共查询到15条相似文献,搜索用时 78 毫秒
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提出一种新的处理方法-XPS标准曲线法来测量硅片上超薄氧化硅层(SiO2/Si)的厚度。该方法利用一系列氧化硅厚度(d)准确已知的SiO2/Si标准样品,分别记录其氧化硅和元素硅的Si(2p)谱线,并得到峰高比(R),然后将厚度(d)对峰高比(R)作图得到标准曲线。在相同的实验条件下,测得未知样品氧化硅和元素硅的Si(2p)谱线并计算其峰高比,通过插入法在标准曲线上得到相应的氧化硅层厚度。SiO2/Si标准样品由设备一流和经验丰富的权威实验室提供,其氧化硅厚度采用多种方法进行测量比对。实验表明:基于氧化硅厚度准确知道的标准样品制作的XPS标准曲线,用于硅片上超薄氧化硅层厚度测量时具有快速、简便和比较准确等优点,有较好的实用价值。 相似文献
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不同表面状态镀锡钢板铬酸盐钝化膜中铬元素的XPS分析 总被引:3,自引:0,他引:3
用X射线光电子能谱(X-ray photoelectron spectroscopy, XPS)分析的方法,对铬酸盐钝化镀锡钢板的正常表面及缺陷点处铬元素的含量、价态以及由铬元素组成的化合物进行了研究。用超声波的方法对铬酸盐钝化镀锡钢板进行处理后,研究了超声波处理对缺陷处的铬元素的含量、价态的影响。结果表明,钝化膜中主要含有Cr,O, Sn元素。镀锡铬酸盐钝化膜中正常表面的铬元素主要是以Cr(OH)3,Cr单质以及Cr2O3的形态存在。在对镀锡板表面进行阴极电解钝化的过程中,Cr(Ⅵ)发生了转化,价态降低。在缺陷处,除了有Cr(OH)3和Cr2O3以外,还有微量的Cr(Ⅵ)存在。在缺陷处铬元素的含量低于正常表面,在超声波清洗处理后,缺陷处铬元素的含量明显低于不经超声波清洗的含量。施加的超声波因产生强烈的洗脱作用,使吸附在缺陷处的微量的Cr(Ⅵ)消失。 相似文献
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采用固源Si分子束外延,在较高的生长温度于Si(100)衬底上制备出Si1-xGex/Si量子阱发光材料。发光样品的质量和特性通过卢瑟福背散射、X射线双晶衍射及光致发光评估。背散射实验中观察到应变超晶格的反常沟道效应;X射线分析表明材料的生长是共度的、无应力释放的,结晶完整性好。低温光致发光主要是外延合金量子阱中带边激子的无声发射和横光学声子参与的激子复合。并讨论了生长温度对量于阱发光的影响。 相似文献
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立方氮化铝(c-AlN)以其优异的性能成为发光二极管、激光二极管等光电子器件的理想材料。采用激光分子束外延法制备了c-AlN/TiN/Si(100)异质结构,研究了它的显微组织和光学性能。结果表明:AlN薄膜和TiN缓冲层呈立方岩盐矿结构的(200)面择优取向;c-AlN薄膜、TiN缓冲层和Si衬底的界面清晰,不存在第二相,但错配应力使得界面处存在一定的缺陷;c-AlN薄膜的光致发光谱分别在376,520,750 nm处有3个发光中心;376 nm处的发光峰与氮空位(V_N)和氧杂质(O_N)有关,520 nm处的发光峰与Al空位(V_(Al))和O_N的复合有关,而750 nm处的发光峰可归因于V_(Al)和价带之间的辐射复合;c-AlN薄膜的电致发光中心在580 nm附近,也属于c-AlN的深能级缺陷发光。 相似文献
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分别采用具有和不具有弯曲弧磁过滤器的两种真空阴极弧离子镀方法,在不同工艺参量下制备了类金刚石碳膜.采用Raman光谱和X射线光电子能谱(XPS),分析了不同工艺参量下的类金刚石碳膜的键结构,通过对Raman光谱的D峰、G峰和C1s电子结合能峰位、强度的对比,详细讨论了沉积工艺参量对类金刚石碳膜结构的影响.研究发现,不同工艺下具有高强度D峰Raman光谱的类金刚石碳膜,其C1s电子结合能却分别位于284.15,285.50eV,表明高度石墨化和高度金刚石化两种状态类金刚石碳膜,都可以形成具有高强度D峰Raman光谱曲线
关键词:
类金刚石碳膜
Raman光谱
X射线光电子能谱 相似文献
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The structure, growth and stoichiometry of heteroepitaxial Pr2O3 films on Si(1 1 1) were characterized by a combined RHEED, XRD, XPS and UPS study in view of future applications as a surface science model catalyst system. RHEED and XRD confirm the growth of a (0 0 0 1) oriented hexagonal Pr2O3 phase on Si(1 1 1), matching the surface symmetry by aligning the oxide in-plane direction along the Si azimuth. After an initial nucleation stage RHEED growth oscillation studies point to a Frank-van der Merwe growth mode up to a thickness of approximately 12 nm. XPS and UPS prove that the initial growth of the Pr2O3 layer on Si up to ∼1 nm thickness is characterized by an interface reaction with Si. Nevertheless stoichiometric Pr2O3 films of high crystalline quality form on top of these Pr-silicate containing interlayers. 相似文献
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Surface structure, determined by scanning tunneling microscopy (STM), surface morphology, determined by atomic force microscopy (AFM), and surface composition, determined by X-ray photoelectron spectroscopy (XPS) of 20.0 nm Si0.8Ge0.2 quantum dots formed at 800 °C and encapsulated with 0-10 nm of Si at 500 °C and 800 °C are presented. It is observed that the quantum dot surface morphology changes during the Si encapsulation at 800 °C by the smoothing of the quantum dots. The height of the quantum dots decreases faster than can be accounted for from the amount of Si deposited, indicating that there is movement of material out of the quantum dots during the encapsulation process. Encapsulation at 500 °C results in a retention of the quantum dot surface morphology with increased Ge segregation compared to Si encapsulation at 800 °C. We conclude that the changing surface morphology at 800 °C is not the result of Ge segregation but due to intermixing resulting from the tensile strain of Si depositing on SiGe. 相似文献
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Results of experimental studies of the influence of substrate preparation on the surface chemistry and surface morphology of the laser-assisted chemical vapour deposition (L-CVD) SnO2 thin films are presented in this paper. The native Si(1 0 0) substrate cleaned by UHV thermal annealing (TA) as well as thermally oxidized Si(1 0 0) substrate cleaned by ion bombardment (IBA) have been used as the substrates. X-ray photoemission spectroscopy (XPS) has been used for the control of surface chemistry of the substrates as well as of deposited films. Atomic force microscopy (AFM) has been used to control the surface morphology of the L-CVD SnO2 thin films deposited on differently prepared substrates. Our XPS shows that the L-CVD SnO2 thin films deposited on thermally oxidized Si(1 0 0) substrate after cleaning with ion bombardment exhibit the same stoichiometry, i.e. ratio [O]/[Sn] = 1.30 as that of the layers deposited on Si(1 0 0) substrate previously cleaned by UHV prolonged heating. AFM shows that L-CVD SnO2 thin films deposited on thermally oxidized Si(1 0 0) substrate after cleaning with ion bombardment exhibit evidently increasing rough surface topography with respect to roughness, grain size range and maximum grain height as the L-CVD SnO2 thin films deposited on atomically clean Si substrate at the same surface chemistry (nonstoichiometry) reflect the higher substrate roughness after cleaning with ion bombardment. 相似文献
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