Structure and properties of the 70Li2S · (30 − x)P2S5 · xP2O5 oxysulfide glasses and glass–ceramics

The 70Li₂S · (30 ? x)P₂S₅ · xP₂O₅ (mol%) oxysulfide glasses were prepared by the melt quenching method. The glasses were prepared in the composition range 0 ≦ x ≦ 10. The glass–ceramics were prepared by heating the glasses over crystallization temperatures. The PO_nS_3?n (n = 1–3) oxysulfide units were produced in the glasses and glass–ceramics by partial substituting P₂O₅ for P₂S₅. In particular, the P₂OS₆^4? unit would be produced by substituting a small amount of P₂O₅ for P₂S₅. The oxygen atoms were incorporated into the Li₇P₃S₁₁ crystal structure because the diffraction peaks of the oxysulfide glass–ceramic shifted to the higher angle side. The glass–ceramic with 3 mol% of P₂O₅ exhibited the highest conductivity of 3.0 × 10^?3 S cm^?1 and the lowest activation energy for conduction of 16 kJ mol^?1. The P₂OS₆^4? dimer units in the oxygen-incorporated Li₇P₃S₁₁ crystal would improve conductive behavior of the Li₂S–P₂S₅ glass–ceramics.     

Structure of TeO2 · B2O3 glasses inferred from infrared spectroscopy and DFT calculations

Glasses in the system (1 ? x)TeO₂ · xB₂O₃ glasses (with x = 0.3 and 0.4) have been prepared from melt quenching method. The structural changes were studied by FTIR spectroscopy and DFT calculations. From the analysis of the FTIR spectra it is reasonable to assume that when increasing boron ions content the tetrahedral [BO₄] units are gradually replaced by trigonal [BO₃] units. The increase in the number of non-bridging oxygen atoms would decrease the connectivity of the glass network, would depolymerize of borate chains and would necessite quite a radical rearrangement of the network formed by the [TeO₆] octahedral. This is possible considering that tellurium dioxide brings stoichiometrically two oxygen atoms in [TeO₄] and needs an additional oxygen atom for the formation of [TeO₆] octahedra. This additional oxygen atom is evidently taken off from the boron co-ordination and thus boron atoms transfer their [BO₄] co-ordination into [BO₃] co-ordination. We used the FTIR spectroscopic data in order to compute two possible models of the glasses matrix. We propose two possible structural models of building blocks for the formation of continuous random network glasses used by density functional theory (DFT) calculations.     

Optical and electrical properties of as-prepared and annealed (Se80Te20)100 − xAgx (0 ≤ x ≤ 4) ultra-thin films

Optical and electrical properties of the (Se₈₀Te₂₀)_100 ? xAg_x (0 ≤ x ≤ 4) ultra-thin films have been studied. The ultra-thin films were prepared by thermal evaporation of the bulk samples. Thin films were annealed below glass transition temperature (328 K) and in between glass transition temperature and crystallization temperature (343 K). Thin films annealed at 343 K showed crystallization peaks for Se–Te–Ag phases in the XRD spectra. The transmission and reflection of as-prepared and annealed ultra-thin films were obtained in the 300–1100 nm spectral region. The optical band gap has been calculated from the transmission and reflection data. The refractive index has been calculated by the measured reflection data. It has been found that the optical band gap increases, but the refractive index, extinction coefficient, real and imaginary dielectric constant decrease with increase in Ag content. The optical band gap and refractive index show the variation in their values with increase in the annealing temperature. The extinction coefficient increases with increasing annealing temperature. The surface morphology of ultra-thin films has been determined using a scanning electron microscope (SEM). The measured dc conductivity, under a vacuum of 10^? 5 mbar, showed thermally activated conduction with single activation energy in the measured temperature range (288–358 K) and it followed Meyer–Neldel rule. The dc activation energy decreases with increase in Ag content in pristine and annealed films. The results have been analyzed on the bases of thermal annealing effects in the chalcogenide thin films.     

Epitaxial lateral overgrowth of non-polar GaN(1 1̄ 0 0) on Si(1 1 2) patterned substrates by MOCVD

m-Plane GaN was grown selectively by metal–organic chemical vapor deposition (MOCVD) on patterned Si(1 1 2) substrates, where grooves aligned parallel to the Si〈1 1 0〉 direction were formed by anisotropic wet etching to expose the vertical Si{1 1 1} facets for growth initiation. The effect of growth conditions (substrate temperature, chamber pressure, and ammonia and trimethylgallium flow rates) on the growth habits of GaN was studied with the aim of achieving coalesced m-plane GaN films. The epitaxial relationship was found to be GaN(1 1? 0 0) || Si(1 1 2), GaN[0 0 0 1] || Si[1 1 –1], GaN[1? 1? 2 0] || Si[1 1? 0]. Among all growth parameters, the ammonia flow rate was revealed to be the critical factor determining the growth habits of GaN. The distribution of extended defects, such as stacking faults and dislocations, in the selectively grown GaN were studied by transmission electron microscopy in combination with spatially resolved cathodoluminescence and scanning electron microscopy. Basal-plane stacking faults were found in the nitrogen-wing regions of the laterally overgrown GaN, while gallium-wings were almost free of extended defects, except for the regions near the GaN/Si{1 1 1} vertical sidewall interface, where high dislocation density was observed.     

