首页 | 本学科首页   官方微博 | 高级检索  
相似文献
 共查询到20条相似文献,搜索用时 15 毫秒
1.
王瑞敏  陈光德 《物理学报》2009,58(2):1252-1256
利用325nm紫外光激发,对不同组分的InxGa1-xN薄膜的喇曼散射谱进行了研究.在光子能量大于带隙的情况下,观察到显著增强的二阶A1(LO)声子散射峰.二阶LO声子峰都从一阶LO声子的二倍处向高能方向移动,移动量随样品In组分的增加而增大,认为是带内Frhlich相互作用决定的多共振效应引起的.分析了一阶LO声子散射频率和峰型与In组分的关系.在喇曼谱中观察到样品存在相分离现象,并与X射线衍射的实验结果进行 关键词xGa1-xN合金')" href="#">InxGa1-xN合金 紫外共振喇曼散射 二阶声子 相分离  相似文献   

2.
Multiphonon resonant Raman scattering in N‐doped ZnO films was studied, and an enhancement of the resonant Raman scattering process as well as longitudinal optical (LO) phonon overtones up to the sixth order were observed at room temperature. The resonant Raman scattering intensity of the 1LO phonon in N‐doped ZnO appears three times as strong as that of undoped ZnO, which mainly arises from the defect‐induced Raman scattering caused by N‐doping. The nature of the 1LO phonon at 578 cm−1 is interpreted as a quasimode with mixed A1 and E1 symmetry because of the defects formed in the ZnO lattice. In addition, the previously neglected impurity‐induced two‐LO‐phonon scattering process was clearly observed in N‐doped ZnO. Copyright © 2009 John Wiley & Sons, Ltd.  相似文献   

3.
Measurements of resonance Raman scattering in InAs at 77°K near the E1 gap have been extended to 2.73 eV. The peak in the resonance curve appears at about 2.66 eV, 70 meV above the optical gap, and gives a larger temperature shift of the resonance than previously reported. Resonance lineshapes are obtained for allowed TO and LO and for forbidden LO phonon scattering. The forbidden scattering intensities are consistent with selection rules predicted for linear q-dependent and/or surface electric field induced scattering mechanisms.  相似文献   

4.
We have observed electric field modulated Raman scattering by A1 LO phonons in CdS. The field induced scattering is observed with a geometry in which Raman scattering by A1 LO phonons is normally allowed. The interference of the field induced and allowed terms in the transition susceptibility leads to a modulated Raman scattering intensity proportional to the applied field. This is contrasted with data previously reported on field induced Raman scattering by E1 LO phonons in a configuration in which the Raman scattering is normally forbidden and in which there is no interference between linear wavevector dependent and field induced terms in the transition susceptibility. Electric field effects on Raman scattering by TO phonons and by 2 LO phonons is also discussed.  相似文献   

5.
The Raman spectra of Zn1?xCdxS crystals are studied. The narrow peak between TO (Γ) and LO (Γ) lines at x ? 0 is due to deffect-induced first order scattering. The anomalously intense peak in the same spectral region at x ? 1 is supposed to be result of resonance interaction between LO (Γ) phonon and quasilocalized vibrations.  相似文献   

6.
We use near‐resonance Raman scattering to investigate zinc oxide (ZnO) nanowires grown by chemical vapor deposition on Si substrates. We discuss the role of quasimode mixing on the wavenumber of the longitudinal optical (LO) bands, and we perform Raman measurements with different excitation powers to investigate possible laser heating effects. We find that in the Raman spectra of as‐deposited nanowires grown along the c‐axis of wurtzite, the LO bands are located slightly below the E1(LO) mode of bulk ZnO. We perform a calculation of the expected LO wavenumber in an ensemble of randomly oriented nanowires. Our analysis shows that light refraction, together with the orientation‐dependent cross‐section of the nanowires for the incoming light, counterbalances quasimode mixing effects in the as‐grown product, giving rise to LO bands that are barely redshifted relative to the E1(LO) mode. In the case of ZnO nanowires that have been mechanically removed (scratched) and subsequently deposited onto separate Si substrates, we observe clear laser‐induced heating. Temperature effects account well for the Raman wavenumber shifts displayed by the LO bands in the Raman spectra of the scratched nanowires. Copyright © 2010 John Wiley & Sons, Ltd.  相似文献   

