The influence of hydrogen chloride doping level on the complex refractive indices of anisotropic polyaniline film: Application of a new internal reflection waveguide coupling technique

Nondestructive three‐dimensional refractive‐index measurements are used for the determination of both crystallinity and orientation in thin polymer films. The prism waveguide coupler is particularly suitable for three‐dimensional isotropic and anisotropic thin‐film studies because of the quantitative character of the information obtained and the ease of data acquisition. It has been limited, however, to measuring the refractive index of optically transparent or weakly absorbing films. This study shows that a modified prism waveguide coupler can be used to determine the complex refractive index over a range from transparent to highly absorbing films from the internally reflected light intensity. Thus, both the refractive index, n, and the extinction coefficient, k, can be obtained. This method is used to determine the anisotropic three‐dimensional n and k values of spin‐coated emeraldine base and hydrogen chloride doped emeraldine salt polyaniline films. © 2001 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 39: 2481–2490, 2001     

Optical anisotropy of polymeric films measured by waveguide propagation mode determination

Extruded thin films of a liquid-crystalline charge-conjugated rigid-rod polymer poly(p-phenylenebenzobisthiazole), PBT, and a semicrystalline thermoplastic polyethylene-terephthalate (Mylar) were fabricated and examined for film thickness, refractive index, and linear attenuation coefficient. Optical waveguide modes were successfully induced on the polymeric films using a prism coupler at λ = 633 and 1300 nm. Highly consistent thickness values were obtained for the polymeric films. In addition, the anisotropic nature of the optical properties was determined using TE and TM propagation modes. A refractive index as high as 2.3 was observed on PBT film. The refractive index data suggested that the PBT and Mylar films were optically anisotropic with refractive indices n? (out-of-plane) invariably smaller than n∥ (in-plane). Large anisotropy was also discovered in the linear attenuation coefficient α, with α_∥/α_? ≈ 50 for the Mylar films. Complementary polarimetric and spectroscopic interference measurements were also applied to investigate the optical anisotropy of the extruded polymeric films. © 1992 John Wiley & Sons, Inc.     

Role of Plasma Parameters on the Conjugated Structure Retention in Polyaniline Thin Film

The role of plasma parameters on the film characteristics is investigated on polyaniline thin film deposited by radio frequency (RF) plasma polymerization. A series of un-doped and iodine doped polyaniline thin films are prepared by RF discharge operating at 13.56?MHz with different discharge powers and pressure variation from 0.1 to 0.05?mbar and variation in deposition time from 20 to 40?min. A good thin film is found with a power ranging from 9?W (?28?V self bias) to 20?W (?65?V self bias) at 0.1?mbar pressure which is confirmed by fourier transform infra-red spectroscopy showing the retention of aromatic rings. In addition, iodine doping is carried out with 9?W power and 0.1?mbar pressure. The characterization of process plasma is done using Langmuir probe diagnostics and optical emission spectroscopy. A correlation has been established between film characteristics and plasma properties investigated using optical emission spectroscopy and Langmuir probe analysis. Emphasis has been given on the study of the influence of plasma parameters, particularly of the electron energy distribution function on the quality of conjugated plasma polymerized aniline film.     

磷酸铁纳米薄膜复合光波导氨气传感元件的制备

将硝酸铁和甲醇、磷酸溶液按一定比例混合后,通过旋涂法制备了磷酸铁（FePO₄）纳米薄膜,测定了匀胶机转速对膜厚及烘干温度对膜厚和折射率的影响,并发现薄膜的烘干温度超过150 ℃时,薄膜的厚度（130 nm）和折射率(1.7)变化不大。将该薄膜固定在钾离子交换玻璃光波导表面,研制出FePO₄膜/K⁺交换玻璃复合光波导。酸碱指示剂溴百里酚兰（BTB）作为敏感试剂,固定在复合光波导表面,研制了BTB膜-FePO₄膜/K⁺交换玻璃复合光波导氨气传感元件。采用自装的光波导气体传感检测系统对不同浓度的氨气进行了检测。结果表明,该传感元件能够检测0.35 mg/m³浓度的氨气,并具有响应（10 s）及恢复（90 s）速度快、可逆性好、连续使用等特点。     

A spectroelectrochemical study on single-oscillator model and optical constants of sulfonated polyaniline film

