单晶Cu(001)薄膜塑性变形的分子动力学模拟

使用分子动力学方法,模拟研究了单晶Cu(001)薄膜在双向等轴拉伸应变下的塑性变形行为.当应变超过一定值时,样品通过产生位错、层错及孪晶而发生塑性变形.当应变相对较低时,不全位错首先在薄膜表面形核并在密排面上滑移,留下堆积层错;当应变增加时,位错在表面与内部同时成核生长,层错数量也随之增加.分析了相邻滑移面上的位错之间相互作用形成孪晶的微观过程.材料内部形成大量堆积层错及孪晶后,较大孪晶的密排面上的原子也会发生滑移,形成孪晶内部的层错结构以释放残余应力.     

CVD金刚石薄膜孪晶形成的原子机理分析

采用X射线衍射技术、电子背散射衍射技术和扫描电镜分别观察了不同甲烷浓度条件下沉积的CVD自支撑金刚石薄膜的宏观织构、晶界分布和表面形貌. 研究了一阶孪晶在金刚石晶体{111}面生长的原子堆垛过程. 结果表明，由于一阶孪晶〈111〉60°的取向差关系以及{111}面的原子堆垛结构，使{111}面上容易借助碳原子的偏转沉积产生一阶孪晶. 低甲烷浓度时，碳原子倾向于在表面能较低的{111}面沉积，为孪晶的形成提供了便利，且高频率孪晶使薄膜织构强度减弱. 甲烷浓度升高使生长激活能较小的{001}面成为主要前沿生长面，因而只有〈001〉晶向平行薄膜法向的晶粒能够不断长大，因此孪晶形核概率明显减小. 另外，在薄膜中发现二阶孪晶，并对二阶孪晶的形成进行了分析. 关键词： 金刚石薄膜 孪晶 原子机理 取向差     

织构金刚石薄膜的成核与生长

在加衬底偏压和不加衬底偏压两种情况下，用微波等离子体化学汽相沉积（MWCVD）技术在Ｓｉ（１００）衬底上合成了织构的金刚石薄膜使用扫描电子显微镜（ＳＥＭ）和取向Ｘ射线衍射技术证实了我们得到的样品是织构的金刚石薄膜观察了织构的金刚石薄膜的成核和生长过程，从理论上对金刚石薄膜异质外延的成核和生长机理进行了探讨 关键词：     

高压导致纳米TiO2形变的电子显微研究

α-PbO₂相TiO₂高压相具有适宜的带隙能和可见光范围的光催化能力,是一种适用于可见光、高效且环保的光催化材料.本文使用金刚石对顶压砧对锐钛矿纳米球进行加压-卸压处理得到了α-PbO₂相TiO₂高压相.利用透射电子显微镜对比初始样品和卸压样品,观察结果表明晶粒发生了明显形变,高分辨图显示其晶粒中存在大量[100]方向层错和形变孪晶,其中亚微米级晶粒中形成了透镜形片层结构的形变孪晶带;纳米级晶粒中形成了扇形多重形变孪晶.研究表明高压下锐钛矿TiO₂可以发生明显的形变,其形变的微观机制与金属类似,主要为形变孪晶和层错滑移,形变孪晶的形成存在明显的尺寸效应.这些结果为TiO₂高压相变的尺寸效应研究提供了一个新的切入点,同时还为制备孪晶α-PbO₂相TiO₂高压相提供了方法.     

堆垛层错和温度对纳米多晶镁变形机理的影响

本文采用分子动力学模拟方法研究了在拉伸载荷下,堆垛层错和温度对纳米多晶镁力学性能的影响,在模拟中,采用嵌入原子势描述镁原子之间的相互作用．计算结果表明：在纳米晶粒中引入堆垛层错能明显增强纳米多晶镁的屈服应力,但堆垛层错对纳米多晶镁杨氏模量的影响很小;温度为300．0K时,孪晶在晶粒交界附近形成,孪晶随着拉伸应变的增加而逐渐生长．当拉伸应变达到0．087时,一种基面与X—Y面成大约35°角且内部包含堆垛层错的新晶粒成核并快速增长．也就是说,孪晶和新晶粒的形成和繁殖是含堆垛层错的纳米多晶镁在300．0K温度下的主要变形机理．模拟结果也显示,当温度为10．0K时,位错的成核和滑移是含堆垛层错的纳米多晶镁拉伸变形的主要形式．     

激光刻蚀类球状微米金刚石聚晶薄膜对场致电子发射稳定性的影响

在覆盖金属钛层的陶瓷上,通过微波等离子体化学气相沉积(MPCVD)法制备出类球状微米金刚石聚晶薄膜,并通过激光刻蚀金刚石聚晶薄膜的表面.利用扫描电子显微镜、拉曼光谱,X射线衍射分析了刻蚀前后的结构和表面形貌,测试了刻蚀前后薄膜的场致电子发射特性,发现激光的刻蚀对金刚石聚晶薄膜场致电子发射的稳定性有一定的提高,并对其制备过程及发射机理进行了研究.     

