用瞬态电容谱法研究GaAs1-xPxLED深能级及其对发光的影响

本文利用瞬态电容潜(DLTS)法测量了不同效率的GaAsxPxLED的深能级浓度、深度、俘获截面.发现效率高LED仅有一个明显的电子深能级△En=0.15eV和一个很弱的△En=0.33eV电子深能级,它们的俘获截面都小于1.5×10-14cm2,总的能级浓度小,约为1.4×1015cm-3.效率差的两只LED一般除有两个以上的电子能级还有两个空穴能级,它们的俘获截面甚至大到2.2×10-12和1.3×10-13cm2;从DLTS图还可以发现谱峰高而宽,说明杂质浓度大,总浓度分别为6.3×1015cm-3和3.4×1015cm-3.讨论了深能级对发光效率的影响.     

深能级对GaAs1-xPxLED老化过程的影响

用深能级瞬态谱(DLTS)研究了GaAs1-xPx LED在正向电压,I=100mA(J=250A/cm2)大电流下老化750小时左右的过程中深能级浓度、深度、俘获截面的变化。GaAs1-xPx LED中存在三个电子能级:△En1=(0.19±0.01)eV;△En2=(0.20±0.01)eV;△En3=(0.40±0.01)eV。发现老化之后△En1与△En2的能级密度变小,而△En3的能级宽度却有所增大。同时测量了它们的发光光谱、光通,C-V特性和I-V特性。讨论了深能级在GaAs1-xPx LED老化过程中对发光效率与退化特性的影响。认为△En1与△En2对GaAs1-xPx LED的发光效率与退化特性无影响,而△En3是限制GaAs1-xPx LED发光效率和退化特性的有效复合中心。     

硒化锌晶体背景深能级的光电容谱

对用国产硒化锌(ZnSe)晶体制成的Au-ZnSe肖特基势垒进行了光电容测量。光子能量hv在0.57～0.61eV范围内的激发光引起单指数型电容瞬变过程。hv在0.67～1.0eV范围内的激发光引起的电容瞬变过程呈现双指数行为。回归分析结果表明样品中存在六个深能级,分别位于导带下方0.55,0.66,0.92,1.19,1.38和1.S2eV处。     

CdTe太阳电池中起因于Cu的深能级

在CdTe太阳电池中,易引入并形成Cu深能级中心. 本文采用深能级瞬态谱测试法研究了ZnTe背接触和石墨背接触CdTe太阳电池的部分深能级中心. 研究中运用密度泛函相关理论,分析闪锌矿结构CdTe,Cd空位体系和掺Cu体系的电子态密度,计算得出T_d场和C_3v场下Cu²⁺ d轨道的分裂情况. 计算结果表明,CdTe太阳电池中的E_v+0206 eV和E_v+0122 eV两个深中心来源于Cu替代Cd原子. 计算结果还表明,掺入Cu可降低CdTe体系能量.     

双异质结AlxGa1-xAs/GaAs发光管中与氧有关能级的测量

用DLTS和单次脉冲瞬态电容技术研究了液相外延生长的双异质结AlxGa1-xAs/GaAs发光管,掺Si的n-Al0.05Ga0.95As有源层中的深能级。着重分析了一个与氧有关的电子陷阱,其发射激活能为EC-ED=0.29eV。我们发现该电子陷阱随正向注入脉冲宽度tp的增加DLTS峰向低温移动,即在确定的温度下发射率随tp的增加而增加。用DLTS首次测得该能级的俘获瞬态谱,发现俘获峰随反向撤空脉冲宽度tR的增加向低温端移动,即在确定的温度下俘获率随tR的增加而增加,并且俘获激活能从△Eσ=0.28eV变化到0.26eV,用位形坐标图讨论了引起变化的原因。     

在C_(70)固体p-GaAs结构中的甚深深能级

发展了恒温电容瞬态数据处理方法 ,称新方法为恒温电容瞬态时间积谱 (ICTTS) .用ICTTS方法测量分析了C70固体 p GaAs异质结的深能级 ,结果发现在C70 固体中存在两个很深的空穴陷阱 ,H1 和H2 ,它们的能级位置分别为Ev 0 85 6eV和Ev 1 0 37eV     

有源层掺杂剂对Ga1-xAlxAs/GaAs双异质结发光管特性的影响

本文研究了由液相外延技术生长的GaAIAs/GaAs双异质结材料制成的发光管,有源层掺杂剂对器件特性的影响结果表明,器件结构和器件制作工艺相同的GaAIAs/GaAs发光管,有源层掺Si可获得较大的光输出功率,而频响特性<15MHz,波长在8700Å以上;对有源层掺Ge器件,光输出功率低于掺Si器件,而频响特性则>15MHz,波长可控制在8200Å~8500Å.深能级测量表明二者有不同的深能级位置,对掺Si(氧沾污)器件,Ec-ET≈0.29eV,而掺Ge器件ET-Ev≈0.42eV.两种掺杂剂对有源层暗缺陷的影响尚无明显区别.     

