Interpretation of scanning tunneling microscopy and atomic force microscopy images of 1T-TiS2

The surface of 1T-TiS₂ was examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The STM and AFM images of this compound were interpreted on the basis of the partial electron density ρ(r,E_F) and total electron density ρ(r) of a slab which consists of six (001) 1T-TiS₂ layers. Electronic structure calculations were performed using the ab-initio Hartree–Fock program crystal. It was found that the bright spots in experimental STM images correspond to sulfur atoms at both positive and negative bias voltages. The AFM image showed a periodicity which can be explained by the atomic corrugation at the surface. Structural defects on the surface were also investigated, and their interpretation constitutes experimental proof that only sulfur atoms were detected by scanning probe microscopies.     

Organized molecular assemblies for scanning probe microscope lithography

Nanostructures down to a few ten nanometers in size have been fabricated with Langmuir–Blodgett (LB) films and self-assembled monolayers (SAMs) using scanning probe microscope lithography. The SAMs have been prepared with organosilane and bipolar amphiphiles, alkanethiol molecules as ultrathin resists on Si and Au substrates. The LB films on silicon substrates using both the polymer of thiophene derivatives and the mixture of palmitic acid and hexadecylamine were prepared and fabricated. The effect of functional groups of molecules on the atomic force microscope (AFM) anodization has been studied in the optimized process conditions. Applied voltage between the AFM tip and sample, the scanning speed and the relative humidity in the laboratory are also important factors for nanometer-scale lithography of the ultrathin films. The STM lithography with an octadecanethiol SAM on Au film in the air was carried out at the pulse mode of tip bias with respect to the suitability of STM lithography. The high structural orderness and perfect thickness of ultrathin organic molecular assemblies are the major advantages as required for nanoscale lithography.     

Combined cross-sectional STM/AFM in liquid: Study of InGaAs/GaAs heterostructures with quantum wells and dots

Combined scanning tunneling and atomic force microscopy (STM/AFM) of cross-sectional cleavages in a protective liquid medium (oil) is applied to study InGaAs/GaAs heterostructures with quantum wells and dots. It is shown that the quantum wells and dots can be visualized on cleavages in both AFM and STM modes and to measure the current-voltage characteristics of the contact between an AFM probe and the cleavage surface.     

Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces

Scanning tunnelling microscopy (STM) study and modification of hydrogen (H)-passivated Ge(100) surfaces have been investigated. Thermal oxidation procedures were used to minimise surface roughness. Ge samples were passivated in HF solution after thermal oxidation. STM and atomic force microscope (AFM) imaging showed that, using HF etching after thermal oxidation, we can obtain a natural H-passivatedtopographically and chemically flat Ge(100) surface. The root-mean-square (rms) roughness ofa H-passivatedGe(100) surface measured both by STM and AFM is less than 2 ?. Electric properties of H-passivatedGe(100) surfaces were studied by scanning tunnelling spectroscopy (STS) in nitrogen ambient. STS showed that the H-passivated Ge surfaces were not pinned. Modification on H-passivated Ge(100) surfaces was carried out using STM by applying an electric voltage between the sample and tip in air. Modified features were characterised by STM and AFM imaging. On the H-passivated Ge(100) surfaces, stable, low-voltage, nanometer-scale modified features can be produced.     

INVESTIGATION ON THE STRUCTURE AND ELECTRIC PROPERTIES OF BUCKY ONIONS

Bucky onions were fabricated by the DC discharge method and their behaviors and electric properties on Highly Oriented Pyrolytic Graphite (HOPG) were studied by using an atomic force microscope (AFM), a scanning tunneling microscope (STM) and a transmission electron microscope (TEM). Small-sized Bucky onions demonstrated the properties of semiconductors and as the size increased their metallicity became stronger. AFM and STM images revealed the tendency of Bucky onions to form dimers.     

