Mass spectrometric method for the absolute calibration of the intramolecular nitrogen isotope distribution in nitrous oxide

A mass spectrometric method to determine the absolute intramolecular (position-dependent) nitrogen isotope ratios of nitrous oxide (N₂O) has been developed. It is based on the addition of different amounts of doubly labeled ¹⁵N₂O to an N₂O sample of the isotope ratio mass spectrometer reference gas, and subsequent measurement of the relative ion current ratios of species with mass 30, 31, 44, 45, and 46. All relevant quantities are measured by isotope ratio mass spectrometers, which means that the machines inherent high precision of the order of 10^–5 can be fully exploited. External determination of dilution factors with generally lower precision is avoided. The method itself can be implemented within a day, but a calibration of the oxygen and average nitrogen isotope ratios relative to a primary isotopic reference material of known absolute isotopic composition has to be performed separately. The underlying theoretical framework is explored in depth. The effect of interferences due to ¹⁴N¹⁵N¹⁶O and ¹⁵N¹⁴N¹⁶O in the ¹⁵N₂O sample and due to ¹⁵N ₂ ⁺ formation are fully accounted for in the calculation of the final position-dependent nitrogen isotope ratios. Considering all known statistical uncertainties of measured quantities and absolute isotope ratios of primary isotopic reference materials, we achieve an overall uncertainty of 0.9 (1). Using tropospheric N₂O as common reference point for intercomparison purposes, we find a substantially higher relative enrichment of ¹⁵N at the central nitrogen atom over ¹⁵N at the terminal nitrogen atom than measured previously for tropospheric N₂O based on a chemical conversion method: 46.3±1.4 as opposed to 18.7±2.2. However, our method depends critically on the absolute isotope ratios of the primary isotopic reference materials air–N₂ and VSMOW. If they are systematically wrong, our estimates will also necessarily be incorrect.     

Mass spectrometric study of organocyclosiloxanes

Organocyclosiloxanes of various chemical structures were studied by mass spectrometry using different ionization methods. The electron ionization mass spectra contain no peaks of molecular ions, and the main fragment ions are formed due to complicated rearrangements in a molecular ion, which provides no comprehensive view about the molecular structure. The desorption spectra exhibit peaks of quasimolecular and fragment ions, which characterize both molecular weights and chemical structures of the compounds under study. Dedicated to Academician G. A. Abakumov on the occasion of his 70th birthday. Published in Russian in Izvestiya Akademii Nauk. Seriya Khimicheskaya, No. 9, pp. 1746–1749, September, 2007.     

混合酸制备四氟化硅气体用于硅同位素测量

1引言在自然界中,硅元素有3种稳定同位素28Si,29Si和30Si,丰度分别为92.23%,3.68%和3.09%。准确测量硅的摩尔质量,需准确测量硅的3种同位素的丰度值。目前,测量硅摩尔质量最佳的方法是采用SiF4气体测定硅同位素的丰度值,这     

Mass spectrometric analysis of ceramics after decomposition with elemental fluorine

The features of a combustion with elementary fluorine for the case of compact SiC ceramics and model substances for boron containing ceramics (H₃BO₃ and Na₂B₄O₇) were investigated with the aim of their decomposition and analysis. On-line detection of the gaseous decomposition products by quadrupole mass spectrometry using electron impact ionisation was studied. Limitations by blanks and transport interferences were investigated. Standard addition as well as the isotope dilution technique were used for calibration in the case of B, C and W at the trace and major component level.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthdayDeceased May 1995.     

Mass spectrometric studies of 2-aryl-5-acetylthiazole derivatives

Electron ionisation mass spectrometry was usefully used to characterize structurally 2-aryl-5-acetylthiazole derivatives in the gas phase. The compounds show characteristic fragmentation pathways depending on the chemical nature of the substituent at position 2, consisting mainly in the cleavage of both the 1,2- and 3,4-bonds of the thiazole ring. Liquid secondary ion mass spectrometry was applied to study the effects of protonation on the gas-phase unimolecular reactions of this class of compound. Tandem mass spectrometric experiments, carried out on molecular and protonated molecular ions, and also on fragment ions produced in the source, allowed the elucidation of gas-phase decompositions of low-internal energy ions.     

