Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on absorbing medium

The propagation of s- and p-polarised electromagnetic plane waves in a N-layer system of anisotropic films on isotropic and homogeneous absorbing substrate is investigated in the long-wavelength limit. The analytical expressions are obtained for the reflection (transmission) coefficients and ellipsometric angles of an anisotropic multilayer system. All analytical results are correlated with the numerical solution of the reflection problem on the basis of rigorous electromagnetic theory for anisotropic layered systems. The possibilities of using obtained approximate formulae for resolving the inverse problem for ultrathin anisotropic dielectric films upon absorbing substrates are discussed.     

Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on non-absorbing isotropic medium

The reflection of s- and p-polarised electromagnetic plane waves from an N-layer system of anisotropic dielectric films upon transparent homogeneous substrate is investigated in the long-wavelength approximation. The analytical expressions are obtained for the amplitude reflection (transmission) coefficients, reflectances (transmittances), and ellipsometric angles of an anisotropic multilayer thin-film system. All analytical results are in agreement with the numerical solution of the reflection problem for anisotropic stratified medium. The possibilities of using obtained expressions for resolving the inverse problem for ultrathin anisotropic films upon isotropic substrates are discussed.     

Laser probing of anisotropic ultrathin dielectric films on absorbing materials via differential reflection characteristics

The reflection from an ultrathin anisotropic film on an isotropic absorbing substrate is investigated in the long-wavelength limit. The analytical expressions for the differential reflection characteristics of s- and p-polarized electromagnetic plane waves are obtained. All analytical results are correlated with the numerical solution of the reflection problem on the basis of rigorous electromagnetic theory for anisotropic medium. The possibilities of using the obtained approximate formulas for resolving the inverse problem for ultrathin anisotropic dielectric films upon absorbing substrates are discussed.     

Reflection characterization of anisotropic ultrathin dielectric films on absorbing isotropic substrates

The reflection of linearly polarized light from an ultrathin anisotropic dielectric film on isotropic absorbing substrate is investigated analytically in the long-wavelength limit. All analytical results are correlated with the numerical solution of the anisotropic reflection problem on the basis of rigorous electromagnetic theory. Simple analytical approach developed in this work not only gives a physical insight into the reflection problem but also provides a way of estimating the necessary experimental accuracy for optical diagnostics by reflection characteristics. It is shown that obtained expressions are of immediate interest for determining the parameters of anisotropic surface layers. Innovative possibilities for optical diagnostics of anisotropic properties of ultrathin dielectric layers upon absorbing materials are discussed.     

Inverse relationships for ellipsometry of uniaxially anisotropic nanoscale dielectric films on isotropic materials

The possibilities of determining the optical parameters of uniaxially anisotropic non-absorbing ultrathin films on the basis of ellipsometric parameters are analyzed in the framework of a long-wavelength approximation. It is shown that the special convenience of this analytical approach lies in the fact that it enables to find out the situations where it is possible to decouple the optical constants and the thickness (to provide correlation-free measurements) of an anisotropic ultrathin film. The accuracy of the obtained formulas for determining the parameters of ultrathin films is estimated by computer simulation of the reflection problem on the basis of the exact electromagnetic theory for anisotropic layered systems.     

Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry

The differential reflection characteristics for ultrathin inhomogeneous dielectric film on absorbing substrate are investigated in the long-wavelength approximation. The obtained first-order expressions for differential reflectivity and changes in the ellipsometric angles caused by ultrathin layer are of immediate interest to the solution of the inverse problem. The method to determine the averaged values (not the realistic profile) of refractive index for inhomogeneous nanometric films are shown. The novel possibilities for determining the dielectric constant and thickness of nanoscale homogeneous films by the differential ellipsometric and reflectivity measurements are developed, and a simple method to estimate whether the nanometric film is homogeneous or not is also discussed.     

Design of antireflection composite coating based on metal nanoparticles

A design of ultrathin composite layer with metal nanoparticles on a dielectric surface is proposed for interference reduction of Fresnel reflection. The structural and material parameters of the antireflection composite are calculated within the Maxwell-Garnett effective-medium approximation. The results of the approximate analytical calculation are in good agreement with the exact numerical solution to the Maxwell equations.     

Application of longitudinal generalized magneto-optical ellipsometry in magnetic ultrathin films

The longitudinal generalized magneto-optical ellipsometry(GME) method is extended to the measurement of threelayer ultrathin magnetic films. In this work, the theory of the reflection matrix is introduced into the GME measurement to obtain the reflective matrix parameters of ultrathin multilayer magnetic films with different thicknesses. After that, a spectroscopic ellipsometry is used to determine the optical parameter and the thickness of every layer of these samples, then the magneto-optical coupling constant of the multilayer magnetic ultrathin film can be obtained. After measurements of a series of ultrathin Fe films, the results show that the magneto-optical coupling constant Q is independent of the thickness of the magnetic film. The magneto-optical Kerr rotations and ellipticity are measured to confirm the validity of this experiment. Combined with the optical constants and the Q constant, the Kerr rotations and ellipticity are calculated in theory. The results show that the theoretical curve fits very well with the experimental data.     

Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry

The effect of nanometer dielectric films on the differential reflection characteristics of linearly polarized light from non-absorbing materials is investigated in the long-wavelength approximation. The second-order formulas for changes in the reflectance of s- and p-polarized light caused by ultrathin layer are obtained. A detailed analysis of the influence of ultrathin film to the reflectivity of p-polarized light in the vicinity of the Brewster angle is carried out. The novel methods are developed for determining the thickness and refractive index of uniform (or the average values of refractive index of nonuniform) nanometer-scale films by differential reflectivity and ellipsometric measurements.     

Computational analysis of metamaterial–aluminum–silicon solar cell model

In this paper, the optical parameters of an improved waveguide structure for a more efficient silicon solar cell are studied. Despite its favorable electronic, physical, and chemical properties, silicon remains a poor absorber of light. The optical losses due to the reflection at the air/glass interface of the cell and the transmission at its back are other factors, which limit the cell conversion efficiency. Consequently, several mechanisms for light trapping capable to increase the collection of the incident photons as electrical current and to decrease the transmission loss, have been developed. In this context, we propose a multilayer waveguide structure in which the sunlight is guided by a metamaterial layer and the transmission loss is eliminated by an aluminum back reflector. The reflection and transmission coefficients are derived by using the Generalized Transfer Matrix Method. The application of the law of conservation of energy allowed the determination of the absorption coefficient. These optical parameters are examined for several angles of incidence for s-polarized light, p-polarized light and unpolarized light. Simulation results show a significant reduction of reflection and a complete suppression of transmission.     

Magnetic reversal mechanism in strong perpendicular magnetic anisotropic CoPt/AlN multilayer film

Magnetic reversal mechanism of the Sub/AlN5 nm/[CoPt2 nm/AlN5 nm]₅ nano multilayer film, which shows strong perpendicular magnetic anisotropy (K_u=6.7×10⁶ erg/cm³), has been studied. The angle-dependent magnetic hysteresis loops of this highly perpendicular anisotropic CoPt/AlN multilayer film were measured in the present work, applying a magnetic field along different angles φ with respect to the film normal. It demonstrates that the magnetic reversal of the CoPt ultrathin layers in the CoPt/AlN multilayer film is occurred by the reversible magnetization rotation and the irreversible displacement of domain walls. The φ-dependent part of coercive field is resulted from the internal stress according to the Kondorsky and Kersten model. The φ-independent part of coercive field implies some random and isotropy pinning centers (e.g., vacancies, dislocations, grain boundaries) in the ultrathin CoPt layers. Our work is useful for coercivity control of metal/ceramics layered structures, in particular the perpendicular magnetic tunneling junctions.     

悬浮二维晶体材料反射光谱和光致发光光谱的周期性振荡现象

研究了在二氧化硅/硅衬底上制备的悬浮石墨烯以及二硫化钼的反射光谱以及悬浮二硫化钼的光致发光光谱.研究发现:悬浮多层石墨烯的反射光谱表现出明显的振荡现象,并且该振荡具有一定的周期性;振荡周期的大小不依赖于悬浮多层石墨烯的层数,而是随着衬底上沉孔深度(空气层厚度)的增加而减小.利用多重光学干涉模型可以解释这种振荡现象以及振荡周期随沉孔深度改变的变化趋势.该模型计算结果表明,只有当沉孔深度达到微米量级时这种振荡现象才会显著出现;并且可由振荡周期定量地确定出沉孔深度.对于悬浮的二硫化钼样品,其反射光谱和光致发光光谱也出现了类似的振荡现象.这表明这种振荡现象是在各种衬底上悬浮二维材料反射光谱和光致发光光谱的一种普遍性结果,也预示悬浮二维材料器件的电致发光光谱也会出现类似的振荡现象,对悬浮二维晶体材料的物理性质和器件性能研究具有一定的参考价值.     

Modification of the structure of bandpass reflection interference filters

Spectral properties of bandpass reflection interference filters, whose components represent interference transmission cutoff short-and long-wavelength filters, are studied. It is shown that the use of transmission cutoff filters provides a uniform suppression of background outside the transmission band of a bandpass reflection filter. A reflection filter becomes a virtually ideal polarizer for radiation incident on the surfaces inside a filter at angles of 35° and greater.     

