The influence of wire shape on surface plasmon mode distribution

The influence of the nanowire shape on the excitation of surface plasmon polaritons at metallic nanowire arrays is studied numerically. For a system of silver nanowires housed on a polymer substrate, nanowires with rectangular and elliptical cross sections are compared. It was found that in the case of rectangular nanowires the excitation efficiency is higher for surface plasmons at the polymer–metal interface than for surface plasmons at the air–metal interface. Conversely, in the case of elliptical nanowires the air–metal plasmon modes are stronger. Further, it is noted that the nanowire shape directly influences the position of the surface plasmon resonance.     

Post-growth tailoring of quantum-dot saturable absorber mirrors by chemical etching

We have designed and grown a resonant, low-finesse quantum-dot saturable absorber mirror and subsequently modified the important parameters using chemical etching. The modulation depth and saturation fluence at the design wavelength of 1064 nm were modified by etching the sample to tune the cavity resonance. The device properties were characterised using normal incidence spectroscopic reflectivity measurements, intensity dependent reflectivity measurements and modelled using a transfer matrix approach. The saturable absorber mirror was used to facilitate self-starting, passively mode locked pulses in a neodymium vanadate laser operating at 1064 nm. The etching was found to affect the duration of the pulses, leading to temporal width tuning over a range of 94 ps. The shortest pulse duration of 84 ps was achieved for the cavity resonance close to 1064 nm, with an output power of 3 W. This method is an effective technique for post-growth engineering of the properties of semiconductor saturable absorber mirrors (SESAMs) with nanometre precision.     

Camera calibration based on paraxial raytracing

Traditional camera calibration is based on the pinhole model, which is an approximation algorithm using untrue geometrical assumptions and giving a single lumped result for the multiple optical elements in a camera. To provide an alternative method of camera calibration, we extend the traditional 2×2 matrix-based paraxial raytracing method to 6×6 in order to trace paraxial rays by using the first-order Taylor series expansion of Snell’s laws. Then we establish the geometric relationship between images and objects. Compared with the Snell’s Law camera calibration model of our previous work, the paraxial model offers explicit analytical sensitivity analysis for the mathematical manipulation of problematical conditions. Compared with the existing pinhole model, the proposed method, in addition to five intrinsic and six extrinsic parameters, gives the position parameters of each optical element of the camera system.     

Collective surface plasmon resonance coupling in silver nanoshell arrays

Collective surface plasmon resonance (SPR) excitations in an ordered array of silver nanoshells have been theoretically studied using generalized Mie theory. Near- and far-field radiative coupling between the nanoshells in the array result in a non-monotonic shift of the collective SPR band. When the distance between the shells in the array approaches that of the collective SPR wavelength, we observe narrowing of the collective SPR band due to constructive interference between the scattered electric field from the particles in the array. Further increase of the distance between the nanoshells in the array leads to destructive interference and broadening of the collective SPR band.     

Simultaneous excitation of cavity resonance and surface plasmon resonance in Ag/Al<Subscript>2</Subscript>O<Subscript>3</Subscript>/Ag layer structure

Simultaneous excitation of cavity resonance (CR) and surface plasmon resonance (SPR) was observed in the angular spectrum by substituting Ag/Al₂O₃/Ag layers for the metal film in a Kretschmann structure. Two reflective valleys, elicited respectively by CR and SPR, appeared at different positions in the angular spectrum. The former is the sum of enhanced transmission of CR and absorption of the metal, expressed in the reflection spectrum and extremely insensitive to the changes of the surface environment (refractive index). The latter behavior is like that when two metal films are stuck together: it has almost the same resonance depth and width, and is extremely sensitive to the changes of the surface environment. Moreover, two SPR peaks could be excited simultaneously at one angle but with different wavelengths in the frequency spectrum, which is not seen in traditional Kretschmann structures.     

Observation of enhanced beaming from photonic crystal waveguides

We report on the experimental observation of the beaming effect in photonic crystals using experimentally mapped spatial field distributions of energy emitted from a subwavelength photonic crystal waveguide into free-space, rendering with crisp clarity the diffractionless beaming of energy. Our experimental data agree well with our numerical studies of the beaming enhancement in photonic crystals with modulated surfaces. Without loss of generality, we study the beaming effect in a photonic crystal scaled to microwave frequencies and demonstrate the technological capacity to deliver long-range wavelength-scaled beaming of energy.     

Improved directional emission by resonant defect cavity modes in photonic crystal waveguide with corrugated surface

Directional emission of light from a photonic crystal (PC) waveguide can be observed by adding periodically corrugated surface as reported in Moreno et al. (Phys. Rev. B 69:121402, 2004). In this paper, it is being further shown by numerical simulation with finite-difference time-domain method that adding point defects to the adjacent layer of surface corrugations helps to improve directional emission. The coupling between the resonant cavity modes and surface modes is believed to account for this effect.     