Scanning probe microscopy characterization of gold-chemisorbed poplar plastocyanin mutants

Two poplar plastocyanin mutants adsorbed onto gold electrodes have been characterized at single molecule level by scanning probe microscopy. Immobilization of the two redox metalloprotein mutants on Au(1 1 1) surface was achieved by either a disulphide bridge (PCSS) or a single thiol (PCSH), both the anchoring groups having been introduced by site-directed mutagenesis. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) analysis gives evidence of a stable and robust binding of both mutants to gold. The lateral dimensions, as estimated by STM, and the height above the gold substrate, as evaluated by AFM, of the two mutants well agree with crystallographic sizes. A narrower height distribution is observed for PCSS compared to PCSH, corresponding to a more homogeneous orientation of the former mutant adsorbed onto gold. Major differences between the mutants are observed by electrochemical STM. In particular, the image contrast of adsorbed PCSS is affected by tuning the external electrochemical potential to the redox levels of the mutant, consistent with some involvement of copper active site in the tunneling process. On the contrary, no contrast variation is observed in electrochemical STM of adsorbed PCSH. Moreover, scanning tunneling spectroscopy experiments reveal asymmetric I–V characteristics for single PCSS proteins, reminiscent of a rectifying-like behaviour, whereas an almost symmetric I–V relation is observed for PCSH.     

STM的同胞兄弟--原子力显微镜(AFM)

介绍了在扫描隧道显微镜（ＳＴＭ）基础上发展起来的原子力显微镜（ＡＦＭ）的工作原理、关键部分、工作模式及其应用。     

Transport at surface nanostructures measured by four-tip STM

For in situ measurements of local electrical conductivity of well-defined crystal surfaces in ultrahigh vacuum, we have developed two kinds of microscopic four-point probe methods. One is a ‘four-tip STM prober’, in which independently driven four tips of scanning tunneling microscope (STM) are used for four-point probe conductivity measurements. The probe spacing can be changed from 500 nm to 1 mm. The other one is monolithic micro-four-point probes, fabricated on silicon chips, whose probe spacing is fixed around several μm. These probes were installed in scanning-electron-microscopy/electron-diffraction chambers, in which the structures of sample surfaces and probe positions were in situ observed. The probes can be positioned precisely on aimed areas on the sample with aid of piezo-actuators. With these machines, the surface sensitivity in conductivity measurements has been greatly enhanced compared with macroscopic four-point probe method. Then the conduction through the topmost atomic layers (surface-state conductivity) and influence of atomic steps upon conductivity could be directly measured. The STM prober is mainly described here.     

Scanning Hall probe microscopy of vortex matter

Scanning Hall probe microscopy (SHPM) is a novel scanned probe magnetic imaging technique whereby the stray fields at the surface of a sample are mapped with a sub-micron semiconductor heterostructure Hall probe. In addition an integrated scanning tunnelling microscope (STM) or atomic force microscope (AFM) tip allows the simultaneous measurement of the sample topography, which can then be correlated with magnetic images. SHPM has several advantages over alternative methods; it is almost completely non-invasive, can be used over a very wide range of temperatures (0.3–300 K) and magnetic fields (0–7 T) and yields quantitative maps of the z-component of magnetic induction. The approach is particularly well suited to low temperature imaging of vortices in type II superconductors with very high signal:noise ratios and relatively high spatial resolution (>100 nm). This paper will introduce the design principles of SHPM including the choice of semiconductor heterostructure for different measurement conditions as well as surface tracking and scanning mechanisms. The full potential of the technique will be illustrated with results of vortex imaging studies of three distinct superconducting systems: (i) vortex chains in the “crossing lattices” regime of highly anisotropic cuprate superconductors, (ii) vortex–antivortex pairs spontaneously nucleated in ferromagnetic-superconductor hybrid structures, and (iii) vortices in the exotic p-wave superconductor Sr₂RuO₄ at milliKelvin temperatures.     

