X‐ray focusing scheme with continuously variable lens

A novel hybrid X‐ray focusing scheme was developed for operation of the X‐ray streak camera at the Advanced Photon Source: an X‐ray lens focuses vertically from a long distance of 16 m and produces an extended focus that has a small footprint on an inexpensive sagittal mirror. A patented method is used to continuously adjust the focal length of the lens and compensate for chromatic dispersion in energy scans.     

Effective aperture of X‐ray compound refractive lenses

A new definition of the effective aperture of the X‐ray compound refractive lens (CRL) is proposed. Both linear (one‐dimensional) and circular (two‐dimensional) CRLs are considered. It is shown that for a strongly absorbing CRL the real aperture does not influence the focusing properties and the effective aperture is determined by absorption. However, there are three ways to determine the effective aperture in terms of transparent CRLs. In the papers by Kohn [(2002). JETP Lett. 76 , 600–603; (2003). J. Exp. Theor. Phys. 97 , 204–215; (2009). J. Surface Investig. 3 , 358–364; (2012). J. Synchrotron Rad. 19 , 84–92; Kohn et al. (2003). Opt. Commun. 216 , 247–260; (2003). J. Phys. IV Fr, 104 , 217–220], the FWHM of the X‐ray beam intensity just behind the CRL was used. In the papers by Lengeler et al. [(1999). J. Synchrotron Rad. 6 , 1153–1167; (1998). J. Appl. Phys. 84 , 5855–5861], the maximum intensity value at the focus was used. Numerically, these two definitions differ by 50%. The new definition is based on the integral intensity of the beam behind the CRL over the real aperture. The integral intensity is the most physical value and is independent of distance. The new definition gives a value that is greater than that of the Kohn definition by 6% and less than that of the Lengeler definition by 41%. A new approximation for the aperture function of a two‐dimensional CRL is proposed which allows one to calculate the two‐dimensional CRL through the one‐dimensional CRL and to obtain an analytical solution for a complex system of many CRLs.     

Direct nano‐scale patterning of Ag films using hard X‐ray induced oxidation

The morphological change of silver nano‐particles (AgNPs) exposed to an intense synchrotron X‐ray beam was investigated for the purpose of direct nano‐scale patterning of metal thin films. AgNPs irradiated by hard X‐rays in oxygen ambient were oxidized and migrated out of the illuminated region. The observed X‐ray induced oxidation was utilized to fabricate nano‐scale metal line patterns using sectioned WSi₂/Si multilayers as masks. Lines with a width as small as 21 nm were successfully fabricated on Ag films on silicon nitride. Au/Ag nano‐lines were also fabricated using the proposed method.     

X‐ray harmonics rejection on third‐generation synchrotron sources using compound refractive lenses

A new method of harmonics rejection based on X‐ray refractive optics has been proposed. Taking into account the fact that the focal distance of the refractive lens is energy‐dependent, the use of an off‐axis illumination of the lens immediately leads to spatial separation of the energy spectrum by focusing the fundamental harmonic at the focal point and suppressing the unfocused high‐energy radiation with a screen absorber or slit. The experiment was performed at the ESRF ID06 beamline in the in‐line geometry using an X‐ray transfocator with compound refractive lenses. Using this technique the presence of the third harmonic has been reduced to 10^?3. In total, our method enabled suppression of all higher‐order harmonics to five orders of magnitude using monochromator detuning. The method is well suited to third‐generation synchrotron radiation sources and is very promising for the future ultimate storage rings.     

Application of kinoform lens for X‐ray reflectivity analysis

In this paper the first practical application of kinoform lenses for the X‐ray reflectivity characterization of thin layered materials is demonstrated. The focused X‐ray beam generated from a kinoform lens, a line of nominal size ～50 µm × 2 µm, provides a unique possibility to measure the X‐ray reflectivities of thin layered materials in sample scanning mode. Moreover, the small footprint of the X‐ray beam, generated on the sample surface at grazing incidence angles, enables one to measure the absolute X‐ray reflectivities. This approach has been tested by analyzing a few thin multilayer structures. The advantages achieved over the conventional X‐ray reflectivity technique are discussed and demonstrated by measurements.     

Object image correction using an X‐ray dynamical diffraction Fraunhofer hologram

Taking into account background correction and using Fourier analysis, a numerical method of an object image correction using an X‐ray dynamical diffraction Fraunhofer hologram is presented. An example of the image correction of a cylindrical beryllium wire is considered. A background correction of second‐order iteration leads to an almost precise reconstruction of the real part of the amplitude transmission coefficient and improves the imaginary part compared with that without a background correction. Using Fourier analysis of the reconstructed transmission coefficient, non‐physical oscillations can be avoided. This method can be applied for the determination of the complex amplitude transmission coefficient of amplitude as well as phase objects, and can be used in X‐ray microscopy.     