The optical properties of sulfonated polyaniline (SPAN) thin film prepared by electrochemical method have been investigated. Polychromic behavior of SPAN thin film (transparent yellow-green-dark blue) was observed when the cyclic voltammograms were taken between -0.25 V and +1.90 V (vs. Ag/AgCl, sat.) during the growth of polyaniline film. In situ UV-vis spectra of the polymers-indium tin oxide (ITO) glass electrode were taken during the oxidation of the polymers at different applied potentials. The direct band gap values of SPAN thin film changed from 3.771 eV to 3.874 eV with the applied potentials. From in situ UV-vis spectra, the optical constants such as refractive index and dielectric constant of the SPAN thin film were determined. The important changes in absorption edge, refractive index and the dielectric constant were observed due to the applied potentials. The refractive index dispersion curves of the film obey the single-oscillator model and oscillator parameters changed with the applied potentials. The most significant result of the present work is in situ spectroelectrochemical method, which can be used to modify the optical band gaps and constants.     

Optical switching of azobenzene sidechain molecules observed by surface plasmon spectroscopy

The use of surface plasmons is reported for the optical characterization of thin organic films, in particular thin polymer films at a metal dielectric interface. The basic properties of PSP are presented, including excitation and the technique of surface plasmon microscopy, which allows to obtain an image. As an example studies are presented on the trans-cis photoisomerization of azobenzene sidechain polymers in ultra thin films, prepared by the Langmuir-Blodgett-Kuhn technique. The transition from the trans to the cis state induces a change in the refractive index of the film. These changes were detected and their kinetics measured by a surface plasmon spectroscopy technique. A refractive index pattern could be written into the films and the areas of different refractive indices have been detected by surface plasmon microscopy.     

宽带隙Cu(In,Al)Se2薄膜的制备及表征

以特殊脉冲电沉积方法制备CuInSe2(CIS)前驱体薄膜, 通过真空蒸镀法在CIS薄膜上沉积Al膜, 经硒化退火后在氧化铟锡(ITO)基底上制备了Cu(InAl)Se2(CIAS)薄膜. 采用扫描电子显微镜(SEM)、X射线能谱(EDS)、X射线衍射(XRD)、X射线光电子能谱(XPS)、紫外-可见吸收光谱(UV-Vis)对其形貌、结构、成分及光学吸收性质进行了表征. 结果表明, 制备的CIAS薄膜颗粒均匀, 表面平整致密, 呈黄铜矿结构. 薄膜在可见光区具有良好的吸收, 带隙约为1.65 eV.     

Optical properties of thermally evaporated 4-(4-nitrobenzalideneamino) antipyrine Schiff base thin films

4-(4-nitrobenzalideneamino) antipyrine (NBAA) have been synthesized by refluxed ethanolic solution of 4-aminoantipyrine and p-nitrobenzaldehyde for 4 h and characterized with various physico-chemical techniques. Thin films of NBAA have been prepared by the thermal deposition technique in a vacuum of 1.5 × 10⁻⁵ mbar onto optical flat glass substrates. X-ray diffraction patterns show amorphous nature for all NBAA thin films except UV irradiated thin film which shows amorphous nature with some crystallinity but with small amount. The optical constants of thermally deposited NBAA thin film were investigated in the wavelength range 200–2500 nm. The type of optical transition near the edge of the band gap is found to be indirect allowed transition. The effect of UV irradiation as well as the effect of annealing on the optical properties of NBAA thin films was investigated. The value of the energy gap for thin films under investigation is calculated and found to be 1.56 eV for as-deposited, 1.45 eV for annealed and 1.82 eV for UV irradiation.     

Refractometric discrimination of void-space filling and swelling during vapour sorption in polymer films

Thin polymeric films have been deposited as upper cladding layers on a new integrated optical interferometer fabricated from layers of silicon oxynitride on a silicon wafer. The evanescent field of the probing waveguide mode transduces refractive index changes in the polymer layer into the measured phase changes in the device. Real-time measurement of index change and its sign is obtained. Upon exposure to humid air, we record water sorption by films of poly(vinyl pyrrolidone) by a rapid positive index change for void-space filling followed by a slow negative index change for swelling. Sorption of water vapor into a thin film of the viscous liquid polymer polyethylenimine shows only swelling mode behaviour and a simple constitutive model can be applied to give the fractional water occupied volume.     

Photovoltaic Behaviour of Titanyl Phthalocyanine Thin Films and Titania Bilayer Films

Summary: Titanyl phthalocyanine (TiOPc) thin films were prepared using evaporation and surface polymerization by ion-assisted deposition (SPIAD) in a vacuum deposition system. These films were characterized by means of ultraviolet and X-ray photoelectron spectroscopy as well as UV/Vis absorption spectroscopy. Valence band and elemental content indicated that phthalocyanine electronic and chemical structures were largely preserved during SPIAD. Further, bilayer thin films of titania (TiO₂) and SPIAD TiOPc were prepared. TiO₂ film was deposited by reactive magnetron sputtering of TiO₂ target. Study of the structured samples was focused on the optical and electrical properties of the composite films. The films were characterized by non-contact photovoltage measurements and UV-Vis spectroscopy. These results suggest there is a possibility to use these bilayer thin films in photovoltaic solar cells, however further experiments to improve conductivity of the films will be required.     

