剪切电子散斑平移棱镜相移方法研究

在剪切电子散斑干涉中,由于错位的二物光束同向传播,很难将二物光分开引入附加相位的方法来实现相移.平移棱镜相移法可以在二束物光不分开的情况下实现相移.本文对平移棱镜相移法进行了理论分析,证明平移棱镜可以引入稳定、线性的附加相位,给出了附加位移与附加相位之间的关系式.利用周边固定、中心加栽的圆盘进行实验,给出了实验结果,证...     

偏转平台剪切电子散斑干涉相移技术研究

在沃拉斯顿棱镜作为剪切器件的传统剪切散斑干涉术中,由于错位的二物光束同光路传播,很难通过将它们分开来引入附加相位的方法实现相移。本文提出的偏转平台法是利用平台上物体的偏转来引入附加相位的,从而可以实现剪切电子散斑干涉的相移。理论分析证明,物体的偏转可以引入稳定、线性的附加相位,并给出了物体偏转角度与附加相位之间的关系式;利用周边固定、中心加载圆盘进行了典型实验,给出了实验结果,证明偏转平台相移技术能够有效地从干涉条纹中提取位移导数信息。     

用于静态和动态平面内位移测量的剪切束电子斑纹图干涉术的相移和载波技术

报道了一种新颖的用于平面内位移测量的相移和载波技术。在剪切束电子斑纹图干涉度量术中，照明光束由棱镜分为两个波前，棱镜的侧面移动将引入相移。在棱镜后加一小角光楔，则光楔的转动产生载波条纹。棱镜或光楔的转动可由机械或电学机构精密控制。形变信息由数字图像处理算法，相位迭代和傅里叶变换法给出。文中介绍了理论及其实验演示的结果     

用于静态和动态平面内位移测量的剪切束电子斑纹图干涉术的相移和载…

报道了一种新颖的用于平面内位移测量的相移和载波技术。在剪切束电子斑纹图干涉度度术中，照明光束由棱镜分为两个波前，棱镜的侧面移动将引入相移。在棱镜后加一小角光楔，则光楔的转动产生载波条纹。棱镜或光楔的转动可由机械或电学机构精密控制。形为信息由数字图像处理算法，相位迭代和傅里叶变换法给出。文中介绍了理论及其实验演示的结果。     

基于光学涡旋相移技术的离面位移测量

设计了基于光学涡旋相移技术的离面位移测量实验方案,实现了电子散斑干涉中相移的数字控制.该方法利用输入液晶空间光调制器中的叉形光栅产生涡旋光束,通过涡旋光束绕轴的旋转产生相移;同时,产生的涡旋光束又作为参考光与物光干涉.实验中,在物体发生离面位移前后依次输入四幅叉形光栅,产生相移步长为π/2的涡旋光束,利用CCD获得涡旋光与物光的干涉光场,从而获得离面位移场的包裹相位;再通过解包裹,获得物体离面变形的相位变化.光学涡旋相移法可应用于离面位移测量.     

两步相移数字全息物光重建误差分析与校正

系统研究了两步相移数字全息干涉术中相移误差引起的波前再现误差的计算和校正方法. 基于衍射物光相位分布的随机性和振幅相位的相互独立性原理,介绍了相移数字全息中物光波前再现误差的表达形式,推导出步长为π/2的两步算法中物光重建误差的表达式. 通过进一步分析这一重建误差的结构和特点,结合物光表达式,给出了自动校正相移误差引起的波前重建误差的校正方法. 该方法无需增加测量,在未知相移误差大小的情况下,只对标准两步相移算法恢复的物光复振幅进行处理就可以实现对物光振幅和相位的同时校正. 计算机模拟结果表明,校正后可将 关键词： 相移干涉术 数字全息 物光重建 误差校正     

涡旋光的干涉特性及其在变形测量中的应用

将涡旋光应用于电子散斑干涉,测量变形物体的离面位移.把传统的电子散斑干涉测量技术与液晶空间光调制器相结合,将所获得的涡旋光作为参考光或者物光进行变形测量.推导出物光为平面光、参考光为涡旋光,和参考光、物光均为涡旋光时物体变形后的干涉强度公式,模拟计算了变形后的干涉图样,分析了变形图样的特征.运用四步相移方法得到了物体的变形相位公式,通过解包裹得到了物体的变形相位.模拟计算得到的三维相位分布图与物体离面位移的变形相位理论值的三维分布图相吻合.模拟实验结果表明,涡旋光可以应用于物体的变形测量,为变形测量提供新的途径.     