Nanostructured Crystals of Fluorite Phases Sr1 – xRxF2 + x (R Are Rare-Earth Elements) and Their Ordering. 15. Concentration Dependence of the Defect Structure of As Grown Nonstoichiometric Phases Sr1 – xRxF2 + x (R = Sm,Gd)

Crystallography Reports - The defect structure of as grown single crystals Sr1 – xSmxF2 + x (x = 0.14, 0.26) and...     

Nanostructured Crystals of Fluorite Phases Sr1 – xRxF2 + x (R Are Rare-Earth Elements) and Their Ordering. 13: Crystal Structure of SrF2 and Concentration Dependence of the Defect Structure of Nonstoichiometric Phase Sr1 – xLaxF2 + x As Grown (x = 0.11, 0.20, 0.32, 0.37, 0.47)

Crystallography Reports - The defect structure of as-grown SrF2 and nonstoichiometric phases Sr1 – xLaxF2 + x (x = 0.11, 0.20, 0.32, 0.37, 0.47) single...     

Growth of Sm1 – ySryF3 – y (0 < y ≤ 0.31) Crystals and Investigation of Their Properties

Crystallography Reports - Sm1&nbsp;–&nbsp;ySryF3&nbsp;–&nbsp;y (0 &lt; y ≤ 0.31) crystals have been grown from melt by directional solidification in a...     

Optimization of the Compositions of Solid Electrolytes Pb1 – xRxF2 + x with Fluorite-Type Structure in Conductivity and Thermal Stability

Crystallography Reports - The compositions of nonstoichiometric phases Pb1&nbsp;–&nbsp;xRxF2&nbsp;+&nbsp;x (CaF2 type, R is a rare-earth element) have been optimized with...     

Magnetic behavior,transport properties and nanocrystallization of melt-spun YxCe50 − xCu42Al8 (0 ≤ x ≤ 50) amorphous system

Amorphous Y_xCe_50 ? xCu₄₂Al₈ (0 ≤ x ≤ 50) ribbons prepared by melt-spinning on the Cu wheel were subjected to X-ray diffractometry (XRD), differential scanning calorimetry (DSC) and to the measurements of magnetization and resistivity in the temperature range from 1.7 to 300 K. Effective activation energies, characteristic crystallization temperatures and enthalpies of as-quenched alloys have been determined. Two stages of crystallization have been observed in most samples (except shallow effects in Ce₅₀Cu₄₂Al₈). The activation energies have been calculated from the Kissinger relation to be 247 ± 18 and 570 ± 56 kJ/mol for Y₂₅Ce₂₅Cu₄₂Al₈ and Y₅₀Cu₄₂Al₈, respectively. The absence of the endothermic effect for x = 50, usually associated with a glass transition, below the primary crystallization event, indicates the presence of dispersed polyamorphous packing with a wide range of local glass transitions. The magnetization versus temperature plot for Y₂₅Ce₂₅Cu₄₂Al₈ points to a magnetic ordering at temperatures considerably below 50 K. This observation has been confirmed by the temperature dependence of resistivity, which exhibits a singularity at the same temperature. Moreover, a negative temperature coefficient of resistivity, characteristic of disordered systems, was observed. The electrical resistivity in the Y₂₅Ce₂₅Cu₄₂Al₈ amorphous alloy is governed by the weak localization of electrons.     

Synthesis and structure–property relations in xCuO–(1 − x)Bi2O3 (0.5 ⩽ x ⩽ 0.9) (C1–C5: x = 0.5, 0.6, 0.7, 0.8, 0.9) glasses

Synthesis of the xCuO–(1 ? x)Bi₂O₃ (0.5 ? x ? 0.9) (C1–C5: x = 0.5, 0.6, 0.7, 0.8, 0.9) glasses was done via nitrate–citrate gel route. Glassy phase is ascertained by XRD studies. Magnetic susceptibility results in the range 4.2–400 K show weak paramagnetic nature with exchange integrals ～0.024–0.13 eV in the glasses. The electron paramagnetic resonance (EPR) in the range 4.2–363 K shows g ≈ 2.0 and the trend of the g-matrix elements g_|| > g_⊥ > g_e for the glasses C1–C5 at 4.2 K are due to the Cu²⁺ (3d⁹) paramagnetic site in the glasses which is in a tetragonally elongated octahedron [O_1/2–CuO_4/2–O_1/2] having D_4h symmetry. IR spectroscopic results show the presence of octahedron [BiO_6/2]^3? and [CuO_6/2]^4? units and pyramidal [BiO_2/2O]^? unit in the glasses.     

Study of the Fracture Toughness of K2NixCo(1 – x)(SO4)2 · 6H2O Crystals in Dependence of the Growth Direction and Rate

Crystallography Reports - K2Ni(SO4)2 · 6H2O (KNSH), K2Co(SO4)2 · 6H2O (KCSH), and K2NixCo(1&nbsp;–&nbsp;x)(SO4)2 · 6H2O (KCNSH) crystals have been grown by traditional...     