Mass spectrometric imaging of synthetic polymers

The analysis of synthetic polymers represents today an important part of polymer science to determine their physical properties and to optimize the performance of polymeric materials for block copolymers as well as blend systems. The characterization can easily and rapidly be performed by mass spectrometry. In particular, the film formation of a synthetic polymer is of interest in material research and quality control, which can be determined by employing mass spectrometric imaging (MSI) using secondary ion mass spectrometry (SIMS) or matrix-assisted laser desorption/ionization (MALDI) mass spectrometry. MALDI-MSI has been rapidly improved for the analysis of tissue cross-sections due to its soft ionization and accessible m/z range, which both also play an important role in polymer science. On the other hand, SIMS-MSI enables a sub-micrometer molecular spatial resolution, which is limited in MALDI-MSI due to the spatial resolution capabilities of the laser desorption process. The aim of the present contribution is to summarize recent advances in both imaging techniques for the analysis of synthetic polymers and to highlight their capabilities to correlate several imaging modalities in future applications.     

用稳定同位素质谱技术检测肉鸡色素的来源

通过分析肉鸡中稳定同位素δ13C值和δ15N值,推断肉鸡色素的来源,证明稳定同位素质谱技术可以作为调查动物饲料来源、追溯动物产品的方法。结果表明:添加色素组,随着色素添加量的增加RCF值显著升高(P<0.05);撤除色素后,各处理间的RCF值差异不显著(P>0.05);鸡肉粗蛋白中δ13C值在撤除色素前后的差异不显著(P>0.05)。饲喂不同含量的玉米组,随着玉米含量的增加,各组的RCF值有显著的差异(P<0.05);当饲料中玉米的含量由10%换成70%时,鸡爪的RCF值大幅度升高(P<0.05),反之,鸡爪的RCF值大幅度降低(P<0.05);鸡肉粗蛋白中δ13C值随着玉米含量的变化呈现显著差异(P<0.05)。另外,添加色素组和饲喂玉米组,当RCF值相同时,鸡肉粗蛋白中δ13C值有显著差异。     

Comparison of AMS,TIMS, and SIMS techniques for determining uranium isotope ratios in individual particles

The determination of isotope ratios in individual uranium particles is very important for nuclear safeguards. In this work, accelerator mass spectrometry (AMS), thermal ionization mass spectrometry (TIMS), and secondary ion mass spectrometry (SIMS) were applied to isotope ratio analysis of individual uranium particles and compared in terms of background, measurement accuracy, and efficiency. Several individual uranium particles (1–7 μm) from certified reference materials were used as samples. The results show that the average values of blank counting rate of ²³⁵U for AMS, FT-TIMS (FT: fission track), SEM-TIMS (SEM: scanning electron microscope), and SIMS were 7.3, 7.8, 2.7 and 2.2 cps, respectively. The relative error of ²³⁴U/²³⁵U and ²³⁴U/²³⁶U isotope ratios of the particles from U200 for AMS were within 10% and 20%, whereas the results of FT-TIMS and SIMS were within 5% and 10%, respectively. The relative error and external precision of ²³⁴U/²³⁸U and ²³⁵U/²³⁸U of the particles from U850 for the method of AMS, SEM-TIMS, and SIMS were within 10% and 5%, respectively. For ²³⁶U/²³⁸U, the average values of the relative error and external precision measured by AMS were within 5%, which measured by SEM-TIMS and SIMS were all within 10%. AMS has advantages in measuring ²³⁶U/²³⁸U. The measurement time of AMS and SEM-TIMS was shorter than that of FT-TIMS and longer than that of SIMS. It is considered that AMS and SEM-TIMS have a certain development prospect, and it is necessary to research deeply.     