7.
Low-temperature photoluminescence, exciton reflection, and multiphonon resonant Raman scattering spectra of Ni-and Co-doped Zn1−x MnxTe crystals were investigated. Intense emission occurs in a broad spectral region (1100–17 000 cm−1) in the crystals containing Ni atoms. It is caused by intracenter transitions involving Mn2+ ions and transitions between the conduction band and a level of the doubly charged acceptor. The features of the exciton photoluminescence and multiphonon resonant Raman scattering involving longitudinal-optical (LO) phonons at various temperatures are investigated. The insignificant efficiency of the localization of excitons on potential fluctuations in the Zn1−x MnxTe:Co crystals is established. A temperature-induced increase in the intensity of the 5LO multiphonon resonant Raman scattering line due to the approach of the conditions for resonance between this line and the ground exciton state is observed in these crystals. Fiz. Tverd. Tela (St. Petersburg) 40, 616–621 (April 1998)  相似文献   

8.
Wavelength derivative Raman spectra of five mixed crystals of K1–x Na x TaO3 have been measured at room temperature (RT) and liquid Nitrogen temperature (LNT). The results show three types of structures: a) two structures resulting from first order Raman scattering made allowed by the displacement of Na from the center of inversion site. One of these structures strongly softens as the crystal temperature approaches the ferroelectric phase transition. b) two structures that correspond to first order Raman scattering by the LO3 and TO4 zone center modes. These are observed only in K0.35Na0.65TaO3 at LNT. c) structures that correspond to second order Raman scattering. Except for four lines the main effect of Na concentration is to shift the energy of the lines. Comparison of the Na concentration and pressure dependences of the energies of these lines shows that the average change in the volume of the unit cell resulting from the replacement of K by Na has a dominant effect on the energy shift of the lines. Four of the lines undergo a large change in shape and intensity. At present, no definite explanation of this result can be made.  相似文献   

9.
Raman scattering has been used to characterize the effects of processing techniques on the photosensitive area of GaAs planar photoconductors. The longitudinal optic (LO) phonon observed in the first-order Raman spectra was studied to probe the consequences of both chemical and plasma etching on the crystalline quality of an n-doped GaAs photosentitive area. This method has also been used to examine the stress at the interface of a Si3N4 film and an n-doped GaAs surface. For this purpose, three specially designed GaAs planar photoconductors (SN 353, AN 344, SN 344) have been fabricated. Electrical measurements on the photoconductors support the results of Raman study. First, as expected, increasing the number of processes leads to slightly poorer electrical performance. Secondly, a significant strain-induced shift in the GaAs LO phonon frequency has been observed under the Si3N4 film for the AN 344 photoconductor. However, the electrical performances of this device clearly indicate no dramatic change in the value of the n-doped surface potential.  相似文献   

10.
The dependence of the shape and the intensity of the first order resonant Raman line 1LO on the direction and magnitude of phonon wave vector has been investigated in CdS crystals. Comparison of RRS in different orientations shows that in the most pure samples the phonon wave vector is determined, to a great extent, by the momentum conservation law. In Ni doped crystals one can observe violation of momentum conservation, resulting in a sharp increase of 1 LO intensity. The shape of the 1 LO line in such sample does not depend on the experimental orientation. For the first time the dependence of the Raman intensity on the scattering angle has been observed by the comparison of forward and backward scattering spectra. Observation of this dependence shows that the free excitons are the dominating intermediate states in the resonant Raman scattering in A2B6 compounds.  相似文献   

