A highly linear open-loop high-speed CMOS sample-and-hold

This paper presents an open loop high speed CMOS sample and hold with improved linearity. Previously, an open-loop S/H and a method of charge injection cancellation were introduced (Hadidi et al. in The 2006 International Conference on Solid State Devices and Materials 604–605, 2006). However, it requires many clock phases. In this paper a new charge injection cancellation scheme and switch linearization method is introduced. The proposed S/H could be implemented in a simple manner in contrast with the previous one while its linearity has been improved (especially in near nyquist frequencies). The proposed S/H with sampling rate of 500 MS/s achieves SNDR of 76 dB at nyquist single-tone input signal and SNDR of 72.5 dB at near nyquist dual-tone input signal. The sample and hold is implemented using TSMC 0.35 μm dual-poly quadruplet metal CMOS technology.     

一种全差分CMOS采样/保持电路

文章对影响采样/保持电路精度的电荷注入效应和时钟馈通效应进行了分析,提出了一种全差分CMOS采样/保持电路的设计方案,有效地消除了电荷注入效应误差和时钟馈通误差,极大地减小了其非线性误差,并保证了较高的精度。设计的电路采用TSMC 0.35μm CMOS工艺提供的PDK,在Cadence SpectreS环境下进行仿真验证。测试结果表明,电路信噪比达-81 dB,积分非线性为±0.25 LSB。该电路已运用到一种高速高精度A/D转换器中,性能良好。     

一种100 MHz采样频率CMOS采样/保持电路

设计了一种高速采样保持电路。该电路采用套筒级联增益自举运算放大器,可在达到高增益高带宽的同时最大程度地减小功耗;优化了采样开关,获得了良好的线性度,减少了输出误差;电路的采样频率达到100 MHz。采用Charter半导体公司的0.35μm标准CMOS工艺库,对整体电路和分块电路进行了性能分析和仿真。     

A high-speed sample-and-hold circuit based on CMOS transmission lines

We introduce the design of a high-speed sample-and-hold circuit (SHC) based on spatial sampling with CMOS transmission lines (TLs). Signal propagation analysis shows that periodically loaded CMOS TLs exhibit filter properties, which cause attenuation and deformation of signal pulses. Nevertheless, the dispersion effects on clock pulse propagation are minimal since clock lines are short, much shorter than the meandered input-signal line. Design considerations on clock pulse generator, sampling switches, and charge amplifiers are presented. Compared with other CMOS approaches, the proposed SHC generates clock pulses on chip and avoids clock jitter difficulties. The SHC is implemented in a 0.13 μm digital CMOS process with standard on-chip coplanar waveguides (CPW) as signal and clock pulse propagation TLs, silicon N-type field effect transistors (NFET) as sampling switches, and high-frequency charge amplifiers for charge amplification. Clock pulse signals of ~50 ps width with ~17 ps fall edge are generated on-chip. Simulation analysis with Cadence Spectre shows that a sampling rate of 20 Giga-sample/s with a 25 dB spurious free dynamic range (SFDR) can be achieved. With shorter clock pulses, both sampling rate and SFDR can be improved in future design.     

用于CMOS图像传感器内置流水线ADC的采样/保持电路

设计了用于CMOS图像传感器内置流水线ADC的采样/保持电路,该电路具有10位采样精度和50 MHz采样速率,采用开关电容电荷重分布式结构,加入图像传感器的黑光校准功能。放大器采用全差分套筒式共源共栅增益增强型结构,保证了所需的增益和带宽。电路采用0.18μmCMOS工艺实现。HSPICE仿真结果表明,电路可在5 ns内达到0.05%的精度;对于24.0218 MHz、±0.5 V摆幅的正弦输入信号,SNDR和SFDR分别达到62.47 dB和63.73 dB,满足系统要求。     

一种应用于流水线ADC的14-bit 50MS/s 采样保持电路

A high performance sample-and-hold （S/H） circuit used in a pipelined analog-to-digital converter （ADC） is presented. Capacitor flip-around architecture is used in this S/H circuit with a novel gain-boosted differential folded cascode operational transconductance amplifier. A double-bootstrapped switch is designed to improve the performance of the circuit. The circuit is implemented using a 0.18 μm 1P6M CMOS process. Measurement results show that the effective number of bits is 14.03 bits, the spurious free dynamic range is 94.62 dB, the signal to noise and distortion ratio is 86.28 dB, and the total harmonic distortion is -91.84 dB for a 5 MHz input signal with 50 MS/s sampling rate. A pipeline ADC with the designed S/H circuit has been implemented.     

