Ultrasensitive UV-tunable grating in all-solid photonic bandgap fibers

We study the shift of a long period grating’s resonance wavelength with UV induced refractive index changes in an all-solid photonic bandgap fiber. A long period grating is mechanically imprinted in an all-solid photonic bandgap fiber with Germanium doped silica high-index rods in a lower-index silica background. The index of the high-index rods is modified through UV exposure, and we observe that the long period grating’s resonance shifts with the bandgaps. With a sensitivity of 21,000 nanometers per refractive index unit and a 8.8 nm resonance width changes of refractive index of 3 × 10⁻⁶ are in principle detectable     

Line patterning with large refractive index changes in the deep inside of glass by nanosecond pulsed YAG laser irradiation

Nanosecond (∼100 ns) pulsed (10 Hz) Nd:YAG laser operating at the wavelength (λ) of 1064 nm with pulse energies of 0.16-1.24 mJ/cm² has irradiated 10Sm₂O₃·40BaO·50B₂O₃ glass. It is demonstrated for the first time that the structural modification resulting the large decease (∼3.5%) in the refractive index is induced by the irradiation of YAG laser with λ=1064 nm. The lines with refractive index changes are written in the deep inside of 100-1000 μm depths by scanning laser. The line width is 1-13 μm, depending on laser pulse energy and focused beam position. It is proposed that the samarium atom heat processing is a novel technique for inducing structural modification (refractive index change) in the deep interior of glass.     

Femtosecond laser embedded grating micromachining of flexible PDMS plates

We report on the femtosecond laser micromachining of photo-induced embedded diffraction grating in flexible Poly (Dimethly Siloxane) (PDMS) plates using a high-intensity femtosecond (130 fs) Ti: sapphire laser (λ_p = 800 nm). The refractive index modifications with diameters ranging from 2 μm to 5 μm were photo-induced after the irradiation with peak intensities of more than 1 × 10¹¹ W/cm². The graded refractive index profile was fabricated to be a symmetric around from the center of the point at which femtosecond laser was focused. The maximum refractive index change (Δn) was estimated to be 2 × 10⁻³. By the X-Y-Z scanning of sample, the embedded diffraction grating in PDMS plate was fabricated successfully using a femtosecond laser.     

Tunable negative index metamaterial using yttrium iron garnet

A magnetic field tunable, broadband, low-loss, negative refractive index metamaterial is fabricated using yttrium iron garnet (YIG) and a periodic array of copper wires. The tunability is demonstrated from 18 to 23 GHz under an applied magnetic field with a figure of merit of 4.2 GHz/kOe. The tuning bandwidth is measured to be 5 GHz compared to 0.9 GHz for fixed field. We measure a minimum insertion loss of 4 dB (or 5.7 dB/cm) at 22.3 GHz. The measured negative refractive index bandwidth is 0.9 GHz compared to 0.5 GHz calculated by the transfer function matrix theory and 1 GHz calculated by finite element simulation.     

Simultaneous measurement of refractive index and temperature using dual-period grapefruit microstructured fiber grating

By cascading the long period fiber grating (LPFG) and fiber Bragg grating (FBG) in grapefruit microstructured fiber, a novel dual-period fiber grating sensor is proposed. The refractive index and temperature are measured simultaneously by using the different sensitivity of FBG and LPFG. The relationship between dual-period fiber grating transmission spectrum and refractive index, resonant wavelengths and temperature are analyzed theoretically, respectively. The simulation results show that the accuracy of the sensor in measuring refractive index and temperature is estimated to be 2319.6 nm/RIU in a range from 1.33 to 1.36 and 0.017 nm/°C from 0 °C to 100 °C, respectively. Thus, the sensor has high refractive index sensitivity, and can provide the theoretical foundation for the optical fiber biosensor.     