11.
韩茹  杨银堂  柴常春 《物理学报》2008,57(5):3182-3187
研究了利用离子注入法得到的掺氮n-SiC拉曼光谱. 理论线形分析表明,与4H-SiC相比,6H-SiC中LO声子等离子体激元耦合模(LOPC模)拉曼位移随自由载流子浓度变化较小. 5145nm激发光下得到的电子拉曼散射光谱表明,k位处由1s(A1)到1s(E)的能谷轨道跃迁带来的拉曼谱6H-SiC中有四条,4H-SiC中有二条;高频6303及635cm-1处观察到的谱线被认为与深能级缺陷有关. 最后,利用纤锌矿型结构二级拉曼散射选择定则指认了6 关键词: 碳化硅 电子拉曼散射 轨道能谷分裂 倍频谱  相似文献   

12.
Defect induced first order resonance Raman spectra have been measured on cleaved single crystals of intermediate valent TmxSe, where the Tm to Se ratio x varied between 0.87 and 1.05. A softening of the zone boundary LO phonons linear in the degree of valence mixing was observed. On polished samples an additional scattering peak at 60 cm-1 was found. Its intensity varies with stoichiometry concomitant with the degree of valence mixing and it disappears in the trivalent Tm3+0.87Se.  相似文献   

13.
Raman scattering spectroscopy has been used for the characterization of zinc oxide nanoparticles obtained by mechanical activation in a high‐energy vibro‐mill and planetary ball mill. Raman modes observed in spectra of nonactivated sample are assigned to Raman spectra of the ZnO monocrystal, while the spectra of mechanically activated samples point out to the structural and stoichiometric changes, depending on the milling time and the choice of equipment. Observed redshift and peak broadening of the E2high and E1 (LO) first‐order Raman modes are attributed to increased disorder induced by mechanical milling, followed by the effects of phonon confinement due to correlation length decrease. The additional modes identified in Raman spectra of activated ZnO samples are related to the surface optical phonon modes, due to the intrinsic surface defects and presence of ZrO2as extrinsic defects introduced by milling in zirconia vials. Copyright © 2009 John Wiley & Sons, Ltd.  相似文献   

14.
The following anomalies in the (GaSb)1?xGe2x Raman data are simply explained using an alloy theory and an order-disorder phase-transition model: (i) the discontinuous dependence on x of the Ge-like LO mode, (ii) the anomalous LOTO splitting, (iii) the discontinuous change in the derivative with respect to x of the GaSblike LO line width, (iv) the maximum as a function of x of the Ge-like LO line width, and (v) the asymmetries of the LO lines.  相似文献   

15.
Gallium arsenide (GaAs) cells have been in the race with silicon single‐crystal cells for the highest efficiency photovoltaic devices. The annealed, irradiated Schottky barrier (SB) solar cells were characterised using micro‐Raman spectroscopy at three different regions: namely, at the (1) ohmic contact region, (2) unirradiated region and (3) irradiated region. We also present a micro‐Raman study of the damage process in annealed GaAs SB solar cells bombarded by high‐energy ions. A Gaussian line shape was fitted to the Raman spectra of the longitudinal optical phonon A1(LO), and parameters such as intensity, full width at half maximum (FWHM) and the area under the peak were obtained for the different annealing temperatures. Biaxial stress (σ), carrier concentration (n), depletion length (Ld), dislocation velocity (ν) and life time of the first‐order optical phonon (τ) of the A1(LO) mode of the irradiated region of the samples annealed at different temperatures were calculated. Copyright © 2010 John Wiley & Sons, Ltd.  相似文献   

16.
Hydrostatic pressure has been used to tune in resonance Raman scattering (RRS) in bulk GaAs. Using a diamond anvil cell, both the photoluminescence peak (PL) and the 2 LO and LO-phonon Raman scattered intensities have been monitored, to establish RRS conditions. When theE 0 gap of GaAs matchesħω S orħω L, the 2 LO and LO-phonon intensity, respectively, exhibit resonance Raman scattering maxima, at pressures determined byħω L. With 647.1 nm radiation (ħω L = 1.916 eV), a sharp and narrow resonance peak at 3.75 GPa is observed for the 2 LO-phonon. At this pressure the 2 LO-phonon goes through its maximum intensity, and falls right on top of the PL peak, revealing thatħω S(2 LO) =E 0. This is the condition for “outgoing” resonance. Experiments with other excitation energies (ħω L) show, that the 2 LO resonance peak-pressure moves to higher pressure with increasingħω L, and the shift follows precisely theE 0 gap. Thus, the 2 LO RRS is an excellent probe to follow theE 0 gap, far beyond the Γ-X cross-over point. A brief discussion of the theoretical expression for resonance Raman cross section is given, and from this the possibility of a double resonance condition for the observed 2 LO resonance is suggested. The LO-phonon resonance occurs at a pressure whenħω LE 0, but the pressure-induced transparency of the GaAs masks the true resonance profile.  相似文献   