EUV emission from solids illuminated with a laser-plasma EUV source

In this paper a possibility of performing fluorescence experiments in extreme ultraviolet (EUV) using a laboratory EUV source was demonstrated. Usually such measurements are performed using third-generation synchrotrons because of extremely low probability of fluorescence in this wavelength range. In this work a 10 Hz laser-plasma EUV source based on a gas puff target was used. Fluorescent radiation from Al and Si was registered. Despite relatively low spectral resolution, some differences in Si spectra coming from different kind of samples were revealed.     

Recent high-<Emphasis Type="Italic">p</Emphasis><Subscript><Emphasis Type="Italic">T</Emphasis></Subscript> results from STAR

We present selected recent results of multi-hadron correlation measurements in azimuth and pseudorapidity at intermediate and high p _T in Au+Au collisions at , from the STAR experiment at RHIC. At intermediate p _T , measurements are presented that attempt to determine the origin of the associated near-side (small Δφ) yield at large pseudo-rapidity difference Δη that is found to be present in heavy ion collisions. In addition, results are reported on new multi-hadron correlation measures at high-p _T that use di-hadron triggers and multi-hadron cluster triggers with the goal to constrain the underlying jet kinematics better than in the existing measurements of inclusive spectra and di-hadron correlations.     

Polarization-independent low-pass spatial filters based on one-dimensional photonic crystals containing negative-index materials

A new application of one-dimensional photonic crystals containing negative-index materials is proposed as low-pass spatial filters. Through optimizing the parameters of defect layer, a series of polarization-independent defect modes in the zero-average-index gap of the photonic crystals are obtained with the increase of the incident angle. Based on these defect modes, polarization-independent low-pass spatial filters are designed. The spatial-frequency bandwidth of the spatial filters can be adjusted by changing the period number of the defective photonic crystal structures. In addition, the effect of the losses of negative-index materials on the spatial filters is considered.     

Concentration quenching of Eu<Superscript>2+</Superscript> in a novel blue–green emitting phosphor: Ba<Subscript>2</Subscript>ZnSi<Subscript>2</Subscript>O<Subscript>7</Subscript>:Eu<Superscript>2+</Superscript>

A novel blue–green emitting phosphor Ba₂ZnSi₂O₇: Eu²⁺ was prepared by a combustion synthesis (CS) method. An efficient green emission under conditions ranging from ultraviolet to visible light was observed. The emission spectrum shows a single intensive band centered at 503 nm, which corresponds to the 4f ⁶5d ¹→4f ⁷ transition of Eu²⁺. The excitation spectrum is a broad band extending from 260 to 465 nm, which matches the emission of ultraviolet light-emitting diodes (UV-LEDs). The critical quenching concentration of Eu²⁺ in Ba₂ZnSi₂O₇:Eu²⁺ phosphor is about 0.05 mol. The corresponding concentration quenching mechanism is verified to be a dipole–dipole interaction. The value of the critical transfer distance is calculated as 19 Å, which is in good agreement with the value (20 Å) derived from the experimental data.     

Numerical analysis of the spectral response of an NSOM measurement

Near-field Scanning Optical Microscopy (NSOM) is a powerful tool for investigating optical field with resolution greater than the diffraction limit. In this work, we study the spectral response that would be obtained from an aperture NSOM system using numerical calculations. The sample used in this study is a bowtie nanoaperture that has been shown to produce concentrated and enhanced field. The near- and far-field distributions from a bowtie aperture are also calculated and compared with what would be obtainable from a NSOM system. The results demonstrate that it will be very difficult to resolve the true spectral content of the near-field using aperture NSOM. On the other hand, the far-field response may be used as a guide to the near-field spectrum.     

Morphology studies of the metal surfaces with enhanced absorption fabricated using interferometric femtosecond ablation

Recently, the enhancing of bulk metals optical absorption with focused femtosecond pulses was demonstrated. This absorption enhancement is caused by different nano- and micro-structures which are formed during laser ablation with ultrashort pulses. In this paper we study the evolution of the surface structures using interferometric ablation and compare it to normal fs-ablation. Previously we have shown that interferometric femtosecond ablation is an efficient method to fabricate absorbing metal surfaces. In this study we ablated large areas of hole-array structures with different pulse numbers in polished stainless steel and copper samples. The evolution of surface morphology and the depth of the holes for these structured surfaces are presented. In addition, the reflectance of laser generated surface structures are measured at the wavelength range of 200–2300 nm using a standard spectrophotometer.     