Microstructural analysis of Ga2S3–2MCl (M = K, Rb, Cs) glasses using Raman scattering

Raman scattering spectra of Ga₂S₃–2MCl (M = K, Rb, Cs) glasses have been conducted at room temperature. Based on the analysis of the local co-ordination surroundings of Cs⁺ ions, the similarities and differences of Raman spectra for the glass Ga₂S₃–2CsCl and the bridged molecular GaCl₃ were explained successfully. Through considering the effect of M⁺ ions on mixed anion units [GaS_4?xCl_x] and bridged units [Ga₂S_6?xCl_x] and the corresponding microstructural model, the Raman spectral evolution of the Ga₂S₃–2MCl (M = K, Rb, Cs) glasses was reasonably elucidated.     

Electronic properties calculation of Ge1 − x − ySixSny ternary alloy and nanostructure

The band structure of Ge_{1 ? x ? y}Si_xSn_y ternary alloys, which are easier to grow than binary Ge_1-xSn_x alloys, and clearly offer a wider tunability of their direct band-gap and other properties, was calculated and investigated by using the empirical pseudo-potential plane wave method with modified Falicov pseudo-potential formfunction. The virtual crystal approximation (VCA) and 2 × 2 × 2 super-cell (mixed atoms) method were adopted to model the alloy. In order to calculate all of these properties, the empirical pseudo-potential code was developed. The lattice constant of the alloy varies between 0.543 to 0.649 nm. The regions in the parameter space that corresponds to a direct or indirect band gap semiconductor are identified. The Ge_{1 ? x ? y}Si_xSn_y ternary alloy shows the direct band gap for appropriate composition of Si, Ge and Sn. The direct energy gap is in the range 0–1.4 eV (from the VCA calculation), and 0–0.8 eV (from the super-cell calculation), depending on the alloy composition. Therefore, this alloy is a promising material for optoelectronic applications in both visible and infrared range, such as interband lasers or, solar cells. Furthermore, strain-free heterostructures based on such alloys are designed and, using the effective-mass Hamiltonian model, the electronic structure of GeSiSn quantum wells with arbitrary composition is investigated, in order to understand their properties and the potential of their use in devices.     

Production and properties of high purity TeO2− WO3−(La2O3, Bi2O3) and TeO2− ZnO−Na2O−Bi2O3 glasses

TeO₂–WO₃ (TW), TeO₂–WO₃–La₂O₃ (TWL), TeO₂–WO₃–La₂O₃–Bi₂O₃ (TWLB) and TeO₂–ZnO–Na₂O–Bi₂O₃ (TZNB) glasses were produced by high-purity oxide mixtures melting in platinum or gold crucible at 800 °C in the atmosphere of purified oxygen. The total content of Cu, Mn, Fe, Co and Ni impurities was not more than 0.1–0.5 ppm wt in the initial oxides and glasses. The stability of TZNB glasses to crystallization, characterized by (T_x ? T_g) value more than 150 °C, was demonstrated by DSC measurements at heating rate 10 K/min. In the case of La₂O₃-containing glasses the thermal effects of both crystallization and fusion of the crystallized phases were not observed. The hydroxyl groups absorption coefficients of pure tellurite glasses at the maximum of the absorption band (λ ~ 3 μm) were in the region of 0.012–0.001 cm^?1. The optical absorption losses, measured by the laser calorimetry method at λ = 1.56 and 1.97 μm, did not exceed 100 dB/km.     

The electrical switching and thermal behavior of bulk Ge15Te85 − xSnx and Ge17Te83 − xSnx glasses

Bulk Ge₁₅Te_85 ? xSn_x and Ge₁₇Te_83 ? xSn_x glasses, are found to exhibit memory type electrical switching. The switching voltages (V_t) and thermal stability of Ge₁₅Te_85 ? xSn_x and Ge₁₇Te_83 ? xSn_x glasses are found to decrease with Sn content. The composition dependence of V_t has been understood on the basis of the decrease in the OFF state resistance and thermal stability of these glasses with tin addition. X-ray diffraction studies reveal that no elemental Sn or Sn compounds with Te or Ge are present in thermally crystallized Ge–Te–Sn samples. This indicates that Sn atoms do not interact with the host matrix and form a phase separated network of its own, which remains in the parent glass matrix as an inclusion. Consequently, there is no enhancement of network connectivity and rigidity. The thickness dependence of switching voltages of Ge₁₅Te_85 ? xSn_x and Ge₁₇Te_83 ? xSn_x glasses is found to be linear, in agreement with the memory switching behavior shown by these glasses.     

Optimization of the Compositions of Solid Electrolytes Cd1 – xRxF2 + x (R = La–Lu,Y) with a Fluorite-Type Structure for Conductivity and Thermal Stability

Crystallography Reports - Optimization of the compositions of Cd1–xRxF2+x nonstoichiometric phases (CaF2 type, R is a rare-earth element) for the ionic conductivity and thermal stability is...