Calculation of attenuation and x‐ray fluorescence intensities for non‐parallel x‐ray beams

With the nowadays widespreaded use of x‐ray optics in x‐ray fluorescence analysis, large convergence or divergence angles can occur. This experimental situation violates a basic assumption of the usual fundamental parameter quantification procedure. In order to take beam divergences in micro x‐ray fluorescence analysis into account, a way of calculating fluorescence intensities numerically by Monte Carlo integration is described. For three examples of typical micro‐XRF set‐ups the fluorescence intensities and their deviation from the parallel beam geometry are calculated. Furthermore, we propose a new approach with ‘equivalent angles’ which correct for the beam divergences in fundamental parameter methods. Copyright © 2003 John Wiley & Sons, Ltd.     

Quantitative or semi‐quantitative?–laboratory‐based WD‐XRF versus portable ED‐XRF spectrometer: results obtained from measurements on nickel‐base alloys

‘Semi‐quantitative’ analytical procedures are becoming more and more popular. Using such procedures, the question of the accuracy of results arises. The accuracy of an analytical procedure depends to a great extent on spectral resolution, counting statistics and matrix correction. Two ‘semi‐quantitative’ procedures are compared with a quantitative analytical program. Using a laboratory‐based wavelength‐dispersive x‐ray fluorescence (WD‐XRF) spectrometer and a portable energy‐dispersive x‐ray fluorescence (ED‐XRF) spectrometer, 28 different nickel‐base alloy Certified Reference Materials (CRMs) were analyzed. Line interferences and inaccurate matrix correction are reasons for deviations from the reference value. As the comparison shows, ‘semi‐quantitative’ analyses on the WD‐XRF spectrometer can be accepted as quantitative determinations. The investigations show that the results obtained with the portable ED‐XRF spectrometer do not meet the quality requirements of laboratory analysis, but they are good enough for field investigations. Copyright © 2004 John Wiley & Sons, Ltd.     

Application of surface‐enhanced Raman spectroscopy (SERS) to the analysis of natural resins in artworks

Surface‐enhanced Raman spectroscopy (SERS) is rapidly growing as an analytical technique for the detection of extremely low concentrations of analytes. The analysis of natural resins from artworks is often restricted by sample size constraints in general, and Raman spectroscopy in particular is hampered by fluorescence when using visible irradiation wavelengths. This work demonstrates that SERS is able to overcome interference from fluorescence in such samples using the incident wavelength 514.5 nm, to allow collection of SERS spectra from extremely small samples. Characterisation of the natural resin surface coating from a painting by Tiepolo is discussed. Copyright © 2008 John Wiley & Sons, Ltd.     

Validation and traceability of XRF and SEM‐EDS elemental analysis results for solder in high‐reliability applications

A procedure and calibration samples were developed for X‐ray fluorescence spectrometry and scanning electron microscopy (SEM) with energy dispersive spectrometry (EDS) analysis methods for Sn and Pb amounts in solder and coatings. Test methods are needed by laboratories that perform destructive physical analysis of high‐reliability electronics for MIL‐STD‐1580B. Calibrants are prepared by evaporative deposition of multiple, alternating quantities of pure Sn and pure Pb having mass per unit area proportional to mass fractions of Sn and Pb in a solder being mimicked. Validation reference materials are prepared by evaporative deposition of thin films of SRM 1729 Tin Alloy (97Sn–3Pb). Films are created on high‐purity Ni foil to mimic some actual electronics structures and prevent charging during SEM‐EDS measurements. Maximum thickness of films prepared this way must be kept below approximately 1 µm to ensure that the entire thickness is probed by the primary X‐ray or electron beam and that measured X‐rays come from the entire thickness of all films. Detailed procedures are presented, and method performance was characterized. The primary purpose is to create calibrations for Sn and Pb that are simple to implement and establish traceability to the international system of units. The secondary purpose is to validate calibrations using a certified reference material to prove that, for simpler structures of thin solder coatings on metal, both X‐ray fluorescence and SEM‐EDS provide accurate results. Keeping films thin may be unrealistic in comparison with some, if not many, electronic structures, but this approach enables a laboratory to demonstrate competence in a controlled manner. Copyright © 2014 John Wiley & Sons, Ltd.     

