失调光学系统光线追迹公式

本文借助坐标变换，对现有的光线追迹公式进行改进，推导出一套失调光学系统的光线追迹公式。利用该套公式可以计算出光学系统存在各种失调情况下的像差值。     

任意折射率的三维离散空间光线追迹方法研究

介绍了Runge-Kutta光线追迹方法,并以此作为任意折射率介质中光线追迹基本手段;针对具有折射率任意分布性质并且离散的三维流场空间,建立了流场空间任意点的折射率和折射率梯度计算方法;在追迹过程中,提出了追迹步长根据当地折射率梯度和网格几何尺寸自适应调节的思想和方法,用于提高追迹的精度和效率。结果表明,建立的光线追迹方法适用于三维离散空间折射率任意分布的光线追迹,具有较高的精度和效率。     

基于元胞自动机的气动光学光线追迹算法

对于含激波等大密度脉动结构气动光学流场,沿着直线路径对折射率积分会带来较大的光程误差.因此,数值求解光线方程进行光线追迹是必要的.与数值求解光线方程不同,元胞自动机(cellular automata,CA)通过给定光线位置和方向变换规则来模拟光线在介质中传输路径.本文基于已有的实验测量、数值仿真所获得的高超声速流场密度场数据,分别采用数值求解光线方程法和CA光线追迹算法进行光线追迹,进而得到光线出射流场后的光程差.结果表明, CA算法对于二维气动光学流场中光线追迹的适用性,且较数值求解光线方程方法具有更高的效率.     

纯几何光线追迹的数值并行计算

二维光线追迹传输是光学传输工程模拟中的一个典型的数值计算问题，其计算非常复杂，随着离散化程度的增加，计算量也将极大地增加。考虑到更加复杂的全物理光线追迹模型传输结构和升级为三维光线追迹问题，其计算量更加庞大，计算时间更会剧增无疑，对此程序设计并行程序很有实际意义。     

劳厄弯晶光学特性的光线追迹研究

基于X射线几何衍射的晶层模型,编写了用于柱面弯曲劳厄晶体的光线追迹软件.程序主体用C语言编写,在VC++环境下运行.利用程序分别对衍射光方向和能量带宽两方面不同的项目进行追迹,通过模拟结果与理论计算和实验结果的对比,显示出很好的一致性,从而验证了程序在追迹衍射光衍射方向变化和能量变化方面的正确性.利用该光线追迹软件,追...     

反射镜热畸变对高能激光系统输出光束质量的影响

高能激光系统中,反射镜镜面热变形会使系统的输出光强和波前分布不均匀性加剧,从而导致输出光束质量的下降。建立了复杂镜面光线追迹的模型,使用Fresnel衍射公式和光线追迹的方法,研究了高能激光系统内通道不同数量22．5。反射镜对输出光束质量的影响。该方法和部分结果对高能激光系统激光器的优化设计,激光内通道冷却方式以及自适应光学校正能力设计参数的选取具有一定的参考价值。     

片状放大器泵浦腔屋脊形反射器性能分析

 用蒙特卡洛光线追迹法模拟和比较屋脊形截面反射器与平板反射器的光传输性能 ,分析反射器构型对泵浦腔性能的影响。三维光线追迹结果显示：在本文设定的腔体构型条件下, 屋脊形反射器腔的光传输效率可达63％,优于平板反射器腔的传输效率(η≤56%)。     

椭圆反射式波带片光线追迹算法

提出了一种基于光栅衍射原理的椭圆反射式波带片(ERZP)光线追迹算法,分析了ERZP的衍射聚焦和能谱分辨特性。基于该算法,将ERZP光线追迹模块添加到光学仿真软件X-LAB中,使之具有了计算量小、效率高等优点,这对含有ERZP光学系统的设计和数值模拟具有重要意义。     

基于子曲面分割和迭代的自由曲面光线追迹方法

根据光学自由曲面数学描述复杂,但面形较为平滑的特点,提出一种新的基于子曲面分割和迭代的自由曲面光线追迹方法。通过离散点分割形成子曲面阵列,根据三角形内角和定理确定目标子曲面,对目标子曲面进行切平面迭代完成光线追迹。通过数值仿真,采用所提方法分别对偶次非球面、双圆锥曲面、扩展多项式面和单透镜无像散系统进行光线追迹,并与ZEMAX追迹结果进行比对。结果表明:该方法在离散点采样密度很低的情况下（降低了计算机的内存消耗和运算时间）仍然可以保证光线追迹的精确性,与ZEMAX中光线和自由曲面交点的偏差达到10-3（nm）量级,出射光线角度的偏差达到10-3（）量级。     

用于空间相机设计的高精度光线追迹方法

空间光学系统在应用需求牵引下,向着大尺度、高精度、复杂化等方向发展,像差随着焦距与口径的增大呈幂指数增长,微小的误差扰动就会引起像质的大幅退化,因此对光线追迹算法的精度和稳定性提出了更严苛要求.本文从误差分析理论出发,提出了光线追迹精度表示模型,依据模型分析了计算过程误差来源,并设计了高精度光线追迹算法.数值仿真实验和典型空间相机设计案例结果表明,本文方法在精度上较原有方法提高了5—6个数量级,残差平均比Zemax小近3个数量级,数值稳定性也得到了极大提升.     

