X‐ray Crystallography in Open‐Framework Materials

Open‐framework materials, such as metal–organic frameworks (MOFs) and coordination polymers have been widely investigated for their gas adsorption and separation properties. However, recent studies have demonstrated that their highly crystalline structures can be used to periodically organize guest molecules and non‐structural metal compounds either within their pore voids or by anchoring to their framework architecture. Accordingly, the open framework can act as a matrix for isolating and elucidating the structures of these moieties by X‐ray diffraction. This concept has broad scope for development as an analytical tool where obtaining single crystals of a target molecule presents a significant challenge and it additionally offers potential for obtaining insights into chemically reactive species that can be stabilized within the pore network. However, the technique does have limitations and as yet a general experimental method has not been realized. Herein we focus on recent examples in which framework materials have been utilized as a scaffold for ordering molecules for analysis by diffraction methods and canvass areas for future exploration.     

Characterization of multicomponent polymer trilayers with resonant soft X‐ray reflectivity

Resonant soft X‐ray reflectivity (RSoXR) has been used to quantify the layer thicknesses and the interfacial widths of a single, complex thin film with three polymeric layers supported on an inorganic substrate. By adjusting the photon energy, the sensitivity to particular interfaces within the trilayer can be selectively enhanced. The results significantly improve and broaden the capabilities of RSoXR, which has previously only been demonstrated and used for bilayers on silicon substrates. The capability of RSoXR to characterize polymer trilayers was not readily predictable from prior bilayer results, as the RSoXR characterization of bilayers benefits from a strong X‐ray reflection from the substrate that serves as a reference beam with which the reflections from the other interfaces interfere with. The impact of having the capability to investigate trilayers is exemplified by discussing the utility of RSoXR to characterize organic electronic light emitting multilayers. © 2009 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 47: 1291–1299, 2009     

Transient Absorption Spectroscopy Studies on Polythiophene–Fullerene Bulk Heterojunction Organic Blend Films Sensitized with a Low‐Bandgap Polymer

Recently, the concept of near‐infrared sensitization is successfully employed to increase the light harvesting in large‐bandgap polymer‐based solar cells. To gain deeper insights into the operation mechanism of ternary organic solar cells, a comprehensive understanding of charge transfer–charge transport in ternary blends is a necessity. Herein, P3HT:PCPDTBT:PCBM ternary blend films are investigated by transient absorption spectroscopy. Hole transfer from PCPDTBT‐positive polarons to P3HT in the P3HT:PCPDTBT:PCBM 0.9:0.1:1 blend film can be visualized. This process evolves within 140 ps and is discussed with respect to the proposed charge‐generation mechanisms.

     

Poly(9‐undecyl‐9‐methyl‐fluorene) and poly(9‐pentadecyl‐9‐methyl‐fluorene): Synthesis,solution structure,and effect of side chain asymmetry on aggregation behavior

We report on solution aggregates and backbone conformation of poly(9‐undecyl‐9‐methyl‐fluorene) (PF1‐11) and poly(9‐pentadecyl‐9‐methyl‐fluorene) (PF1‐15), having two different side chains compared with poly(9,9‐dihexylfluorene) (PF6) and poly(9,9‐dioctylfluorene) (PF8) with two identical side chains. In the poor solvent methylcyclohexane (MCH), X‐ray scattering indicates that PF1‐11 and PF1‐15 appear as three‐dimensional aggregates (5–10 nm wide and thick), forming ribbon‐like agglomerates (correlation lengths of 100 nm). PF6 and PF8 appear as two‐dimensional aggregates (>10 nm wide and 2–3 nm thick) involving ribbon‐like agglomerates (correlation lengths much greater than 100 nm). Upon heating, all aggregates undergo a gel–sol transition which occurs at lower temperatures for PF1‐11 and PF1‐15 (<60°C) than for PF6 and PF8 (>80°C). In the good solvent toluene, PF1‐11 and PF1‐15 form networks of cylindrical particles. The mesh size and the cylinder radius are smaller in 24°C toluene (60 nm, 0.5 nm) than in 60°C MCH (300 nm, 1–2 nm). Nuclear magnetic resonance spectra in toluene‐d₈ together with density functional theory calculations suggest higher torsion angles between polymer repeat units for PF6, PF8, and PF1‐11 (less planar conformation) and a gauche arrangement of the dihedral angles between the bridge carbon atom and the side chain methylene groups in PF1‐15. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2019 , 57, 826–837     

Effects of Thermal Annealing Upon the Nanomorphology of Poly(3‐hexylselenophene)‐PCBM Blends

Grazing incidence X‐ray diffraction (GI‐XRD) is used to characterize the crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3‐hexylselenophene) (P3HS) films and blend films of P3HS with [6‐6‐]‐phenyl‐C₆₁‐butyric acid methyl ester (PCBM) as a function of ‘step‐by‐step’ thermal annealing, from room temperature to 250 °C. The temperature‐dependent GIXRD data show how the melting point of P3HS crystallites is decreased by the presence of PCBM. P3HS crystallite domain sizes dramatically increase upon annealing to the P3HS melting temperature. The formation of well‐oriented HMW P3HS crystallites with the (100) plane parallel to the substrate (edge‐on orientation), when cooled from melt, are observed. We compare the behaviour of P3HS pure and blend films with that of poly(3‐hexyl)thiophene (P3HT) pure and PCBM blended films and suggest that the similar temperature dependent behaviour we observe may be a common to polythiophene and related polymers and their blends.

