BT-99型水质分析仪的常见故障及故障排除方法

介绍BT-99型水质分析仪在使用过程中经常出现的故障,分析了故障产生的可能原因,并提出了故障排除方法。     

ZTGC-900D型气相色谱仪的常见故障及其排除

介绍ZTGC-900D型气相色谱仪使用过程中出现的几起故障,对故障进行分析、诊断,提出了故障的排除方法。     

微波消解仪中光纤传感器的故障排除

对MARS-5型微波消解仪在正常使用过程中报警、显示"RTP-300 Plus ERROR"、仪器不能工作的故障原因进行了分析,提出了可自行处理的故障排除方法.为避免类似故障发生,提出了操作中的注意事项.     

气相色谱-质谱联用仪常见故障的排除

介绍气相色谱-质谱联用仪的常见故障：与质谱仪调谐相关的故障、与校准和灵敏度相关的故障及与色谱图和质谱图相关的故障，给出了产生故障的可能原因，提出了故障排除的方法。     

氢火焰离子化检测器凝集物引发的噪声故障分析

GC-9790型气相色谱仪氢火焰离子化检测器的燃烧室被高沸点凝集物污染,在直流电场作用下,持续发生电离反应,形成约4000μV的基线噪声。对故障原因和故障产生机理进行了分析,提出了故障排除方法。     

原子荧光光度计检定/校准的影响因素

主要介绍了原子荧光分光光度计检定/校准的过程中常见故障,如联机故障、载气故障、点火故障和自动进样器故障等,针对无信号强度、荧光强度偏低、空白强度较高、仪器不稳定和重复性较差、线性不好等常见问题进行剖析并提出相应解决方法,根据工作经验和仪器工作原理提出了原子荧光光度计检定/校准过程中仪器参数和溶液配制方法。     

高效液相色谱仪故障排除两例

在高效液相色谱仪使用过程中,输液系统混入气泡及输液泵无法运行是两种常见故障,其中输液系统混入气泡的故障较难排除。结合工作经验,分析了故障产生的原因,并提出了故障排除方法。     

SW-Ⅱ型数显温控XL-Ⅰ箱形高温炉的故障及维修方法

运用电学的基本原理,对数显温控高温炉的故障进行了分析,在实践中总结出各种故障的发生原因、特征现象及解决方法。     

NexION 300X型电感耦合等离子体质谱仪的日常维护及故障排除

在使用PE公司生产的Nex ION 300型电感耦合等离子体质谱仪(ICP–MS)过程中,出现了点不着火、易熄火、检测灵敏度低、精密度不好等故障,分析了故障产生的原因,提出了故障排除方法。对该仪器的日常维护提出了建议。     

ZSX Primus Ⅱ型X射线荧光光谱仪故障处理与维护

介绍了日本理学ZSX Primus Ⅱ型X射线荧光光谱仪使用中所出现的几例故障现象,对其产生的原因进行了分析,归纳总结了故障排除的方法与过程。     

Measurement of lattice displacements at planar defects in 2H and 18R martensites.

A review of transmission electron microscopy studies of planar defects in 18R and 2H martensites in Cu-Zn-Al alloys is presented. The non-basal plane faults observed in the 2H structure, the F1 faults, show two kinds of dislocations at their ends. In contrast, two types of non-basal plane faults are observed in the 18R structure, Fo and Fx faults. The non-basal plane faults can be composed of segments of Fo and Fx faults. Six types of imperfect dislocations appear, depending on the type of basal plane fault ending at the non-basal plane fault. The Burgers vectors of all these dislocations have been determined from the contrast analysis of the images and HREM observations.     

理学D/MAX—1400全自动X射线衍射仪真空及其控制电路故障部位判定和排除

在简要介绍真空控制流程图的基础上,选择了TMP轴承受损、TMP叶轮打烂、电路参数改变TMP加速过快OLL报警烧保险、转靶磁密封不良VAC1报警、供电缺相过流保护和真空控制放大器自激离子规衰老等6个有代表性的、已排除的故障实例进行深入分析研究,提出了排除故障的思路和方法。     

Digisorb 2600型物理吸附仪真空系统检漏、故障分析及对策

就Ｄｉｇｉｓｏｒｂ２６００型物理吸附仪的真空系统拟出了表格形式的基本检漏步骤，并在此基础上详细介绍了几例特殊真空故障的查找，分析及解决方法。     

BAIRD Ps-6真空型电感耦合等离子发射光谱仪的故障分析与对策

对Ｐｓ－６型光谱仪作了简介的基础上，从联锁保护电路入手，选择了射频发生器。相检测电路，气路，真空系统，光路准直监视系统，光电倍增管和高压电路等八例有代表性，。已排除的故障实例深入进行了研究，提出了排除故障的思路与办法。     

Waters ALC/GPC 150c高温凝胶渗透色谱仪的故障分析与处理

在简要介绍ALC/GPC 15 0c高温凝胶渗透色谱仪的基础上 ,选择了旋转空气分配阀、泵的控制电路、示差折光检测器、信号测量、微机控制和电源等关键部件所产生的十个有代表性的、已排除的故障实例进行深入分析研究 ,提出了排除故障的思路和办法     

X-ray diffraction from faulted cellulose I constructed with mixed Iα–Iβ stacking

Cellulose from higher plants is usually thought to be a composite of the Iα and Iβ allomorphs, with predominance of the latter. Instead of the pure allomorphs, this article proposes that Iα and Iβ stacking patterns coexist within each crystallite, forming a type of crystallographic defect known as stacking fault. Models of faulted crystallites are constructed with mixed Iα–Iβ stacking and their X-ray diffraction intensities are calculated using the Diffracted Intensities From Faulted Xtals (DIFFaX) computer program. Simulated powder diffractograms from faulted crystallites compare favorably with experimental data, modifying diffractogram regions that have been misfit by models based on the Iβ crystal structure. Calculations also reveal that stacking faults generate a signature in the (hkl) dependence of diffraction line broadening, guiding further experimental verification and eventual quantification of stacking faults. Our findings bring an alternative view of native cellulose polymorphism and suggest that the proposed stacking faults are ubiquitous crystallographic defects in cellulose from higher plants.     

JEOL JSM-35C型扫描电子显微镜故障及排除

在介绍真空系统联锁控制流程图的基础上，选择了粗真空系统抽力变差、进样系统泄漏、真空联锁保护电路误动作、二次电子检测高压电路故障、二次电子检测电路故障、倍率放大器故障和图象放大倍率校正等七个有代表性的、已排除的故障实例进行深入分析研究，提出排除故障的思路和办法。     

HV-4B型碳硫分析仪的故障及维修

介绍HV-4B型碳硫分析低度的常见故障、故障产生的原因及排除方法。     

Solid state structural changes at high temperatures in cadmium iodide

Further experiments on the heating of polytypic crystals of cadmium iodide at high temperatures have yielded more information on the kinetics of stacking faults existing in the crystals and their role in structural transformations and polytype formation. The streaking of X-ray reflections progressively decreases in successive heating runs, showing that random stacking faults resulting from partial dislocations are gradually eliminated and that no fresh dislocations are created by heating. On the other hand, the extent of arcing of the reflections always increases, implying that more dislocations, both unit and partial, which had been earlier held up against some obstacles, move into existing tilt boundaries. The arc stays practically unchanged during further heating runs, thus indicating that the process of heating does not produce fresh dislocations and that no further significant movement of the dislocations takes place. The common type 4H has been established as the phase of maximum thermodynamic stability. The successive phase transformations in a crystal have revealed a systematic elimination of the stacking faults. The long period polytypes have been found to be thermally more stable than the short period polytypes.