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X-ray powder diffraction data on the molecular semiconductors based on the 1:1 charge-transfer complexes of the electron donors, viz. phenothiazine (PTZ), 2-chlorophenothiazine (CPZ), 2-acetyl phenothiazine (APZ) and 2-(trifluoromethyl)-phenothiazine (TPZ) with 2,3-dichloro-5,6-dicyano-p-benzoquinone (DDQ) have been reported in this paper. The indexing has been done by Ito's method. All the complexes have been found to have orthorhombic crystal structures. The lattice parameters for the individual complexes are as follows: (i) PTZ-DDQ: a = 6.020 Å, b = 9.775 Å, c = 24.280 Å; (ii) CPZ-DDQ: a = 5.830 Å, b = 8.070 Å, c = 20.280 Å; (iii) APZ-DDQ: a = 5.055 Å, b = 7.955 Å, c = 19.520 Å; (iv) TPZ-DDQ: a = 5.130 Å, b = 8.195 Å, c = 19.850 Å. 相似文献
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Andrzej Katrusiak 《Crystal Research and Technology》1991,26(5):523-531
The high-pressure X-ray diffraction technique, commonly applied for inorganic crystals, is discussed in a view of its application for laboratory studies on molecular crystals of organic compounds – particularly when the weak X-ray scattering of such specimens causes experimental difficulties. To minimize the background-to-signal ratio, relatively big crystal samples (ca. 0.005 A3) were used and the mechanical properties of the gasket material were applied to obtain the optimum experimental conditions for pressure generation and lowering the background of reflections. The mechanical properties of tungsten, Inconel, and hardened steel gaskets are different and these properties can be helpful in planning high-pressure measurements with large high-pressure chamber to contain a big crystal sample. Several characteristic features of organic crystals – like their strong compressibility (depending on the nature of intermolecular interactions) and pressure-dependence of thermal vibrations of atoms – can have a direct impact on the conditions of high-pressure experiments. The properties of molecular crystals of organic compounds have been discussed on the basis of several high-pressure structural studies, mainly on simple cyclic β-diketoalkanes (enol forms). It has been attempted to assess the feasibility of investigating the details of molecular structure at high pressures by X-ray laboratory studies. A systematic pressure-induced change in the length of double C O bonds is observed in this group of compounds, which can be correlated with the compression of the H-bonds involving the carbonyl groups. 相似文献
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The thermal dehydration of ZnSeO4 · 6 H2O, ZnSeO4 · 5 H2O, and ZnSeO4 · 3 H2O has been studied by TG, DTA, and DSC-analyses. It has been established that the dehydration of ZnSeO4 · 6 H2O occurs stepwise and as intermidiate hydrates ZnSeO4 · 5 H2O, ZnSeO4 · 3 H2O and ZnSeO4 · H2O are produced. The enthalpy of dehydration of the observed phase transitions has been determined. The enthalpy of formation of ZnSeO4 · 6 H2O, ZnSeO4 · 5 H2O, ZnSeO4 · 3 H2O, and ZnSeO4 · H2O has been calculated on the basis of the DSC-data. ZnSeO4 · 5 H2O and ZnSeO4 · 3 H2O have been studied rentgenographically: ZnSeO4 · 5 H2O crystallizes in triclinic system with lattice parameters: a = 6.387(2) Å; b = 10.706(3) Å; c = 6.167(3) Å; α = 98.66(2)°; β = 109.32(3)° γ = 75.52(3)° V = 384.3(2) Å3; SG P1 . ZnSeO4 · 3 H2O forms orthorhombic crystals with lattice constants: a = 8.165(4)Å; b = 11.314(5) Å; c = 12.465(7) Å; V = 1151.5(7) Å3; SG Pbca. 相似文献
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Benzidine-m. aminophenol system gives a double simple eutectic type phase-diagram showing the formation of a 1:2 addition compound with congruent melting point surrounded by two eutectics on either side. The linear velocity of crystallization data on pure components, eutectics, and addition compound suggest square relationship between growth velocity and undercooling. From the X-ray diffraction studies it can be inferred that the eutectics are not a simple mechanical mixtures of two components. Whereas microstructural investigations suggest faceted growth of the addition compound and a typical characteristic growth of the eutectics, spectral studies indicate the formation of intermolecular hydrogen bonding between two components forming the molecular complex. 相似文献
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Ana T. Marques Joana A. Silva Manuela Ramos Silva Ana Matos Beja Licinia L. G. Justino Abilio J. F. N. Sobral 《Journal of chemical crystallography》2008,38(4):295-299
Abstract 2-Methoxy-5-phenylaniline, a promissor monomer for PANI studies, has been characterized by single-crystal X-ray diffraction
at two temperatures: orthorhombic, space group P212121, Z = 12 with a = 5.9900(2) ?, b = 20.4873(6) ?, c = 26.3727(8) ? and R = 0.0868 for 293(2) K and a = 5.8337(9) ?, b = 20.4428(31) ?, c = 26.0773(40) ? and R = 0.0669 for 120(2) K. There are three independent molecules in the unit cell. One of them is approximately planar, the other
two have the phenyl rings rotated. At room temperature the two latter molecules are joined in dimers through H-bonds and at
low temperature the same molecules are joined in columns that run along the a-axis.