Highly Enhanced Emission of Visible Light from Core–Dual‐Shell‐Type Hybridized Nanoparticles

Core–dual‐shell‐type hybridized nanoparticles (NPs) having Au‐core/dye‐doped silica inner shell/Au outer shell are successfully fabricated by developing a biphasic process that is a kind of so‐called “one‐pot” method. The resulting hybridized NPs exhibit evidently about 20‐fold enhancement of fluorescence intensity, increase in fluorescence quantum yield, and decrease in fluorescence lifetime. These effects depend on the metal nanostructure being optimized, compared with the reference hybridized NPs with neither a Au‐core nor a Au outer shell, due to the gap‐mode effect induced by localized surface plasmon resonance in the core–dual‐shell‐type MIM‐like nanostructure. More detailed elucidation concerning the enhancement mechanism will provide the possibility of photonic device application, for example as a high‐performance point light source, nanolaser, or sensor for bioimaging in the visible region in the near future.     

Accurate standard‐based quantification of X‐ray fluorescence data using metal‐contaminated plant tissue

Quantitative X‐ray fluorescence (XRF) measurements have been conducted on naturally lead‐contaminated samples. The calibration procedure using the ratio of fluorescence to Compton scattered radiation was investigated using Monte Carlo simulation. Experimental results with low‐energy photons (14 keV) and simulations show a very good linearity of the fluorescence to Compton ratio as a function of metal concentration. Lead (Pb), iron (Fe) and zinc (Zn) are measured in samples of Phaseolus vulgaris (bean seeds) that have been grown using a nutritive solution with different Pb dopings. Naturally contaminated samples are thus obtained. The calibration must be done for fixed conditions of X‐ray energy and scattering angle, while X‐ray beam intensity and detector to sample distance can change from one sample to another. Simulation allows to evaluate the matrix effect on the calibration curve, and shows that linearity is preserved even in the presence of other heavy elements in the fluorescence spectrum. However, calibration must be done using samples with similar matrix as it affects the slope of the curve. Copyright © 2010 John Wiley & Sons, Ltd.     

A simple calibration procedure of polycapillary based portable micro‐XRF spectrometers for reliable quantitative analysis of cultural heritage materials

Portable micro‐X‐ray fluorescence (micro‐XRF) spectrometers mostly utilize a polycapillary X‐ray lens along the excitation channel to collect, propagate and focus down to few tens of micrometers the X‐ray tube radiation. However, the polycapillary X‐ray lens increases the complexity of the quantification of micro‐XRF data because its transmission efficiency is strongly dependent on the lens specifications and the propagated X‐ray energy. This feature results to a significant and not easily predicted modification of the energy distribution of the primary X‐ray tube spectrum. In the present work, we propose a simple calibration procedure of the X‐ray lens transmission efficiency based on the fundamental parameters approach in XRF analysis. This analytical methodology is best suited for compact commercial and portable micro‐XRF spectrometers. The developed calibration procedure is validated through the quantitative analysis of a broad range of samples with archeological relevance such as glasses, historical copper alloys, silver and gold alloys offering an overall accuracy of less than 10%–15%. Copyright © 2015 John Wiley & Sons, Ltd.     

Surface‐enhanced Raman scattering within silver‐nanoparticle‐decorated nanometric apertures

An analytical approach using enhanced Raman spectroscopy to record molecular vibrations and associated molecular images within nanometric apertures is presented, which can essentially rival or surpass its counterparts, i.e. fluorescence microscopy, by providing unique structure‐specific information forward to chemical identification and structure elucidation. Utilizing a precise nanolithographic technology and the following chemically electroless silver deposition procedure, we deliberately construct the large scale zero‐mode waveguide array in gold film with embossed silver nanostructures on the bottom of nanowells capable of acquiring enhanced Raman spectra with substantial sensitivity and high chemical fidelity. Two chemicals, aminothiophenol (4‐ATP) and Rhodamine 6G, respectively, are employed as molecular indicators to successfully demonstrate the capability of this analytical strategy by exhibiting high‐quality Raman spectra and 2D chemical‐specific images. With a high magnitude objective (60×), we enable to acquire Raman spectra from a single nanometric aperture and quantitatively determine a peak enhancement factor of 3.63 × 10⁵ for ATP, while 1.25 × 10⁶ to Rhodamine 6G, comparable with a regular nanoparticle‐based surface‐enhanced Raman spectroscopy‐active substrate. Overall, the compelling characteristics of this detection scheme highlight its privileges for interrogating the individual molecular behavior in extremely confined geometry and illustrating the chemical insights of trace components without any labeling reagent and extra sample preparation. Copyright © 2013 John Wiley & Sons, Ltd.     

