Composition dependence of photoconductivity of Al20AsxTe80−x glasses

The time dependent photocurrent of Al₂₀As_xTe_80−x glasses has been studied at low temperatures. It is found that the photocurrent of all the Al₂₀As_xTe_80−x samples studied does not decrease appreciably during illumination, which is consistent with the behavior of other narrow band gap amorphous chalcogenides. Further, the photosensitivity is found to be maximized for the composition x=25, which can be associated with rigidity percolation.     

Electron microscopic study of the crystallization kinetics of the amorphous alloy Pd80Si20

Amorphous Pd₈₀Si₂₀ foils, prepared by the rapidly rotating mill device method, were quenched from the liquid state, temperatures of the melt being 1100, 1500 and 1600°C. The foils were linearly heated at a rate of 1.5 °C/min over a temperature range of 20–600°C. The structural changes were observed by methods of optical microscopy, transmission electron microscopy and electron diffraction. The beginning of crystallization of the amorphous phase is affected by the temperature of the melt. The crystallization of the amorphous phase was terminated at a temperature of 390–400°C. Silicides Pd₉Si₂ and Pd₃Si, the morphology of which varied with temperature, were formed during crystallization.     

Structural change of liquid Si15Te85 and Si20Te80 with temperature: Ab initio molecular dynamics simulations

Using ab initio molecular dynamics simulations, the structural and electronic properties of liquid Si₁₅Te₈₅ and Si₂₀Te₈₀ at two temperatures were studied respectively. Compared with available experimental data, the calculated structure factors are acceptable. From symmetry arguments, the calculated partial bond-angle distribution functions suggest that with increasing temperature the extensive tetrahedral network structures persist longer in liquid Si₂₀Te₈₀ than those do in liquid Si₁₅Te₈₅. Our results indicate that the local tetrahedral structure around Si atoms and the Peierls-like distorted local atomic structure around Te atoms both play important roles in the structural change of liquid Si₂₀Te₈₀ and Si₁₅Te₈₅, which also suggest that the mechanisms of the structural change upon cooling in liquid Si₂₀Te₈₀ and Si₁₅Te₈₅ are of no essential difference. The results of DOS and LDOS indicate that the variation of the dip in DOS at E_F mainly results from the change of Te p orbitals.     

Thermal conductivity and specific heat of bulk amorphous chalcogenides Ge20Te80−xSex (x = 0,1,2,8)

Bulk amorphous chalcogenide samples of Ge₂₀Te_80−xSe_x (x = 0, 1, 2, 8) have been prepared using a melting-quench method, and characterized by the differential scanning calorimetry, X-ray powder diffraction, high-resolution transmission electron microscopy, specific heat and thermal conductivity measurements. The low temperature specific heat measurements identified some localized low-frequency oscillation modes (Einstein modes) in conjunction with a Debye-like behavior. It was found that with increasing Se concentration the characteristic Debye temperature did not change whereas the Einstein temperature slightly decreased. The lattice thermal conductivity of all Ge₂₀Te_80−xSe_x samples exhibited typical amorphous heat conduction behavior, which has been discussed in connection with the phonon mean free path and in the context of a phenomenological model of heat conduction for highly disordered system.     

The neutron diffraction study of liquid GeTe and As2Te3

The radial distribution analyses for GeTe and As₂Te₃ are made at temperatures above the melting point in the range of momentum transfer between 0.7 and 10.0 Å^?1 by the neutron diffraction technique. Furthermore, the local order in amorphous GeTe is determined by analyzing the intensity data of the electron diffraction of its thin film. The result for the amorphous film indicates that the local distribution of atoms in amorphous GeTe is not characteristic of the structure of its crystalline state. The shape of the peaks of the intensity curve for liquid GeTe differs from that for the amorphous and crystalline states. However, the short bond length and the small coordination number determined from liquid RDF suggest that the covalent-like bonding between nearest-neighbor atoms remains unbroken when melting. The general form of the structure factor for liquid As₂Te₃ is similar to that for the amorphous material reported previously. The position of the first peak of RDF in the liquid state is observed to be shifted to a shorter distance than the average of nearest-neighbor atoms in crystalline As₂Te₃. The structure of GeTe differs considerably between the crystalline, amorphous and liquid states, whereas the local order in the liquid As₂Te₃ is similar to that in the amorphous state but not in the crystalline state.     