电解沉积成膜法制备氧化钼变色薄膜的研究

本文研究了一种新的制备过渡金属氧化钼(MoO₃)变色薄膜的方法,即电解沉积成膜法。通过X射线衍射实验证明用该方法制得的氧化钼薄膜为非晶质。与传统的真空蒸镀法相比,该薄膜同样具有良好的电致变色和光致变色特性,并观测到了可见光变色效应。结果表明,该方法将为大面积制备均匀过滤金属氧化物变色薄膜走向实用化打下基础。     

溶胶-凝胶法制备的Y_2O_3薄膜的光波导性质研究

用醋酸钇溶解于甲氧基乙醇的溶胶 凝胶法制备了Y2 O3光波导薄膜。通过二乙烯三胺的络合作用 ,获得了均匀和稳定的前驱液 ,并用浸渍提拉法得到了薄膜。差热分析、红外吸收光谱被用来表征Y2 O3凝胶和粉末。用XRD、扫描电子显微镜、m线法和波导荧光光谱法研究了Y2 O3光波导薄膜的结构和光波导性质。结果表明 ,Y2 O3薄膜对于光活性掺杂是一种很好的基质材料 ,预示Y2 O3薄膜在光电子方面具有巨大的应用前景。     

掺硼p型非晶硅薄膜的制备及光学性能的表征

以高氢稀释的硅烷(SiH₄ )为反应气体,硼烷(B₂H₆)为掺杂气体,利用RF-PECVD方法,在玻璃衬底上制备出掺硼的氢化非晶硅(a-Si:H)薄膜,研究了硼掺杂量对氢化非晶硅(a-Si:H)薄膜的光学性能的影响.利用NKD-7000 W光学薄膜分析系统测试薄膜的透射谱和反射谱,并利用该系统的软件拟合得出薄膜的折射率、消光系数、吸收系数等光学性能参数,利用Tauc法计算掺硼的非晶硅薄膜的光学带隙.实验结果表明,随着硼掺杂量的增加,掺杂非晶硅薄膜样品在同一波长处的折射率先增大后减小,而且每一样品均随着入射光波长的增加而减小,在波长500 nm处的折射率均达到4.3以上;薄膜的消光系数和吸收系数随着硼掺杂量的增大而增大,在500 nm处的吸收系数可高达1.5×10⁵cm^-1.在实验的硼掺杂范围内,光学带隙从1.81 eV变化到1.71 eV.     

Structural,morphological, optical and third order nonlinear optical response of spin-coated NiO thin films: An effect of N doping

The present work deals with the deposition of NiO and Nitrogen (N)-doped NiO thin films by sol-gel spin coating technique. Structural, morphological, linear and non-linear optical characteristics of undoped and N-doped (1–15 wt%) NiO films were studied. From XRD measurements, it is evident that single phase nano crystalline NiO is formed for all doping concentrations. Surface morphology study shows that higher concentration of N doped NiO thin films were of high quality and EDX mapping confirmed the doping of Nitrogen in films. The Raman spectra of the studied films were analyzed over the range of 1400-200 cm⁻¹. The optical studies confirm that as doping increases, transparency of the film decreases (except at 10% N doping) and the band gap narrows. Nonlinear parameters such as refractive index and susceptibilities also depend on N dopant concentration. Z-scan studies viz., absorption index, nonlinear refractive index were carried out on undoped and N doped NiO samples and the results were matched with theoretical calculated values.     

Third-order nonlinear and planar waveguide properties of TiO<Subscript>2</Subscript>/organically modified silane hybrid films doped with different disperse red 1 content

TiO₂/organically modified silane organic–inorganic hybrid films doped with different disperse red 1 contents are prepared by combining a low-temperature sol–gel method and a spin-coating process. Effects of the disperse red 1 content on the third-order nonlinear and the planar waveguide properties of the hybrid films are also studied by a z-scan technique and a prism coupling technique. Results indicate that the nonlinear refractive index of the hybrid films is negative, whose magnitude is of the order of 10⁻⁸ esu for the measured samples. It is suggested that both the thermal effect and the photoisomerization process contribute to the third-order nonlinear optical properties of the hybrid films jointly. It is also found that the refractive index and the thickness of the hybrid films decrease with an increase of the temperature as the independent variable. In addition to, optical absorption properties of the hybrid films are characterized by UV–Visible spectroscopy. These results indicate that the as-prepared hybrid films are promising candidates for photonic applications.     

