Characterization of Langmuir-Blodgett film using differential charging in X-ray photoelectron spectroscopy

Differential charging is often regarded as a problem in X-ray photoelectron spectroscopy (XPS) studies, especially for insulating or partially conducting samples. Neutralization techniques have been developed to circumvent this effect. Instead of neutralizing the positive charge, which is often the technique to obtain good quality data, it is possible to exploit this phenomenon to get useful information about the sample. An attempt is made here to use this differential charging to study the mono- and multilayer Langmuir-Blodgett (LB) films of cadmium arachidate on silicon substrate. The surface potential was probed by measuring XPS line shift with respect to their neutral position and was found to have correlation with the thickness of the films. No differential charging was observed in the monolayer LB film where there was only one layer of cadmium headgroup. Significant differential charging was observed for multilayer films, the total charging as well as the differential charging in these films increase with increasing number of layers. Angle-resolved XPS measurements were performed to obtain additional information about the structure of the films. Charging of the upper layer of the films close to the vacuum interface was found to be less compared to that of the interior. The discrete cadmium layers were found to be more differentially charged compared to the continuous hydrocarbon stacks in the multilayer LB films. Charging of the discrete cadmium layers has been utilized to obtain quantitative information of the multilayer LB films.     

Quantitative surface characterization using X-ray photoelectron spectroscopy

Use of X-ray Photoelectron Spectroscopy (XPS) for quantitative surface analysis is reviewed. Examples chosen are from our research on heterogeneous catalysts. XPS is useful for measuring distributions of oxidation states because of significant chemical shifts for many elements. However, linewidths complicate analysis of mixtures, necessitating the use of data analysis methodology. Use of factor analysis or deconvolution with non-linear least squares curve fitting gives useful protocols. Five important questions are posed, and some examples of solutions are presented: 1) How many components are present? 2) Where are they located? 3) What do they look like? 4) How much of each component is present? 5) How good is the answer?     

Quantitative surface characterization using X-ray photoelectron spectroscopy

Use of X-ray Photoelectron Spectroscopy (XPS) for quantitative surface analysis is reviewed. Examples chosen are from our research on heterogeneous catalysts. XPS is useful for measuring distributions of oxidation states because of significant chemical shifts for many elements. However, linewidths complicate analysis of mixtures, necessitating the use of data analysis methodology. Use of factor analysis or deconvolution with non-linear least squares curve fitting gives useful protocols. Five important questions are posed, and some examples of solutions are presented: 1) How many components are present? 2) Where are they located? 3) What do they look like? 4) How much of each component is present? 5) How good is the answer?     

Characterization of peptide adsorption on InAs using X-ray photoelectron spectroscopy

The well-defined structure and high stability of peptides make them attractive biotemplates for low-temperature synthesis of semiconductor nanocrystals. Adsorbed peptide monolayers could also potentially passivate semiconductors by preventing regrowth of the oxide layer. In this work, the adsorption and passivation capabilities of different collagen-binding peptides on InAs surfaces were analyzed by X-ray photoelectron spectroscopy (XPS). Before peptide functionalization, Br(2)- and HCl-based etches were used to remove the native oxide layer on the InAs surfaces. The presence of the N 1s peak for peptide-functionalized samples confirms the adsorption of peptides onto the etched InAs surfaces. Calculated coverages were similar for all peptide sequences and ranged from ～20 to 40% of a monolayer using the deconvoluted C 1s spectra and from ～2 to 5% for the N 1s spectra. The passivation ability of the peptides was analyzed by comparing the ratios of the oxide components to the nonoxide components in the XPS spectra. The thickness of the oxide layer was also approximated by accounting for the attenuation of the substrate photoelectrons through the oxide layer. We find that the oxide layer regrowth still occurs after peptide functionalization. However, the oxide layer thicknesses for peptide-functionalized samples do not reach as received levels, indicating that the peptides do have some passivation ability on InAs.     

X-ray photoelectron spectroscopy of some silicates

The binding energies of Si(2S) and O(1S) electrons in a number of silicate compounds are reported and correlated with their respective calculated charges by applying an iterative Pauling method. The use of ESCA to establish the molecular structure of the metasilicates is also discussed.     

Method to determine the work function using X-ray photoelectron spectroscopy

A method is suggested to determine the work function from the Fermi level of metals and alloys and to evaluate the contact potential difference between the sample and spectrometer as well as between contacting samples. Translated fromZhurnal Struktumoi Khimii, Vol. 39, No. 6, pp. 1147–1150, November–December, 1998.     

X-ray photoelectron spectroscopy of boron compounds

The results of X-ray photoelectron (XPS) studies of boron compounds (predominantly boron hydrides and their derivatives — 49 compounds) are presented. The results are analyzed to form a representative set of XPS data for the boron element.     

Analysis of PPMMA films from oxygen plasma using X-ray photoelectron spectroscopy

Plasma polymerized methyl methacrylate (PPMMA) films have been synthesised on silicon substrates in RF glow discharge using oxygen plasma. The electron beam delineation sensitivity of the PPMMA films has been studied systematically by varying oxygen and monomer flow rates. X-ray photoelectron spectroscopy (XPS) analysis clearly illustrates how C/O ratio in the films determines the properties of PPMMA films as electron beam resist. © 1994 John Wiley & Sons, Inc.     