类球状微米金刚石聚晶膜场发射的稳定性

在覆盖金属钛层的陶瓷上,利用微波等离子体化学气相沉积(MPCVD)法制备出类球状微米金刚石聚晶膜。通过二极管结构测试了聚晶膜的场致电子发射特性,利用扫描电子显微镜、拉曼光谱、XRD分析了场发射前后薄膜的结构和表面形貌的变化。发现在高场、大电流密度的场发射中,对类球状微米金刚石聚晶薄膜中的金刚石聚晶颗粒影响很小,而对金刚石聚晶颗粒间的非晶碳层影响很大。对类球状微米金刚石聚晶变化机理进行了研究。     

石英衬底上生长的高光学质量的纳米金刚石薄膜

采用射频等离子体增强的热丝化学气相沉积(RFHFCVD)技术在石英玻璃衬底上制备了表面光滑、晶粒致密均匀的纳米金刚石薄膜.用扫描电子显微镜(SEM)和台阶仪观测薄膜的表面形貌和粗糙度,x射线衍射(XRD)和Raman光谱表征膜层的结构,并用紫外可见近红外光谱仪测量其光透过率.实验结果表明,衬底温度、反应气压及射频功率对金刚石膜的结晶习性、表面粗糙度及光透过率均有很大程度的影响,其最佳值分别为700℃,2×133Pa和200W.在该最佳参量下经1h的生长即获得连续、平滑的纳米金刚石膜,其平均晶粒尺寸为约25 关键词： 纳米金刚石薄膜 射频等离子体增强热丝化学气相沉积 光透过率     

等离子体诱导碳纳米管到纳米金刚石的相变

采用氢等离子体，实现了碳纳米管向金刚石的结构相变，并实现了金刚石的高密度成核，有效成核密度可达10\+\{11\}／cm\+2以上，处于目前金刚石成核密度的最高行列，为制备优质的金刚石薄膜提供了保证.高分辨透射电镜、x射线衍射和拉曼光谱都证实了金刚石的形成.同时，对纳米金刚石晶粒的生成机理进行了初步探讨. 关键词： 等离子体 碳纳米管 纳米金刚石 结构相变     

氦气对MPCVD沉积金刚石的影响

为了确定添加氦气对微波等离子体化学气相沉积(MPCVD)金刚石膜的影响,采用发射光谱法(OES)在线诊断了CH₄-H₂-He等离子体的发射光谱特性,研究了He对等离子体内基团空间分布的影响;并利用扫描电子显微镜(SEM)和拉曼(Raman)光谱对不同He体积分数下沉积出的金刚石膜进行了表征。结果表明：随着He体积分数的增加,等离子体内H_α, H_β, H_γ, CH和C₂基团的谱线强度均呈上升趋势,其中H_α基团的谱线强度增加最大。光谱空间诊断发现He的加入导致等离子体中各基团的空间分布均匀性变差,造成沉积出的金刚石膜厚度极不均匀。沉积速率测试表明,He的加入导致碳源基团相对浓度增加,有利于提高薄膜的沉积速率,当He体积分数由0 vol.%增加至4.7 vol.%时,沉积速率提高了24%。SEM测试结果表明,随着He体积分数的增加,金刚石膜表面形貌由(111)晶面取向向晶面取向混杂转变,孪晶生长明显。高He(4.7 vol.%)体积分数下由于C₂基团的相对浓度较高,导致二次形核密度增加。此外,由于基片台受到等离子体的刻蚀和溅射作用,导致薄膜沉积过程中引入了金属杂质原子。二次形核和杂质原子的存在使得孪晶大量的产生,薄膜呈现出压应力。     

High-resolution identification of ½⟨110⟩ stacking faults in epitaxial Ba0.3Sr0.7TiO3 thin films

The near-interface region of an epitaxial Ba_0.3Sr_0.7TiO₃ thin film grown on LaAlO₃ (001) was found to consist of a high density of ½?110? stacking faults bounded by partial dislocations. The stacking faults can extend over large distances (greater than 50 nm). Various possible atomic configurations of the faults were considered. The atomic structures of the faults were identified using high-resolution electron microscopy and simulation as well as energy-filtered imaging. The ½[101] and faults (where [001] is normal to the film plane) were found to lie predominately on the {100} and {110} planes. The ½lsqb;101] faults on (010), (110) or (1&1tilde;0) have never been observed before in perovskites. The stacking faults on [100] have a structure consisting of a double layer of edge-sharing TiO₆ octahedra. The excess of Ti was detected by energy-filtered imaging. The formation of the extended stacking faults is probably related to a small amount of excess Ti during the film deposition, which may originate from the non-stoichiometry of the ceramic targets BaTiO₃ and SrTiO₃. It is also enhanced by the misfit-induced compressive strain in the early stages of the film growth.     

