共查询到20条相似文献,搜索用时 78 毫秒
1.
2.
3.
根据多狭缝自准直仪目标物形状特征及光电探测器成像特点,通过边缘检测算法确定经过高斯滤波处理的CCD图像的像元级边界.在此基础上应用局部牛顿插值法对CCD图像边缘位置附近进行亚像元细分,实现亚像元边缘检测;再结合最小二乘直线边缘拟合法进一步提高图像边缘检测准确度.经验证,该算法可达到0.13″的定位准确度. 相似文献
4.
5.
研究并设计了基于FPGA的亚像元图像融合系统,该系统能够在接收到亚像元相机输出的两路CCD图像信号后,实时地将其融合并显示.搭建了亚像元图像融合实验平台,介绍了系统的组成以及主要电路的实现方法,并进行了实验验证.结果表明,图像融合效果好,设计方案可行. 相似文献
6.
以QuickBird卫星记录的DN值图像为实验数据,根据1~4波段积分辐亮度之和与全色波段积分辐亮度之间的比例关系及能量守恒律构建分解方程,将1~4波段图像每个像元分解成16(4×4)个像元,获得了分辨率为0.61 m的1~4波段辐亮度图像.与原图像比较,空间分辨率提高到4倍,地物细部特征清晰,视觉效果明显提高,图像成图适宜比例尺从1:10 000提高到1:2 500. 相似文献
7.
8.
9.
亚像元边缘检测系统的FPGA实现 总被引:1,自引:0,他引:1
提出了一种集成于单片FPGA的数字化线阵CCD边缘检测系统。通过对CCD输出图像的边缘灰度梯度分析,利用高斯滤波除噪、边缘检测算法确定其像元级边界,并提出了一种以最小二乘多项式拟合来确定亚像元级边界位置的新算法。整个系统以现场可编程门阵列器件作为核心及数字电路硬件的载体,利用VHDL语言及图形化输入方式在QuartusⅡ7.2软件平台上进行了系统的设计。误差分析及仿真结果表明,该边缘检测系统的分辨率可达到将近六十分之一的像元宽度,可应用于研制高精度CCD光电自准直仪。 相似文献
10.
11.
针对SILEX-I超短超强脉冲激光装置输出光束光谱分布的精密测量问题,采用脉冲激光相对光谱功率来评价光谱分布,以溴钨灯为标准光源开展相对光谱功率测量方法的研究,获得相对光谱功率的理论计算公式。以SP2760光栅光谱仪作为光谱测量设备在SILEX-I激光装置上进行了光谱分布测量的验证实验,并给出了不确定度评定,获得了扩展相对不确定度1.7%的测量精度。测量结果显示,相对光谱功率分布与光栅光谱仪的原始光谱响应值分布具有显著的差异,可以更加准确地反映输出脉冲的光谱分布。 相似文献
12.
针对由器件光谱特性引起的光栅光谱仪测量误差问题,提出了一种误差校正方法,并对该技术中的理论模型、数值提取算法和精度、误差校正精度进行了研究。首先,在深入剖析光栅光谱仪工作原理的基础上,建立了光谱误差校正的理论模型;其次,在研究光栅、探测器、反射镜等核心器件光谱特性曲线典型特征的基础上,提出了器件光谱响应参数提取算法,并对该算法的精度进行了实验研究;最后利用本文所建立的理论模型和数值提取算法对光栅光谱仪测得的溴钨灯光谱进行了校正,并将校正后的结果与溴钨灯标准谱线进行了比较。实验结果表明,本文所提出的数值提取算法的平均误差为0.39%,校正后的光谱曲线与溴钨灯标准光谱曲线一致,说明本文所提出的校正技术能够有效消除器件光谱特性引入的误差。 相似文献
13.
利用掠入射反射短波截止原理,成功地实现了平场光栅谱仪的无级次重叠摄谱.实验结果表明,利用该方法来消除平场光栅谱仪中短波长的高级谱对所考察波段的一级谱的影响是简便而有效的.实验获得了镁激光等离子体在4.4~5.6nm,5.9~11.8nm,7.0~14.0nm三个不同波段的近似的纯一级谱. 相似文献
14.
采用国内首次研制出的2 000线/mm的自支撑透射光栅配上背照射软X光CCD(charge coupled device)组成了高谱分辨透射光栅谱仪。通过实验标定和理论模型计算相结合得到了高线对透射光栅的绝对衍射效率;同时建立了透射光栅谱仪测谱解谱方法,编制了相应的解谱程序。在“神光”激光装置上利用该谱仪通过激光打靶实验获得了金腔靶注入口发射的X光能谱定量实验结果,实验结果表明,该谱仪测谱范围在高能区达到6 000eV,谱分辨达到0.1nm,能够清晰地分辨金等离子体M带三峰分布X光谱结构。 相似文献
15.
The spectral focusing characteristics of a grazing-incidence flat-field spectrometer with a spherical variable-line-spacing grating in the 5-40nm spectral range are presented. The spectrometer can be used for any object at a distance in the 50mm-infinity range from the grating apex with a diffracted spectrum sharply focused on an almost flat focal plane at a constant distance from the grating apex. 相似文献
16.
17.
采用国内首次研制出的2 000线/mm的自支撑透射光栅配上背照射软X光CCD(charge coupled device)组成了高谱分辨透射光栅谱仪。通过实验标定和理论模型计算相结合得到了高线对透射光栅的绝对衍射效率;同时建立了透射光栅谱仪测谱解谱方法,编制了相应的解谱程序。在“神光”激光装置上利用该谱仪通过激光打靶实验获得了金腔靶注入口发射的X光能谱定量实验结果,实验结果表明,该谱仪测谱范围在高能区达到6 000eV,谱分辨达到0.1nm,能够清晰地分辨金等离子体M带三峰分布X光谱结构。 相似文献
19.
The efficiency of soft X‐ray diffraction gratings is studied using measurements and calculations based on the differential method with the S‐matrix propagation algorithm. New open‐source software is introduced for efficiency modelling that accounts for arbitrary groove profiles, such as those based on atomic force microscopy (AFM) measurements; the software also exploits multi‐core processors and high‐performance computing resources for faster calculations. Insights from these calculations, including a new principle of optimal incidence angle, are used to design a soft X‐ray emission spectrometer with high efficiency and high resolution for the REIXS beamline at the Canadian Light Source: a theoretical grating efficiency above 10% and resolving power E/ΔE > 2500 over the energy range from 100 eV to 1000 eV are achieved. The design also exploits an efficiency peak in the third diffraction order to provide a high‐resolution mode offering E/ΔE > 14000 at 280 eV, and E/ΔE > 10000 at 710 eV, with theoretical grating efficiencies from 2% to 5%. The manufactured gratings are characterized using AFM measurements of the grooves and diffractometer measurements of the efficiency as a function of wavelength. The measured and theoretical efficiency spectra are compared, and the discrepancies are explained by accounting for real‐world effects: groove geometry errors, oxidation and surface roughness. A curve‐fitting process is used to invert the calculations to predict grating parameters that match the calculated and measured efficiency spectra; the predicted blaze angles are found to agree closely with the AFM estimates, and a method of characterizing grating parameters that are difficult or impossible to measure directly is suggested. 相似文献
20.
A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments. 相似文献