Modified Michelson interferometer for probing refractive index of birefringent crystal CSBN50

Based on the modified Michelson interferometer and phase analysis method, a high-accuracy method for probing the refractive index (RI) of transparent medium is proposed. The validated test was performed on a birefringent crystal CSBN50 with the estimated accuracy being up to 10⁻⁴. The ordinary and extraordinary refractive indices of CSBN50 at 632.8 nm are determined as n₀=2.32853±0.00016 and n_e=2.27664±0.00016, respectively.     

A high-precision measurement technique for evaluating alcohol concentrations using an optical metrology system based on a position sensing detector

This study develops a high-precision, non-destructive optical metrology system based on a position sensing detector for measuring the refractive index of a liquid solution such that its alcohol concentration can be derived. A series of experiments are performed to measure the refractive indices of samples of known alcohol concentrations in the range 0–99.5%. The experimental results indicate that the refractive index and the alcohol concentration are related by a quadratic function. According to this mathematical function, the refractive index of a sample with an alcohol concentration of 95% is n_95%=1.36442. The measured value of the refractive index of the same sample is found to be n_alcohol-95%=1.36587. The deviation of just 0.00145 between the two sets of results confirms the accuracy of the analytical prediction method. For a sample with a known alcohol concentration of 37%, the error between the analytically predicted concentration value and the actual value is found to be less than 0.7%. Overall, the results confirm that the proposed system provides a low-cost, straightforward and highly precise approach for measuring the alcohol concentration of liquid samples.     

Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials

We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of n=10^–5. The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS₂ are used as samples for demonstrating our method.     

Measurements of the refractive indices and refractive index increment of a synthetic PMMA solutions at 488 nm

We describe a Mach–Zehnder interferometer (MZI) method for measuring the refractive index (RI) of polymethyl-methacrylate (PMMA) solution in both acetone and methyl-ethyl-ketone (MEK). The measurements are made as a function of concentration values 4, 8, 12, 16 and 20 g/l at a wavelength of 488 nm with a high degree of accuracy tends to 1.4×10⁻⁵. The refractive index increments (RIIs) dn/dc of PMMA in both investigated solvents are determined too. In addition, the RIIs Δn as a function of concentration and the RIIs at zero concentration (dn/dc)_c=0 are determined for both solvents accurately. The PMMA solutions in acetone and MEK solvents are chosen for laser light scattering investigations.     

Refractive index of standard oils as a function of wavelength and temperature

The refractive indices (n) of eight standard oils from Physikalisch Technische Bundesanstalt, Germany were determined with an accuracy of ±1×10⁻⁴ by using Abbe Refractometer. The measurements were performed at temperature 20°C in the spectral range 0.4–0.7 μm. The experimental data were fitted to the simple Cauchy dispersion formula and the results were found to be consistent within the limits of experimental error. In all cases, the refractive index decreased monotonically with increasing wavelength. The refractive indices (n) of these oils have been measured as a function of the temperature t (20°C up to 50°C) at λ=0.589 μm and were found to have linear temperature dependencies. The refractive indices of the studied oils and the uncertainty in their values are calculated at λ=0.589. The Lorentz–Lorenz (L–L) formula has been tested and it was found to be valid with a maximum deviation of 0.4% and was used to calculate the molecular polarizability θ.     

Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index

Low coherence interferometry can provide simultaneous measurement of refractive index n and thickness t of a transparent plate, as reported recently by some research groups. Precise measurement of n and t is impossible unless chromatic dispersion of index is taken into account. We then proposed and demonstrated a unique technique for simultaneous measurement of phase index n_p, group index n_g and thickness t using a special sample holder. This paper describes a novel technique for simultaneous measurement of n_p, n_g and t using an approximate expression of the chromatic dispersion in terms of n_p. The approximate expression of chromatic dispersion does not require use of the special sample holder, and n_p, n_g and t are determined from two measurable quantities with an accuracy of 0.3% or less, for the sample thickness was around 1 mm. In addition, it is possible to shorten the measurement time compared with the above method.     

Zygo interferometer for measuring refractive index of photorefractive bismuth silicon oxide (Bi12SiO20) crystal

An application of the Zygo system for measuring the refractive index of optical materials such as bismuth silicon oxide (BSO) having a higher value of the refractive index than that of glass is presented. The setting accuracy is found to be of the order of 1 μm in the Zygo phase measuring interferometer. The mean value of refractive index of BSO crystal measured by the interferometer for several samples of thickness in the range of 3–9 mm is 2.542 at a wavelength of 632.8 nm. The accuracy of measurement is ±0.002. It is possible to achieve an accuracy of ±0.0003 for a sample of thickness of 30 mm in the measurement of refractive index due to high setting accuracy of the Zygo system.     