不同基底对TiO2和SiO2薄膜的光学性能的影响

采用溶胶-凝胶法分别在K9玻璃、单晶硅和石英玻璃基底上制备了纳米TiO₂和SiO₂薄膜。利用SEM、UV-Vis及反射式椭圆偏振光谱仪对薄膜的微观结构及光学特性进行了表征和分析。结果表明:3种基底中, 单晶硅基底上TiO₂和SiO₂薄膜折射率最大;在非晶态K9玻璃和石英玻璃基底上TiO₂薄膜折射率和透光率差异较大;SiO₂薄膜在非晶态基底上折射率、透光率相近;3种基底上薄膜的折射率和消光系数都有随波长增大而减小的趋势, 同时Cauchy模型能较好的描述单晶硅基底上两种薄膜在400~800 nm波段的光学性能。     

不同基底对TiO2和SiO2薄膜的光学性能的影响

采用溶胶-凝胶法分别在K9玻璃、单晶硅和石英玻璃基底上制备了纳米TiO₂和SiO₂薄膜。利用SEM、UV-Vis及反射式椭圆偏振光谱仪对薄膜的微观结构及光学特性进行了表征和分析。结果表明：3种基底中, 单晶硅基底上TiO₂和SiO₂薄膜折射率最大;在非晶态K9玻璃和石英玻璃基底上TiO₂薄膜折射率和透光率差异较大;SiO₂薄膜在非晶态基底上折射率、透光率相近;3种基底上薄膜的折射率和消光系数都有随波长增大而减小的趋势, 同时Cauchy模型能较好的描述单晶硅基底上两种薄膜在400~800 nm波段的光学性能。     

Structural and optical characterization of thermally evaporated cadmium sulfide thin films

The article reports the structural and optical properties of vacuum‐evaporated cadmium sulfide (CdS) films with different thicknesses at room temperature. The structural investigations performed by means of X‐ray diffraction (XRD) technique have showed that all the films have the zinc‐blende structure, a face‐centered cubic form with lattice constants a = b = c = 5.82 Å and point group F4 3m. Crystallite sizes calculated from Scherrer relation are in the range of 173–345 Å. So far, because the optical parameters of the metastable cubic CdS have not been so well known, we apply spectroscopic ellipsometry to determine the thickness, optical constants and energy band gap of CdS thin film deposited by thermal evaporation onto opaque gold substrate, a perfect reflectivity and inert metal. As shown the measured spectral behavior of the optical constants and the band gap value of CdS thin film are in agreement with those obtained by the reflectance and transmittance methods. The energy band gap of CdS thin film determined from the spectral behavior of the absorption coefficient is about 2.46 eV. Copyright © 2008 John Wiley & Sons, Ltd.     

Fluorescence spectra and their temperature dependence of amorphous anthracene films doped with naphthacene

Fluorescence spectra and their temperature dependence of amorphous anthracene films doped with naphthacene were observed. An amorphous film was prepared by vacuum evaporation technique on a quartz plate cooled down to 30–40°K. The obtained results were discussed in relation to the structural change in the amorphous film.     

Influence of Mn incorporation on the structural and optical properties of sol gel derived ZnO film

Undoped and manganese doped ZnO (ZnO:Mn) films were prepared by sol gel method using spin coating technique. The effect of Mn incorporation on the structural and optical properties of the ZnO film has been investigated. The crystalline structure and orientation of the films have been investigated by using their X-ray diffraction spectra. The films exhibit a polycrystalline structure. Mn incorporation led to substantial changes in the structural characteristics of the ZnO film. The scanning electron microscopy (SEM) images of the films showed that the surface morphology of the ZnO film was affected by the Mn incorporation. The transparency of the ZnO film decreased with the Mn incorporation. The optical band gap and Urbach energy values of the ZnO and ZnO:Mn films were found to be 3.22, 3.19 eV and 0.10, 0.23 eV, respectively. The optical constants of these films, such as refractive index, extinction coefficient and optical dielectric constants were determined using transmittance and reflectance spectra. The refractive index dispersion curve of the films obeys the single oscillator model with dispersion parameters. The oscillator energy, E _o , and dispersion energy, E _d, of the films were determined 5.30 and 16.26 eV for ZnO film and 5.80 and 12.14 eV for ZnO:Mn film, respectively.