基于选择采样的高效迭代相位提取算法

在光学精密测量中,相移干涉法应用广泛。常用的相移器件容易出现相移误差,采用等步距相位提取算法会产生测量误差。基于最小二乘的迭代相位提取算法可以有效消除该类相位提取误差,提高测量精度,但是其迭代过程运行时间长,效率低。提出了一种基于选择采样的迭代相位提取算法,先对干涉图像进行等间隔抽样,降低计算量;再根据对比度滤除干涉图像中低质量像素点,防止误差增大,进行最小二乘迭代求解相位。仿真实验对算法进行了分析和验证,在抽样间隔为2时的选择采样方法与所有像素点全部代入计算相比,运行时间从6.687 s降为0.725 s,均方根误差仅为0.032 9。实验结果证明:选择采样的迭代相位提取算法运算时间短、误差小,非常适合高速相移干涉测量应用。     

大剪切电子散斑干涉的载频调制与位移场测量

将电子散斑干涉场的载波调制引入到大剪切电子散斑干涉中,通过对参考物的微小偏转引入载波条纹;利用傅里叶变换法,解调出了变形场的相位,从而实现了物体变形场的精确测量。讨论了大剪切载频的调制机理,理论分析表明,调制条纹的空间频率与参考面偏转的角度成正比;因此,控制参考面的偏转角度可实现不同位移量系统的调制。利用中心加载周边固定圆盘进行了典型实验,实验结果证明在大剪切电子散斑干涉技术中可以通过参考面的旋转高质量地实现电子散斑干涉条纹的调制,求解位移场。该系统具有系统简单,不需要专门引入参考光,条纹质量好等优点。该技术可扩展电子散斑干涉的应用范围,有一定的实际应用价值。     

相移相位测量的全息再现算法及测量误差分析

用全息原理和方法研究相移相位测量,得到了N步整周期相移再现物光波复振幅同步叠加函数(N步相移函数),同时提出一种新的相移相位测量误差分析和最大误差估计方法。N步相移干涉图是以理想平行光为参考光的无衍射同轴全息图,将其与对应的相移参考光相乘后求和得到N步相移函数;在理想情况下,这是一种复振幅分离、测量和物光波复振幅函数同步叠加方法,存在误差时计算出的相位是最小二乘方法的最佳期望结果。利用N步相移函数得到的N 1步相移函数,说明非理想N步相移函数是理想N步相移函数与误差函数之和,可以把相位型误差转化为与振幅和强度相对误差同等的误差来对待,降低了相位测量中误差估计的难度,给出了N步相移算法最大误差的估计方法和公式。     

Differential phase contrast in optical coherence tomography

We report on a modification of optical coherence tomography (OCT) that allows one to measure small phase differences between beams traversing adjacent areas of a specimen. The sample beam of a polarization-sensitive low-coherence interferometer is split by a Wollaston prism into two components that traverse the object along closely spaced paths. After reflection at the various sample surfaces, the beams are recombined at the Wollaston prism. Any phase difference encountered between the two beams is converted into a change of polarization state of the recombined beam. This change is measured, and the resulting signals are converted to differential phase-contrast OCT images. The first images obtained from simple test objects allowed us to determine path-difference gradients with a resolution of the order of 5 x 10(-5) .     

A displacement measurement system, utilizing a Wollaston interferometer

A dual interferometric displacement measurement system is presented where a Wollaston prism interferometer is employed in conjunction with a normal Michelson interferometer. The system operates without the use of external polarizers, apart from those associated with the Wollaston prism interferometer itself. It is shown that an optical path difference induced in the Michelson interferometer can be detected using the Wollaston prism in a normal interferometer arrangement. Further, the interference pattern produced by the Wollaston prism interferometer changes in a measurable, linear fashion as the optical path difference from the Michelson interferometer alters. A simple theoretical analysis of the system is presented and used to derive a computer model of the optical arrangement. Results from an experimental implementation of the system, using a Wollaston prism with a beam separation of 0.5 degrees and a superluminescent diode, of wavelength 825 nm, as a light source, are included and compared to the results from the computer model.     