Index Abstract
X-ray Diffraction and DFT Studies of 2-Methoxy-5-phenylaniline
Ana T. Marques, Joana A. Silva, Manuela Ramos Silva, Ana Matos Beja, Licinia L. G. Justino, Abilio J. F. N. Sobral
2-Methoxy-5-phenylaniline, a promissor monomer for PANI studies, has been characterized by single-crystal X-ray diffraction
at 293(2) K and 120(2) K. The three independent molecules in the unit cell show different conformations and establish distinct
intermolecular H-bonds.
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Abstract
Crystals of benzyl (RS,RS,RS)-7-phenylbicyclo[5.1.0]octan-2-ylcarbamate 9 and (RS,RS,RS)-N-[3′-(4″-methylpiperazin-1″-yl)propyl]-N-{5-(4′′′-cyanophenyl)bicyclo[3.1.0]hexan-2-yl}amine dihydrochloride 10·2HCl were synthesised and single crystal X-ray diffraction was used to establish unambiguously the relative configurations within these structures. Compound 9 crystallizes in the orthorhombic space group P2 1 2 1 2 1 with cell parameters of a = 6.85340(10) ?, b = 9.8732(2) ?, c = 27.5407(6) ?, V = 1863.54(6) ?3 and Z = 4. In the crystal structure adjacent molecules are linked by N–H···O=C hydrogen bonds. Compound 10·2HCl crystallizes as the corresponding monohydrate in the monoclinic space group P2 1/n with cell parameters of a = 7.1540(17) ?, b = 39.763(12) ?, c = 8.163(3) ?, β = 91.062(7)°, V = 2321.7(11) ?3 and Z = 4. In the crystal structure adjacent molecules are linked by a series of hydrogen bonds between the ammonium groups, chloride ions and adventitious water molecules. 相似文献14.
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Folomeshkin M. S. Pisarevsky Yu. V. Prosekov P. A. Volkovsky Y. A. Kumskov A. S. Grigoriev Y. V. Ligacheva E. A. Targonskii A. V. Blagov A. E. Kovalchuk M. V. 《Crystallography Reports》2019,64(1):1-5
Crystallography Reports - A technique for studying the carbon-fiber structure using X-ray diffraction and electron microscopy has been developed. Average crystal-structure parameters are determined... 相似文献
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Sirotinkin V. P. Podzorova L. I. Mikhailina N. A. Pen’kova O. I. 《Crystallography Reports》2022,67(2):278-285
Crystallography Reports - A surface structural analysis of two ceramic samples of zirconium oxide (ZrO2) sintered at 1550°C, stabilized in the tetragonal form, before and after hydrothermal... 相似文献
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The technique of simultaneous X-ray diffraction and differential scanning calorimetry (XDDSC) is introduced into the field of molecular and liquid crystals. The technique allows fast time-resolved X-ray diffractograms to be recorded simultaneously with the recording of heat flow into or out of the specimen during a heating, cooling or isothermal scan. Structural transformations, as revealed by changes in the diffraction pattern, can thereby be unambiguously correlated with thermal events such as endo-or exo-therms or changes in heat capacity. Small and wide angle diffraction can be monitored. Sample pans and cuvettes made of boron nitride or graphite are used, both materials combining high transparency for X-rays with good thermal conductivity. Selected examples of application of the technique are presented. 相似文献
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采用扫描电镜(SEM)和电子背散射衍射(EBSD)技术,观察和分析了GaAs和GaN晶片热压键合的界面热应力和晶片键合质量.利用EBSD测量了GaAs-GaN键合界面的菊池花样质量、晶格转动、晶格错配和位错密度等应力敏感参数.结果表明,晶片键合质量良好,键合界面中心区域的热应力小于边缘区域的热应力.GaN层和GaAs层中的应力影响范围,在中心区域分别约为100 nm和300 nm,在边缘区域分别约为100 nm和500nm.EBSD显示的应力分布图与模拟应力场相似.模拟和计算表明,最大剥离应力和剪切应力分布在键合界面的边缘.剥离应力是导致晶片解键合的主要原因. 相似文献