Revisiting the form of dead time corrections for neutron coincidence counting

A standard nondestructive assay technique for determining the mass of plutonium in an item is passive neutron coincidence counting. In passive neutron coincidence counting, the dead time or rate loss corrections for the singles and doubles neutron counting rates are routinely made using empirical relationships that are based on the design and performance of the individual counter used to make the measurements. The empirical methods were developed ahead of any supporting theory for dead time losses and have worked well to date for the majority of safeguards measurement scenarios. Modern applications using highly efficient systems with short neutron lifetimes together with the challenges posed by highly multiplying items mean dead time corrections of higher fidelity are needed. While many attempts have been made to develop dead time corrections that are based on the physical principles of the measurements being performed, these corrections have often been found to be difficult to implement in a real system. For instance, Matthes and Haas developed an approach in 1985 which did not gain favor largely because the form of the doubles correction apparently required numerical integration which was difficult to implement with the computer technology of that time. A recent review into the approach that was developed by Matthes and Haas has determined that a straightforward analytical expression can be derived for the doubles correction that is similar to the singles rate correction that was developed in their original work. An analysis of the expressions is presented here to show how they relate to the traditional empirical methods. Further, we illustrate their implications and limitations. For instance the empirical methods do not address within burst losses i.e. rate related losses due to the correlated neutron bursts from fission, whereas the Matthes and Hass expression for singles counting does exhibit such an effect.     

Energy‐dependent dead‐time correction in digital pulse processors applied to silicon drift detector's X‐ray spectra

Dead‐time effects in X‐ray spectra taken with a digital pulse processor and a silicon drift detector were investigated when the number of events at the low‐energy end of the spectrum was more than half of the total, at counting rates up to 56 kHz. It was found that dead‐time losses in the spectra are energy dependent and an analytical correction for this effect, which takes into account pulse pile‐up, is proposed. This and the usual models have been applied to experimental measurements, evaluating the dead‐time fraction either from the calculations or using the value given by the detector acquisition system. The energy‐dependent dead‐time model proposed fits accurately the experimental energy spectra in the range of counting rates explored in this work. A selection chart of the simplest mathematical model able to correct the pulse‐height distribution according to counting rate and energy spectrum characteristics is included.     

Dead time corrections to photon counting statistics II: Quantum theory

The recent formulation of the quantum theory of photodetection, based on the quantum theory of continuous measurements, is extended to the case of a (nonideal) detector which has non-zero dead time. A general result is proven which expresses the dead time modified counting statistics in terms of the counting statistics of anassociated ideal detector. As an illustration, the dead time corrections to the counting statistics of a single-mode free field are worked out, and these corrections are shown to be identical in form to the dead time corrections for a classical optical field of constant intensity.     

Empirical dead‐time corrections for synchrotron sources

An experimental comparison of models for performing dead‐time corrections of photon‐counting detectors at synchrotron sources is presented. The performance of several detectors in the three operating modes of the Advanced Photon Source is systematically compared, with particular emphasis on asymmetric fill patterns. Several simple and well known correction formulas are evaluated. The results demonstrate the critical importance of detector speed and synchrotron fill pattern in selecting the proper dead‐time correction.     

Correction of ultraviolet single photon counting image distortion

Single photon counting imaging technology has been widely used in space environment detection, astronomy observation, nuclear physics, and ultraweak bioluminescence. However, the distortion of the single photon counting image will badly affect the measurement results. Therefore, the correction of distortion for single photon counting image is very significant. Ultraviolet single photon imaging system with wedge and strip anode is introduced and the influence factor leading to image distortion is analyzed. To correct original distorted image, three different image correction methods, namely, the physical correction, the global correction, and the local correction, are applied. In addition, two parameters, i.e, the position index and the linearity index, are defined to evaluate the performance of the three methods. The results suggest that the correction methods can improve the quality of the initial image without losing gray information of each counting light spot. And the local correction can provide the best visual inspections and performance evaluation among the three methods.     

单光子计数探测系统的线性性能研究

利用单光子计数技术对微弱光进行探测具有与其他模拟法相比的多个优势,如有好的抗漂移性、高的信噪比、较宽的线性区等。线性性能是探测器的基本性能之一,利用叠加法和距离平方反比法测量单光子计数探测系统的线性范围,当非线性因子为0.05时,利用叠加法实验测得系统线性响应计数率为3.9×10~5 Counts/s,利用距离平方反比法实验测得系统线性响应计数率为5×10~5 Counts/s。结果表明,两种方法测得响应线性度一致性较好。分析了电子学系统的漏计误差对探测器系统线性范围的影响。实验表明,通过缩短电子学系统中甄别器的死区时间(td)可以提高系统的线性范围。     

Dead time corrections to photon counting statistics I: Classical theory

A complete solution is given to the problem of calculating the dead time corrections to the counting statistics of an arbitrary doubly stochastic Poisson process with a non-negative random intensity function. It is shown that for the particular case of an optical field with constant intensity, the general dead time modified counting formula leads to a corrected version of results earlier derived by Bedard.     