Measurement of refractive index variation of liquids by surface plasmon resonance and wavelength-modulated heterodyne interferometry

In this study an alternative method based on surface plasmon resonance is proposed for in-situ monitoring of variation in the refractive index of a test sample. A wavelength-modulated light source and an unequal-path-length optical configuration heterodyne interferometer are used to detect the phase difference change, which can then be used to estimate the change in the refractive index of a test sample. The experimental results demonstrate a phase stability of 0.02°. The resolution power of the refractive index is 1.5 × 10^− 6 RIU. This method has several advantages over previously used methods such as simple optical setup, easier operation in real time, and low cost.     

Design and simulation of a novel 32 × 32 photonic bandgap power switch based on SOI waveguide

In this paper, we propose a novel 32 × 32 photonic bandgap (PBG) power switch based on silicon-on-insulator (SOI) substrate. The 32 × 32 PBG power switch merges the design concept of PBG structure and multimode interference (MMI) structure. With controlling the voltages of 256 blocks for changing the refractive index, we can demonstrate that the light propagation direction can be switched to the assigned output port as a 32 × 32 power switch. According to the simulations, the power switching control tables are searched and selected for successful switching. The size of our designed 32 × 32 PBG switch can be reduced to 252 × 6040 μm which is much smaller than the conventional opto-electronic switches.     

Synthesis and investigation of nonlinear optical properties of semiconductor ZnS nanoparticles

ZnS nanoparticles were prepared by a simple chemical method and using PVP (poly vinylpyrrolidone) as capping agent. The sample was characterized by UV-vis spectrophotometer, X-ray diffraction (XRD) and Z-scan technique. XRD pattern showed that the ZnS nanoparticles had zinc blende structure with an average size of about 2.18 nm. The value of band gap of these nanoparticles was measured to be 4.20 eV. The nonlinear optical properties of ZnS nanoparticles in aqueous solution were studied by Z-scan technique using CW He-Ne laser at 632.8 nm. The nonlinear absorption coefficient (β) was estimated to be as high as 3.2×10⁻³ cm/W and the nonlinear refractive index (n₂) was in order of 10⁻⁸ cm²/W. The sign of the nonlinear refractive index obtained negative that indicated this material exhibits self-defocusing optical nonlinearity.     

The preparation and refractive index of BST thin films

Radio-frequency magnetron sputtering technique is used to deposit Ba_0.65Sr_0.35TiO₃ (BST) thin films on fused quartz substrates. In order to prepare the high-quality BST thin films, the crystallization and microstructure of the films were characterized by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM). More intense characteristic diffraction peaks and better crystallization can be observed in BST thin films deposited at 600 °C and subsequently annealed at 700 °C. The refractive index of the films is determined from the measured transmission spectra. The dependences of the refractive index on the deposition parameters of BST thin films are different. The refractive index of the films increases with the substrate temperature. At lower sputtering pressure, the refractive index increases from 1.797 to 2.197 with pressure increase. However, when the pressure increases up to 3.9 Pa, the refractive index reduces to 1.86. The oxygen to argon ratio also plays an important effect on the refractive index of the films. It has been found that the refractive index increases with increase in the ratio of oxygen to argon. The refractive index of BST thin films is strongly dependent on the annealing temperature, which also increases as the annealing temperature ascends. In a word, the refractive index of BST thin films is finally affected by the films’ microstructure and texture.     

The optical properties of planar waveguides in LiB3O5 crystals formed by Cu implantation

A planar optical waveguide has been formed in a LiB₃O₅ crystal using 6.0 MeV Cu⁺-ions with a dose of 1 × 10¹⁵ ions/cm² at room temperature. Possible propagating modes were measured at a wavelength of 633 nm using the prism-coupling method. The refractive index profiles of the waveguide were reconstructed by an effective refractive index method and the beam propagation method was used to investigate the properties of the propagation modes in the formed waveguide. The results suggest that the fundamental TE₀ and TM₀ modes may be well-confined and propagate a longer distance inside the waveguide. The implantation process was also simulated using the transport of ions in matter code (TRIM), which indicates that the nuclear energy deposition may be the main factor for the refractive index change.     

