ВЛИЯНИЕ СТАРЕНИЯ НА Э ЛЕКТРИЧЕСКИЕ СВОЙСТ ВА ПОЛУПРОВОДНИКОВОЙ С ИСТЕМЫ Bi2Te3-Bi2Se3

, Bi₂Te₃-Bi₂Se₃. , , , . .

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Influence of ageing on change in electrical properties of semiconducting systems of Bi₂Te₃-Bi₂Se₃

The paper describes the effect of ageing observed on a semiconducting system Bi₂Te₃ — Bi₂Se₃. It is shown that the change in electrical conductivity and thermoelectric force, which takes place during ageing, is caused by the change in concentration of the free electrons. The influence of this process on the efficiency of equipment employing the Peltier effect is analyzed.

     

新型层状Bi2Se3的第一性原理研究

近年来,在石墨烯研究热潮的推动下,众多种类丰富、性能各异的二维化合物材料相继被发现,其中一些二维材料具有多种同素异构体,进而呈现出更丰富的性质.层状Bi2Se3由于其独特的物理性质,受到人们广泛的关注,而它的同素异构体尚未有人研究.本文采用基于密度泛函理论的结构搜索方法,预测了一个稳定的b-Bi2Se3新相,它具有良好...     

硼掺杂拓扑绝缘体Bi2Se3单晶的电输运性质研究

本文首次报道了用自助溶剂法(self-flux)制备优良的硼(B)掺杂硒化铋(Bi2BxSe3-x)样品的探索。实验结果显示掺杂样品中大部分B是以替代Se位方式存在,少量B以插入Bi2Se3晶格或范德瓦尔斯间隙的形式存在。当B的含量逐渐增加时,Bi2Se3的晶格常数c先减小后增加,且样品具有清晰的层状结构。掺杂量x=0.05的样品局部区域出现纳米带结构,同时该样品在低温下出现了明显的金属-绝缘转变现象。Bi2Se3样品电阻率随掺杂含量的增加而增加,表明B掺杂提高了样品表面态对整体电导的贡献,同时纳米带结构也有助于增加表面态的贡献。     

Molecular-beam epitaxy of topological insulator Bi2Se3 （111） and （221） thin films

This paper presents an overview of the growth of Bi2Se3, a prototypical three-dimensional topological insulator, by molecular-beam epitaxy on various substrates. Comparison is made between the growth of Bi2 Se3 （111） on van der Waals （vdW） and non-vdW substrates, with attention paid to twin suppression and strain. Growth along the [221] direction of Bi2Se3 on InP （001） and GaAs （001） substrates is also discussed.     

Gate-voltage control of chemical potential and weak antilocalization in Bi₂Se₃

We report that Bi?Se? thin films can be epitaxially grown on SrTiO? substrates, which allow for very large tunablity in carrier density with a back gate. The observed low field magnetoconductivity due to weak antilocalization (WAL) has a very weak gate-voltage dependence unless the electron density is reduced to very low values. Such a transition in WAL is correlated with unusual changes in longitudinal and Hall resistivities. Our results suggest a much suppressed bulk conductivity at large negative gate voltages and a possible role of surface states in the WAL phenomena.     

In-plane transport and enhanced thermoelectric performance in thin films of the topological insulators Bi₂Te₃ and Bi₂Se₃

Several small-band-gap semiconductors are now known to protect metallic surface states as a consequence of the topology of the bulk electron wave functions. The known "topological insulators" with this behavior include the important thermoelectric materials Bi?Te? and Bi?Se?, whose surfaces are observed in photoemission experiments to have an unusual electronic structure with a single Dirac cone. We study in-plane (i.e., horizontal) transport in thin films made of these materials. The surface states from top and bottom surfaces hybridize, and conventional diffusive transport predicts that the tunable hybridization-induced band gap leads to increased thermoelectric performance at low temperatures. Beyond simple diffusive transport, the conductivity shows a crossover from the spin-orbit-induced antilocalization at a single surface to ordinary localization.     