Hard X‐ray microbeam lithography using a Fresnel zone plate with a long focal length

Focused hard X‐ray microbeams for use in X‐ray nanolithography have been investigated. A 7.5 keV X‐ray beam generated at an undulator was focused to about 3 µm using a Fresnel zone plate fabricated on silicon. The focused X‐ray beam retains a high degree of collimation owing to the long focal length of the zone plate, which greatly facilitates hard X‐ray nanoscale lithography. The focused X‐ray microbeam was successfully utilized to fabricate patterns with features as small as 100 nm on a photoresist.     

Combined measurement of X‐ray photon correlation spectroscopy and diffracted X‐ray tracking using pink beam X‐rays

Combined X‐ray photon correlation spectroscopy (XPCS) and diffracted X‐ray tracking (DXT) measurements of carbon‐black nanocrystals embedded in styrene–butadiene rubber were performed. From the intensity fluctuation of speckle patterns in a small‐angle scattering region (XPCS), dynamical information relating to the translational motion can be obtained, and the rotational motion is observed through the changes in the positions of DXT diffraction spots. Graphitized carbon‐black nanocrystals in unvulcanized styrene–butadiene rubber showed an apparent discrepancy between their translational and rotational motions; this result seems to support a stress‐relaxation model for the origin of super‐diffusive particle motion that is widely observed in nanocolloidal systems. Combined measurements using these two techniques will give new insights into nanoscopic dynamics, and will be useful as a microrheology technique.     

Full‐field X‐ray reflection microscopy of epitaxial thin‐films

Novel X‐ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full‐field hard X‐ray microscope uses the surface scattering signal, in a reflectivity or diffraction experiment, to spatially resolve the local structure with 70 nm lateral spatial resolution and sub‐nanometer height sensitivity. Sub‐second X‐ray exposures can be used to acquire a 14 µm × 14 µm image with an effective pixel size of 20 nm on the sample. The optical configuration and various engineering considerations that are necessary to achieve optimal imaging resolution and contrast in this type of microscopy are discussed.     

X‐ray focusing by the system of refractive lens(es) placed inside asymmetric channel‐cut crystals

An X‐ray one‐dimensionally focusing system, a refracting–diffracting lens (RDL), composed of Bragg double‐asymmetric‐reflecting two‐crystal plane parallel plates and a double‐concave cylindrical parabolic lens placed in the gap between the plates is described. It is shown that the focal length of the RDL is equal to the focal distance of the separate lens multiplied by the square of the asymmetry factor. One can obtain RDLs with different focal lengths for certain applications. Using the point‐source function of dynamic diffraction, as well as the Green function in a vacuum with parabolic approximation, an expression for the double‐diffracted beam amplitude for an arbitrary incident wave is presented. Focusing of the plane incident wave and imaging of a point source are studied. The cases of non‐absorptive and absorptive lenses are discussed. The intensity distribution in the focusing plane and on the focusing line, and its dependence on wavelength, deviation from the Bragg angle and magnification is studied. Geometrical optical considerations are also given. RDLs can be applied to focus radiation from both laboratory and synchrotron X‐ray sources, for X‐ray imaging of objects, and for obtaining high‐intensity beams. RDLs can also be applied in X‐ray astronomy.     

Focusing synchrotron radiation using a polycapillary half‐focusing X‐ray lens for imaging

An imaging system based on a polycapillary half‐focusing X‐ray lens (PHFXRL) and synchrotron radiation source has been designed. The focal spot size and the gain in power density of the PHFXRL were 22 µm (FWHM) and 4648, respectively, at 14.0 keV. The spatial resolution of this new imaging system was better than 5 µm when an X‐ray charge coupled device with a pixel size of 10.9 × 10.9 µm was used. A fossil of an ancient biological specimen was imaged using this system.     

A sagittally focusing double‐multilayer monochromator for ultrafast X‐ray imaging applications

The development of a sagittally focusing double‐multilayer monochromator is reported, which produces a spatially extended wide‐bandpass X‐ray beam from an intense synchrotron bending‐magnet source at the Advanced Photon Source, for ultrafast X‐ray radiography and tomography applications. This monochromator consists of two W/B₄C multilayers with a 25 Å period coated on Si single‐crystal substrates. The second multilayer is mounted on a sagittally focusing bender, which can dynamically change the bending radius of the multilayer in order to condense and focus the beam to various points along the beamline. With this new apparatus, it becomes possible to adjust the X‐ray beam size to best match the area detector size and the object size to facilitate more efficient data collection using ultrafast X‐ray radiography and tomography.     

High‐resolution spectroscopy on an X‐ray absorption beamline

A bent‐crystal spectrometer based on the Rowland circle geometry has been installed and tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility to improve its performances. The energy resolution of the spectrometer allows different kinds of measurements to be performed, including X‐ray absorption spectroscopy, resonant inelastic X‐ray scattering and X‐ray Raman scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X‐ray absorption beamline. This improvement in the fluorescence detection is of particular importance when the probed element is embedded in a complex and/or heavy matrix, for example in environmental sciences.     