Dispersive optical constants of a-Se100−xSbx films

Thin films of amorphous Se_100−xSb_x (x=5,10 and 20 at%) system are deposited on a silicon substrate at room temperature (300 K) by thermal evaporation technique. The optical constant such as refractive index (n) has been determined by a method based on the envelope curves of the optical transmission spectrum at normal incidence by a Swanpoel method. The oscillator energy (E_o), dispersion energy (E_d) and other parameters have been determined by the Wemple–DiDomenico method. The absorption coefficient (α) has been determined from the reflectivity and transmitivity spectrum in the range 300–2500 nm. The optical-absorption data indicate that the absorption mechanism is a non-direct transition. We found that the optical band gap, E_g^opt, decreases from 1.66±0.01 to 1.35±0.01 eV with increase Sb content.     

Refractive indices of (AlAs)(GaAs) short-period superlattices

The refractive indices of short-period binary (AlAs)_m(GaAs)_n superlattices, wherem = n, were investigated by measuring the beam divergences of optical waveguides using these superlattices as the core material. It is demonstrated that the refractive index depends on the period of the superlattice and not simply on the average composition. The refractive index is shown to depend in a systematic way on the direct bandgap of the superlattice, although the relationship may not be quite the same as that for a random alloy.     

A high-precision optical metrology system for determining the thickness of birefringent wave plates

This study develops a non-destructive measurement system for determining the thickness and refractive indices of birefringent optical wave plates. Compared to previous methods presented in the literature, the proposed metrology system provides the ability to measure the thickness of the birefringent optical plate in high-precision. The results show that for a commercially available birefringent optical wave plate with refractive indices of n_e=1.5518, n₀=1.5427 and a thickness of 452.1428 μm, the experimentally determined value for the error in the wave plate thickness measurement is just 0.046 μm. The measurement resolution of the proposed system exceeds that of the interferometer hardware itself. The proposed method provides a simple yet highly accurate means of measuring the principal optical parameters of birefringent glass wave plates.     

Spontaneous photorefractive effect in Sr1−x CaxTiO3 (x=0.014)

The temperature dependence of the principal values of the refractive index in Sr_1−x Ca_xTiO₃ (x=0.014) has been measured in the 17–275 K range under various conditions of sample illumination with 1.96 eV photons. The spontaneous photorefractive contribution δn ^ph to the temperature-induced variation of the refractive index of Sr_1−x Ca_xTiO₃, which appears after illumination of the sample in the ferrophase (transition temperature T _c=32 K) and persists in the paraphase under heating up to 150 K, has been separated. The photoinduced polarization has been estimated. Fiz. Tverd. Tela (St. Petersburg) 39, 711–713 (April 1997)     

Z-scan technique as a tool for the measurement of blood glucose

The measurement of the blood glucose level utilizing the optical nonlinearity observed by a single-optical beam Z-scan technique is proposed. The glucose level is calculated by measuring the nonlinear refractive index (n ₂) of the sample. The results are compared with the measurement made by the conventional colorimetric method and are found to be in good agreement.     

Nonlinear optical responses of Sudan IV doped liquid crystal by z-scan and moiré deflectometry techniques

The nonlinear optical properties of a nematic liquid crystal doped with an azo dye were investigated. The magnitude and the sign of the third-order nonlinear refractive index, n₂, were measured using both single-beam z-scan and moiré deflectometry techniques. The measurements were performed at 532 nm using a Nd:Yag CW laser. The positive sign showed that sample which was studied possess a self-focusing optical nonlinearity. Rather close agreement was found between the values for n₂ obtained by z-scan and by moiré deflectometry. The nonlinear refractive index was found to be in the order of 10^− 6 (cm²/W) and the nonlinear absorption coefficient to be β = 0.171 (cm/W).     

Investigation on optical properties of Bi<Subscript>2.85</Subscript>La<Subscript>0.15</Subscript>TiNbO<Subscript>9</Subscript> thin films by prism coupling technique

Layered-perovskite ferroelectric Bi_2.85La_0.15TiNbO₉ (LBTN) optical waveguiding thin films were grown on fused silica substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD) revealed that the film is highly (00l) textured. We observed sharp and distinct transverse electric (TE) and transverse magnetic (TM) multimodes and measured the refractive indices of LBTN thin films at 632.8 nm. The ordinary and extraordinary refractive indices were calculated to be n _TE=2.358 and n _TM=2.464, respectively. The film homogeneity and the film-substrate interface were analyzed using an improved version of the inverse Wentzel–Kramer–Brillouin (iWKB) method. The refractive index of the film remains constant at n ₀ within the waveguiding layer. The average transmittance of the film is 70% in the wavelength range of 400–1400 nm and the optical waveguiding properties were evaluated by the optical prism coupling method. Our results showed that the LBTN films are very good electro-optical active material.     

