Depolarization of backscattered linearly polarized light from ZnO thin film

The depolarization behavior of backscattered linearly polarized light from ZnO thin film was investigated experimentally. The results show that the characteristics are related to both the polarization orientation and wavelength of linearly polarized incident light. When the incident light is s-polarized, the depolarization behaviors are different for different wavelengths. When the incident light is p-polarized, the depolarization behaviors, on the contrary, are similar for different wavelengths. In addition, there is an optimal incident angle for depolarization of linearly polarized light with different wavelengths, which is equal to their effective Brewster angles, respectively.     

Anisotropic laser-induced evaporation of graphite films

An experimental investigation of the effect of linearly polarized high-energy pulsed laser light, normally incident on a carbon thin film, is reported. The material under study consists of platelike graphite crystallites with basal crystallographic planes mostly oriented perpendicular to the substrate surface. An increase is revealed in the fraction of the graphite crystallites oriented perpendicular to the polarization plane. Laser light is found to cause significant anisotropy in diffuse scattering by the film surface. Experimental observations are explained by a model of anisotropic evaporation of graphite-like carbon material due to polarization dependence of the absorption and reflection coefficients for a rough surface.     

Modulation of the polarization state of light using a weak anisotropic thin film

The polarization state of light is modulated by an anisotropic thin film. An anisotropic MgF(2) film is deposited onto a plate that is put in contact with a BK7 prism to form a BK7 prism/film/air configuration. It is shown that the polarization state of reflected light can be easily modulated from a linear state to a circular state by rotating the thin-film plate.     

Resonant terahertz generation from InN thin films

Highly efficient conversion from ultrafast optical pulses to their terahertz (THz) counterparts has been achieved with InN thin films. An average THz output power as high as 0.931 microW has been obtained for an average pump power of 1 W, corresponding to a normalized conversion efficiency of 190% mm(-2). Based on our measured dependences of the THz output power on pump polarization, incident angle, pump power, and InN film thickness, resonance-enhanced optical rectification is one of the most plausible mechanisms for the THz generation in the InN films.     

投影光学系统中的偏振像差分析

当光束斜入射时,光学薄膜存在一定的偏振效应。在飞利浦棱镜系统中,当一定大小孔径角的照明光束斜入射到分色合色薄膜后,S偏振分量和P偏振分量存在一定的相位差,使得线偏振光变成椭圆偏振光。利用琼斯矩阵偏振光线追迹的方法,分析了投影光学系统中由于两偏振分量相位差引起的偏振像差,以及它与暗态泄漏光强和系统衬比度的关系。得出了系统出瞳面上的光波偏振特性,以及在不同大小孔径角的照明光束入射下偏振像差的变化。分析了膜厚监控误差对光学系统偏振像差的影响,发现膜厚监控误差对偏振像差和系统衬比度有很大的影响。所使用的分析方法可以应用于其他大口径光学系统。     

Design of non-polarization angle-tuned narrowband thin film filter

Angle-tuned thin film bandpass filter is widely used in DWDM system. In oblique incidence, the bandwidths and central wavelengths of the P-polarization and S-polarization light will separate obviously, which will cause serious polarization dependent loss. These phenomena of the polarization sensitivities are analyzed and a novel non-polarization 100 GHz four-cavity narrowband dielectric thin film stack used in oblique incidence is proposed. The simulation results show that it can eliminate the polarization bandwidths and central wavelengths separation within the incident angle from 0° to 25°, and its tunable range can cover the whole C-band.     

Polarization characteristics and magneto-optic diffraction efficiency at oblique light incidence

In a great number of papers that deal with the study of the magneto-optic diffraction (MOD), theoretical analysis and interpretation of experimental data are performed without regard for reflection effects of the incident and diffracted light beams on the entrance and exit surfaces of the transparent film. In consequence the MOD parameters are not connected with the angle of light incidence and the orientation of the incident light polarization plane. In the present work the reflection effects are taken into account. For the Raman-Nat diffraction region the general expressions involving the relationships of diffracted light polarization and intensity with the symmetry of the grating, angle of incidence and polarization of the incident light are obtained. In particular it is shown that even for a symmetrical grating the polarization of the zeroth-order diffracted beam differs from that of the incident light, and the polarization of higher-order beams differs from the orthogonal one providing that the incident light is not s- or p-polarized. A maximum in the angular dependence of diffraction efficiency is predicted being observed experimentally.     

Electrically-Controllable Liquid Crystal Polarizing Filter for Eliminating Reflected Light

A high-speed controllable polarizing filter has been developed to eliminate obstructive polarized light reflected from glass and watery surfaces for image pickup in video media program producing and marine dynamic remote sensing. In this device, the polarization plane of incident light is rotated through 0°, 45°, 90° or 135° by an electrically-controllable polarization rotator composed of 45° and 90° twisted nematic liquid crystal cells, and the polarization component of reflected light is absorbed by a fixed polarizing film. It selectively absorbs more than 80% of incident white light linearly polarized in an arbitrary direction. With the drastic reduction of reflected light, the object images hidden by the bright reflected light are clearly captured in real time. Another type of polarizing filter, using a guest-host liquid crystal cell instead of the polarizing film, controls light absorption as well as polarization angle.     

