Interfacial effects on moisture absorption in thin polymer films

Moisture absorption in model photoresist films of poly(4-hydroxystryene) (PHOSt) and poly(tert-butoxycarboxystyrene) (PBOCSt) supported on silicon wafers was measured by X-ray and neutron reflectivity. The overall thickness change in the films upon moisture exposure was found to be dependent upon the initial film thickness. As the film becomes thinner, the swelling is enhanced. The enhanced swelling in the thin films is due to the attractive nature of the hydrophilic substrate, leading to an accumulation of water at the silicon/polymer interface and subsequently a gradient in concentration from the enhancement at the interface to the bulk concentration. As films become thinner, this interfacial excess dominates the swelling response of the film. This accumulation was confirmed experimentally using neutron reflectivity. The water rich layer extends 25 +/- 10 A into the film with a maximum water concentration of approximately 30 vol %. The excess layer was found to be polymer independent despite the order of magnitude difference in the water solubility in the bulk of the film. To test if the source of the thickness dependent behavior was the enhanced swelling at the interface, a simple, zero adjustable parameter model consisting of a fixed water rich layer at the interface and bulk swelling through the remainder of the film was developed and found to reasonably correspond to the measured thickness dependent swelling.     

Peculiarities of electric field alignment of nonlinear optical chromophores incorporated into thin film polymer matrix

The electric field poling process of free-standing films of poly(methyl methacrylate) (PMMA) matrix doped with the nonlinear optical compound 4-(dimethylamino)-4'-nitrostilbene (DMANS) was investigated by molecular simulation methods. The influence of the vacuum/bulk interfacial regions on static and dynamic properties, including the glass transition temperature T_g and the field-induced chromophore reorientation, was studied by employing films of three different thicknesses and by comparison with previous work on the bulk system. The interfacial region, defined as the region, where the local density increases from zero to the bulk density, is about 2 nm wide, independent of the film thickness. T_g decreases with decreasing film thickness, in accord with previous experimental work and theoretical predictions. The resistance against field-induced chromophore reorientation in the liquid state is found to increase strongly with the film thickness.     

Interface effects on moisture absorption in ultrathin polyimide films

Water absorption in thin films (<1000 Å) of a commercial polyimide was evaluated by monitoring dimensional changes induced by a humid environment. Film thickness was measured using x-ray reflectivity, which is a nondestructive technique offering angstrom resolution in the measurements of thin film or multilayer thickness. The effect of several variables on the absorption of moisture were monitored in polyimide films adhered to polished silicon substrates, including total dry film thickness, exposure time, and the contribution of a coupling agent. The percentage increase in film thickness due to moisture uptake is found to be a weak function of dry film thickness, decreasing as dry film thickness increases, and to be somewhat affected by the use of an interfacial coupling agent. The observed behavior points to the polymer/substrate interface as a strong factor controlling the absorption of moisture in the polyimide/silicon system, and is believed to reflect the presence of a highly moisture-saturated interfacial layer. A bilayer model is proposed, and the feasibility of using this model to describe the observed behavior is considered. Published 1998 John Wiley & Sons, Inc.

1 This article is a US Government work and, as such, is in the public domain in the United States of America.

J Polym Sci B: Polym Phys 36 : 155–162, 1998     

Wetting reversal transition in phase-separated polymer mixtures

We investigate a wetting reversal transition in thin films of two-phase mixtures of poly(ethylene-propylene) (PEP) and its deuterated analogue (dPEP) on a substrate covered by a self-assembled monolayer (SAM) whose surface energy, _γSAM, is tuned by varying the SAM composition. As _γSAM increases from 21 to 24 mJ/m², a transition from a three-layer (air/dPEP/PEP/dPEP/SAM) to a two-layer (air/dPEP/PEP/SAM) structure occurs at increasing T_c - T, where T_c and T are the critical and transition temperatures, respectively. As the system structure changes from three-layer to two-layer, the thicknesses of the dPEP-rich wetting layers at the air/mixture and mixture/SAM interfaces are found to smoothly increase and decrease, respectively, while the thickness of the PEP-rich layer (ca. one half of the total film thickness) does not change. The dependence of the transition temperature on _γSAM is predicted by a simple model using the experimental data on the surface energies of PEP/dPEP and estimates of the interfacial energy between PEP and dPEP.     