用于脉冲星导航的X射线光子计数探测器研究

研制了用于脉冲星导航的X射线光子计数探测器原理样机, 该探测器主要由对X射线灵敏度较高的CsI光电阴极、微通道板电子倍增器和收集阳极组成. 对X射线光子计数探测器灵敏度、时间分辨率和整个系统的死时间进行了测试, 实验结果表明该探测器的灵敏度在5 keV时可达5.2× 10³ A/W, 时间分辨率可达到1.1 ns, 系统整体的死时间为100 ns. 关键词： 脉冲星导航 光子计数探测器 灵敏度 时间分辨率     

Counting‐loss correction for X‐ray spectroscopy using unit impulse pulse shaping

High‐precision measurement of X‐ray spectra is affected by the statistical fluctuation of the X‐ray beam under low‐counting‐rate conditions. It is also limited by counting loss resulting from the dead‐time of the system and pile‐up pulse effects, especially in a high‐counting‐rate environment. In this paper a detection system based on a FAST‐SDD detector and a new kind of unit impulse pulse‐shaping method is presented, for counting‐loss correction in X‐ray spectroscopy. The unit impulse pulse‐shaping method is evolved by inverse deviation of the pulse from a reset‐type preamplifier and a C‐R shaper. It is applied to obtain the true incoming rate of the system based on a general fast–slow channel processing model. The pulses in the fast channel are shaped to unit impulse pulse shape which possesses small width and no undershoot. The counting rate in the fast channel is corrected by evaluating the dead‐time of the fast channel before it is used to correct the counting loss in the slow channel.     

Complete single-photon counting and timing module in a microchip

A complete module for single-photon counting and timing is demonstrated in a single chip. Features comparable with or better than commercially available macroscopic modules are obtained by integration of an active-quenching and active-reset circuit in complementary metal-oxide semiconductor technology together with a single-photon avalanche diode (SPAD). The integrated SPAD has a 12-microm-diameter sensitive area and operates with an overvoltage above breakdown adjustable up to 20 V. With a 5-V overvoltage the photon detection efficiency peaks above 40% around 500 nm, and the dark-counting rate is lower than 600 counts/s at room temperature. The overall counting dead time is 33 ns.     

引入源-样品距离影响的主动中子多重性质量反演公式北大核心CSCD

主动中子多重性计数测量方法是常用的核材料质量无损测量方法,已广泛应用于核材料衡算、核安保测量与军控核查等领域。我们通过对JMCT中子-光子输运程序的二次开发,实现了对经典点模型铀样品质量估算实验的数值模拟,并提出了改进的铀样品质量计算公式。该算法可以显著降低本实验中源-样品耦合与源中子反照等作用对铀样品质量估算精度的影响。建立了主动中子多重性计数测量探测系统模型和32个铀样品半球壳模型,模拟得到了与铀样品距离不同的DT源和AmLi源主动中子多重性计数,利用数值模拟手段检验了质量估算算法的有效性。数值模拟结果表明,改进的铀质量估算算法可以使质量估算的平均偏差率降低到10%以下。     

On the effect of dead time on the counting statistical error

In X‐ray intensity measurements, the counting statistical error is typically calculated as the square root of the number of counts collected. This, however, is an approximation in the sense that the effect of the dead time in the counting process has been ignored. In this work, the equations for calculation of the counting statistical error in X‐ray fluorescence measurements will be derived, including the effect of the dead time of the counting chain. Copyright © 2016 PANalytical B.V. X‐Ray Spectrometry Published by John Wiley & Sons Ltd.     

多击响应的三层阳极丝位置灵敏探测器及其信号重整

最新发展起来的三层延迟线阳极, 即Hexanode与标准的螺旋状延迟线(HDL)阳极相比, 对多击事件有较好的响应能力. 它与一对微通道板组合在一起构成的位置灵敏探测器能够响应同时或短时间间隔内到达探测器的多个粒子, 并给出粒子的全部动量信息. 针对Hexanode在响应多个同时或短时间间隔内到达的粒子时出现的信号丢失问题, 自行编写了一个信号重整程序. 经过此程序的处理后, 多击响应位置灵敏探测器的死时间只存在于两个粒子同时到达探测器的同一位置时(在一定时间及位置范围内). 在最近完成的使用Hexanode探测器的近阈值e+He→3e+He⁺⁺中, 获得了很好的结果.     