     

Small‐angle X‐ray scattering and polymer melting: A model study

Small‐angle X‐ray scattering (SAXS) gives information on lamellar stacks in semicrystalline polymers. SAXS experiments have been used to follow the melting transition that occurs over a temperature range of 10 °C or more. One common feature is the increase in the average period by 50–100% during the melting process, a change that is often attributed to sequential melting of crystals in the lamellar stack. A quantitative treatment shows that the scattering experiment indicates only the original period, not the average period that increases throughout sequential melting. With this model, I discuss the relation between structural parameters of the melting structure and quantities derived from the SAXS intensity, the correlation function, and the interface distribution function. Uncertainties persist in our understanding of polymer melting. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 2454–2460, 2001     

Time‐resolved crystallization study of absorbable polymers by synchrotron small‐angle X‐ray scattering

Changes in the lamellar morphology that occurred during the quiescent isothermal crystallization of absorbable poly(p‐dioxanone) (PDS) and PDS/poly(glycolide) block copolymer were studied by synchrotron small‐angle X‐ray scattering. Important morphological parameters such as the lamellar long period, the thicknesses of the crystal and amorphous phases, and the scattering invariant were estimated as a function of time, and trends observed over a wide range of experimental conditions are discussed. Thicker but more perfect lamellae were detected at higher crystallization temperatures. The breadth of the normalized semilog Lorentz‐corrected intensity peak systematically decreased with increasing temperature. In addition, the values of the crystallization half‐time and the Avrami exponent (n = 2.5), determined from the real‐time changes in the lamellar development, showed superb agreement with the bulk crystallinity data generated from other experimental techniques, such as calorimetry and dielectric relaxation spectroscopy. © 2000 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 153–167, 2001     

Electrogenerated Chemiluminescence of Pure Polymer Films and Polymer Blends

We recently reported the discovery of soliton‐like electrogenerated chemiluminescence (ECL) waves from pure conjugated polymer films and gold‐nanoparticles‐doped polymer films. In addition to a more detailed study of these polymer systems by changing the film thickness and the distribution of local leaks, we also apply the ECL wave phenomenon to polymer blends of conjugated and nonconjugated polymers. Poly(9,9‐dioctylfluorene‐co‐benzothiadiazole) (F8BT) is used as the active material that is oxidized and produces ECL with the presence of a co‐reactant, tri‐n‐propylamine (TPA). Several factors such as film thickness, artificial leaks, and solubility of doped polymers are examined for their effects on the ECL behavior. When polystyrene (PS), less soluble in the electrolyte, is blended with F8BT, dotted ECL signals are observed and transported as waves. When poly(methyl methacrylate) (PMMA), more soluble in the electrolyte, is blended with F8BT, PMMA serves as local scratches and ECL waves are triggered simultaneously from the whole film.

     

Characterization of trace embedded impurities in thin multilayer structures using synchrotron X‐ray standing waves

X‐ray standing wave (XSW) field generated under Bragg reflection condition in a periodic Mo/Si multilayer structure has been used to determine the concentration and location of various trace element contaminants embedded in different layers of that multilayer structure. We have used intense synchrotron X rays for XSW analysis. It is observed that various trace element impurities such as Cr, Fe, Ni and W get embedded unintentionally in the multilayer structure during the deposition process. Consequences of such impurity incorporation on the optical properties of the multilayer structure are discussed in hard and soft X‐ray regions. Present measurements are important in order to optimize the deposition methods on one hand and to better correlate the measured optical properties of a multilayer structure with theoretical models on the other. Copyright © 2010 John Wiley & Sons, Ltd.     

Microsecond X‐ray Absorption Spectroscopy Identification of CoI Intermediates in Cobaloxime‐Catalyzed Hydrogen Evolution

Rational development of efficient photocatalytic systems for hydrogen production requires understanding the catalytic mechanism and detailed information about the structure of intermediates in the catalytic cycle. We demonstrate how time‐resolved X‐ray absorption spectroscopy in the microsecond time range can be used to identify such intermediates and to determine their local geometric structure. This method was used to obtain the solution structure of the Co^I intermediate of cobaloxime, which is a non‐noble metal catalyst for solar hydrogen production from water. Distances between cobalt and the nearest ligands including two solvent molecules and displacement of the cobalt atom out of plane formed by the planar ligands have been determined. Combining in situ X‐ray absorption and UV/Vis data, we demonstrate how slight modification of the catalyst structure can lead to the formation of a catalytically inactive Co^I state under similar conditions. Possible deactivation mechanisms are discussed.     

