Multilayer mirror systems to form hard X-ray beams

This paper is an overview of the research activities carried out in the past five years at the Institute for Physics of Microstructures RAS and “X-ray” Company towards the manufacture of multilayer mirror systems capable of forming X-ray beams in the subnanometer range of wavelengths. The systems fabrication technology is presented, including techniques for producing supersmooth surfaces of specified shape, methods of graded multilayer structure deposition on such surfaces, and the principles of designing optimal mirror parameters. The characteristics of a quadrelliptical reflector—a novel high light-gathering power four-corner focusing system—are reported.     

On creating multilayer X-ray focusing mirrors

We review the recent studies and results obtained in the last five years at the Institute for Physics of Microstructures (IPM) in the field of multilayer mirror construction for hard X-ray wavelength range ( 7n = 0.05—0.25 nm), E = 25—5 keV)). Mirrors with cylindrical and spheroidal shapes as well as Kirkpatrick-Baez cross systems are considered.     

Light interference in octonion formalism

Considering light interference in an octonion formalism, it is shown that the interference equations in nonassociative theory obtained in [1] have an octonion solution. The associator — a new characteristic of the interference field — is a qualitative measure of the memory of the medium. Tbilisi Medical University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 54–60, August, 1996.     

基于白光扫描干涉法的光纤折射率分布的测量

提出了一种光纤折射率分布的测量方法,采用白光扫描干涉技术,并在参考镜上构造与光纤样品相同的结构来克服白光相干长度短的限制,优化了光路,提高了干涉条纹间的对比度.采用与白光干涉信号的包络线呈高斯分布的Morlet小波作为小波变换的母小波进行拟合处理,得到光纤与已知折射率的匹配液之间的相对高度.通过计算获得光纤的折射率分布...     

Enhanced Coupling of Light from Organic Electroluminescent Device Using Diffusive Particle Dispersed High Refractive Index Resin Substrate

To improve light extraction from organic electroluminescent (EL) devices, we introduced a diffusive substrate with 25 μm thickness consisting of high refractive index resin and scattering particles. It is expected that the diffusive substrate with high refractive index matrix converts the waveguided emission into external emission from both glass substrate and indium-tin-oxide/organic layer. We used the ray tracing method to optimize the scattering effect and to verify the coupling out effect of the diffusive high refractive index substrate. With the use of the ray tracing calculation, an increase in the external emission up to a factor of 2.7 was expected compared to use of a common glass substrate. Experimentally, the coupling out effect of the diffusive high refractive index substrate strongly depended on the thickness of electron transporting layer (ETL) due to the well-known interference effect. The current efficiency increased by a factor of 1.3 for an organic EL device with a 60-nm-thick ETL and by a factor of 6.8 for one with a 120-nm-thick ETL.     

Art output mirror for fir laser

ATR prism was used firstly as the FIR laser output coupler. Such output mirror possesses good separation of the pump (λ≈10μm) and FIR radiation without losses. Transmittance of this mirror can be simply controlled by adjustment of gap between two output prisms. The dependence of mirror output characteristics on pump radiation polarization, prism refractive index, gap between prisms are under consideration.     

Spectroscopy of GaAs/AlGaAs microstructures with submicron spatial resolution using a near-field scanning optical microscope

A near-field scanning optical microscope (NSOM), which we built, is used to investigate 1–5-μm wide stripes with a 10-nm thick layer—a quantum well — on a GaAs surface. A map of the photoluminescence intensity is obtained synchronously with the topographic profile of the structures. The measured spatial distribution of the photoluminescence intensity is described satisfactorily in a model that takes into account carrier diffusion in the layer and the existence of a region with a short carrier lifetime near the side boundaries of the layer. Pis’ma Zh. éksp. Teor. Fiz. 63, No. 7, 523–527 (10 April 1996)     

A method for continuous control of the refractive index of liquids in capillaries

An interference method for controlling the refractive index of liquids pumped through a capillary is considered. The liquid is sounded by two systems of interference bands, the period of which differs by an insignificant value prescribed by the condition of nonius coincidence. An analytical expression is obtained to calculate the refractive index of the liquid controlled in automatic reading of the interference patterns. Institute of Electronics, National Academy of Sciences of Belarus, 22 Logoiskii Trakt, Minsk, 220841, Belarus. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 66, No. 6, pp. 832–835, November–December, 1999.     

Identifying contributions of individual layers constituting multilayer dielectric mirrors

First-order approximations have been used to study the recursion expressions of the reflection and transmission coefficients of a weakly absorptive multilayer mirror. It has been proved that in the proximity of the central frequency ω₀ of a quarter-wave mirror, contributions of an individual layer to the reflection delay time and absorption-induced reflectivity reduction can be quantitatively specified with a single weighting factor pertinent to that layer. Derivations have indicated that the absorption-induced reductions of mirror reflectivity and reflection delay can be reduced by selecting an odd layer number and a large index ratio between alternating high and low refractive index coating materials. Calculations have also suggested that the absorbed incident light is not distributed, among the reflected and transmitting parts, according to the ratio between the reflectivity and potential transmission.     