DC plasma etching of silicon by sulfur hexafluoride. Mass spectrometric study of the discharge products

Polycrystalline silicon wafers were etched in dc discharges of SF₆. SF_x species were extracted from the discharges and measured with a mass spectrometer. A systematic procedure was used to measure the SF _x ⁺ signals such that they are indicators of events in the discharge close to the sample undergoing etching. The picture that emerges is remarkably simple and shows the relative stability of several SF_x species including SF₆, SF₄, SF₂, and SF which are shown to be extracted from the discharge both in the presence and absence of the silicon sample. When silicon is being etched on the cathode of the discharge cell, the only significant additional products are SiF₄ and S₂F₂. A comparison of blank and sample data for opposite substrate polarities shows that there is only a small cation-assisted etching effect and suggests that ions do not play an important role in the etching of silicon by SF₆ discharges.     

同位素质谱和无机质谱

本文是《分析试验室》定期评述中“同位素质谱和无机质谱”的第四篇评述，评述的范围是１９９４年１１月至１９９６年１０月我国气体同位素质谱，热电离同位素质谱，加速器质谱，火花源质谱，电感耦合等离子体质谱，辉光放电质谱，同位素稀释质谱，二次离子质谱，激光共振电离子飞行时间质谱，电子探针，质子探针，激光探针和它们在地学，核科学，环境科学，材料学，计理学，医学和生命科学中的应用，引用文献１４９篇。     

Mass spectrometric characterization of substituted 2-thiazolin-4-one derivatives

Electron ionization mass spectrometry was used for the structural characterization of substituted 2-thiazolin-4-one derivatives in the gas phase. The compounds follow common fragmentation pathways, producing ions whose abundances are dependent on the chemical nature of the substituent at position 2. Collision-induced dissociation tandem mass spectrometric experiments, carried out on both molecular ions and fragment ions produced in the source, allowed the elucidation of gas-phase decompositions. The presence of tautomeric forms is suggested for some ionic species. Rapid identification of a primary or secondary amine moiety at position 2 of the thiazoline ring can be achieved by the detection of characteristic fragmentations occurring both in the ion source and under the collision-induced dissociation regime.     

Laser Mass Spectrometry of Organophosphorus Pesticides and Related Compounds

Abstract

Laser mass spectra obtained for 20 organophosphorus (OP) compounds were systematically evaluated for groups containing analogous structural features. Variations in fragmentation can be understood based on simple organic reactions. While detailed mechanistic interpretations of the laser mass spectra (LMS) were not possible, the qualitative features in the LMS obtained from five compounds, not in the original set, could be predicted based on the characteristics of the other OP compounds studied. The success of the prediction lends credence to the qualitative models developed for rationalizing the LMS. A specific feature in the LMS of aromatic thionophosphates is a thiono-thiolo rearrangement. Detailed investigation into the phenomena involved comparison of LMS obtained from aromatic thionophosphates with spectra from electron impact, chemical ionization, field desorption, and secondary ion mass spectrometry. These results led to the conclusion that the rearrangement in laser mass spectrometry must occur during volatilization while the molecule/ion is in the “cloud” present immediately above the laser impact area.     

二次离子质谱生物成像

二次离子质谱作为目前空间分辨率最高的质谱成像技术,以其免标记、高灵敏、多组分检测优势和亚微米级高空间分辨成像优势为诸多生命科学问题的研究提供了全新的分析手段,在基础细胞生物学、组织生理病理学、生物医药与临床医学等领域的研究中得到了广泛应用.本文综述了二次离子质谱在生物组织、细胞、仿生生物膜等体系中的质谱成像研究进展.     

Mass spectrometric analysis of ceramic components for solid oxide fuel cells

For the determination of trace impurities in ceramic components of solid oxide fuel cells (SOFCs), some mass spectrometric methods have been applied such as spark source mass spectrometry (SSMS), laser ionization mass spectrometry (LIMS), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and inductively coupled plasma mass spectrometry (ICP-MS). Due to a lack of suitable standard reference materials for quantifying of analytical results on La _x Sr _y MnO₃ cathode material a matrix-matched synthetic standard-high purity initial compounds doped with trace elements-was prepared in order to determine the relative sensitivity coefficients in SSMS and LA-ICP-MS. Radiofrequency glow discharge mass spectrometry (rf-GDMS) was developed for trace analysis and depth profiling of thick non-conducting layers. Surface analytical techniques, such as secondary ion mass spectrometry (SIMS) and sputtered neutral mass spectrometry (SNMS), were used to determine the element distribution on surfaces (homogeneity) and the surface contaminants of SOFC ceramic layers.Dedicated to Professor Dr. rer. nat. Hubertus Nickel on the occasion of his 65th birthday     