On the use of clessidra prism arrays in long‐focal‐length X‐ray focusing

Clessidra (hour‐glass) X‐ray lenses have an overall shape of an old hour glass, in which two opposing larger triangular prisms are formed of smaller identical prisms or prism‐like objects. In these lenses, absorbing and otherwise optically inactive material was removed with a material‐removal strategy similar to that used by Fresnel in the lighthouse lens construction. It is verified that when the single prism rows are incoherently illuminated they can be operated as independent micro‐lenses with coinciding image positions for efficient X‐ray beam concentration. Experimental data for the line width and the refraction efficiency in one‐dimensional focusing are consistent with the expectations. Imperfections in the structures produced by state‐of‐the‐art deep X‐ray lithography directed only 35% of the incident intensity away from the image and widened it by just 10% to 125 µm. An array of micro‐lenses with easily feasible prism sizes is proposed as an efficient retrofit for the refocusing optics in an existing beamline, where it would provide seven‐fold flux enhancement.     

Confocal full‐field X‐ray microscope for novel three‐dimensional X‐ray imaging

A confocal full‐field X‐ray microscope has been developed for use as a novel three‐dimensional X‐ray imaging method. The system consists of an X‐ray illuminating `sheet‐beam' whose beam shape is micrified only in one dimension, and an X‐ray full‐field microscope whose optical axis is normal to the illuminating sheet beam. An arbitral cross‐sectional region of the object is irradiated by the sheet‐beam, and secondary X‐ray emission such as fluorescent X‐rays from this region is imaged simultaneously using the full‐field microscope. This system enables a virtual sliced image of a specimen to be obtained as a two‐dimensional magnified image, and three‐dimensional observation is available only by a linear translation of the object along the optical axis of the full‐field microscope. A feasibility test has been carried out at beamline 37XU of SPring‐8. Observation of the three‐dimensional distribution of metallic inclusions in an artificial diamond was performed.     

Analysis of tapered front‐coupling X‐ray waveguides

The coupling and propagation of electromagnetic waves through planar X‐ray waveguides (WG) with vacuum gap and Si claddings are analyzed in detail, starting from the source and ending at the detector. The general case of linearly tapered WGs (i.e. with the entrance aperture different from the exit one) is considered. Different kinds of sources, i.e. synchrotron radiation and laboratory desk‐top sources, have been considered, with the former providing a fully coherent incoming beam and the latter partially coherent beams. It is demonstrated that useful information about the parameters of the WG can be derived, comparing experimental results with computer simulation based on analytical solutions of the Helmholtz equation which take into account the amplitude and phase matching between the standing waves created in front of the WG, and the resonance modes propagating into the WG.     

X‐ray dynamical diffraction Fraunhofer holography

An X‐ray dynamical diffraction Fraunhofer holographic scheme is proposed. Theoretically it is shown that the reconstruction of the object image by visible light is possible. The spatial and temporal coherence requirements of the incident X‐ray beam are considered. As an example, the hologram recording as well as the reconstruction by visible light of an absolutely absorbing wire are discussed.     

Silicon nitride transmission X‐ray mirrors

Transmission X‐ray mirrors have been fabricated from 300–400 nm‐thick low‐stress silicon nitride windows of size 0.6 mm × 85 mm. The windows act as a high‐pass energy filter at grazing incidence in an X‐ray beam for the beam transmitted through the window. The energy cut‐off can be selected by adjusting the incidence angle of the transmission mirror, because the energy cut‐off is a function of the angle of the window with respect to the beam. With the transmission mirror at the target angle of 0.22°, a 0.3 mm × 0.3 mm X‐ray beam was allowed to pass through the mirror with a cut‐off energy of 10 keV at the Cornell High Energy Synchrotron Source. The energy cut‐off can be adjusted from 8 to 12 keV at an angle of 0.26° to 0.18°, respectively. The observed mirror transmittance was above 80% for a 300 nm‐thick film.     

X‐ray spectromicroscopy with the scanning transmission X‐ray microscope at BESSY II

Using the scanning transmission X‐ray microscope at BESSY II, colloidal structures from a Chernozem soil have been studied with a spatial resolution around 60 nm and a spectral resolution of 1700 at the K‐absorption edge of carbon. Elemental mapping has been used to determine the distribution of organic matter within the colloidal structures. Spectra have been extracted from image stacks to obtain information about the chemical state. For the analysis of the latter, principal component analysis and cluster analysis have been applied. It was possible, for example, to discriminate clay particles against organic components.     

Kinoform optics applied to X‐ray photon correlation spectroscopy

Moderate‐demagnification higher‐order silicon kinoform focusing lenses have been fabricated to facilitate small‐angle X‐ray photon correlation spectroscopy (XPCS) experiments. The geometric properties of such lenses, their focusing performance and their applicability for XPCS measurements are described. It is concluded that one‐dimensional vertical X‐ray focusing via silicon kinoform lenses significantly increases the usable coherent flux from third‐generation storage‐ring light sources for small‐angle XPCS experiments.