Evaluation of Raman and SERS analytical protocols in the analysis of Cape Jasmine dye (Gardenia augusta L.)

The identification of organic colorants in works of art (such as dyes on textiles or organic pigments) by Raman spectroscopy is generally limited by the presence of a strong fluorescence background. In this paper, the effectiveness of minimizing fluorescence in the analysis of Cape Jasmine (Gardenia augusta L.) by dispersive Raman spectroscopy at three different excitation wavelengths (633, 785 and 1064 nm) and by surface‐enhanced Raman spectroscopy (SERS) with and without acid hydrolysis is evaluated and compared. It is shown that these vibrational techniques offer an alternative analytical approach, when, as is particularly the case of Cape Jasmine, sample preparation procedures that are routinely applied for natural organic dyes and pigments cause alterations that lead to low sensitivity in the more classical high‐performance liquid chromatography‐photodiode array (HPLC‐PDA) analytical protocols. Samples of the yellow dye G. augusta L. in the following forms were analyzed: dyed on alum mordanted wool, dyed on nonmordanted and alum mordanted silk, pigment precipitated on hydrated aluminum oxide, extract mixed with a protein binder and painted on glass, and as a water‐based glaze applied on a mock‐up of a typical Chinese wall‐painting. Raman bands at 1537, 1209 and 1165 cm⁻¹ are identified as discriminating markers for the carotenoid colorant components crocetin and crocin. Copyright © 2009 John Wiley & Sons, Ltd.     

EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials

A fast and simple preconcentration procedure for recovering various cation impurities from potassium dihydrogenphosphate (KDP) single crystals and raw materials, followed by energy‐dispersive X‐ray fluorescence analysis (EDXRF), is described. The technique is based on the adsorption of metal 8‐hydroxyquinoline complexes from aqueous solutions of KDP on activated carbon, separation of the concentrate on a Nuclepore filter and subsequent determination by EDXRF. To fix activated carbon powder on a filter surface, an amount of 1‐hexadecanol is added to the KDP solution during the preconcentration procedure. The optimum conditions for the best recovery of the impurities were established. It was shown that a preconcentration factor of 100 can be achieved and the detection limit for a number of elements was down to 0.01 µg g^?1. The relative standard deviations were 6–17% for element concentrations of 0.2 µg g^?1. The method was successfully applied to the determination of Fe, Co, Cu, Ni, Zn, Mn, Ti and Bi in KDP single crystals and raw materials. Copyright © 2005 John Wiley & Sons, Ltd.     

Surface‐enhanced Raman spectroscopy for quantitative measurement of lactic acid at physiological concentration in human serum

Lactic acid is a simple and effective indicator for estimating physiological function. Rapid and sensitive detection of lactic acid is very useful in clinical diagnosis. However, the concentration of lactic acid in the physiological state is too low to be detected using traditional Raman spectroscopy. We applied silver colloidal nanoparticles‐mediated surface‐enhanced Raman spectroscopy (SERS) for rapid identification and quantification of lactic acid. The standard SERS spectra of lactic acid were defined and the 1395 cm⁻¹ band intensity was used for quantification from 0.3 to 2 mM (R² = 0.99). In clinical blood sample measurement, the ultrafiltration (cutoff value 5 kDa) can efficiently reduce background fluorescence to improve SERS performance. We established identical and optimal procedure by adjusting reaction time and volume ratio of serum and nanoparticles to obtain high SERS reproducibility. Finally, we showed that silver colloidal nanoparticles‐mediated SERS technique was successfully applied to detect lactic acid at physiological concentrations in the blood. Copyright © 2010 John Wiley & Sons, Ltd.     

A portable spectrometer for simultaneous PIXE and XRF analysis

A new portable system that performs simultaneous particle induced x‐ray emission and x‐ray fluorescence analysis is described. It is based on the use of a ²⁴⁴Cm radioactive source as α‐particle and x‐ray emitter, coupled to a Si drift detector. Particular care has been devoted to the choice of the materials surrounding the source. X‐ray fluorescence spectra are presented, showing high detection efficiency for elements from Na (K lines) to Pb (L and M lines). The system can be used as a qualitative tool for ‘fingerprint’ analysis and, in some cases, as a quantitative one. Examples are presented and discussed. Copyright © 2007 John Wiley & Sons, Ltd.     