用于干涉光谱仪中的新型Wollaston 棱镜系统

提出了一种用于干涉光谱仪中的新型Wollaston棱镜系统———带反射镜的Wollaston棱镜系统。对其结构及光束在其中的传播特性进行了深入分析,并对两束光的光程差进行了计算机模拟。结果表明光程差与入射点位置的关系具有极好的线性,并且所得光程差的动态范围为同类装置的二倍。研究结果为偏振型空间调制干涉光谱仪的设计和应用提供了理论依据。     

一种多棱镜组合设计优化图像干涉性能的新方法

为了在不影响干涉条纹成像质量的基础上通过增大双折射棱镜结构角的方法获得更细致的光谱成分,优化设计了双折射棱镜的结构.通过计算分束角与结构角之间的函数关系,分析得知在传统双折射棱镜后附加一个与第二个楔形同性质的等腰三角形棱镜,使出射棱镜的o光和e光平行于光轴,即分束角α为0°,从而干涉条纹的成像不再受分束角的变化所影响....     

Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance

Dual-channel phase-shifting interferometry for simultaneous phase microscopy is presented. Red and blue light beams are used for microscope illumination. A 45 tilted beamsplitter replicates the object and reference waves in red light together with the object wave in blue light into two parallel beams. The two resulting quadrature phase-shifting interferograms in red light and the object waves in blue light are generated in the two channels. The two interferograms are recorded simultaneously by a color charge-coupled device (CCD) camera, and can be separated via RGB components of the recorded color patterns without crosstalk. As a result, the phase of tested specimen can be retrieved. The feasibility of the proposed method is demonstrated by test performed on a microscopic specimen.     

Strain and vibration analysis by fibre based speckle shearing interferometry

An optical fibre based, speckle shearing interferometer is described. The instrument uses a highly birefringent optical fibre to illuminate a test object with equal intensities of light guided by the orthogonal polarisation eigenstates of the fibre. A Wollaston prism is used to obtain two sheared images with adjustable shear. Optical phase changes between the sheared images are readily achieved, without mechanical movement of components, by straining the optical fibre. Object strain determination, by fringe analysis with phase stepping techniques, is readily achieved. Vibration analysis by heterodyning is also reported.     

Compulsorily Phase Locked Interferometer Using Orthogonally Polarized Light Source of a Modulated LD with High Extinction Ratio

This paper describes a compulsorily phase locked differential interferometer using an orthogonally polarized light source of a modulated LD with high extinction ratio to reduce non-linearity of the interferometer caused by polarization cross-talk. The current modulated LD is used as a light source to make the interferometer compact and for the scanning phase of the interferometer. The interferometer is operated compulsorily at the maximum inclination point of the fringe intensity curve by fringe scanning and an electric system. A Wollaston prism of high extinction ratio (50 dB) is used to combine the polarizing beams and to make the polarization cross-talk very small. In one light source the polarized output beams are on the same propagation axis; in the other they have a small crossing angle (2.5 mrad ∼ 10 mrad) to completely exclude non-linearity of the interferometer causded by polarization cross-talk. Using jets of a gas mixture of nitrogen and ethylene, this interferometer was demonstrated to be useful in detecting the photothermal effect of a photothermal velocimeter under phase fluctuation in a turbulent flow.     

Comment on "Phase-shift extraction and wave-front reconstruction in phase-shifting interferometry with arbitrary phase steps"

We comment on the recent Letter by Cai et al. [Opt. Lett. 28, 1808 (2003)] in which an approach to phase-shifting interferometry with arbitrary phase steps was proposed. Cai et al. based their method of phase shifting on the idea that the intensities of the reference and object beams can be measured previously, which actually makes the whole posterior phase-shifting procedure absolutely unnecessary. Their method is also based on the statement that the phase of the Fresnel diffraction pattern of a test object if generally a spatially random distribution, which in most situations is wrong.     

Parallel two-step phase-shifting microscopic interferometry based on a cube beamsplitter

Parallel two-step phase-shifting interferometry for microscopy is presented, and the recording condition for generalized two-step phase-shifting interferometry is discussed. A 45° tilted cube beamsplitter enables to replicate the orthogonally linear polarized object and reference waves into two parallel beams, respectively. As a consequence, two interferograms with quadrature phase shift are obtained along the two beams, and phase reconstructed with an improved algorithm. To reconstruct the phase distribution from the two-step phase-shifting interferograms, a certain recording condition should be satisfied. However, the recording condition has not ever been discussed before. In this paper, the recording condition for the two-step phase-shifting interferometry is derived and that is: the intensity of reference wave should be no less than two times object wave intensity.