Strains induced upon drying thin films solvent-cast on flexible substrates

Solvent coating is an important commercial technique utilized in fabricating thin films. In certain cases, undesirable strains may be built into the composite as the solvent is removed. The stress field in a two-layer sample and its distribution along the interface have been analyzed. By considering the shrinkage of the solvent cast film equivalent to applying an axial compressive load, interfacial expressions were derived which are valid for solvent drying of solution cast films. Experimental procedures and measurements are presented for the solvent casting of thin brittle films onto flexible polymeric substrates. Interfacial strains are determined and their dependence on accurate material property measurements is evaluated. The relation between the bulk and interfacial strain is illustrated.     

Contact angles in thin liquid films : III. Interaction forces in Newton black soap films

The interaction parameters of Newton black soap films stabilized by NaDS, as derived from contact angle experiments, have been interpretated in terms of the structure and the interaction forces in the films. From the film thickness and the difference between the surface excess of the salt in the film and at the bulk surface it is concluded that (a) the diffuse double-layer overlap in the film is practically complete; (b) the film only contains absorbed DS⁻ ions and an equal amount of Na⁺ counterions, but no salt; and (c) the double layer at the bulk surface is still partly diffuse. A model for the structure of the NB films is proposed according to which the adsorbed DS⁻ ions with their counterions form a two-dimensional square lattice at each film surface. It is found that the interaction free energy of the NB films can be explained by taking into account the electrostatic interactions between the discrete ions in the two opposing surface lattices. The model of the NB film is qualitatively in agreement with the experimental results of other workers.     

Substrate interaction effects on order to disorder transition behavior in block copolymer films

We present an overview of the recent progress on the phase transition in the block copolymer (BCP) films in terms of the interfacial interactions effects of the substrates and the χ (Flory-Huggins segmental interaction parameter) effects between the two blocks. For the BCP films thinner than a critical thickness (L_c) above which the transition is independent of film thickness, the order-to-disorder transition (ODT) increased or decreased with decreasing film thickness depending on the interfacial interaction types. The rapid and slow changes in the ODT were attributed to the relative magnitude of enthalpic contribution to χ between two blocks. Interestingly, a periodic amplification in the block composition for the BCP films suppressed the compositional fluctuation in the film geometry, resulting in the ODT shifts from the bulk ODTs above L_c. This effect of the BCP films was more illustrated by the ODT shift effects depending on the strength of the preferential interactions on the substrates. © 2013 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys, 2013     

Structure and Dynamics of Confined Polymer Melts from Attractive Interaction to Repulsive Interaction Between Polymer and Smooth Wall

We studied the static and dynamic properties of unentangled polymer chains which have a variable strength of interaction with the confining smooth walls by means of the lattice Monte Carlo simulation based on the bond-fluctuation model, that is, investigated the wall-polymer interactions which systematically vary from attraction to repulsion. A critical value of attractive potential(ε_wc) is found to be -0.6k_BT, and only below it can the adsorption layer of monomers be formed near the wall. At the critical point of attraction ε_wc, attractive interaction counterba- lances the wall-polymer excluded volume effect, which minimizes the confinement effects on both chain dimension and mobility. Influences on both chain dimension and mobility increase with the increasing of either attraction or repulsion imposed by the walls. Despite of the nature and strength of the wall-polymer interaction, with the decrease of film thickness, configurations more parallelly aligned and flattened are adopted by confined chains, and a systematic trend of deceleration is found. Variations of chain dynamics with both film thickness and wall-polymer interaction can be well explained by the corresponding changes in the confinement of the nearest-neighboring particles that surround the chains. Besides, the thickness of the interfacial layer inside polymer films, where chains adopt a flattened “pancake” shape, is about two times the bulk radius of gyration and independent of the wall-polymer interaction.     