Evaluation of the uncertainty of element determination using the energy‐dispersive x‐ray fluorescence technique and the emission–transmission method

A detailed study of the uncertainty quantification procedure for the determination of element mass fractions in a soil matrix by using energy‐dispersive x‐ray fluorescence spectrometry and the emission–transmission method was carried out. The particular case of secondary target excitation with an Mo target and Mo anode x‐ray tube was addressed. The effects of simplification of the theoretical model on the determined mass fractions of elements were studied. The main contributions to the uncertainty were identified and the ways of reducing their magnitude were indicated. The approach was found to be helpful in designing an optimum analytical strategy. It can also be used as guidance for assessing the uncertainty in other modes of x‐ray fluorescence analysis. Copyright © 2003 John Wiley & Sons, Ltd.     

Lift‐off protocols for thin films for use in EXAFS experiments

Lift‐off protocols for thin films for improved extended X‐ray absorption fine structure (EXAFS) measurements are presented. Using wet chemical etching of the substrate or the interlayer between the thin film and the substrate, stand‐alone high‐quality micrometer‐thin films are obtained. Protocols for the single‐crystalline semiconductors GeSi, InGaAs, InGaP, InP and GaAs, the amorphous semiconductors GaAs, GeSi and InP and the dielectric materials SiO₂ and Si₃N₄ are presented. The removal of the substrate and the ability to stack the thin films yield benefits for EXAFS experiments in transmission as well as in fluorescence mode. Several cases are presented where this improved sample preparation procedure results in higher‐quality EXAFS data compared with conventional sample preparation methods. This lift‐off procedure can also be advantageous for other experimental techniques (e.g. small‐angle X‐ray scattering) that benefit from removing undesired contributions from the substrate.     

基于高通量微弱荧光快速检测的高分辨熔解曲线分析仪

高分辨熔解(HRM)曲线分析技术是近年发展起来的一种用于基因突变检测和单核苷酸多态性(SNP)分析的新方法,它通过实时监测PCR产物升温过程中双链DNA饱和染料的荧光强度变化来分析核酸序列的微小差异。根据HRM分析仪对荧光检测的时间和灵敏度需求,提出基于光开关阵列的多路高速荧光激发和检测模块实现高通量的微弱荧光快速检测;并根据HRM荧光数据特点,对原始荧光曲线进行滤波、基线探测、归一化和对温度微分等处理,从熔解曲线两端的线形区域自动提取基线作为归一化的标准,可以在不损失曲线形态特征信息的情况下获得更为精确的熔解温度,从而实现不同基因型熔解曲线的快速、准确识别。     

Principal component analysis‐assisted energy dispersive X‐ray fluorescence spectroscopy for non‐invasive quality assurance characterization of complex matrix materials

The analytical challenges in direct quality assurance analysis of complex matrices (extreme matrix effects, spectral overlap, poor signal‐to‐noise ratio (SNR) for trace analytes, ‘dark matrix’, imprecise geometry, need for sample integrity) by energy dispersive X‐ray fluorescence (EDXRF) spectrometry necessitate development of novel techniques for material characterization. We demonstrate the utility of principal component analysis (PCA) in isotope‐excited EDXRF spectrometry of a complex matrix (in this case lubricating oil) in the context of a newly developed EDXRF and scattering (EDXRFS) technique. Lubricating oil quality may be interpreted in terms of its viscosity, anti‐wear, anti‐oxidation, and anti‐rust properties, which are detectable via B, Ca, Mg, Zn, Fe, Na additives (quality markers). Our method involves simultaneous non‐invasive acquisition of both fluorescence and scatter spectra from samples held in a propylene dish, and their modeling in a reduced multidimensional space for an interpretable overview that is analytically more useful than, and complementary to, fluorescence peak‐based quantitation of the additives; by this method, only Fe and Zn are directly detectable, but with SNR of the fluorescence peak 15–20 times poorer compared with analysis after sample digestion. Although Fe and Zn cannot distinguish the various lubricating oil brands, it can differentiate authentic from adulterated. The method was however found to be analytically useful when combined with PCA: various brands of lubricating oil were discriminated in addition to the detection of adulteration. PCA processing of the spectra showed that the most important quality assurance spectral signature information responsible for the success is contained in the scatter region (low‐Z elements). Evaluation of the performance of the method with respect to SNR (i.e. analysis time and therefore speed) showed that there was no significant difference in method performance of analysis live time in the range 100–1000 s, showing proof of concept for rapid characterization of complex matrix materials by PCA‐assisted EDXRFS. Copyright © 2012 John Wiley & Sons, Ltd.     