Characterization of optical planar waveguide in Ce:KNSBN crystal formed by triple-energy helium ion implantation

We report on the optical planar waveguide formation and modal characterization in a Ce:KNSBN crystal by triple helium ion implantation at energies of (2.0, 2.2 and 2.4 MeV) and fluences of (1.5, 1.65 and 2.25) × 10¹⁵ cm⁻². The prism-coupling method is used to investigate the dark-line spectroscopy at wavelength of 632.8 and 1539 nm, respectively. The refractive index profiles of the waveguide are reconstructed by an effective refractive index method. It is found that the ion-beam irradiation creates slight increase of extraordinary index whilst decreases ordinary one in the guide region. The modal analysis shows, at wavelength of 632.8 nm, the fields of one TE and three TM modes are well restricted in the guiding region, which means the formation of non-leaky waveguide in the crystal. The damping coefficients of the waveguide are 0.6 and 1.6 cm⁻¹ for ordinary and extraordinary polarized light at 632.8 nm, respectively.     

Influence of substoichiometer on the laser-induced damage characters of HfO2 thin films

HfO₂ is one of the most important high refractive index materials for depositing high power optical mirrors. In this research, HfO₂ thin films were prepared by dual-ion beam reactive sputtering method, and the laser-induced damage thresholds (LIDT) of the sample were measured in 1-on-1 mode for laser with 1064 nm wavelength. The results indicate that the LIDT of the as-grown sample is only 3.96 J/cm², but it is increased to 8.98 J/cm² after annealing under temperature of 200 °C in atmosphere. By measuring the laser weak absorption and SIMS of the samples, we deduced that substoichiometer is the main reason for the low LIDT of the as-grown sample, and the experiment results were well explained with the theory of electronic-avalanche ionization.     

Optical properties of methane to 288 GPa at 300 K

Optical properties of solid methane (CH₄) were studied at high pressure and room temperature using a diamond anvil cell. Reflectivity and transmission measurements were used to measure the refractive index to 288 GPa. Fabry-Perot interferometery was used to measure the sample thickness to 172 GPa. This data was fitted to the derived expression of thickness vs. pressure that was then used to calculate the thickness to 288 GPa. This in turn was combined with optical absorption experiments to obtain the absorption coefficient and hence the extinction coefficient k^*. From combined reflection and absorption experiments the refractive index n=n_s+ik^* was obtained. The index of refraction and the ratio of molar refraction to molar volume showed a large increase between 208 and 288 GPa. This behavior indicated that a phase transformation of insulator-semiconductor might have occurred in solid CH₄ by 288 GPa.     

Broadband near-infrared fibers dispersion measurement using white-light spectral interferometry

A new technique for an experimental determination of the effective refractive index, group refractive index and dispersion of fibers in a broad near-infrared spectral range is presented. The method is based on a white-light spectral interference which utilizes an unbalanced Michelson interferometer. The effective refractive index is obtained by a direct fitting the cosine function to the spectral interference pattern recorded by a low resolution spectrometer. The method has been tested in the spectral range of 1000-1700 nm both with standard telecommunication fibers and a sample of a photonic fiber. The accuracy of dispersion measurement () exceeds those from the previously reported near-infrared white-light spectral interference methods.     

Research on the temperature characteristics of optical fiber refractive index

The delay of optical signal is determined by the refractive index and length of optical fiber, and temperature would have an intense influence on the index. To establish the relationship between refractive index and temperature, the temperature characteristics of refractive index was analyzed and the thermo-optical coefficient equation was derived according to the polarization of the induced electric dipole moment in SiO₂ optical fiber. A measuring system based on optical fiber delay was carried out to measure the index within the temperature range of −30 °C to 70 °C and the experimental result was compared with the theoretical result. The final result shows that the relationship between refractive index and temperature is linear in the temperature range of discussion.     

Determination of the refractive index over a wide wavelength range through time-delay measurements of femtosecond pulses

We present a simple method to measure the refractive index dispersion over a broad wavelength range (0.6-1.6 μm). In a first step, the optical group indices are obtained by measuring the time-retardation of tunable 150 fs laser pulses within a sample relative to air. The refractive index dispersion is then calculated using a Sellmeier equation that describes the measured group index dispersion. We show that our experimental data agree with previously published results to within 2 × 10⁻⁴ for a 3 mm thick sample of fused silica and to within 3 × 10⁻³ for the index n₁ of a 2 mm thick crystal of the highly dispersive and anisotropic organic crystal 4-N,N-dimethylamino-4′-N′-methyl stilbazolium tosylate (DAST).     