Technique to Estimate the Reflectance of a High-Reflectance Dielectric Multilayer Coating Mirror Using Incident Beam Angular Dependence of Its Transmittance

The reflectance of a high-reflectance dielectric multilayer coating mirror tuned to a monochromatic laser wavelength was estimated from its transmittance which was measured with 0.4 ppm accuracy. The transmittance was calculated from its theoretical formula including three parameters (refractive indexes of low and high refractive films (n_L, n_H) and a number of layer units composed of a pair of one low and one high refractive film (N)) which were estimated from the incident beam angular dependence curve of the transmittance. This calculated transmittance agreed with that measured as a ratio of the laser beam power before and after the mirror with 6 ppm difference.     

Surface plasmon optical sensor with enhanced sensitivity using top ZnO thin film

Surface plasmon resonance (SPR) is one of the most sensitive label-free detection methods and has been used in a wide range of chemical and biochemical sensing. Upon using a 200 nm top layer of dielectric film with a high value of the real part ε′ of the dielectric function, on top of an SPR sensor in the Kretschmann configuration, the sensitivity is improved. The refractive index effect of dielectric film on sensitivity is usually ignored. Dielectric films with different refractive indices were prepared by radio frequency magnetron (RF) sputtering and measured with spectroscopic ellipsometry (SE). The imaginary part ε′′ of the top nanolayer permittivity needs to be small enough in order to reduce the losses and get sharper dips. The stability of the sensor is also improved because the nanolayer is protecting the Ag film from interacting with the environment. The response curves of the Ag/ZnO chips were obtained by using SPR sensor. Theoretical analysis of the sensitivity of the SPR sensors with different ZnO film refractive indices is presented and studied. Both experimental and simulation results show that the Ag/ZnO films exhibit an enhanced SPR over the pure Ag film with a narrower full width at half maximum (FWHM). It shows that the top ZnO layer is effective in enhancing the surface plasmon resonance and thus its sensitivity.     

Pockels effect of water in the electric double layer at the interface between water and transparent electrode

We have obtained the first experimental evidence for the Pockels effect of water, which is induced by a high electric field in the electric double layer (EDL) on the water-transparent electrode interface. The electric-field induced energy shift of the visible interference fringes of a 300 nm indium-tin-oxide (ITO) electrode layer is observed, indicating a negative refractive index change at the interface. Numerical calculation reproduces well the experimental observation, showing that the signal mainly originates from water in the EDL. The Pockels constants of water are estimated to be r₃₃ = 5.1 × 100 pm/V and r₁₃ = 1.7 × 100 pm/V. The large anisotropy of the Pockels effect of water is deduced from the incidence angle dependence of the p-polarization signal. At the same time, the ITO shows a blue shift of the band gap in the UV due to the band population effect in the space charge layer. The plasma frequency in the near IR is also expected to increase due to the band population effect, since the ITO has a high doped carrier population close to metal. A negative refractive index change in the ITO space charge layer is induced from both effects, but its effect on the signal is estimated to be much smaller than that of the negative refractive index change of water in the EDL.     

Evaluation and use of the Pd | SrCe0.95Yb0.05O3| Pd electrochemical reactor for equilibrium-limited hydrogenation reactions

The current — overpotential characteristics of the H₂ - Pd - SCY interphase have been studied at atmospheric total pressure and temparatures between 400 – 550 °C in the single chamber reactor — cell: Pd | SCY | Pd. The results of I−η measurements indicate that the apparent anodic and cathodic charge tranfer coefficients are equal to: α_a=α_c=0.5. The present results are compared to those obtained with the single — chamber reactor cell: Ag | SCY | Ag. A solid state proton (H⁺) conducting reactor — cell with Pd electrodes was tested for the ammonia synthesis from its elements at atmospheric pressure. At 570 °C, over 75% of the ectrochemically supplied hydrogen was converted into NH₃. The thermodynamic requirement for a high pressure process was eliminated. Paper presented at the 5th Euroconference on Solid State Ionics, Benalmádena, Spain, Sept. 13–20, 1998.     