Online wide‐angle X‐ray diffraction/small‐angle X‐ray scattering measurements for the CO2‐laser‐heated drawing of poly(ethylene terephthalate) fiber

Fiber‐structure‐development in the poly(ethylene terephthalate) fiber drawing process was investigated with online measurements of wide‐angle and small‐angle X‐ray scattering with both a high‐luminance X‐ray source and a CO₂‐laser‐heated drawing system. The intensity profile of the transmitted X‐ray confirmed the location of the neck‐drawing point. The diffraction images had a time resolution of several milliseconds, and this still left much room for improvement. Crystal diffraction appeared in the wide‐angle X‐ray images almost instantaneously about 20 ms after necking, whereas a four‐point small‐angle X‐ray scattering pattern appeared immediately after necking. With the elapse of time after necking, the four‐point scattering pattern changed into a meridional two‐point shape. © 2005 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 43: 1090–1099, 2005     

In Situ Synchrotron Radiation X‐Ray Microspectroscopy of Polymer Microcontainers

Direct, real‐time analytical techniques that provide high‐resolution information on the chemical composition and submicrometer structure of various polymer micro‐ and nanoparticles are in high demand in a range of life science disciplines. Synchrotron‐based scanning transmission X‐ray microspectroscopy (STXM) combines both local‐spot chemical information (assessed via near‐edge X‐ray absorption fine structure spectroscopy) and imaging with resolution of several tens of nanometers, and thus can yield new insights into the nanoscale properties of these materials. Furthermore, this method allows in situ examination of soft‐matter samples in aqueous/gaseous environments and under external stimuli, such as temperature, pressure, ultrasound, and light irradiation. This Minireview highlights some recent progress in the application of the STXM technique to study the temperature‐dependent behavior of polymer core–shell microcapsules and to characterize the physicochemical properties of the supporting shells of gas‐filled microbubbles in their natural hydrated state.     

First Preparations and Characterization of Conductive Polymer Crystalline Nanoneedles

Single crystalline nanoneedles of three families of the most studied conductive organic polymers - polythiophene, polyaniline and polypyrrole - were synthesized for the first time using an interfacial polymerization process that takes place with simultaneous crystallization. As the crystal growth is concurrent with polymerization, more ordered crystal packing can be expected. Most of the bulk conducting-polymer systems studied contains regions that are inhomogeneous. Single nanocrystals of conducting polymers have not been reported, although needle-shaped bulk crystals of the quarterphenyl cation radical salt have previously been studied. The investigation of processes in a nanodomain of a single crystal is critical in ascertaining the inherent electronic properties of polymer nanoelements. The organic conductive nanoneedles were characterized using TEM, HRTEM, electron diffraction, EDS, and EPR to establish their crystal structure and composition. Scanning tunneling microscopy/spectroscopy (STM/STS) investigation were conducted to examine their electronic behaviors, leading to the discovery of a field-induced conductance switching with response times on the millisecond level. The switch voltages are in the range of 3 to 4 volts in STM experiments, consistent with the trend of the band gap of the three polymers. The organic conductive nanoneedles with nano-tip having high density of mobile electron may serve as interesting elements for nanoscale electronics.     

X‐ray analysis of the bisphenol‐A‐type macrocyclic carbonate trimer

Collection of the single crystal X‐ray refraction data of the Bisphenol‐A‐type Macrocyclic oligocarbonate trimer (c‐3mer) at room temperature was carried out. The single crystal of the cyclic trimer that is recrystallized from ethyl acetate showed solvent molecule in the center of macro ring. Similarly, cyclic tetramer (c‐4mer) contained two p‐xylene molecules. Smaller dimer (c‐2mer) did not afford co‐crystal with solvent. Conformation of the carbonate in c‐3mer was s‐cis and s‐cis as in c‐4mer. A relationship between the conformation of carbonate and noncatalyst polymerization activity was not found. Copyright © 2000 John Wiley & Sons, Ltd.     

Surface roughness and electrical conductivity of the SnO2 ultra‐thin layers investigated by X‐ray reflectivity

Spray pyrolysis technique was applied to deposit two sets of ultra‐thin layers of tin dioxide (SnO₂). For the first and second sets, 0.01 and 0.05 molar precursor solutions were prepared, respectively. In both sets, utilizing the X‐ray reflectivity (XRR) technique, the effect of precursor concentration (PC) and precursor volume (PV) on the layer structure are investigated. The layer thickness of the samples, in each set, is a PV‐dependent parameter. For the same PV, samples with higher PC have a larger thickness and higher density. The electron density profiles deduced from XRR data analyses establish a link between measured values of sheet resistance and electron densities. The samples with higher PV and PC show less sheet resistance. The quantum size effect was utilized to show that the surface roughness for layers of more than almost 200 Å of samples in set two plays no role in the layer conductivity. Meanwhile, the same effect explains, adequately, the role of the surface roughness in the resistivity of the ultra‐thin layers in Set 1.