Low-temperature specific heat of amorphous and crystalline Te0.81Ge0.15As0.04

We have measured the specific heats of amorphous and crystalline specimens of Te_0.81Ge_0.15As_0.04 between 0.2 and 20 K, and of crystalline Te_0.93As_0.07 between 1 and 20 K. Amorphous Te_0.81Ge_0.15As_0.04 shows a low-temperature linear specific heat anomaly whose magnitude, 0.027 mJ/mol-K², is similar to that of other amorphous insulators. Crystalline Te_0.81Ge_0.15As_0.04 exists as a two-phase material comprised of GeTe and As-doped Te. The specific heat of this material is analyzed in terms of a weighted average of the properties of its two constituents.     

Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by X-ray diffraction (II)

A spherical-shaped model of Al_0.20As_0.50Te_0.30, Al_0.10As_0.40Te_0.50 and Al_0.10As_0.20Te_0.70 amorphous alloys has been performed by the random Monte Carlo method. These models describe quite well the experimental radial distribution functions and abide by the expected coordination numbers apart from the threefold coordinated Te, of which an excess has appeared. The structures are formed, basically, of distorted tetrahedra around the Al atoms whose corners are occupied by As or Te atoms. Also, a separated phase model for Al_0.10As_0.20Te_0.70 alloy has been built taking into account the results of thermodynamical study on this amorphous alloy system. The fitting of this model was better than that of the model generated under the hypothesis of a continuous phase.     

Stability of amorphous SETE mixtures under pressure

A sharp semiconductor-metal transition is observed for a-Se₈₀Te₂₀ mixture at about 90 kbar. The resistance for the specimen which experiences the semiconductor-metal transition is recovered after releasing pressure. The sharp semiconductor-metal transition is reproducible in the second compression. X-ray diffraction measurements reveal that the amorphous specimen is transformed into the crystal with layer structure on the transition to metallic state and on releasing pressure the specimen is transformed again into the amorphous state. A brief comment is given for the interesting phenomena that the high-pressure crystalline phase can be recovered to the amorphous phase on releasing pressure.     

Capacitance-voltage characteristics of In0.3Ge2Sb2Te5 thin films

The influence of indium doping on the capacitance variation with temperature and applied bias voltage of Ge₂Sb₂Te₅ is investigated. The capacitance-voltage (C-V) measurements of In_0.3Ge₂Sb₂Te₅ and Ge₂Sb₂Te₅ thin films were performed for a sweep of voltages from −20 to +20 V at different temperatures. The results show different capacitance behavior of In_0.3Ge₂Sb₂Te₅ and Ge₂Sb₂Te₅ films. As the temperature increases the capacitance of the indium-doped sample decreases and becomes negative. The negative capacitance effect might be attributed to a significant increase of the film’s conductivity due to temperature and applied bias voltage. The nonlinearity in the capacitance and conductivity could be related to the nucleation mechanism as the temperature becomes close to the amorphous-crystalline transition temperature.     

AC conductivity of (As2Te3)95Ge5

The elctrical conductivity of amorphous chalcogenide (As₂Te₃)₉₅Ge₅ is investigated at variable frequency, from 1 kHz up to 35 GHz, and a variable temperature, from 77 to 300 K. The low-temperature conductivity is constant with temperature at a fixed frequency. At a fixed temperature, it obeys a ω^0.8 law only at low frequencies. The results are analysed with respect to the polaron problem, but also with a simple model of several dilute localized levels having a wide energy distribution in the forbidden band.     

Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by x-ray diffraction (I)

An analysis of the atomic radial distribution function of Al_0.20As_0.30Te_0.30, Al_0.10As_0.40Te_0.50 and Al_0.10As_0.20Te_0.70 amorphous alloys obtained from quenching of the molten mixture of the elements was performed. A structure in which all the Al atoms are tetrahedrally bonded to the other types of atoms in the material, would satisfy the requirements of the experimental curve. Tetrahedral groups might be linked to each other by As and Te atoms, or directly through a Te or As atom belonging to more than one tetrahedra.     

Length and density changes of amorphous Pd40Cu30Ni10P20 alloys due to structural relaxation

The density changes of bulk amorphous Pd₄₀Cu₃₀Ni₁₀P₂₀ due to structural relaxation under isothermal heat treatment were measured using the buoyancy method. The corresponding length changes of amorphous Pd₄₀Cu₃₀Ni₁₀P₂₀ ribbons applying non-isothermal heat treatment are determined applying dilatometry. The measured density changes Δρ(T=const.,t)/ρ_o as a function of isothermal heat treatment increase close to the glass transition up to 0.18%. The measured density changes as a function of temperature and time are furthermore reversible. The experimental data validate the model predictions of the free volume model for length and density changes of amorphous alloys due to structural relaxation applying isothermal and non-isothermal heat treatment.     