基于谐振环的太赫兹宽带偏振转换器件研究

提出了一个基于谐振环结构的宽带且高效的太赫兹线偏振转换器.该结构由金属-电介质-金属三层构成,位于顶层的是基于开口谐振环的超表面,中间为介质层,底部为金属板.实验结果表明,该结构可以在0.59-1.24 THz频率范围内将线偏振的太赫兹波偏振方向旋转90°,转换率超过80%.通过计算该结构在所研究的频率范围内反射光的偏振角和椭圆角,证实了该结构可以在较宽的频率范围内实现高效的线偏振转换.对该结构在偏振转换率高的频率下表面电流和电场进行仿真,分析了高偏振转换率和宽带的机理.同时,研究了该结构的偏振转换率对入射角以及偏振角的依赖性,结果表明该结构在0°-30°入射角范围内、-10°-10°偏振角范围内均有很好的偏振转换性能.     

纳米ZnO薄膜的反射及偏振特性研究

用电子束蒸发镀膜法制备了纳米ZnO薄膜．通过测量其X射线衍射谱,计算出纳米ZnO颗粒的平均粒径大小为30nm．实验研究了纳米ZnO薄膜的反射和偏振性质,结果表明：当振动方向平行于入射面的线偏振光（简称P光）入射纳米ZnO薄膜时,不存在严格意义上的布儒斯特角,但对于入射角却存在一个临界角β．当入射角小于β时,反射光的振动面随着入射角的增大向左旋转;当入射角大于β时,振动面转而向右旋转;当振动方向垂直于入射面的线偏振光（简称S光）入射纳米ZnO薄膜时,反射光的振动面始终向左旋转．     

Polarization phase-shifting interferometer by rotating azo-polymer film with photo-induced optical anisotropy

A new type of phase-shifting interferometer was presented by rotating an azo-polymer film with photo-induced optical anisotropy in the light path of orthogonal polarization interferometry. By changing the angle of the optical axis of the azo-polymer film, four phase-shifted fringe patterns were obtained, from which phase difference between orthogonal polarized light could be calculated. The polarization states and the formation of the interferograms were analyzed theoretically using Jones matrix calculations and the experimental verification of the proposed method was also given. This method has a simple optical configuration which utilizes commercially available polarization devices and anisotropic azo-polymer film of low cost. The phase-shifting interferometer also demonstrates a new application of azo-polymer film.     

Ultrabroadband strong light absorption based on thin multilayered metamaterials

Light absorbers have drawn intensive attention as crucial components for solar‐energy harvesting, thermal emission tailoring, modulators, etc. However, achievement of light absorbers with wide bandwidth remains a challenge thus far. Here, a thin, unprecedentedly ultrabroadband strong light absorber is proposed and experimentally demonstrated, which consists of periodic taper arrays constructed by an alumina–chrome multilayered metamaterial (MM) on a gold substrate. This MM can change from a hyperbolic material to an anisotropic dielectric material at different frequency ranges and the special material features are the fundamental origins of the ultrabroadband absorption. The absorber is quite insensitive to the incident angle, and can be insensitive to the polarization. One two‐dimensional periodic array of 400‐nm height MM tapers is fabricated. The measured absorption is over 90% over almost the entire solar spectrum, reaching an average level of 96%, and remains high (above 85%) even in the longer‐wavelength range till 4 μm. The proposed absorbers open up a new avenue to realize broadband thin light‐harvesting structures.     

Bragg diffraction of light by ultrasonic shear waves in a plane-parallel layer

We have studied anisotropic Bragg diffraction of light by ultrasonic shear waves in an optically isotropic plane-parallel layer. We have established the analytical dependences of the relative intensities and polarization azimuths of reflected and transmitted diffracted waves on the intensity of the ultrasound, the layer thickness, the angle of incidence, and the polarization azimuth of the incident light. We show that rotation of the plane of polarization of the diffracted wave is determined by the different Fresnel reflection of the s and p polarized components of the incident light in the plane-parallel layer. We have determined that in mismatched acousto-optic structures, deep amplitude modulation of transmitted and reflected light is possible which is an order of magnitude greater than the usual modulation in matched structures.     