Charge Formation on the Surface of a Laminated Polyimide–Fluoroplastic Film by Direct-Current Discharge Treatment

The effect of a direct-current discharge on the tetrafluoroethylene–hexafluoropropylene copolymer (FP) layer of laminated polyimide–fluorocarbon polymer films (including the commercial film PMF-351) placed in the cathode fall was studied. The magnitude of the negative charge induced in the films was shown to be independent of the film thickness. A thermostimulated relaxation curve for the PMF-351 film exhibited two peaks, one at 484 K due to relaxation of the negative charge in the bulk of the FP layer and the other at 417 K characteristic of negative charge relaxation in the polyimide layer. The results are explained by detrapping of electrons by plasma UV radiation that is not absorbable by the FP layer.     

Scanning angle Raman spectroscopy measurements of thin polymer films for thickness and composition analyses

Scanning angle (SA) Raman spectroscopy was used to measure the thickness and composition of polystyrene films. A sapphire prism was optically coupled to a sapphire substrate on which 6–12% (w/v) polystyrene in toluene was spin coated. Raman spectra were collected as the incident angle of the p-polarized, 785-nm excitation laser was varied from 56 to 70°. These angles span above and below the critical angle for a sapphire/polystyrene interface. The thickness of the polystyrene film was determined using a calibration curve constructed by calculating the integrated optical energy density distribution as a function of incident angle, distance from the prism interface and polymer thickness. The calculations were used to determine the incident angle where waveguide modes are excited within the polymer film, which is the angle with the highest integrated optical energy density. The film thicknesses measured by SA Raman spectroscopy ranged from less than 400 nm to 1.8 μm. The average percent uncertainty in the SA Raman determinations for all films was 4%, and the measurements agreed with those obtained from optical interferometery within the experimental uncertainty for all but two films. For the 1270-nm and 580-nm polystyrene films, the SA Raman measurements overestimated the film thickness by 5 and 18%, respectively. The dependence of the calibration curve on excitation polarization and composition of the polymer and bulk layers was evaluated. This preliminary investigation demonstrates that scanning angle Raman spectroscopy is a versatile method applicable whenever the chemical composition and thickness of interfacial polymer layers needs to be measured.     

Interfacial structure in thin water layers formed by forced dewetting on self-assembled monolayers of omega-terminated alkanethiols on Ag

A method for the spectroscopic characterization of interfacial fluid molecular structure near solid substrates is reported. The thickness and interfacial molecular structure of residual ultrathin D20 films remaining after forced dewetting on alkanethiolate self-assembled monolayers (SAMs) of 11 1-mercaptoundecanoic acid (11-MUA), 11-mercaptoundecanol (11-MUD), and undecanethiol (UDT) on Ag are investigated using ellipsometry and surface Raman spectroscopy. The residual film thickness left after withdrawal is greater on hydrophilic SAMs than on hydrophobic SAMs. This behavior is rationalized on the basis of differing degrees of fluid slip within the interfacial region due to different interfacial molecular structure. The v(O-D) regions of surface Raman spectra clearly indicate unique interfacial molecular properties within these films that differ from bulk D20. Although the residual films are created by shear forces and Marangoni flow at the three-phase line during the forced dewetting process, the nature of the films sampled optically must also be considered from the standpoint of thin film stability after dewetting. Thus, the resulting D20 films exist in vastly different morphologies depending on the nature of the water-SAM interactions. Residual D20 is proposed to exist as small nanodroplets on UDT surfaces due tospontaneous rupture of the film after dewetting. In contrast, on 11-MUD and 11-MUA surfaces, these films exist in a metastable state that retains their conformal nature on the underlying modified surface. Analysis of the peak intensity ratios of the so-called "ice-like" to "liquid-like" v(O-D) modes suggests more ice-like D20 character near 11-MUD surfaces, but more liquid-like character near 11-MUA and UDT surfaces. The creation of residual ultrathin films by forced dewetting is thus demonstrated to be a powerful method for characterizing interfacial molecular structure of fluids near a solid substrate under ambient conditions of temperature and pressure.     

Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS,XPS, and AFM

The fine microstructure of the passive films on nanocrystalline (NC) and coarse crystalline (CC) 304 stainless steels (SSs) in 0.5 M H₂SO₄ were investigated by electrochemical impedance spectroscopy (EIS), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). The results indicate that the passive film on both CC and NC SSs exhibits a two-layer microstructure consisting of a compact inner layer and a porous outer layer. Some hydrated compounds (HC) were present in the porous outer layer of NC SS but not CC SS in 0.5 M H₂SO₄ solution. The pores in the outer layer of the NC SS were observed to be in the nanoscale by AFM. HC filling of the pores in the passive film on NC SS may occur due to capillary forces endowed by the nanosize pores. XPS analysis of the passive films on both CC and NC SSs, however, does not show such a composition difference which is attributed to dehydration occurring in the XPS vacuum chamber. Both the inner and outer layers of the NC SS were determined by EIS analysis to be more compact and protective than the corresponding films on CC SS as evidenced by the lower Q value, higher n, and much higher R value in the corresponding layer.     

Thermal stability of surface freezing films in Ga-based alloys: an x-ray photoelectron spectroscopy and scanning tunneling microscopy study

We have investigated the thickness and surface structure of surface freezing films in Ga-Bi and Ga-Pb alloys over a wide temperature range between room temperature and the respective surface freezing transitions by x-ray photoelectron spectroscopy (XPS) and scanning tunnelling microscopy (STM). For the example of a Ga-Bi alloy dilute in Bi, XPS measurements show that the surface freezing film has a nearly constant value of approximately 25 A between the surface freezing temperature of 130 degrees C and room temperature if the sample is cooled slowly (5 Kh). On heating to 130 degrees C the film thickness exhibits a clear hysteresis on melting. On quenching the alloy sample (>100 Kh) the film thickness increases by almost a factor of 10. These observations indicate that the surface freezing films are metastable. The surface structure of the surface freezing films of various Ga-rich Ga-Bi and Ga-Pb alloys has been probed for the first time by STM at different temperatures below and above the bulk eutectic point. Atomically resolved STM images show the surface structures of pure Bi (0001) and Pb (111), respectively, at room temperature. On heating above the eutectic temperature the surface structure of the films does not change significantly as judged from the size and thickness of Pb or Bi terraces. These observations together with the film thickness variation with temperature indicate that the surface freezing films behave like a metastable independent surface phase. These results together with the wetting characteristics of these alloys suggest that surface freezing in these systems is a first order surface phase transition between wetting and metastable surface freezing films. The energy barrier for nucleation is strongly reduced due to a lowering of the interfacial energy if the nucleus is completely immersed in the respective wetting layer.     

Growth mechanism of Nb-doped TiO<Subscript>2</Subscript> sol–gel multilayer films characterized by SEM and focus/defocus TEM

TiO₂ and Nb-doped TiO₂ films were prepared by sol–gel processing, their microstructure was adjusted by varying the number of subsequent coating-firing cycles that resulted in final total film thickness of ~100 nm. When only few subsequent coatings are stacked (large single layer thickness) granular polycrystalline microstructures are observed. Doping with Nb reduces the crystallite size compared to the respective pure anatase films. When the single layer thickness is reduced, the film growth is successively dominated by the nucleation of subsequent films on the underlying crystalline material resulting in a columnar dense film structure. The multilayer architecture of such films can be demonstrated by defocus TEM imaging even if crystalline columns exceed single film boundaries. Results indicate that Nb is homogeneously incorporated into the anatase lattice by substitution of Ti, nevertheless the electric conductivity after H₂ post annealing is significantly lower than reported for analogous films prepared by magneton sputtering or pulsed laser deposition.     