Probe-based recording technology

The invention of the scanning tunneling microscope (STM) prompted researchers to contemplate whether such technology could be used as the basis for the storage and retrieval of information. With magnetic data storage technology facing limits in storage density due to the thermal instability of magnetic bits, the super-paramagnetic limit, the heir-apparent for information storage at higher densities appeared to be variants of the STM or similar probe-based storage techniques such as atomic force microscopy (AFM). Among these other techniques that could provide replacement technology for magnetic storage, near-field optical scanning optical microscopy (NSOM or SNOM) has also been investigated. Another alternative probe-based storage technology called atomic resolution storage (ARS) is also currently under development. An overview of these various technologies is herein presented, with an analysis of the advantages and disadvantages inherent in each particularly with respect to reduced device dimensions. The role of micro electro mechanical systems (MEMS) is emphasized.     

新型AFM探针的制备及应用

采用熔拉 -腐蚀复合方法 ,将普通单模石英光纤制成直锥形光纤探针。利用自制工具将探针打弯 ,制成悬臂式光纤探针 ,在AFM上取得了较理想的测试结果。将自制光纤探针和商用硅材料探针获得的两种扫描图像进行了对比 ,分析了悬臂式光纤探针的特点     

A novel atomic force microscope operating in liquid with open probe unit and optimized laser tracking system

A novel atomic force microscope （AFM） for large samples to be measured in liquid is developed. An innovative laser beam tracking system is proposed to eliminate the tracking and feedback errors. The open probe design of the AFM makes the operation in liquid convenient and easy. A standard 1200-lines/mm grating and a sheet of filter paper axe imaged respectively in air and liquid to confirm its performance. The corrosion behavior of aluminum surface in 1-mol/L NaOH solution is further investigated by the AFM. Experimental results show that the system can realize wide range （20 × 20 （μm）） scanning for large samples both in air and liquid, while keeping nanometer order resolution in liquid by eliminating the tracking and feedback error.     

Characterization of carbon nanotubes by scanning probe microscopy

Carbon nanotubes, fabricated by the Ebbesen-Ajayan method, were imaged using scanning tunneling microscopy (STM) and atomic force microscopy (AFM) in air and were compared to images obtained with high-resolution transmission electron microscopy (HRTEM). The HRTEM images revealed an abundance of elongated structures ranging in diameter from 3.0 to 30 nm, and with lengths of up to 0.8 μm. Many of the structures possessed several graphitic shells as if the tubes were nested one in the other. Reproducible images of the tubular structures, typically 20 nm in diameter and with a large variation in length, were obtained with both STM and AFM when the nanotubes were deposited on hydrogen-terminated Si(111), confirming that the nested structures observed with HRTEM do indeed have a tubular morphology. No single-walled, bare nanotubes or spherical fullerenes (typical of the Krätschmer-Huffman process) were observed.     

Investigation of the electronic properties of Au nanoclusters in SiO<Subscript>2</Subscript> by combined scanning tunneling/atomic force microscopy

The tunneling of electrons through Au nanoc lusters formed by pulsed laser deposition in a SiO₂ thin film on a Si substrate has been investigated by combined scanning/atomic force microscopy (STM/AFM). Conducting Pt-coated Si cantilevers were used. The feedback was maintained via the AFM channel, and the current-voltage (I-V) characteristics of the tunnel contact between the AFM probe and the n ⁺-Si substrate through a =4-nm-thick SiO₂ film with Au nanoclusters =2 nm in diameter were measured simultaneously. The current image of the structure contained areas of increased current (tunnel-current channels) 2–15 nm in size, related to tunneling of electrons through Au nanoclusters in SiO₂. The I-V characteristics recorded in the tunnel-current channels exhibit specific features related to the Coulomb blockade of electron tunneling through Au nanoclusters.     

