon nanotubes as tips: a comparative study

Accurate knowledge of the nanoroughness of surfaces is crucial for many applications related to optics, electronics or tribology. Although atomic force microscopy (AFM) can image surfaces with a nanometre spatial resolution, the finite size of standard tips means that pores, pits or grooves with dimensions similar to or smaller than the tip apex will not be accurately imaged. Furthermore, standard tips are made of silicon or silicon nitride and are prone to wear. Mitigation may arise from the availability of AFM tips with a carbon nanotube (CNT) at their foremost end. This study compares the imaging performance of ultrasharp Si tips, CNT AFM tips prepared by a Langmuir‐Blodgett (LB) technique, and of CNT AFM tips prepared by a chemical vapour deposition (CVD) technique. The free length of the CNT AFM tips is in the range 80–200 and 600–750 nm, respectively. A polycrystalline niobium film surface is imaged that shows nanoroughness. The measurements demonstrate that CNT AFM tips allow excellent imaging if the scan parameters are adjusted very carefully. Nevertheless, in some cases distortions are found. The measured average grain diameter is 19.9 ± 3.6 nm in the case of a CNT AFM tip made by the LB technique, and 18.0 ± 3.3 nm in the case of a CNT AFM tip made by CVD. In addition to cross‐sections of topography images, also the power spectral density (PSD) is analyzed. An empirical approach for the readout of the characteristic length is suggested that involves the first derivative of the decadic logarithm of the PSD. Copyright © 2011 John Wiley & Sons, Ltd.     

The in situ characterization and structuring of electrografted polyphenylene films on silicon surfaces. An AFM and XPS study

An atomic force microscope was used so as to structure by nanofriction films of polynitrophenylene electrografted on substrates of n-type silicon (100) with the native oxide on the top of the surface. AFM measurements of thin films thickness have been carried out in the electrolytic solution for different applied potentials during the electrografting. This investigation allows (i) to determine the relationship between the applied potential and the final thickness of electrografted polyphenylene films and (ii) to specify how the thin layers grow. XPS analysis confirmed the AFM observations on (i) the effective shaving of the grafted polymer chains under mechanical stress and (ii) the existence of a potential threshold for electrografting a polyphenylene film on silicon oxide surfaces. The presence of a residual film in the rubbed zone was attributed to stronger interactions between the first electrografted layer and the native oxide of silicon (through Si-C or/and Si-O-C bonds) than those insuring the cohesion of the multilayer (C-C and C-N bonds).     

Chemical force titrations of functionalized Si(111) surfaces

Chemical force titrations-plots of the adhesive force between an atomic force microscope tip and sample as a function of pH-were acquired on alkyl monolayer-derivatized Si(111) surfaces. Gold-coated AFM tips modified with thioalkanoic acid self-assembled monolayers (SAM) were employed. Alkyl monolayer-derivatized Si(111) surfaces terminated with methyl, carboxyl, and amine groups were produced via hydrosilylation reactions between 1-alkene reagents and H-terminated silicon. The functionalized surfaces were characterized using standard surface science techniques (AFM, FTIR, and XPS). Titration of the methyl-terminated surface using the modified (carboxyl-terminated) atomic force microscope tip resulted in a small pH-independent hydrophobic interaction. Titration of the amine-terminated surface using the same tip resulted in the determination of a surface pKa of 5.8 for the amine from the pH value from the maximum in the force titration curve. A pK(1/2) of 4.3 was determined for the carboxyl-terminated Si(111) in a similar way. These results will be discussed in relation to the modified Si(111) surface chemistry and organic layer structure, as well as with respect to existing results on Au surfaces modified with SAMs bearing the same functional groups.     

Effect of solution concentration, surface bias and protonation on the dynamic response of amplitude-modulated atomic force microscopy in water

The dynamic response of amplitude-modulated atomic force microscopy (AM-AFM) is studied at the solid/water interface with respect to changes in ionic concentration, applied surface potential, and surface protonation. Each affects the electric double layer in the solution, charge on the tip and the sample surface, and thus the forces affecting the dynamic response. A theoretical model is developed to relate the effective stiffness and hydrodynamic damping of the AFM cantilever that is due to the tip/surface interaction with the phase and amplitude signals measured in the AM-AFM experiments. The phase and amplitude of an oscillating cantilever are measured as a function of tip-sample distance in three experiments: mica surface in potassium nitrate solutions with different concentrations, biased gold surface in potassium nitrate solution, and carboxylic acid-terminated self-assembled monolayers (SAMs) on gold in potassium nitrate pH buffers. Results show that, over the range where the higher harmonic modes of the oscillation are negligible, the effective stiffness of the AFM cantilever increases to a maximum as the tip approaches the surface before declining again as a result of the repulsive electrical double layer interaction. For attractive electrical double-layer interactions, the effective stiffness declines monotonically as the tip approaches the surface. Similarly, the hydrodynamic damping of the tip increases and then decreases as the tip approaches the solid/water interface, with the magnitude depending on the species present in the solution.     

Selective surface activation of a functional monolayer for the fabrication of nanometer scale thiol patterns and directed self-assembly of gold nanoparticles

Application of a voltage bias between the tip of an atomic force microscope (AFM) and a silicon substrate causes the localized modification of a specially designed self-assembled monolayer (SAM), transforming a surface-bound thiocarbonate into a surface-bound thiol. The resulting surface-bound thiols are used to direct the patternwise self-assembly of gold nanoparticles (AuNPs). This methodology is applied to deposit individual AuNPs onto a surface with nanometer precision and to produce 10 nm lines of closely spaced AuNPs that are a single nanoparticle in width.     

Ferrocenylundecanethiol self-assembled monolayer charging correlates with negative differential resistance measured by conducting probe atomic force microscopy

Electrical and mechanical properties of metal-molecule-metal junctions formed between Au-supported self-assembled monolayers (SAMs) of electroactive 11-ferrocenylundecanethiol (FcC(11)SH) and a Pt-coated atomic force microscope (AFM) tip have been measured using a conducting probe (CP) AFM in insulating alkane solution. Simultaneous and independent measurements of currents and bias-dependent adhesion forces under different applied tip biases between the conductive AFM probe and the FcC(11)SH SAMs revealed reversible peak-shaped current-voltage (I-V) characteristics and correlated maxima in the potential-dependent adhesion force. Trapped positive charges in the molecular junction correlate with high conduction in a feature showing negative differential resistance. Similar measurements on an electropassive 1-octanethiol SAM did not show any peaks in either adhesion force or I-V curves. A mechanism involving two-step resonant hole transfer through the occupied molecular orbitals (MOs) of ferrocene end groups via sequential oxidation and subsequent reduction, where a hole is trapped by the phonon relaxation, is proposed to explain the observed current-force correlation. These results suggest a new approach to probe charge-transfer involving electroactive groups on the nanoscale by measuring the adhesion forces as a function of applied bias in an electrolyte-free environment.