采用Si薄膜的光子计数成像系统性能的研究

在陶瓷基底上利用电子束蒸镀方法制备了Si薄膜,用作感应读出方式光子计数成像系统的电荷感应层,并研究了薄膜的结构特征和表面形态.X射线衍射(XRD)测试和场发射扫描电子显微镜(FESEM)图像表明,沉积的Si薄膜为无定形态,由于陶瓷晶界的存在,薄膜较粗糙.搭建了相应的实验系统,对比了采用不同厚度Si薄膜时系统的空间分辨率、计数率、脉冲高度分布曲线等,发现薄膜的厚度对探测器的计数率影响较大.此外,实验还对比了采用相同电阻值的Si薄膜和常用的Ge薄膜时系统的性能.研究表明,采用Si薄膜时系统的畸变较小、计数率高     

时间分辨光子计数系统的研究和应用

对由SPCM-AQR-14和MCS组成的时间分辨光子计数系统进行了研究,分析了SPCM和MCS的工作原理及主要特性.利用该系统对磷光物质和洋葱的延迟发光进行了测量,对它们的光子计数率曲线进行拟合,发现其光强衰减符合双曲线规律.     

Performance of a four‐element Si drift detector for X‐ray absorption fine‐structure spectroscopy: resolution, maximum count rate,and dead‐time correction with incorporation into the ATHENA data analysis software

The performance of a four‐element Si drift detector for energy‐dispersive fluorescence‐yield X‐ray absorption fine‐structure measurements is reported, operating at the National Institute of Standards and Technology beamline X23A2 at the National Synchrotron Light Source. The detector can acquire X‐ray absorption fine‐structure spectra with a throughput exceeding 4 × 10⁵ counts per second per detector element (>1.6 × 10⁶ total counts per second summed over all four channels). At this count rate the resolution at 6 keV is approximately 220 eV, which adequately resolves the Mn Kα and Kβ fluorescence lines. Accurate dead‐time correction is demonstrated, and it has been incorporated into the ATHENA data analysis program. To maintain counting efficiency and high signal to background, it is suggested that the incoming count rate should not exceed ～70% of the maximum throughput.     

Electron and Chemical Kinetics in the Low-Pressure RF Discharge Etching of Silicon in SF6

Monte Carlo simulation and Boltzmann equation solutions have been used to study the electron kinetics. All electronic excitation of SF6 is assumed to be dissociative in analogy with the known product channels in ionization and multiphoton dissociation. The electric-field-to-gas-density ratios are high (E/n ? 1000 Td, where 1 Td (Townsend) = 1 × 10-17 V . cm2) in low-pressure (p < 0.3 torr) radiofrequency (RF) discharges. At these high E/n values, the electron energy relaxation time is much shorter than the 74-ns period at 13.56 MHz. Furthermore, the time scale of the chemical kinetics is much longer than the period of the applied RF voltage. Therefore the electron energy distribution can "track" the time-varying electric field, and time- and space-averaged rate coefficients can be used in chemical kinetics models. A rate equation model has been used to study the chemical kinetic processes. Electron-impact dissociation and ionization are the dominant sources of chemically active species. An electron density of 1 × 108 cm-3 is estimated from the known average values of E/n and the discharge input power. Two limiting cases are studied for the positive and negative ion diffusion losses: a) trapped negative ions and positive ion loss at the ambipolar diffusion rate; and b) positive and negative ion losses at the free diffusion rates. Neutral particle diffusion losses are estimated by using an effective diffusion length which takes surface reflection into account and increases as the surface reflection probability increases.     

Automation system for optical counting of nuclear tracks

An automation system consisting of the microscope, video camera and Pentium PC with frame recorder was created. The system provides counting of nuclear tracks on the SSNTD surface with a resolution of 752 × 582 points, determination of the surface area and main axis of the track. The pattern recognition program was developed for operation in Windows 3.1 (or higher) ensuring a convenient interface with the user. In a comparison of the results on automatic track counting with the more accurate hand mode it was shown that the program enables the tracks to be detected even on images with a rather high noise level. It ensures a high accuracy of track counting being comparable with the accuracy of manual counting for densities of tracks in the range of up to 2·10⁵ tracks/cm². The automatic system was applied in the experimental investigation of uranium and transuranium elements.     

A VUV isochromat spectrometer for surface analysis

A vacuum ultraviolet isochromat spectrometer employing an energy selective Geiger-Müller photon counter is described. The mean energy of the spectrometer is 9.7 eV with a standard deviation of ±0.23 eV. Together with the thermal energy distribution of the electrons emitted from a directly heated tungsten cathode, an overall resolution of ±0.33 eV is obtained. Pulsed operation of the x-ray tube avoids additional broadening due to the voltage drop across the filament. Further, pulsed operation of the accelerating voltage is employed to avoid counting losses due to the relatively large dead time of the radiation detector. Operating frequencies of up to 2 kHz are possible. With sensitivities of typically 10⁷ pulses per Coulomb, the anode currents are in the range of 100–200 μA. These attractive properties suggest to employ the method to study surface electronic properties of solids.     

光子计数成像研究

从APD阵列的响应特性出发,利用随机点的统计学描述,建立了光子计数成像的一维点过程数学模型。通过对光子事件发生时间统计特性的描述,分析了光子密度、门控时间、雪崩光电二极管恢复时间等因素对光子计数成像质量的影响。并采用蒙特卡罗方法,对近红外波段不同光子密度条件下多种计数间隔的成像质量进行了仿真,给出了仿真结果。