Electrical and thermal properties of a-(Se70Te30)100−x(Se98Bi2)x (0⩽x⩽20) alloys

In electrical properties, the dc conductivity and photoconductivity measurements have been made in vacuum evaporated thin films of a-(Se₇₀Te₃₀)_100−x(Se₉₈Bi₂)_x system, in the temperature range (308–355 K). It has been observed that dc conductivity and activation energy depend on the Bi concentration. Photocurrent dependence on incident radiation has also been observed which follow the power law (I_ph∝F^γ). Transient photocurrent exhibits the non-exponential decay time. All these parameters show that the recombination within the localized states is predominant. In crystallization kinetics, the heating rate dependence of glass transition and crystallization temperatures is studied to calculate the activation energy for thermal relaxation and activation energy for crystallization. The composition dependence of the activation energy for thermal relaxation and activation energy for crystallization is discussed in terms of the structure of Se–Te–Bi glassy system.     

Calorimetric study of specific heat in glassy Se–Te–Sn–Bi system using MDSC technique: effect of Bi incorporation

Bismuth has historical significance as a modifier in chalcogenide glasses due to the p- to n-type transition at a particular composition of definite glassy systems after its incorporation. We have synthesized some new quaternary glasses using Bi as a modifier in ternary Se₇₈Te₂₀Sn₂ alloy as parent glass in light of this information. Modulated differential scanning calorimetry measurements have been made on glassy Se_{78? x} Te₂₀Sn₂Bi _x (0?≤?x?≤?6) alloys for specific heat studies. We have observed an expected enormously large increase in the specific heat values in the glass transition region. The composition dependence of specific heat values above the glass transition temperature (C_pe ) and below the glass transition (C_pg ) is also discussed in this article.     

Determination of the thickness and optical constants of amorphous Ge–Se–Bi thin films

The effect of varying bismuth concentration on the optical constants of amorphous Ge₂₀Se_{80? x} Bi _x (where x = 0, 3, 6, 9 and 12 at%) thin films prepared by thermal evaporation has been investigated. The transmission spectra T(λ) of the films at normal incidence were obtained in the spectral region from 400 to 2500 nm. An analysis proposed by Swanepoel [J. Phys. E: Sci. Instrum. 16 (1983) p.1214], based on the use of the maxima and minima of the interference fringes, was applied to derive the real and imaginary parts of the complex index of refraction and also the film thickness. Increasing bismuth content was found to affect the refractive index and extinction coefficient of the Ge₂₀Se_{80? x} Bi _x films. Optical absorption measurements show that the fundamental absorption edge is a function of composition. With increasing bismuth content, the refractive index increases while the optical band gap decreases.     

Photoinduced effects on the optical constants of a-Ge–Se–Bi chalcogenide glassy thin films

In addition to the conversion from p-type to n-type conductivity that occurs in Ge–Se–Bi thin films when Bi is incorporated in a certain concentration. We found that, when these films were illuminated to UV light, after being annealed at glass transition temperature T _g, the photobleaching is dominant for Ge₂₀Se_80?x Bi _x (x=0, 2.5, and 5 at.%), while for Ge₂₀Se_72.5Bi_7.5 photodarkening is dominant. The photoinduced changes in the optical constants were studied. The refractive index (n) has been analysed according to the Wwmple–DiDominico single oscillator model and the values of E _o and E _d for exposed and unexposed films were determined, respectively. The photostructural effects were discussed in the light of single–double well model proposed by Tanaka and chemical bond approach.     