在C70固体/p-GaAs结构中的甚深深能级

发展了恒温电容瞬态数据处理方法，称新方法为恒温电容瞬态时间积谱(ICTTS).用ICT TS方法测量分析了C₇₀固体/p GaAs异质结的深能级，结果发现在C₇₀固体中存在两个很深的空穴陷阱，H C₁和H₂，它们的能级位置分别为Ev⁺⁰856eV和 Ev+1037eV. 关键词： 70')" href="#">C₇₀ 深能级 恒温电容瞬态     

Ga1-xAlxAs LED深能级对其发光效率的影响

本文用DLTS法测量了发光效率不同的三只Ga1-xAlxAs LED的深能级浓度.深度和俘获截面,并计算出电子和空穴的寿命,同时测量了它们的发光光谱和光通.从发光效率正比于载流子寿命的观点出发,分析了实验结果.表明1*与3*LED发光效率比R1大致等于它们的寿命比Rτ,但2*与3*却差别很大,文中从光谱角度作了一些分析,差值有所改进.从载流子寿命分析,找出了△Em=0.28、0.33与0.32eV三个能级是分别影响三个LED效率的主要能级。指出了8800Å的红外峰是使发光效率降低的另一个原因,它可能起因于外延层与村底界面处GaAs的带间复合和通过杂质的复合,要得到高效的LED必须制备出好的Ga1-xAlxAs与GaAs界面,应尽可能使红外峰减少.实验表明,效率高的LED仅有一个深能级(0.28eV),在室温下视察不到明显的红外峰。     

自辐射场下PuO分子光谱研究

在相对论有效原子实势近似下, 以Pu为SDD基组、O为6-311+G^*基组, 采用优选的密度泛函 B3LYP方法, 研究了用电场摸拟钚本身产生自辐射场(-0.005—0.005 a.u.) 作用下氧化钚(PuO)基态分子的最高占据轨道(HOMO)能级E_H、最低空轨道(LUMO)能级E_L、能隙E_g和费米能级E_F. 结果表明: 在所加的电场范围内, E_H随着电场的增加均逐渐减少, E_F随着电场的增加均逐渐增大, E_g始终处于增大的趋势, 费米能级E_F上升, 占据轨道的电子难以被激发至空轨道而形成激发态, PuO分子在自辐射场中更趋于稳定, 可以阻止O₂, H₂等扩散到表面内层而腐蚀钚表面, 有利于了钚在自辐射场中抗腐蚀.     

判别两个或两个以上深能级是否属于同一中心的方法

本文分别研究了两个或两个以上深能级之间的耦合和非耦合两种情况所对应的光电容瞬态,根据这两种瞬态的本质差别,提出一个判别两个或两个以上深能级是否属于同一深中心的方法。它具有适用于两个以上的多个深能级的样品以及方法简单和测量时间短等优点。作为例子,将它应用于判别硅中和金有关的施主和受主两能级,结果证实它们确实是属于和金有关的同一中心,而不是分属于两个中心。 关键词：     

Deep level transient spectroscopy investigation of deep levels in CdS/CdTe thin film solar cells with Te:Cu back contact

Deep levels in Cds/CdTe thin film solar cells have a potent influence on the electrical property of these devices. As an essential layer in the solar cell device structure, back contact is believed to induce some deep defects in the CdTe thin film. With the help of deep level transient spectroscopy (DLTS), we study the deep levels in CdS/CdTe thin film solar cells with Te:Cu back contact. One hole trap and one electron trap are observed. The hole trap H1, localized at E_v+0.128~eV, originates from the vacancy of Cd (V_Cd. The electron trap E1, found at E_c-0.178~eV, is considered to be correlated with the interstitial Cu_i⁼ in CdTe.     

GaP发光二极管中深能级对发光强度的影响研究

应用深能级瞬态谱(DLTS)技术,研究了GaP发光二极管中Zn-O对深能级,并计算出了其能级的激活能。GaP红色发光二极管经过γ射线长时间辐照后,其Zn-O对的浓度和发光管发光强度发生了变化。结果表明,经γ射线辐照后,GaP红色发光二极管中的Zn-O对的浓度增大,发光强度增强。它为提高GaP红色发光二极管的发光效率提供了一种新的方法。     

Transient optical absorption and luminescence in Li2B4O7 lithium tetraborate

This paper reports on a study of the transient optical absorption exhibited by Li₂B₄O₇ (LTB) in the visible and UV spectral regions. Using absorption optical spectroscopy with nanosecond time resolution, it is established that the transient optical absorption (TOA) in these crystals originates from optical transitions in hole centers and that the kinetics of the optical-density relaxation is controlled by interdefect tunneling recombination, which involves these hole centers and electronic Li⁰ centers representing neutral lithium atoms. At 290 K, the Li⁰ centers migrate in a thermally stimulated, one-dimensional manner, without carrier ejection into the conduction or valence band. The kinetics of the pulsed LTB cathodoluminescence is shown to be controlled by a relaxation process connected with tunneling electron transfer from a deep center to a small hole polaron migrating nearby, a process followed by the formation of a self-trapped exciton (STE) in an excited state. Radiative annihilation of the STE accounts for the characteristic σ-polarized LTB luminescence at 3.6 eV, whose kinetics is rate-limited by the tunneling electron transfer.     