Highly-sensitive silicon-on-insulator sensor based on two cascaded micro-ring resonators with vernier effect

A highly-sensitive integrated optical biosensor based on two cascaded micro-rings resonator (MRR) is investigated theoretically and experimentally. The free spectral ranges (FSRs) of two cascaded micro-rings are designed to be slightly different in order to generate Vernier effect. A preliminary investigation of our sensor with a Q factor of 2 × 10⁴ using different ethanol concentrations shows that the Vernier effect can improve the sensitivity to 1300 nm per refractive index unit (RIU), compared to 62 nm/RIU for a single ring sensor. The sensor also has a large measurement range of refractive index change up to 1.15 × 10^− 2 RIU. It can be useful for low-cost and highly-sensitive optical biosensor system.     

Dependence of film thickness on the structural and optical properties of ZnO thin films

ZnO thin films are prepared on glass substrates by pulsed filtered cathodic vacuum arc deposition (PFCVAD) at room temperature. Optical parameters such as optical transmittance, reflectance, band tail, dielectric coefficient, refractive index, energy band gap have been studied, discussed and correlated to the changes with film thickness. Kramers-Kronig and dispersion relations were employed to determine the complex refractive index and dielectric constants using reflection data in the ultraviolet-visible-near infrared regions. Films with optical transmittance above 90% in the visible range were prepared at pressure of 6.5 × 10⁻⁴ Torr. XRD analysis revealed that all films had a strong ZnO (0 0 2) peak, indicating c-axis orientation. The crystal grain size increased from 14.97 nm to 22.53 nm as the film thickness increased from 139 nm to 427 nm, however no significant change was observed in interplanar distance and crystal lattice constant. Optical energy gap decreased from 3.21 eV to 3.19 eV with increasing the thickness. The transmission in UV region decreased with the increase of film thickness. The refractive index, Urbach tail and real part of complex dielectric constant decreased as the film thickness increased. Oscillator energy of as-deposited films increased from 3.49 eV to 4.78 eV as the thickness increased.     

Characterization of optical waveguide in Nd: GdVO4 by triple-energy oxygen ion implantation

We report on the optical planar waveguide formation and modal characterization in Nd: GdVO₄ crystals by triple oxygen ion implantation at energies of (2.4, 3.0, and 3.6 MeV) and fluences of (1.4, 1.4, and 3.1)  × 10¹⁴ions/cm². The prism-coupling method is used to investigate the dark-mode property at wavelength of 632.8 nm. The refractive index profiles of the waveguide are reconstructed by an effective refractive index, n_eff method. The modal analysis shows that the fields of TE modes are well restricted in the guiding region, which means the formation of nonleaky waveguide in the crystal.     

Influence of substrate temperature on the optical and piezoelectric properties of ZnO thin films deposited by rf magnetron sputtering

In this study, ZnO thin films were fabricated using the rf magnetron sputtering method and their piezoelectrical and optical characteristics were investigated for various substrate temperatures. The ZnO thin film has the largest crystallization orientation for the (0 0 2) peak and the smallest FWHM value of 0.56° at a substrate temperature of 200 °C. The surface morphology shows a relatively dense surface structure at 200 °C compared to the other substrate temperatures. The surface roughness shows the smallest of 1.6 nm at a substrate temperature of 200 °C. The piezoelectric constant of the ZnO thin film measured using the pneumatic loading method (PLM) has a maximum value of 11.9 pC/N at a substrate temperature of 200 °C. The transmittance of the ZnO thin film measured using spectrophotometry with various substrate temperatures ranged from 75 to 93% in the visible light region. By fitting the refractive index from the transmittance to the Sellmeir dispersion relation, we can predict the refractive index of the ZnO thin film according to the wavelength. In the visible light range, the refraction index of the ZnO thin film deposited at a substrate temperature of 200 °C is the range of 1.88-2.08.