Thermodynamic feasibility study for chemical vapour deposition of some ternary crystals using iodine and hydrogen iodide

Thermodynamic feasibility of transition metal dichalcogenide (TMDC) single crystals of Cu Al S₂, Cu Al Se₂, Cu Al Te₂, Cu Ga S₂, Cu Ga Se₂, Cu Ga Te₂, Cu In S₂, Cu In Se₂, Cu In Te₂, Ag Ga S₂, Ag Ga Se₂, Ag Ga Te₂, Ag In Se₂, Ag In Te₂, using iodine and hydrogen iodide as transporting agents has been reported in this paper. Results give range of temperature for the iodide transport and prevention of starting material formation (elemental transport) in the growth zone. From the range of temperature for the growth of crystals, selected source zone and growth zone temperatures with a differential of 100 °C are also listed. Referring the data listed in the tables can grow good quality crystals. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

An investigation of the kinetic transformation mechanism of Ge12.5Te87.5 chalcogenide glass under non-isothermal regime

Differential scanning calorimetry (DSC) technique was used to study the kinetics of amorphous to crystalline transformation in Ge_12.5Te_87.5 chalcogenide glass. The kinetic parameters of glassy Ge_12.5Te_87.5 under non-isothermal conditions are analyzed by the model-free and model-fitting approaches from a series of experiments at different constant heating rates (5-50 K/min). The effective activation energy of crystallization was determined by analyzing the data using the isoconversional methods of Kissinger-Akahira-Sunose (KAS), Tang, Starink, Flynn-Wall-Ozawa (FWO) and Vyazovkin. The analysis of the present data shows that the effective activation energy of crystallization is constant throughout the entire interval of conversions and hence with temperature. The transformation mechanism examined using the local Avrami exponents indicates that one mechanism (three-dimensional growth) is responsible for the transformation process for all heating rates used. The reaction model that may describe the transformation process of the Ge_12.5Te_87.5 chalcogenide glass is the Avrami-Erofeev model (g(α) = [− ln(1 − α)]^1/n) with n = 3 for all heating range at the whole range of crystallized fraction (α = 0.05-0.95). A good agreement between the experimental and the reconstructed (α-T) curves has been achieved. The transformation from amorphous to crystalline phase in Ge_12.5Te_87.5 chalcogenide glass demonstrates a single-step mechanism.     

Crystallization of amorphous Ni35Zr65 and Fe40Ni40P14B6 under proton irradiation

Two amorphous alloys, Ni₃₅Zr₆₅ and Fe₄₀Ni₄₀P₁₄B₆, were irradiated using 400 keV protons at several temperatures below the crystallization temperature, T_x, to peak doses in the neighborhood of 3.5 to 4.5 dpa. Irradiation at 250°C resulted in the crystallization of both alloys, which were examined by transmission electron microscopy of samples electrolytically polished to various distances from the irradiated surface to study the effect of dose. Samples masked from the proton beam remained amorphous during irradiation. In the Ni₃₅Zr₆₅ alloy crystallization of the equilibrium phases propagated throughout the entire sample, while the in the Fe₄₀Ni₄₀P₁₄B₆ alloy crystallization was observed only in those parts of the samples lying within the proton range. Neither alloy crystallized during irradiation at 100°C. In both these alloys the amorphous phase is therefore evidently stable at irradiation temperatures below approximately 0.6 T_x. An examination of the literature on irradiation damage of binary alloys and intermetallic compounds suggests that there is a tendency for initially amorphous alloys to remain amorphous at irradiation temperatures, T_irr < 0.3 T_L, where T_L (≈T_x) is the “melting” temperature (either a eutectic, peritectic or congruent melting temperature). Also, these same alloys, even when they are initially crystalline, transform to the amorphous state during irradiation at T < 0.3 T_L. Some other crystalline alloys have also been shown to transform to the amorphous state at T_irr < 0.3 T_L even though they have never been prepared in this condition by rapid quenching techniques. The temperature 0.3 T_L appears to be a lower limit, however, since the crystalline to amorphous transformation occurs in many of these alloys at temperatures greater than 0.3 T_L. It is suggested, by analogy with results on void formation in irradiated metals, that this low temperature limit is related to the low mobility of vacancies in these materials, although the mechanism of crystallization, or conversely amorphization, is not fully understood.     