A new high-speed, high-resolution open-loop CMOS sample and hold

A new open loop, high resolution CMOS sample and hold (S/H) circuit is introduced in this article. This circuit is constructed based on a new method which leads to a great reduction in dependency of the storing charge of the holding capacitors to the charge injection of transistors. It is a combination of dummy switches and auxiliary capacitors in order to decrease the voltage spikes that are produced during the sampling mode. Due to the high linearity feature of our proposed design in comparison with previous works, it is reached to a great improvement in signal to noise and distortion ratio up to about 15 dB and it’s ENOB is equivalent with about 16 bits. Another advantages of our proposed design are it’s lower power dissipation and it’s high input voltage range. Also the optimum functionality of our proposed circuit does not damaged by the threshold voltage’s variations in different corners. As our proposed S/H circuit has been designed in open loop structure, it is suitable for high speed applications.     

一种CMOS高速采样/保持放大器

文章分析了采样／保持电路的基本原理，设计了一种CMOS高速采样／保持放大器，采样频率可达到50MHz，并用TSMC的0．35μm标准CMOS工艺库模拟了整体电路和分块电路的性能。     

一种用于14bit 50MHz流水线模数转换器的CMOS采样开关

分析了影响CMOS采样开关性能的非理想因素,针对14bit 50MHz A/D转换器对采样开关特性的要求,提出了一种新型的时钟馈通补偿结构.该结构通过增加dummy开关管能够有效消除时钟馈通对采样值的影响,打破了开关设计中速度和精度之间的制约关系.基于SMIC 0.25μm标准CMOS数模混合工艺,采用Hspice对电路进行了模拟.模拟结果显示,在输入信号为23.3MHz正弦波,峰峰值为2V,采样时钟频率为50MHz,时钟上升/下降时间为0.1ns时,无杂散动态范围达到92dB,信噪失真比达到83dB;同时时钟馈通效应造成的保持误差由5.5mV降为90μV.这种具有时钟馈通补偿结构的采样开关特别适用于高速高分辨率模数转换器.     

一种用于14bit 50MHz流水线模数转换器的CMOS采样开关

分析了影响CMOS采样开关性能的非理想因素,针对14bit 50MHz A/D转换器对采样开关特性的要求,提出了一种新型的时钟馈通补偿结构.该结构通过增加dummy开关管能够有效消除时钟馈通对采样值的影响,打破了开关设计中速度和精度之间的制约关系.基于SMIC 0.25μm标准CMOS数模混合工艺,采用Hspice对电路进行了模拟.模拟结果显示,在输入信号为23.3MHz正弦波,峰峰值为2V,采样时钟频率为50MHz,时钟上升/下降时间为0.1ns时,无杂散动态范围达到92dB,信噪失真比达到83dB;同时时钟馈通效应造成的保持误差由5.5mV降为90μV.这种具有时钟馈通补偿结构的采样开关特别适用于高速高分辨率模数转换器.     

应用于高速CMOS图像传感器的10比特列并行循环式ADC

This paper presents a high-speed column-parallel cyclic analog-to-digital converter(ADC) for a CMOS image sensor.A correlated double sampling(CDS) circuit is integrated in the ADC,which avoids a stand-alone CDS circuit block.An offset cancellation technique is also introduced,which reduces the column fixed-pattern noise(FPN) effectively.One single channel ADC with an area less than 0.02 mm~2 was implemented in a 0.13μm CMOS image sensor process.The resolution of the proposed ADC is 10-bit,and the conversion rate is 1.6 MS/s. The measured differential nonlinearity and integral nonlinearity are 0.89 LSB and 6.2 LSB together with CDS, respectively.The power consumption from 3.3 V supply is only 0.66 mW.An array of 48 10-bit column-parallel cyclic ADCs was integrated into an array of CMOS image sensor pixels.The measured results indicated that the ADC circuit is suitable for high-speed CMOS image sensors.     