一种应用于LCoS光机的复眼照明系统仿真设计

复眼照明系统利用复眼透镜,可实现高亮度和较好的亮度均匀性,并且有较成熟的偏振处理方法,在投影系统特别是基于偏振光的投影系统中能提供比光棒照明系统更加高的亮度和好的均匀性的画面,使得光能利用率和图像均匀性有了较大的提高。在对复眼照明系统的原理进行分析的基础上,设计了一种用于投影光机的复眼照明系统,并用Matlab对该系统进行了光线追迹的仿真程序设计。对复眼照明系统的光线追迹进行了仿真。实际应用证明,在LCoS中采用本方案设计的照明系统比光棒照明系统具有更高的亮度和更好的均匀性。     

X‐ray spectra by means of Monte Carlo simulations for imaging applications

X‐ray tubes have a broad range of applications worldwide, including several techniques for atomic physics, like X‐ray fluorescence, as well as for medical imaging, like computed tomography. The performances of X‐ray imaging detectors have shown to be significantly sensitive to the incident beam spectrum. Therefore, an accurate knowledge of the X‐ray beam becomes necessary for the emission source characterization and the whole imaging process comprehension. Direct measurements and suitable Monte Carlo simulations may be used to establish the X‐ray spectra. Dedicated Monte Carlo simulation routines, based on the PENELOPE code, have been developed to determine the Bremsstrahlung X‐ray spectra generated by conventional X‐ray tubes. The simulated spectra have been validated by comparison with the corresponding experimental data showing an overall good agreement. The incorporation of a suitably designed virtual grid allowed to assess the angular distribution of Bremsstrahlung yield, showing a remarkable anisotropy. In addition, a dedicated program has been developed for virtual imaging, which enables to perform suitable X‐ray absorption contrast images. Also, the developed program includes a user‐friendly graphic interface to allow the upload of required input parameters, which include setup arrangement, beam characteristics, sample properties and image simulation parameters (spatial resolution, tracks per run, etc.). The software includes dedicated subroutines which handle the physical process from X‐ray generation up to detector signal acquisition. The aim of the developed program is to perform virtual imaging by means of absorption contrast and using conventional X‐ray sources, which may be a useful tool for the study the X‐ray imaging techniques in several research fields as well as for educational purposes. The performed comparisons with experimental data have shown good agreement. The obtained results for X‐ray imaging may constitute useful information for the comprehension and improvement of X‐ray image quality, like absorption contrast optimization, detail visualization, definition and detectability. Copyright © 2010 John Wiley & Sons, Ltd.     

光学仪器照明CAD软件设计

设计了一套照明CAD软件用于实现对光学仪器中照明光路照度分布模拟.对该照明CAD系统的光线追迹与光照度计算方法进行了理论探讨,其中在光照度计算方法中引入了线性同余组合发生器,大大提高了模拟的真实性.运用该软件对实际照明光路进行了分析,分析结果表明该软件获得了需要的照度分布模拟图,能较好地满足用户要求.     

Interferometric tolerance determination for a Dove prism using exact ray trace

We use exact ray trace to calculate the interferometric Dove prism tolerance to manufacturing errors. We model the manufacturing errors by modifying the position of the prism vertices. The normal to the prism faces establishes the direction of the rays. We determine the prism tolerance by analyzing the optical traversed path rays. We evaluate the change in the image quality introduced by the normal deviation. When the manufacturing tolerance is maintained within ±0.35 arc sec, the maximum wave-front deviation is better than λ/10 at 633 nm. We found that a Dove prism with such tolerance introduces an OPD of two orders of magnitude lesser than a commercial Dove prism. The exact ray trace accuracy of the developed program is validated with the commercially available optical-design program OSLO™. The calculated tolerance complements a previous analysis of a Dove prism for its implementation in a rotationally shearing interferometer.     