TEM investigation of the formation mechanism of deformation twins in Fe–Mn–Si–Al TWIP steels

The microstructure of a Fe–Mn–Si–Al twinning-induced plasticity (TWIP) steel exhibiting remarkable work hardening rate under uniaxial tensile deformation was investigated using transmission electron microscopy to uncover the mechanism(s) controlling the nucleation and growth of the mechanically induced twins. The results show that the stair-rod cross-slip deviation mechanism is necessary for the formation of the twins, while large extrinsic stacking faults homogenously distributed within the grains could act as preferential sources for the activation of the deviation process. The influence of such features on the thickness and strength of the twins and the resulting mechanical behaviour is discussed and compared to similar works recently performed on Fe–Mn–C TWIP steels.     

Asymmetrical twin boundaries and highly dense antiphase domains in BaNb0.3Ti0.7O3 thin films

Asymmetrical twin boundaries and highly dense antiphase domains were identified by means of transmission electron microscopy in a perovskite-based BaNb_0.3Ti_0.7O₃ thin film grown by laser molecular beam epitaxy on a SrTiO₃ (001) substrate. The microstructural characteristics of the BaNb_0.3Ti_0.7O₃ film were clarified in terms of lamellar {111} twins and antiphase domains, the domain boundaries of which are 1/2?110? stacking faults. It is proposed that the intersections of (111) twinning with the antiphase domain boundaries result in the asymmetrical twin boundaries.     

Revisiting the defect structure of MAX phases: the case of Ti4AlN3

Microstructural study of as-grown Ti₄AlN₃ MAX phase has been performed by transmission electron microscopy. Dislocation walls, dislocation nucleation sites and stacking faults are described. In particular, diffraction contrast analysis combined with high-resolution images give a new insight into the nature of the stacking faults: contrarily to what is usually postulated, it is shown that the stacking faults possess a shear component in the basal plane. The stacking faults are created by the insertion of MX layers in the lattice via diffusion mechanisms. Their possible role on the deformation mechanism of MAX phases is discussed.     

Cubic InN on -plane sapphire

InN has been grown directly on r-plane sapphire substrates by plasma-induced molecular beam epitaxy. X-ray diffraction and transmission electron microscopy investigations have shown that the InN layers consist of a predominant zinc-blende (cubic) structure along with a fraction of the wurtzite (hexagonal) phase whose content increases with proceeding growth. The InN layer is defect rich with a high number of stacking faults and twins. As a consequence a very high residual doping of was estimated. The lattice constant for the zinc-blende phase of InN was found to be a=4.986 Å. The optical investigations were strongly affected by a high number of defects, but nevertheless indicated an absorption edge below 0.6 eV. For this unusual growth of the metastable cubic phase on a noncubic substrate an epitaxial relationship was proposed, where the metastable zinc-blende phase grows directly on the r-plane of sapphire.     

Deformation induced microtwins and stacking faults in aluminum single crystal

Microtwins and stacking faults in plastically deformed aluminum single crystal were successfully observed by high-resolution transmission electron microscope. The occurrence of these microtwins and stacking faults is directly related to the specially designed crystallographic orientation, because they were not observed in pure aluminum single crystal or polycrystal before. Based on the new finding above, we propose a universal dislocation-based model to judge the preference or not for the nucleation of deformation twins and stacking faults in various face-centered-cubic metals in terms of the critical stress for dislocation glide or twinning by considering the intrinsic factors, such as stacking fault energy, crystallographic orientation, and grain size. The new finding of deformation induced microtwins and stacking faults in aluminum single crystal and the proposed model should be of interest to a broad community.     

Deformation-induced martensite and nanotwins by cryogenic laser shock peening of AISI 304 stainless steel and the effects on mechanical properties

Laser shock peening (LSP) of stainless steel 304 was carried out at room and cryogenic temperature (liquid nitrogen temperature). It was found that the deformation-induced martensite was generated by LSP only when the laser-generated plasma pressure is sufficiently high. Compared to room temperature laser shock peening (RT-LSP), cryogenic laser shock peening (CLSP) generates a higher volume fraction of martensite at the same laser intensity. This is due to the increase in the density of potential embryos (deformation bands) for martensite nucleation by deformation at cryogenic temperature. In addition, CLSP generates a high density of deformation twins and stacking faults. After CLSP, an innovative microstructure, characterised by networks of deformation twins, stacking faults and composite structure (martensite and austenite phases), contributes to material strength and microstructure stability improvement. The combined effect of higher surface hardness and a more stabilised microstructure results in greater fatigue performance improvement of the CLSP samples compared to that of the RT-LSP samples.     

New growth mode through decorated twin boundaries

Scanning tunneling microscopy and low energy electron diffraction were used to investigate the growth of partly twinned Ir thin films on Ir(111). A transition from the expected layer-by-layer to a defect dominated growth mode with a fixed lateral length scale and increasing roughness is observed. During growth, the majority of the film is stably transformed to twinned stacking. This transition is initiated by the energetic avoidance of the formation of intrinsic stacking faults compared to two independent twin faults. The atomistic details of the defect kinetics are outlined.