贝塞尔高斯涡旋光束在大气湍流中的传输特性

为了探测更高轨道的空间目标,研制了一台通光口径为Ф750 mm的望远镜.该望远镜为主焦点光学系统,由一片二次非球面反射元件和四片透射元件组成,具有大视场(4°),大相对孔径(1∶1.32)和宽光谱(500~800 nm)的特点.本文以该望远镜的研制为基础,介绍了其光学系统各个元件的单独检测和系统装调完成后的整体检测方法和过程.采用样板法对系统中的球面透射元件进行了单独检测,采用透射无像差补偿器法对二次非球面反射镜进行了单独检测,采用反射无像差补偿器法对组合起来的透射校正镜组进行了检测,并且对系统装调对准之后的光学系统进行室内平行光管和室外对星观测两种方法进行检测.测量结果均满足设计要求,其中球面透镜的面形误差小于0.1个光圈,反射元件和透射元件非球面表面的面形误差均优于λ/30(λ=632.8 nm),透射校正镜组的波像差优于λ/30(λ=632.8nm).光学系统整体检测结果表明,室内和室外检测结果一致,其像面的80% 能量集中度直径在4°的全视场范围内均小于2个像元,达到了设计的成像要求.     

Evaluation of refractive index of cylindrical microlenses from spatial distribution of interference orders

An interference method for measuring the refractive index and surface curvature of cylindrical microlenses is considered. The method consists in probing microlenses by a dynamic interference pattern with a localization of order of several to tens micrometers corresponding to the period of the interference fringes. Basic analytical expressions for evaluation of the curvature radius and refractive index of the probed portion of the microlens are presented. Institute of Electronics, Academy of Sciences of Belarus, 22, Logoiskii Trakt, Minsk, 220841, Belarus. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 64, No. 3, pp. 390–395, May–June, 1997.     

Optical parameters of epitaxial GaN thin film on Si substrate from the reflection spectrum

A method has been proposed for determining the optical properties of a thin film layer on absorbing substrates. The film optical parameters such as thickness, refractive index, absorption coefficient, extinction coefficient and the optical energy gap of an absorbing film are retrieved from the interference fringes of the reflection spectrum at normal incidence. The envelopes of the maxima of the spectrum E_M and of the minima E_m are introduced in analytical forms to find the reflectance amplitudes at the interfaces and approximate values of the thin film refractive index. Then, the interference orders and film thickness are calculated to get accurate values of the needed optical parameters. There are no complex fitting procedures or assumed theoretical refractive index dispersion relations. The method is applied to calculate the optical properties of an epitaxial gallium nitride thin film on a silicon (1 1 1) substrate. Good agreement between our results and the published data are obtained.     

迈克尔逊干涉仪测量液体的折射率及仪器调节方法

本文介绍了用迈克逊干涉仪测量液体折射率的方法，原理简单。在干涉仪导轨上平放一方形玻璃容器，内装待测液体，动镜铅垂地浸没在液体中。通过测出动镜在液体内的移动量及其相应的干涉条纹变化数，就能计算液体的折射率，有较高的测量精度。本文详细分析了干涉仪上分光板的反射光通过空气、玻璃、液体，由反射镜反射后出现的多个反射光点，只有通过对这些反射光点的调节，才能得出干涉条纹并符合计算公式的要求。     

Constructing lie algebras of first-order differential operators

Formulas for calculating vector fields — generators of groups of transformations to a uniform space — from specified structural constants are obtained. The problem of vector-field continuation — the construction of Lie algebras of inhomogeneous first-order differential operators — is considered. It is also shown that the existence of a nontrivial continuation is closely associated with the structure of the isotopic subalgebra and, in particular, that no nontrivial continuation exists for semisimple algebras. Omsk State University. Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 25–32, June, 1997.     

Wavelength tuning characteristics of a fabry-perot semiconductor laser with an external short cavity

Wavelength tuning characteristics of a Fabry-Perot semiconductor laser with an external short cavity are analyzed, in which the oscillation wavelength can be changed by slightly altering the external cavity length. Analysis is based on rate equations for an optical power and carrier density. It is shown that the wavelength tuning range is dominated by a change of carrier density through the effect of carrier-induced refractive index change in the active layer of a laser diode. This depends on effective coupling coefficients of the optical field iteratively reflected back to the laser diode by the external mirror, and on reflection coefficients of an anti-reflection coated laser facet and the external mirror which compose the external cavity. The effective coupling coefficient is also derived using the waveguide theory and Kirchhoff ’s theory. Finally, an unstable condition which may limit a stable wavelength tuning range is shown by results of a linear stability analysis of rate equations.     

含有负折射率介质层的布喇格镜的光学特性研究

从电磁场理论推导了光波在负折射率介质薄层中的传输矩阵,对由正、负折射率介质构成的全介质布喇格反射镜的反射带宽和角度特性进行了分析和讨论,与普通的均由正折射率介质构成的布喇格反射镜的相应特性做了对比,并根据薄膜理论对研究结果作了解释.结果表明含有负折射率介质的布喇格全反射镜的反射带宽和角度特性均优于普通由正折射率介质构成的布喇格镜.