BaTi2Bi2O的电子结构与磁性

采用第一性原理方法,对BaTi₂Bi₂O的电子结构和磁性进行计算.非磁性态的计算结果显示:费米能级处的态密度主要来自d_z²,d_x²-y²和d_xy三个轨道,同时费米面也主要有三部分组成,并且将其沿着矢量q₁=(π/a,0,0)和q₂=(0,π/a,0)平移时,第三部分费米面(沿着X-R连线)与第一部分费米面(M-A连线)嵌套明显,计算得出磁化系数χ₀(q)在X点出现峰值,与峰值出现在M点的FeAs基超导体不同.上述磁化率峰值可以诱导产生自旋密度波,使得BaTi₂Bi₂O材料的磁性基态是bi-collinear antiferromagnetism(AF3)与blocked checkerboard antiferromagnetism(AF4)的二度简并态.随着空穴掺杂,χ₀(q)的峰值降低,而电子掺杂则导致峰值变大.当自旋涨落被完全压制时,超导出现,这可以解释为什么超导只出现在空穴掺杂型化合物而非电子掺杂型.     

Bi2Sr2CaCu2Oy超导单晶的研究进展

近两年来对氧化物高临界温度超导体的研究巳取得了很大的进展．本文总结了Ｂｉ２Ｓｒ２ＣａＣｕ２Ｏｙ超导单晶的研究成果，从若干方面对这种单晶材料的性质作了全面的阐述，例如电子结构、磁性质、输运性质、二维涨落性质等；对一些关键性的实验作了深入的讨论，并指出了一些还需要进一步研究的问题．     

Bi2Sr2Ca1-xPrxCu2Oy和Bi2Sr2Ca1-xYxCu2Oy系列单晶样品输运性质的对照研究

测量了Bi2Sr2Ca1-xPrxCu2Oy(x的范围从0到0.5)和Bi2Sr2Ca1-xYxCu2Oy(x的范围从0到0.41)系列单晶样品的ab平面电阻率ρab(T).两个体系都表现出独特的掺杂效应.对掺Pr系列,超导转变温度Tc随掺杂量的增加逐渐降低,同时剩余电阻率却大幅度增加.在Pr含量达到约0.5时,体系出现了超导-绝缘体转变.对掺Y系列,观测到在某温度T*处ρab(T)偏离了对温度的线性关系,这是赝能隙打开的典型表现.t*随Y含量的增加而增加,而Tc则被迅速压制.我们预期Pr的反常磁性和掺Pr系列未观察到赝能隙有关.     

Bi2Sr2CaCu2Ox单晶的磁性质研究

测量了单晶 Bi_2Sr_2CaCu_2O_x 的磁化强度随磁场和温度的关系.发现样品除在 TT_c 还有较弱的抗磁性:|X_n|～10~(-7)cm~3/g.|X_n|随温降低或外场增加而增加,在外场平行于 b 和 c 轴时 X_n 也是不同的:测量前用纯 N_z 气处理过的样品或在纯He 气中长时间测量过的样品 T_c 较高,转变较剧烈,且后一种情况下 T_c 是随测量时间增加而增高的.所以认为 Bi 系高温超导体的 T_c 与样品的氧含量有关.初步讨论了上述性质的机制.     

The effect of Bi content on the thermal stability and crystallization of Se–Te chalcogenide glass

Glass formation and devitrification of intermediate alloys in the Se–Te–Bi system were studied by differential scanning calorimetry. A comparison of various simple quantitative methods to assess the level of stability of the glassy materials in the above-mentioned system is presented. All of these methods are based on characteristic temperatures, such as the glass transition temperature, T _g, the onset temperature of crystallization, T _in, the temperature corresponding to the maximum crystallization rate, T _p, or the melting temperature, T _m. In this work, a kinetic parameter, K _r(T), is added to the stability criteria. The thermal stability of several compositions of Se–Te–Bi was evaluated experimentally and correlated with the activation energies of crystallization by this kinetic criterion and compared with those evaluated by other criteria. All the results confirm that the thermal stability decreases with increasing Bi content in this glassy system. The crystallization results are analysed and the activation energy and mechanism of crystallization characterized.