薄膜光学锥形光栅的制备与光学特性分析

为了在光学薄膜中引入连续轮廓的微结构,综合利用薄膜的干涉效应与微结构的折反射、衍射效应,提出一种薄膜光学微结构的制备工艺。基于时域有限差分方法设计了具有可见光波段减反射特性的薄膜光学锥形光栅;采用单点金刚石车削技术,结合纳米压印与电感耦合等离子体刻蚀技术,在SiN_x薄膜中制备出高1.6 μm,周期4.1 μm的锥形光栅;在可见光波段,SiN_x薄膜光学锥形光栅的平均反射率为5.7%,反射率的实验检测结果与仿真计算结果达到很高的一致性;当入射光角度在30°以内,薄膜光学锥形光栅的减反特性表现出对光波入射角度的不敏感性。该制备工艺突破了单点金刚石车削技术的材料局限,将连续轮廓的微结构的直接形成工艺拓展至介质薄膜当中,实现了宽光谱、宽入射角度的减反射。     

Optimization of evanescent wave imaging for the visualization of protein adsorption layers

We have optimized the settings of evanescent wave imaging for the visualization of a protein adsorption layer.The enhancement of the evanescent wave at the interface brought by the incident angle,the polarized state of light beam as well as a gold layer is considered.In order to improve the image contrast of a protein monolayer in experiments,we have optimized three factors- the incident angle,the polarization of light beam,and the thickness of an introduced thin gold layer with a theoretical simulation.     

Optical Rectification in Isotropic Thin Film Composed of Chiral Molecules with a Tripod-Like Structure

Optical rectification （OR） effect in the isotropic thin film consisting of chiral molecules with a tripod-like structure is investigated. The expressions of static-electric polarization in the isotropic chiral thin films and the relations between the OR and microscopic parameters of chiral medium are obtained by theoretical derivation. Furthermore, the relations of static electric polarization with the wavelength of incident light and parameters of chiral molecules are simulated numerically.     

Polarization properties of thick anisotropic diffraction holograms recorded with infrared-polymerizable media

The polarization properties of thick anisotropic holographic gratings are studied theoretically and experimentally. The dependences of the diffraction efficiency, ellipticity, and polarization orientation of the diffraction beam on the azimuth angle of polarization of an incident Bragg beam are derived. The experimental data are shown to agree well with the analytical calculations. It is found that the diffraction characteristics can be controlled in a wide range of incident polarization.     

温度变化对金属Ag膜反射镜偏振特性的影响研究

空间遥感应用中的光学有效载荷对系统偏振控制提出了越来越高的要求,作为常用的宽光谱反射镜,金属银(Ag)膜反射镜的偏振特性随着环境温度的改变而变化。本文设计并制备了低偏振灵敏度的Ag膜反射镜,研究了反射镜在45°和60°入射角下,从室温25℃升温到150℃时的偏振特性变化和反射光谱变化情况。随着温度的升高,Ag膜的折射率在350~1 200 nm波长范围内有所增加;Ag膜反射镜的反射光中s和p光的相位差Δ在350~600 nm波长范围内减小,在600~650 nm波长范围内基本稳定,在650~1 200 nm波长范围内增大。温度上升到125℃时,Ag膜和反射镜表面形貌发生改变,增加了表面散射和吸收,导致350~900 nm波段反射率降低,在波长350 nm附近的降低约25%。     

Dependence of wavDependence of wavefront errors on nonuniformity of thin films

In contrast to uncoated substrate, a nonlinear relationship of phase shift with the thicknesses of the thin film makes the calculation of wavefront aberration complicated. A program is compiled to calculate the wavefront aberration of multilayer thin film produced by thickness nonuniformity. The physical thickness and the optical phase change on reflection are considered. As an example, the wavefront aberration of the all-dielectric mirror is presented in ArF excimer lithography system with a typical thickness distribution. In addition, the wavefront errors of the thin film at wavelengths of 193 and 633 nm are compared in the one-piece and two-piece arrangements. Results show that the phase shift upon reflection of the thin film produced by thickness nonuniformity is very sensitive to the incident angle, wavelength, and polarization.     

Investigations of aluminum films with synchrotron radiation of wavelengths 500 to 1000 Å

Measurements of the photocurrent from thin Al cathodes in a windowless electron multiplier as a function of wavelength, polarization, angle of incidence, and film thickness have been carried out in the extreme vacuum ultraviolet. A normal incidence monochromator utilizing synchrotron radiation provided highly polarized light. A marked difference is found between the photocurrent measured during irradiation of thin films with “s” and “p” polarized light at wavelengths near the Al plasma wavelength (835 Å). For films thicker than about 500 Å pronounced interference effects are found in both “p” and “s” light at wavelengths less than the plasma wavelength. The observations can be explained by assuming the photocurrent is related to the photon density (electromagnetic energy density) in the photocathode. Calculations of the energy density in films irradiated with light give the structure found in the measured photocurrent. The measurements indicate our monochromator yields light with a degree of polarization consistent with the calculated polarization of the synchrotron radiation incident upon our grating (about 85%).