Polyelectrolyte adsorption and layer-by-layer assembly: Electrochemical control

Thin films formed via the adsorption or layer-by-layer assembly of charged polymers are important in many sensing, energy, and biomedical applications. When the underlying substrate is a (semi)conductor, the opportunity exists to influence film formation and film properties through an applied electric potential. The recent literature on electrochemical influence of polyelectrolyte-based films is reviewed, with a focus on monolayer and multilayer film assembly and disassembly. Of particular interest are monolayer films grown to a tailored thickness on the 10–100 nm scale, and polyelectrolyte multilayer films controllably disassembled, upon application of a modest electric potential. Experimental observations are discussed in terms of governing factors such as interfacial pH and ionic composition, counter-ion correlations, charge regulation, dielectric discontinuity, and short-range polymer–polymer interactions. Recent modeling efforts are also briefly addressed.     

Influence of a reduced mobility layer on the structural relaxation dynamics of aluminum capped ultrathin films of poly(ethylene terephthalate)

The structural dynamics of ultrathin polymer films of poly(ethylene terephthalate) capped between aluminum electrodes have been investigated by dielectric relaxation spectroscopy. A deviation from bulk behavior, appearing as an increase of the relaxation time at a fixed temperature, is observed for films of thickness below 35 nm. The slowing down acts as a constant shift factor independent from the temperature, and the fragility is constant. The interfacial energy between aluminum and poly(ethylene terephthalate) is calculated to be 3 mJ/m2, confirming a strong interaction between polymer and substrate, which leads to the presence of a layer characterized by a reduced mobility at their interfaces. We proposed a mathematical schematization of a multylayer model that allowed qualitative reproduction of the observed thickness dependences of the static and dynamic properties. In terms of such a model, the upper limit for the thickness of the reduced mobility layer was estimated as 20 nm. The conditions to extend the proposed model to different observables are finally suggested.     

Interfacial structure and properties in polystyrene/epoxy bilayer films

The interfacial structure and properties of immiscible deuterated polystyrene (dPS)/epoxy bilayer films were investigated with neutron reflectivity as functions of the composition of the epoxy layer, the thickness of the dPS layer, and the annealing time. We have found that the interfacial width and its growth rate depend strongly on the compositions of the epoxy layer but only weakly on the thickness of the dPS layer. The effect of the resin/crosslinker composition on the interfacial width and its growth rate is likely due to the different near‐surface structures that result for different epoxy stoichiometries. For an ultra‐thin dPS film (thickness = 2R_g), the data suggest a slight suppression of the growth of the interfacial width that could be due to confinement effects for the long‐chain molecules such as have been previously reported for a thickness of less than approximately 4R_g, where R_g is the radius of gyration of polymer molecules. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 2653–2660, 2002     

Surface stress of polydimethylsiloxane networks

For thin elastic films of crosslinked polydimethylsiloxane (PDMS), the tensile modulus was found to be an increasing function of reciprocal thickness over the whole range of elongations. PDMS films between 0.052 and 0.018 mm were investigated. With decreasing film thickness, surface properties may be expected to increasingly contribute to the measured modulus. For small elongations, surface tension is expected to have no effect or to decrease the measured modulus compared with that of a bulk sample. If a surface layer with a modulus greater than that of the bulk modulus is assumed to exist, then the observed increase in modulus with decreasing film thickness can be explained. © 1997 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 35 : 2391–2396, 1997     

Segmental dynamics near the chain end of polystyrene in its ultrathin films: A study by single-molecule fluorescence de-focus microscopy

Rotational motion of fluorophores chemically attached to polystyrene chain-ends in ultra-thin films on solid substrates was studied by single-molecule fluorescence de-focus microscopy. The collective feature of the rotational motion was found and evidenced by the sharp change of the population of fluorophores undergoing rotational motion within a very narrow temperature range (named as the changing temperature, T _c). The T _c value was found to depend on film thickness and interfacial chemistry and the variation of the T _c value is also dependent on the molecular weight of the polymer. The results demonstrate that the spatial confinement effect enhances the segmental mobility near the polymer chain-ends while the interfacial attraction restricts the segmental motion inside the thin film.