17.
Raman scattering measurements have been performed on In1?xGaxP (0.62?x?1) over the entire frequency range of first and second order scattering. Besides the already known disorder activated band between the LO(Γ) and TO(Γ) modes a new disorder activated band is found in the region of transverse acoustic phonons around 87 cm-1. The position of the new band shifts only slightly with composition while its strength and line-shape change.  相似文献   

18.
A combination of studies on photoluminescence and resonant Raman scattering in N-doped ZnO thin films were carried out at room temperature. In the photoluminescence spectra, a transformation of radiative recombination mechanism from free-exciton to donor-acceptor-pair transition was observed. An enhancement of resonant Raman scattering processes as well as longitudinal optical (LO) phonon overtones up to the sixth order were observed in the Raman spectra. Also, the nature of the 1LO phonon underwent a transformation from a pure A1(LO) mode to a quasimode with mixed A1 and E1 symmetry. The underlying mechanisms accounting for the influences of N doping on the optical properties of ZnO were related to the incorporation of extrinsic defects in the crystal lattice.  相似文献   

19.
We present X‐ray diffraction and Raman spectroscopy studies of Ni‐doped ZnO (Zn1−xNixO, x = 0.0, 0.03, 0.06, and 0.10) ceramics prepared by solid‐state reaction technique. The presence of the secondary phase along with the wurtzite phase is observed in Ni‐doped ZnO samples. The E2(low) optical phonon mode is seen to be shifted to a lower wavenumber with Ni incorporation in ZnO and is explained on the basis of force‐constant variation of ZnO bond with Ni incorporation. A zone boundary phonon is observed in Ni‐doped samples at ∼130 cm−1 which is normally forbidden in the first‐order Raman scattering of ZnO. Antiferromagnetic ordering between Ni atoms via spin‐orbit mechanism at low temperatures (100 K) is held responsible for the observed zone boundary phonon. Copyright © 2008 John Wiley & Sons, Ltd.  相似文献   

20.
Nanocrystalline Mn‐doped zinc oxides Zn1−xMnxO (x = 0–0.10) were synthesized by the sol–gel technique at low temperature. The calcination temperature of the as‐prepared powder was found at 350 °C using differential thermal analysis. A thermogravimetric analysis showed that there is a mass loss in the as‐prepared powder till 350 °C and an almost constant mass till 800 °C. The X‐ray diffraction patterns of investigated nanopowders calcined at 350 °C correspond to the hexagonal ZnO structure without any foreign impurities. The average grain size of the nanocrystal that was observed around ∼25–40 nm from transmission electron microscopy matched well with the crystallite size calculated from the line shape of X‐ray diffraction. The chemical bonding structure in Zn1−xMnxO nanopowders was examined using X‐ray photoelectron spectroscopy techniques, which indicate substitution of Mn2+ ions into Zn2+ sites in ZnO lattice. Micro Raman spectroscopy confirmed the insertion of Mn ions in the ZnO host matrix, and similar wurtzite structure of Zn1−xMnxO (x < 10%) nanocrystals. Temperature‐dependent Raman spectra of the nanocrystals displayed suppression of luminescence and enhancement in full width at half maximum in pure ZnO nanocrystals with increase in temperature, which suggests an enhancement in particle size at elevated temperature. Copyright © 2009 John Wiley & Sons, Ltd.  相似文献   

设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号