Structural and electrical properties of Germanium-doped Sb70Te30 eutectic thin films

Ge-doped Sb₇₀Te₃₀ eutectic films show high potential for high transfer rate recording and non-volatile memory applications. Their potential applications are based on the difference in optical and electrical properties between the crystalline and amorphous phases. However, the structure and crystallization mechanism of such films is not yet well understood.The aim of this work is to study the amorphous-to-crystalline phase transformation mechanism in eutectic thin films of pure Sb₇₀Te₃₀ and doped with 2, 5 and 10 at% of Ge. Results of isokinetics and isothermal annealing were carried out using various techniques: four-probe electrical, optical reflectance and X-ray measurements.The results of optical and electrical measurements of Ge doped Sb₇₀Te₃₀ eutectic films showed that the addition of Ge increases both, the crystallization temperature and the effective activation energy of crystallization and that the mechanism of crystallization does not depend on Ge contents.In amorphous films, Ge acts as impurity center and does not affect the optical band gap value, but decreases the pre-exponential factor in the thermally activated conductivity. In crystalline films, Ge is probably incorporated into the Sb₇₀Te₃₀ structure and Ge vacancy are responsible for p-type metallic conduction, which increases with increasing the Ge content.     

Electron diffraction RDF analysis of amorphous As2Se3,AAs2Se2Te,As2SeTe2 and As2Te3 films

The local order in amorphous films of As₂Se₃, As₂Se₂Te, As₂SeTe₂, and As₂Te₃ has been examined by scanning electron diffraction with direct recording of the intensity of the elastically scattered electrons. The radial distribution functions indicate that there is a systematic increase in mean nearest neighbor distance as the Te concentration is increased, butthe mean coordination number increases slightly around 2.4. Pair function calculation of models shows that the 3-aand 2-fold coordinations of arsenic and chalcogens are retained in these glasses and the interatomic distances are close to those predicted from the Pauling covalent atomic radii of the constituent atomic species. The short range order appears to be similar in amorphous and crystalline As₂Se₃, but different in the case of As₂Te₃ as found by previous workers on bulk materials.     

Optical properties of thin films of system (As2Se3)80−x(As2Te3)x(SnTe)20 prepared by PLD

Thin amorphous films from system (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ were prepared by pulsed laser deposition (PLD) from their bulk glasses and their optical properties were studied by spectral ellipsometry. Spectral dependencies of refractive index, absorption and extinction coefficient and optical gap (1.41–1.66 eV for (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ with x = 20 resp. x = 0) were calculated from optical tansmittance, from ellipsometric data by Tauc method. High values of refractive index n₀ (2.49–2.60) and of non-linear χ⁽³⁾ coefficient of index of refraction (4.9–7.5 × 10⁻¹² esu for the glass (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ with x = 0 resp. x = 20) made studied thin films of system (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ promising candidates for application in optics and optoelectronics.     

Non-isothermal crystallization kinetics study on new amorphous Ga20Sb5S75 and Ga20Sb40S40 chalcogenide glasses

Bulk glasses of the system Ga₂₀Sb_xS_80−x (x = 5 and 40) were prepared for the first time by the known melt quenching technique. Non-isothermal differential scanning calorimetric (DSC) measurements of as-quenched Ga₂₀Sb_xS_80−x (x = 5 and 40) chalcogenide glasses reveal that the characteristic temperatures e.g. the glass transition temperature (T_g), the temperature corresponding to the maximum crystallization rate (T_p) recorded in the temperature range 400-650 K for x = 5 and 480-660 K for x = 40 are strongly dependent on heating rate and Sb content. Upon heating, these glasses show a single glass transition temperature (T_g) and double crystallization temperatures (T_p1 and T_p2) for x = 5 which overlapped and appear as a single crystallization peak (T_p) for x = 40. The activation energies of crystallization E_c were evaluated by three different methods. The crystallization data were examined in terms of recent analysis developed for non-isothermal conditions. The crystalline phases resulting from (DSC) have been identified using X-ray diffraction.     

Electronegativity difference, atomic size parameter and widths of supercooled liquid regions of Sb2S3-As2S3-Sb2Te3 glasses

Electronegativity difference Δ_x, atomic size parameter δ and width of supercooled liquid region (ΔT_x = T_x − T_g, where T_x is the onset crystallization temperature and T_g the glass transition temperature) are analysed for glasses of the ternary system Sb₂S₃-As₂S₃-Sb₂Te₃ as a function of arsenic atomic percentage.Correlation is investigated between the two bonds parameters (Δ_x and δ) and the width of supercooled liquid region ΔT_x (which is generally reliable in estimating the stability against the crystallization of the glasses). It is found that this width of supercooled liquid region of the glasses in Sb₂S₃-As₂S₃-Sb₂Te₃ system depends on electronegativity difference and atomic size parameter.