An interactive graphical user interface (GUI) for the CATGIXRF program – for microstructural evaluation of thin film and impurity doped surfaces

This paper is a continuation and extension of our earlier work (X‐ray Spectrom. 2010 , 39, 127–134, DOI:10.1002/xrs.1215) on the development of a software platform CATGIXRF, as a solution to provide non‐destructive evaluation of nanostructured materials. Here, we describe an interactive graphical user interface (GUI) for the CATGIXRF program. The newly developed GUI interface facilitates determination of microstructural parameters on angstrom length scale for the nanostructured thin layered materials using synchrotron as well as laboratory X‐ray sources. It allows combined analysis capabilities for both the X‐ray reflectivity and grazing incidence X‐ray fluorescence (GIXRF) data simultaneously, thus enabling us a greater sensitivity for the determination of microstructural parameters such as thickness, interface mixing, and roughness of a thin film medium with improved accuracies. The utility and various newly added salient features of the GUI‐CATGIXRF program are described by providing example calculations as well as by analyzing experimentally a few thin film structures with different surface‐interface properties. Copyright © 2016 John Wiley & Sons, Ltd.     

混浊介质多光子激发荧光显微成像的蒙特卡罗模拟

将蒙特卡罗方法与几何光线追踪技术相结合用于研究样品混浊特性对多光子激发蒌光显微成像的影响。推导了模拟多层样品显微成像的数学模型,给出了用程序框图表示的基本仿真系统骨架,对传统蒙特卡罗方法的改进有效地增强了对聚焦光束的模拟能力,初步的模拟结果说明了混浊介质散射特性对显微成像的显著影响。     

A background subtraction approach based on complex wavelet transforms in EDXRF

Subtracting the background accurately is one of the most important issues in energy‐dispersive X‐ray fluorescence (EDXRF) spectra processing. This paper presents a novel approach to perform background subtraction based on dual‐tree complex wavelet transform. Compared with real wavelet transform, the proposed method has some attractive properties, including a smooth, nonoscillating, and nearly shift‐invariant magnitude with a simple near‐linear phase encoding of signal shifts. Therefore, it outperforms real wavelet transform to decompose background into low‐frequency components. The effectiveness of the proposed approach is demonstrated via two simulated spectra with different kinds of backgrounds and one measured spectrum from an energy‐dispersive X‐ray spectrometer. Both simulated and experimental results prove that the proposed approach can subtract background in EDXRF spectra effectively. Copyright © 2014 John Wiley & Sons, Ltd.     

Optimisation du couplage entre une source et un faisceau de fibres optiques à l'aide d'un programme de tracé de rayons

This paper presents a study of the coupling between a source and a fibre bundle. A ray trace numerical simulation was used to examine the effects of geometrical and optical parameters of the concentrator and the fibre bundle. We compare the results of the computer program with measurements obtained in the case of a light emitting diode and a single lens.     

X射线管激发X荧光光谱连续本底扣除方法研究

X射线管是目前X射线荧光光谱分析中最常采用的激发源,它所产生的原级谱成为了X荧光光谱中本底成分的主要来源,在对这种光谱进行进一步的分析处理之前需要对其本底进行扣除,对本底估计的准确性直接影响后续处理步骤的效果。对射线管激发X荧光光谱的成分进行了分析,针对其本底特点构造了一种本底强度的估计方法,并根据实测谱线构建了理论测试谱线以便对光谱处理算法的效果进行评价。该方法利用测得X射线荧光光谱中不包含特征峰的谱段对X射线管原级谱造成的本底成分进行估计,使用只包含连续本底的谱段对整个测量谱段进行插值,从而避免了谱线特征峰重叠或对半高宽估计不当时所产生的影响。利用构建的测试光谱对SNIP法、傅里叶变换法和本文的本底估计方法的使用效果进行了比较,使用该方法估计的本底与理论本底更加接近。结果表明使用的方法对X射线管激发的X荧光光谱的本底估计准确,可以采用这种方法对连续本底进行扣除,在对实际测得的X射线荧光光谱的本底扣除中取得了较好的应用效果。     

Total reflection x‐ray fluorescence analysis—a review

Total reflection x‐ray fluorescence analysis (TXRF) is a special energy‐dispersive x‐ray analytical technique extending XRF down to the ultra trace element range. Detection limits of picograms or nanograms per gram levels are reached with x‐ray tube excitation. Using synchrotron radiation as excitation source, femtogram levels are detectable, particularly important for Si wafer surface analysis. TXRF is specially suited for applications in which only a very small amount of sample is available, as only a few micrograms are required for the analysis. In this review, an overview of theoretical principles, advantages, instrumentation, quantification and application is given. Chemical analysis as well as surface analysis including depth profiling and thin‐film characterization is described. Special research results on extension to low‐Z elements, excitation with synchrotron radiation and x‐ray absorption spectroscopy (XAS) for chemical speciation at trace levels are reviewed. Copyright © 2007 John Wiley & Sons, Ltd.