Laser pulse transient method for measuring the normal spectral emissivity of samples with arbitrary surface quality

A laser pulse transient method for measuring normal spectral emissivity is described. In this method, a laser pulse (λ=1064 nm) irradiates the top surface of a flat specimen. A two-dimensional temperature response of the bottom surface is measured with a calibrated thermographic camera. By solving an axisymmetric boundary value heat conduction problem, the normal spectral emissivity at 1064 nm is determined by using an iterative nonlinear least-squares estimation procedure. The method can be applied to arbitrary sample surface quality. The method is tested on a nickel specimen and used to determine the normal spectral emissivity of AISI 304 stainless steel. The expanded combined uncertainty of the method has been estimated to be 18%.     

Broad spectral photonic crystal fiber surface enhanced Raman scattering probe

A broad spectral surface enhanced Raman scattering sensor is developed using the solid core holey photonic crystal fiber with silver nanoparticles cluster. This SERS probe offers an operational excitation wavelength range overlaying visible light and near infrared light. The PCF SERS sensing is demonstrated in the detection of the 4-Mercaptobenzoic acid (10⁻⁶ M) solution with 514.5 and 785 nm excitation. In this structure of PCF sensor, the related analysis shows that leakage modes also make an important contribution in the SERS activity not only by the evanescent field way.     

Generalized multiple-prism dispersion theory for laser pulse compression: higher order phase derivatives

An exact, and explicit, expression for the second derivative of the generalized multiple-prism angular dispersion is provided. This corresponds to the third derivative of the generalized exit angle with respect to the refractive index (∇ _n ³ φ _2,m ). Higher derivatives, in abstract notation, are also given. The generalized equations are presented in a format applicable to practical prismatic configurations utilized in laser pulse compression schemes in the femtosecond domain. Exact values, as a function of the refractive index, are given for the first, second, and third angular derivatives for compensating double-prism and four-prism configurations of practical interest.     

Fully-connected networks with local connections

Fully-connected mesh networks with local connections are described. Each connector links only nearest neighbors of the node lattice and carries enough passive pass-through vias to provide direct one-to-one links between all the nodes. If the nodes form a one-dimensional ring, then each connector must contain at least N(N−1)/2 physical channels. However, if the nodes are arranged in a d-dimensional hyper-torus, the number of channels per connector drops to N(N ^1/d −1)/2, which scales much more favorably at large N. Such arrangements can provide fully-meshed connectivity when parts of the network are physically inaccessible or when the network needs to be scaled up in a modular fashion.     

The effect of silicon substrate on thickness of SiO2 thin film analysed by spectral reflectometry and interferometry

Techniques of spectral reflectometry and interferometry are used for measuring small changes in thickness of SiO₂ thin film grown by thermal oxidation on different silicon substrates. A slightly dispersive Michelson interferometer with one of its mirrors replaced by a thin-film structure is used to measure the reflectance and interferometric phase of the thin-film structure at the same time. The experimental data are used to determine precisely the thickness of the SiO₂ thin film on silicon wafers of two crystallographic orientations and different dopant concentrations. We confirmed very good agreement between the experimental data and theory and revealed that the thin-film thickness, which varies with the type of silicon substrate, depends linearly on the wavelength at which minimum in the spectral reflectance occurs. Similar behaviour was revealed for the interferometric phase.     

High-resolution X-ray imaging—a powerful nondestructive technique for applications in semiconductor industry

The availability of high-brilliance X-ray sources, high-precision X-ray focusing optics and very efficient CCD area detectors has contributed essentially to the development of transmission X-ray microscopy (TXM) and X-ray computed tomography (XCT) with sub-50 nm resolution. Particularly, the fabrication of high aspect ratio Fresnel zone plates with zone widths approaching 15 nm has contributed to the enormous improvement in spatial resolution during the previous years. Currently, Fresnel zone plates give the ability to reach spatial resolutions of 15 to 20 nm in the soft and of about 30 to 50 nm in the hard X-ray energy range. X-ray microscopes with rotating anode X-ray sources that can be installed in an analytical lab next to a semiconductor fab have been developed recently. These unique TXM/XCT systems provide an important new capability of nondestructive 3D imaging of internal circuit structures without destructive sample preparation such as cross sectioning. These lab systems can be used for failure localization in micro- and nanoelectronic structures and devices, e.g., to visualize voids and residuals in on-chip metal interconnects without physical modification of the chip. Synchrotron radiation experiments have been used to study new processes and materials that have to be introduced into the semiconductor industry. The potential of TXM using synchrotron radiation in the soft X-ray energy range is shown for the nondestructive in situ imaging of void evolution in embedded on-chip copper interconnect structures during electromigration and for the imaging of different types of insulating thin films between the on-chip interconnects (spectromicroscopy).