Charge pump-based MOSFET-only 1.5-bit pipelined ADC stage in digital CMOS technology

A simple low-power and low-area metal-oxide-semiconductor field-effect transistor-only fully differential 1.5-bit pipelined analog-to-digital converter stage is proposed and designed in Taiwan Semiconductor Manufacturing Company 0.18 μm-technology using BSIM3v3 parameters with supply voltage of 1.8 V in inexpensive digital complementary metal-oxide semiconductor (CMOS) technology. It is based on charge pump technique to achieve the desired voltage gain of 2, independent of capacitor mismatch and avoiding the need of power hungry operational amplifier-based architecture to reduce the power, Si area and cost. Various capacitances are implemented by metal-oxide semiconductor capacitors, offering compatibility with cheaper digital CMOS process in order to reduce the much required manufacturing cost.     

一种低电压高精度125 MHz采样/保持电路

介绍了一个低电压高精度的高速采样／保持电路。该电路的电源电压为1．8V，在125MHz频率时钟采样时，可达到10位以上的精度；采用栅源电压恒定的栅压自举开关，极大地减小了采样的非线性失真，同时，有效地抑制了输入信号的直流偏移；高性能增益自举的折叠式级联运算放大器减小了有限增益和不完全建立带来的误差。整个电路以0．18μm CMOS工艺库验证，功耗仅为11．2mW。     

用于14位210 MS/s电荷域ADC的采样保持前端电路

该文提出一种用于电荷域流水线模数转换器(ADC)的高精度输入共模电平不敏感采样保持前端电路。该采样保持电路可对电荷域流水线ADC中由输入共模电平误差引起的共模电荷误差进行补偿。所提出的高精度输入共模电平不敏感采样保持电路被运用于一款14位210 MS/s电荷域ADC中,并在1P6M 0.18 μm CMOS工艺下实现。测试结果显示,该14位ADC电路在210 MS/s条件下对于30.1 MHz单音正弦输入信号得到的无杂散动态范围为85.4 dBc,信噪比为71.5 dBFS,而ADC内核功耗仅为205 mW,面积为3.2 mm²。

     

一款具有新颖的采样保持电路应用于脉冲式超宽带技术的欠采样型模数转换器

本文提出了一款基于CMOS 0.13um,具有新颖的采样保持电路,应用于脉冲式超宽带接收机的欠采样型模数转换器.本文主要的难点在于实现拥有远远高于奈奎斯特频率的输入信号的欠采样型模数转换器。根据我们的了解,本文是当今第二次提出当采样时钟大约在1.056GHz,输入信号超过4GHz的欠采样型模数转换器。电路设计中,我们提出了一款新颖的采样保持电路,解决了信号幅度的衰减和高频输入信号线性度的问题。一款使用零静态功耗动态失调校准比较器被进一步优化,实现了失调,速度以及功耗的要求。测试结果显示,当采样频率为1.056GHz,输入信号高达4.2GHz时,SFDR 为30.1dB。不包括缓冲器,ADC的功耗为30mW,芯片面积为0.6mm2.ADC的FoM是3.75pJ.     