X-ray photoelectron spectroscopy studies of polyethylene-aluminium laminates

X-ray photoelectron spectroscopy was used to examine the effects of extrusion temperature, antioxidants and ozone pre-treatment on the oxidation of polyethylene. The oxidation levels are related to the adhesion between polyethylene and aluminium. The relevance of weak boundary layers is discussed.     

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloid

Transition metal colloids are potential precursors of heterogeneous catalysts with application to selective chemical reactions. Sample preparation techniques are described. Experimental details are given of the characterization of these often air-sensitive particles by X-ray photoelectron and X-ray absorption spectroscopy. First results obtained with both techniques for a Rh-colloid show that the metal is mainly present in the zerovalent chemical state. But the spectra indicate further chemical states of Rh which can be assigned to the outermost metal atoms of the colloid interacting with organic ligands or to the educt Rh-halides.     

Spectroscopic investigation of uranium sorption on soil surface using X-ray photoelectron spectroscopy

A study was carried out to understand the sorption of uranium (U) onto soil surface and identify the species of U on soil surface using X-Ray Photoelectron Spectroscopy (XPS). For the study soil was amended with uranyl nitrate and surface speciation study was carried out by investigating the energy region for U in spectrum. Analysis of spectrum revealed that U is present in U(VI) state. Deconvolution of XPS spectrum of U(VI) sorbed on soil surface revealed that U(VI) species such as, UO₂ ²⁺ and (UO₂)_x(OH) _y ^(2x?y)+ form complex with silanol, aluminol and goethite sites. The possible surface complexation is: ≡Al(OH)₂UO₂ ²⁺, ≡SiO₂UO₂, ≡SiO₂(UO₂)₃(OH)₅ and ≡Fe(OH)₂UO₂.     

X-ray absorption and X-ray photoelectron spectroscopy of a rhodium colloid

Transition metal colloids are potential precursors of heterogeneous catalysts with application to selective chemical reactions. Sample preparation techniques are described. Experimental details are given of the characterization of these often air-sensitive particles by X-ray photoelectron and X-ray absorption spectroscopy. First results obtained with both techniques for a Rh-colloid show that the metal is mainly present in the zerovalent chemical state. But the spectra indicate further chemical states of Rh which can be assigned to the outermost metal atoms of the colloid interacting with organic ligands or to the educt Rh-halides.     

Film thicknesses determined by X-ray photoelectron spectroscopy

The knowledge of the reduced thickness of overlayers in the thickness range up to 5 nm is a valuable contribution to quantitative analysis in XPS. A new method for its determination is described which can be applied to most of the commercially available instruments. The method considers influences like countrate statistics, surface roughness, thickness distribution, elastic electron scattering, divergence of the photoelectrons detected by the spectrometer and energy dependence of the inelastic mean free path of the electrons in matter. The reliability of the results is verified by XPS-measurements performed on SiO₂-layers on Si.Besides, the XPS-results obtained from Si₃N₄-layers on Si measured under different take-off angles demonstrate the applicability of this method for the investigation of film growth. A further aspect is given by the recognition of elastic electron scattering by a simplified expression no longer asking for Monte Carlo calculations.     

X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy

In this work, the chemical changes in calf thymus DNA samples were analyzed by X-ray photoelectron spectroscopy (XPS). The DNA samples were irradiated for over 5 h and spectra were taken repeatedly every 30 min. In this approach the X-ray beam both damages and probes the samples. In most cases, XPS spectra have complex shapes due to contributions of C, N, and O atoms bonded at several different sites. We show that from a comparative analysis of the modification in XPS line shapes of the C 1s, O 1s, N 1s, and P 2p peaks, one can gain insight into a number of reaction pathways leading to radiation damage to DNA.     

利用X射线光电子能谱研究马家塔煤显微组分中氧的赋存形态

煤中氧的赋存形态是煤结构研究的重要内容,煤炭加工转化（如煤的热解、直接加氢液化等）也需要确实详尽的煤中氧赋存形态的数据信息。x射线光电子能谱法（x—ray Photoelectron Speetroscopy,XPS）是近年来新出现的最有效的元素分析方法之一,目前,已在化学、物理、生物等各个领域中得到广泛应用。1974年,XPS分析方法首次用于煤的研究,近年来,XPS成为研究煤中硫和氮存在形态的有效方法之一。许多学者在煤中无机矿物中碳、氧、硫的存在形态及XPS直接测定煤中有机硫等方面做过较多研究工作,但由于煤结构的复杂性、实验条件不尽相同以及煤中矿物的干扰等,以往的研究结果并不完全相同。     

Quantitative surface analysis by X-ray photoelectron spectroscopy and X-ray excited auger electron spectroscopy

It is shown that X-ray excited KLL Auger electron spectra allow it to describe measured signal strengths similarly to X-ray photoelectron signals, thus offering valuable information on the quantitative surface composition of a solid sample. The principal equation and corresponding fundamental parameters are discussed. As a result Auger spectra of C, N, O, F, and Na can be easily used in a multiline approach for quantitative analysis. LMM and MNN spectra give rise to more problems, due to their more complicated structure, uncertainties with regard to the background and the influence of Coster-Kronig transitions. These problems are overcome by the use of empirical ratios of the strongest lines of 2p/LMM or 3d/MNN. Since these ratios are independent of sample composition, they allow it to transform the Auger signal into the corresponding photoelectron signal, provided that a standard sample has been measured. Thus a true additional information is obtained and moreover difficulties in cases of photoelectron spectra with overlapping lines from other chemical elements can be overcome.Dedicated to Professor Günther Tölg on the occasion of his 60th birthday