Mass spectrometric and quantum-chemical study on the structure, stability, and chirality of protonated serine dimers

Stability and structure of homo- and heterochiral protonated serine (Ser) dimers were investigated by a combination of mass spectrometry and ab initio quantum chemical calculations. This established that the energy difference between the most stable homo- and heterochiral forms is very small: tandem mass spectrometry with Cooks' kinetic method yielded a negligible difference in Gibbs free energy (0.2+/-0.2 kJ mol(-1)). The various isomeric forms of (Ser)2 H+ and their energetics were determined by extensive electronic-structure calculations, which yielded homo- and heterochiral forms of the isomers with distinctly different relative energies. The most stable homochiral isomer is stabilized by two hydrogen bonds and is far more stable than any other homochiral isomer. The most stable heterochiral isomer has completely different features, and it is characterized by a salt-bridge structure. This clearly shows that salt-bridge structures do exist in the gas phase even in comparatively small molecules and in the absence of particularly basic or acidic functional groups.     

Mass spectrometric characterization of peptides containing different oxidized tryptophan residues

The term reactive oxygen species refers to small molecules that can oxidize, for example, nearby proteins, especially cysteine, methionine, tryptophan, and tyrosine residues. Tryptophan oxidation is always irreversible in the cell and can yield several oxidation products, such as 5-hydroxy-tryptophan (5-HTP), oxindolylalanine (Oia), kynurenine (Kyn), and N-formyl-kynurenine (NFK). Because of the severe effects that oxidized tryptophan residues can have on proteins, there is a great need to develop generally applicable and highly sensitive techniques to identify the oxidized residue and the oxidation product. Here, the fragmentation behavior of synthetic peptides corresponding to sequences recently identified in three skeletal muscle proteins as containing oxidized tryptophan residues were studied using postsource decay and collision-induced dissociation (CID) in matrix-assisted laser desorption/ionization (MALDI) time-of-flight (TOF)/TOF mass spectrometry (MS) and CID in an electrospray ionization (ESI) double quadrupole TOF-MS. For each sequence, a panel of five different peptides containing Trp, 5-HTP, Kyn, NFK, or Oia residue was studied. It was always possible to identify the modified positions by the y-series and also to distinguish the different oxidation products by characteristic fragment ions in the lower mass range by tandem MS. NFK- and Kyn-containing peptides displayed an intense signal at m/z 174.1, which could be useful in identifying accordingly modified peptides by a sensitive precursor ion scan. Most importantly, it was always possible to distinguish isomeric 5-HTP and Oia residues. In ESI- and MALDI-MS/MS, this was achieved by the signal intensity ratios of two signals obtained at m/z 130.1 and 146.1. In addition, high collision energy CID in the MALDI-TOF/TOF-MS also permitted the identification of these two isomeric residues by their v- and w-ions, respectively.     

Summary of ISO/TC 201 Standard: X ISO 17560:2002—Surface chemical analysis—Secondary ion mass spectrometry—Method for depth profiling of boron in silicon

This International Standard specifies a secondary ion mass spectrometric method using magnetic‐sector or quadrupole mass spectrometers for depth profiling of boron in silicon, and using stylus profilometry or optical interferometry for depth calibration. This method is applicable to single‐crystal, polycrystal or amorphous silicon specimens with boron atomic concentrations between 1 × 10¹⁶ and 1 × 10²⁰ atoms cm^?3, and to the crater depth of 50 nm or deeper. Optical interferometry is generally applicable to crater depths in the range 0.5–5 µm. Copyright © 2004 John Wiley & Sons, Ltd.