A novel high-speed CMOS circuit based on a gang of capacitors

There is no doubt that complementary metal-oxide semiconductor (CMOS) circuits with wide fan-in suffers from the relatively sluggish operation. In this paper, a circuit that contains a gang of capacitors sharing their charge with each other is proposed as an alternative to long N-channel MOS and P-channel MOS stacks. The proposed scheme is investigated quantitatively and verified by simulation using the 45-nm CMOS technology with V_DD = 1 V. The time delay, area and power consumption of the proposed scheme are investigated and compared with the conventional static CMOS logic circuit. It is verified that the proposed scheme achieves 52% saving in the average propagation delay for eight inputs and that it has a smaller area compared to the conventional CMOS logic when the number of inputs exceeds three and a smaller power consumption for a number of inputs exceeding two. The impacts of process variations, component mismatches and technology scaling on the proposed scheme are also investigated.     

一种新型高速CMOS全差分运算放大器设计

设计了一种基于流水线模/数转换系统应用的低压高速CMOS全差分运算放大器。该运放采用了折叠式共源共栅放大结构与一种新型连续时间共模反馈电路相结合以达到高速度及较好的稳定性。设计基于SMIC 0.25μm CMOS标准工艺模型,在Cadence环境下对电路进行了Spectre仿真。在2.5V单电源电压下,驱动0.5pF负载时,开环增益为71.1dB,单位增益带宽为303MHz,相位裕度为52°,转换速率高达368.7V/μs,建立时间为12.4ns。     

A sub-sampling 4-bit 1.056-GS/s flash ADC with a novel track and hold amplifier for an IR-UWB receiver

A sub-sampling 4-bit 1.056-GS/s flash ADC with a novel track and hold amplifier(THA) in 0.13μm CMOS for an impulse radio ultra-wideband(IR-UWB) receiver is presented.The challenge is in implementing a sub-sampling ADC with ultra-high input signal that further exceeds the Nyquist frequency.This paper presents,to our knowledge for the second time,a sub-sampling ADC with input signals above 4 GHz operating at a sampling rate of 1.056 GHz.In this design,a novel THA is proposed to solve the degradation in amplitude and improve the linearity of signal with frequency increasing to giga Hz.A resistive averaging technique is carefully analyzed to relieve noise aliasing.A low-offset latch using a zero-static power dynamic offset cancellation technique is further optimized to realize the requirements of speed,power consumption and noise aliasing.The measurement results reveal that the spurious free dynamic range of the ADC is 30.1 dB even if the input signal is 4.2 GHz sampled at 1.056 GS/s.The core power of the ADC is 30 mW,excluding all of the buffers,and the active area is 0.6 mm~2.The ADC achieves a figure of merit of 3.75 pJ/conversion-step.     

A 9 b/12 b 50 MS/s experimental ADC with continuous approximation architecture in 65 nm CMOS

A 9 bits 50 MS/s 0.5 mW continuous approximation mixed successive approximation (CAR&SAR) ADC is presented. A 12 bits 50 MS/s 0.6 mW CAR&CAR ADC is presented. In the field of low power and high performance ADC, CAR is a new architecture different from SAR. It is faster and easier to get high accuracy. Here we will introduce CAR and its circuit implementation, and the 9 bits experimental ADC is designed to verify CARADC''s feasibility. Meanwhile, its resolution can be extended to 12 bits with adding an extra CAR, and then the performance is raised to 0.6 mW 50 MS/s 72 dB SNDR at TT corner and the Walden FOM is 3.6 fj/conv-step. The 9 b ADC was fabricated by using TSMC 1P9M 65 nm CMOS technology. The ADC achieves 50 dB SNDR and the realized Walden FOM is 34 fj/conv-step. The simulation and measurement results prove that CAR is available in the low power and high performance ADC and it even outperforms SAR. The ADC core occupies an active area of 0.045 mm².     

一种基于微分法的峰值检测电路

提出了一种基于微分法的峰值检测电路,它包含微分电路、双沿触发比较器和采样保持电路。微分电路对输入信号进行微分变换,双沿触发比较器比较微分变换结果与参考电压,得到采样保持控制信号,以控制采样保持电路的正常工作,实现峰值检测功能。该检测电路具有高频率、高精度的特点,工作频率达到200~500 MHz,峰值检测误差小于5%。该检测电路适用于高速A/D转换器、D/A转换器和具有复杂参数的采集系统等领域。