Triplet bound excitons in copper-doped gallium phosphide

This review describes a particular class of neutral defect complexes in GaP, represented by the variety of Cu-related centres, which are observed to bind excitons in a spin-like singlet-triplet configuration. The reasons for this are discussed and two subgroups are defined. One of these consists of centres which bind holes in localized orbitally nondegenerate spin states, but give rise to highly structured optical spectra. The other group is characterized by featureless photoluminescence spectra in the mid-gap spectral region due to a tight binding of both the electron and hole in spin-like states. Both groups are well described with an essentially identical spin-Hamiltonian formalism, as detailed optically detected magnetic resonance measurements have revealed. The relation of this class of neutral defects in GaP to similar complexes in other semiconductors is discussed.     

Theory for the binding energies of the first-row,deep donors in GaP and Si

Substitutional oxygen in GaP is known to be a very deep, non-effective-mass-like donor, capable of binding one or two electrons. No conclusive experiment exists for substitutional N in Si. In this paper, the recently developed Pseudo Impurity Theory is applied to these cases. Without employing any adjustable parameters, the two levels of GaP:O_P are predicted in good agreement with experiment. Si:N is predicted to behave in a similar way. The implications of these results are discussed.     

Photocapacitance study of deep centers in ZnSe-based radiating structures

The photocapacitance method is used to study ZnSe-Au and ZnSe-ZnO(SiO₂) barrier structures in order to investigate deep centers in ZnSe crystals annealed in liquid zinc and subjected to additional thermoprocessing in a vacuum. The energy levels of the deep centers producing photocapacitance are determined. In crystals annealed for 4.5 h acceptor levels with ionization energies of 0.28, 0.36, 0.58, and 0.71 eV are found. With increase in anealing period to 100 h only the level with ionization energy of 0.58 eV appears, leading to a decrease in intensity of the yellow-green band and an increase in intensity of blue scintillation in the electroluminescence spectra.Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 59–63, July 1984.     

Deep levels in semiconductors

All defects which are dominated by short-range forces belong to the family of ‘deep’ impurities and exhibit distinctly different properties from the familiar shallow donors and acceptors, where the decisive term is the Coulomb potential. Whereas formation of the shallow states relates to a small part of the Brillouin zone and can be described within the effective mass theory, the opposite is true of the deep states. However, it has recently been shown that the formation of deep localized states in semiconductors can be described with speed and accuracy, and in a self-consistent manner, by exploiting the localized character of the main part of the defect potential. It is possible to project the interaction between the localized potential and the rest of the crystal upon a limited number of localized functions, spanning the range of the potential, with an uncertainty which is small compared to the magnitude of the forbidden gap. This is achieved without truncating proper characterization of the electronic structure of the host or the chemical identity of the imperfection. An important step forward has also recently been made in devising novel spectroscopic tools tailored to the problem of detection of deep levels. With the advent of deep level transient spectroscopy, combined with optical and electron-microscope techniques, the defect signature can be established in an interactive manner, instead of relying on a single-event data. New phenomena were brought to light (e.g. multiphonon capture and recombination) and the gap separating theory and experiment narrowed. It is the purpose of this article to review this development, with a view of focusing upon quantitative guidelines resulting from computer modelling of deep level systems in semiconductors, e.g. GaP:N, GaP:O, vacancies and vacancy-related defects in Si and GaAs, Si:Co, etc. Although a truly quantitative comparison with experiment is not yet possible because of the remaining uncertainties in the form of the potential in a reconstructed lattice and incompleteness of the experimental data, the way is open for a comprehensive examination of the problem of deep levels.     

A study of deformation-produced deep levels inn-GaAs using deep level transient capacitance spectroscopy

Deformation-produced deep levels, both of electron and hole traps, have been studied using deep level transient capacitance spectroscopy (DLTS) for an undopedn-type GaAs (HB grown) compressed at 440°C. Concentrations of two grown-in electron trap levels (E _c −0.65eV andE _c −0.74eV) and one grown-in hole trap level (E _v +∼0.4eV) increase with plastic deformation, while that of a grown-in electron trap level (E _c −∼0.3eV) decreases in an early stage of deformation. While no new peak appeared in the electron trap DLTS spectrum after plastic deformation, in the hole trap DLTS spectrum a broad spectrum, seemingly composed of many peaks, newly appeared in a middle temperature range, which may be attributed to electronic energy levels of dislocations with various characters.