Instrumentation of STM and AFM combined with transmission electron microscope

A scanning tunneling microscope (STM) combined with a transmission electron microscope (TEM) is a powerful tool for direct investigation of structures, electronic properties, and interactions at the atomic scale. Here, we report on two different designs of such TEM-STM as well as an extension with an atomic force microscope (TEM-AFM). In the first TEM-STM design, a stepper motor, combined with a one-dimensional inertial slider, was used to perform the coarse approach. The advantage of this design was the strong pulling force that enabled notched metallic wires to be broken inside the TEM, which lead to clean sample surfaces. A second design, with a three-dimensional inertial slider, allowed lateral motion inside the TEM, which simplified the adjustment of tip location on the sample. By replacing the STM tip with a standard AFM-cantilever chip, a new combination was demonstrated: TEM-AFM. Here the force was simply measured by direct TEM imaging of the motion of the AFM tip. Some experimental results are included to illustrate the capabilities of TEM-STM and TEM-AFM.     

Surface studies on bimetallic thiocyanate ligand based single crystals of MnHg(SCN)4, CdHg(SCN)4 and ZnCd(SCN)4

Bimetallic SCN ligand based single crystals of manganese mercury thiocyanate (MMTC), cadmium mercury thiocyanate (CMTC) and zinc cadmium thiocyanate (ZCTC) are grown by slow solvent evaporation technique. The growth mechanism and surface features are investigated by optical microscopic techniques such as scanning electron microscopy (SEM) and atomic force microscopy (AFM). The laser induced surface damage measurements were carried out using a Q-switched Nd:YAG laser at 1064 nm with laser beam of 1.0 Hz and pulse duration 25 ps. The laser damage threshold values of MMTC, CMTC and ZCTC are found to be 15.9, 22.9 and 19.7 GW/cm², respectively. The SEM analysis of MMTC reveals the formation of elongated dendrite growth pattern caused by the fluctuations of Mn and Hg metal ligands when thiocyanate (SCN) bridges them. The etching study indicates the occurrence of different types of etch pit patterns like terraced triangles, pillars, pyramids and rods. The AFM images confirm the formation of three major hillocks with cavities in MMTC. The measured roughness values for CMTC crystal are very much lower than that of MMTC.     

光学显微镜与CCD监视器组合的原子力显微镜

研制了一种与光学显微镜结合并配置 CCD 监视器的原子力显微镜,可同时获得样品的原子力显微镜图象及光学图象.已能分辨出5纳米的精细结构,最大扫描范围可达2μm.文中给出了本仪器获得的一些样品图象结果.     

Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S₁₁ of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.     

原子力显微镜探针耦合变形下的微观扫描力研究

原子力显微镜(AFM)的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态.采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响.研究表明，AFM的恒力模式扫描中，法向扫描力并不是恒定大小，与轴向扫描力存在耦合作用，在粗糙峰峰值增加阶段，二力均增加；在粗糙峰峰值减小阶段，二力均减小；该耦合作用随形貌坡度、针尖长度等增加而加强.微观形貌的测试信号和横向扫描侧向力信号受探针耦合变形影响较小，但侧向力与形貌斜率密切相关，且其极值点与形貌极值点存在位置偏差，这些结果均与原子力 关键词： 原子力显微镜 探针悬臂梁 耦合变形 扫描力     

Mechanical properties of H2Pc self-assembled monolayers at the single molecule level by noncontact atomic force microscopy

The mechanical properties of molecular self-assembled monolayers (SAMs) play an important role in understanding the interactions between molecules in the self-assembly, the interactions between molecules and substrate, and thus the formation mechanism of SAMs. Using a high-resolution noncontact atomic force microscope (NC-AFM) combined with a scanning tunneling microscope (STM), we have successfully obtained the sub-molecular resolution of a H(2)Pc self-assembled monolayer grown on a Pb(111) surface. A 2 × 2 superstructure was observed in both AFM and STM topographic images. The lateral critical force of removing a H(2)Pcmolecule from its SAM and moving a single H(2)Pc molecule on Pb(111) were measured. An oscillation of the critical force along the edge of the H(2)Pc SAM with a period of two molecular sites was observed, which can be attributed to the 2 × 2 superstructure. The lateral critical force caused by intermolecular interaction was found to be 25 pN on average and is typically two times larger than the molecule-substrate interaction.