LIF技术与SIMCA算法在煤矿突水水源识别中的研究

煤矿突水水源类型的快速识别对于煤矿水害预警防治意义重大。针对传统水化学方法水源识别耗时较长的问题,提出一种基于激光诱导荧光光谱(LIF)技术与簇类的独立软模式(SIMCA)算法的煤矿突水水源快速识别方法。激光诱导荧光光谱技术具有分析速度快、灵敏度高等特点,在激光器的辅助下,荧光光谱仪实时采集荧光光谱,根据水样的荧光光谱即可进行水源类型识别,在数据库完备的情况下,只需几秒即可进行煤矿水源判断,对于煤矿的水害预警以及灾后救援来说意义重大。实验利用405 nm激光器发射激光,打入被测水体,得到五种常见突水水样的共100组荧光光谱,对各水样的荧光光谱进行光谱预处理。每种水样使用15组共75组荧光光谱作为预测集,剩余的25组水样的荧光光谱作为测试集。利用主成分分析(PCA)分别对五种水样进行建模,而后依据所建模型进行SIMCA分类。实验发现不同水样的荧光光谱差异明显,经过Gaussian-Filter预处理后的荧光光谱,在主成分数为2,显著性程度α＝5%的情况下,利用SIMCA算法进行水样分类,预测集和测试集的正确率皆为100%。     

GE‐MXRF analysis of multilayer films

Polycapillary x‐ray optics (capillary x‐ray lens) is now popular in x‐ray fluorescence (XRF) analysis. Such an x‐ray lens can collect x‐rays emitted from an x‐ray source in a large solid angle and form a very intense x‐ray microbeam which is very convenient for micro x‐ray fluorescence (MXRF) analysis. In this paper, a new method called grazing exit micro x‐ray fluorescence analysis (GE‐MXRF), which combines an x‐ray lens used to form an intense XRF source was developed and applied in multilayer film analysis. Such a method can give the information of film composition, density, and thickness. Through two‐dimensional scan of the film sample, the information of film uniformity can be acquired; meanwhile, this method is also useful in adjusting experiment condition during the film preparation with metal vapor vacuum arc (MEVVA) source ion implantation. Copyright © 2008 John Wiley & Sons, Ltd.     

Toward sub‐micro‐XRF working at nanometer range using capillary optics

Capillary optics are used for X‐ray fluorescence micro‐analysis using the Cu Kα line provided by a rotating anode. The excitation beam is focused using a polycapillary lens on a Co–Ti sample. Cylindrical glass capillaries of various diameters are fitted to the X‐ray detector (Energy Dispersive X‐Ray (EDX) analyzer) and displaced along the irradiated zone of the sample. The fluorescence is studied as a function of capillary position. Good agreement is found between experimental and calculated lateral widths of the fluorescence collection, taken into account the cylindrical capillary critical angles relevant in the experiment. The influence of the cylindrical capillary diameter on the signal level detected is studied to estimate the possibility of lateral resolution increase of X‐ray fluorescence technique both in‐lab and in synchrotron environment. Copyright © 2013 John Wiley & Sons, Ltd.     

Soft X‐ray refractive index by reconciling total electron yield with specular reflection: experimental determination of the optical constants of graphite

The complex refractive index of many materials is poorly known in the soft X‐ray range across absorption edges. This is due to saturation effects that occur there in total‐electron‐yield and fluorescence‐yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optical constants, a procedure that reconciles electron‐yield measurements and reflection spectroscopy by correcting these saturation effects is presented. The procedure takes into account the energy‐ and polarization‐dependence of the photon penetration depth as well as the creation efficiency for secondary electrons and their escape length. From corrected electron‐yield spectra the absorption constants and the imaginary parts of the refractive index of the material are determined. The real parts of the index are subsequently obtained through a Kramers–Kronig transformation. These preliminary optical constants are refined by simulating reflection spectra and adapting them, so that measured reflection spectra are reproduced best. The efficacy of the new procedure is demonstrated for graphite. The optical constants that have been determined for linearly polarized synchrotron light incident with p‐ and s‐geometry provide a detailed and reliable representation of the complex refractive index of the material near π‐ and σ‐resonances. They are also suitable for allotropes of graphite such as graphene.