Improving attosecond pulse reflection by large angle incidence for periodic multilayer mirror in the extreme ultraviolet region

The improvement of attosecond pulse reflection by large angle incidence for periodic multilayer mirror in the extreme ultraviolet region has been discussed. Numerical simulations of both spectral and temporal reflection characteristics of periodic multilayer mirrors under various incident angles have been analyzed and compared. It was found that the periodic multilayer mirror under larger incidence angle can provide not only higher integrated reflectivity but also broader reflection band with negligible dispersion, making it possible to obtain better reflected pulse that owns higher pulse reflection efficiency and shorter pulse duration for attosecond pulse reflection. In addition, with increasing of incident angle, the promoting of attosecond pulse reflection capability has been proven for periodic multilayer mirrors with arbitrary layers.     

Omnidirectional complete reflection from multilayer dielectric structures

Formulas for determining the boundaries of the high-reflectance zone of a dielectric multilayer system at all angles of oblique incidence of light are derived. The optimal conditions for a possible extension of the boundaries of omnidirectional complete reflection for all polarizations in a given spectral range are discussed.     

Correction method for the self‐absorption effects in fluorescence extended X‐ray absorption fine structure on multilayer samples

A novel correction method for self‐absorption effects is proposed for extended X‐ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The effects of refraction and multiple reflection at the interfaces are fully considered in this correction method. The correction is performed in k‐space before any further data analysis, and it can be applied to single‐layer or multilayer samples with flat surfaces and without thickness limit when the model parameters for the samples are known. The validity of this method is verified by the fluorescence EXAFS data collected for a Cr/C multilayer sample measured at different experimental geometries.     

Improving attosecond pulse reflection by large angle incidence for a periodic multilayer mirror in the extreme ultraviolet region

The improvement of attosecond pulse reflection by large angle incidence for a periodic multilayer mirror in the extreme ultraviolet region has been discussed. Numerical simulations of both spectral and temporal reflection characteristics of periodic multilayer mirrors under various incident angles have been analyzed and compared. It was found that the periodic multilayer mirror under a larger incidence angle can provide not only higher integrated reflectivity but also a broader reflection band with negligible dispersion, making it possible to obtain better a reflected pulse that has a higher pulse reflection efficiency and shorter pulse duration for attosecond pulse reflection. In addition, by increasing the incident angle, the promotion of attosecond pulse reflection capability has been proven for periodic multilayer mirrors with arbitrary layers.     

Layer-Resolved Magneto-Optical Kerr Effect In Semi-Infinite Inhomogeneous Layered Systems

The contour integration technique applied to calculate the optical conductivity tensor at finite temperatures in the case of inhomogeneous surface layered systems within the framework of the spin-polarized relativistic screened Korringa-Kohn-Rostoker band structure method is extended to arbitrary polarizations of the electric field. It is shown that besides the inter-band contribution, the contour integration technique also accounts for the intra-band contribution. Introducing a layer-resolved complex Kerr angle, the importance of the first, non-magnetic buffer layer below the ferromagnetic surface on the magneto-optical Kerr effect in the Co | Pt m multilayer system is shown. Increasing the thickness of the buffer Pt, the layer-resolved complex Kerr angles follow a linear dependence with respect to m only after nine Pt mono-layers.     

Application of kinoform lens for X‐ray reflectivity analysis

In this paper the first practical application of kinoform lenses for the X‐ray reflectivity characterization of thin layered materials is demonstrated. The focused X‐ray beam generated from a kinoform lens, a line of nominal size ～50 µm × 2 µm, provides a unique possibility to measure the X‐ray reflectivities of thin layered materials in sample scanning mode. Moreover, the small footprint of the X‐ray beam, generated on the sample surface at grazing incidence angles, enables one to measure the absolute X‐ray reflectivities. This approach has been tested by analyzing a few thin multilayer structures. The advantages achieved over the conventional X‐ray reflectivity technique are discussed and demonstrated by measurements.     

微粗糙基底上多层涂层光散射偏振建模与特性研究

为满足多层涂层目标的偏振探测需求,基于一阶矢量扰动理论,结合偏振传输矩阵,建立微粗糙基底上多层涂层的光散射偏振双向反射分布函数模型,研究多因素影响下两种典型涂层目标,单层减反射涂层和多层高反射涂层的光散射偏振特性,结果表明单层减反射涂层目标的偏振度受观测位置影响,峰值左侧的偏振度较之裸基底增大,右侧反之,探测不同观测角下的偏振度可区分无涂层和涂层目标。不同观测角和入射波长下,多层高反射涂层目标的偏振度与涂层层数和涂层光学厚度显著相关,层数增加,多层涂层在镜反射附近具有去偏作用。仿真结果符合测量数据,验证了多涂层目标散射偏振模型的正确性与合理性,为实现多涂层目标偏振探测和反射隐身技术提供理论依据。