Optical properties of amorphous films

We have analyzed the optical properties of a-Ge_30-xSb_xS₇₀ chalcogenide glass films (x=0,10,20 and 30 at%); the chalcogenide films were prepared by vacuum thermal evaporation. The optical-absorption data indicate that the absorption mechanism is non-direct transition. We found that the optical band gap, E_opt, decreases from 2.04±0.01 to 1.74±0.01 eV, whereas the refractive index increases with increasing Sb content. Data are analyzed by the Wemple equation, which is based on the single-oscillator model.     

Measuring the optical parameters of thin films by p-polarized laser beams

The refractive index n_f, extinction coefficient k_f and thickness d_f of a dip coated film are measured by using p-polarized laser beams. A sample is oblique illuminated with a p-polarized laser beam, and then two reflected beams, from the front and back surfaces, are received with a detector. After measuring their intensity ratio versus the angle of incidence, it is convenient to obtain the parameters of the film by means of data fitting. The films of polymethyltriethoxy silane (PMTES), which were made on a BK-7 glass substrate by dip coating, were measured. The method is non-contact, non-destructive and has the advantages of simplicity of both equipment and understanding. It is also shown that the values measured by this method are coincident with those measured by ellipsometry.     

Design of a hybrid diffractive/refractive achromatized telecentric f·θ lens

The design of a hybrid diffractive/refractive achromatized telecentric f·θ lens with a field of view (FOV) 50° and an effective focal length of 750 mm is presented. The optical stop is placed at the front focal plane so that it is a telecentric system. The design is based on a traditional refractive counterpart, and the designed system consists of a hybrid diffractive/refractive lens and four refractive lenses. The designed f·θ lens shows a considerable reduction in weight with a simplified structure, and exhibits superior performance compared to the refractive system. It is emphasized that the designed f·θ lens can be applied to modern color scanning systems that operate in the visible wavelength range with high performance. It can also be applied to high-energy scanning systems. When applying the designed hybrid diffractive/refractive f·θ lens to the high-energy scanning system, a big laser operating in one longitudinal mode can be replaced by a small multi-mode laser, and the scanning system can be simplified greatly with the accuracy improved.     

Measurement of nonlinear refractive index of Ag and Au nano-particles using moiré technique

In this paper we have measured second order nonlinear refractive index of Ag and Au nano-particles using the moiré deflectometry with a CW He-Ne laser at wavelength of 632.8 nm. The main advantages of this technique are its extreme experimental simplicity and low sensitivity to external distribution in comparison with other interfrometric methods that need very stable experimental set-up. Because of self-focusing (or self-defocusing) that is due to intensity dependent refractive index, presence of sample in the moiré deflectometry set-up lead to rotation of moiré fringes. By moving the sample in set-up we have measured these rotation angles in different displacements from focus point of lens used in this set-up and then we have calculated the nonlinear refractive index of Ag and Au nano-particles using their values. Also we have obtained the sign of n₂ regard to the direction of rotations. Consequently by using the Mathematica software we have exhibited the suitable fitness of theoretical curve with experimental results.     

Path-averaged differential meter of atmospheric turbulence parameters

A path-averaged differential meter of the structure constant of the atmospheric refractive index, C _n ², has been developed and tested. The results of a model numerical experiment on measuring C _n ² and the horizontal component of average wind velocity transverse to the path are reported.     

基于平行平板的折射率高精度非接触测量

常用的测量折射率的方法如偏向角法、自准直法、临界角法、 V棱镜法等,这些方法通常需特制三棱镜与待测件。待测样品不一致且过程复杂,测试定标周期长,难于自动化。为了保证待测材料的完整及实现自动化测量,进行了基于平行平板的折射率非接触测量的尝试。运用该方法进行折射率的测量,不需特制三棱镜并且待测件与待测样品一致。分析表明,通过选择合适的测量角度,该方法旋转角度精度为a=0.003（即10）,导轨精度为L=0.000 8 mm,平行平板厚度测量精度为d=0.001 mm。