Transparent conductive ZnO:Ga films prepared by DC reactive magnetron sputtering at low temperature

Ga-doped ZnO (ZnO:Ga) transparent conductive films were deposited on glass substrates by DC reactive magnetron sputtering. The structural, electrical, and optical properties of ZnO:Ga films were investigated in a wide temperature range from room temperature up to 400 °C. The crystallinity and surface morphology of the films are strongly dependent on the growth temperatures, which in turn exert an influence on the electrical and optical properties of the ZnO:Ga films. The film deposited at 350 °C exhibited the relatively well crystallinity and the lowest resistivity of 3.4 × 10⁻⁴ Ω cm. More importantly, the low-resistance and high-transmittance ZnO:Ga films were also obtained at a low temperature of 150 °C by changing the sputtering powers, having acceptable properties for application as transparent conductive electrodes in LCDs and solar cells.     

The growth of ZnO:Ga:Cu as new TCO film of advanced electrical,optical and structural quality

Because of having similarities in many physical as well as chemical properties to those of Zn, Cu has been strategically used as an effective dopant e.g., Al, Ga, F, etc., to change the optical, electrical and the micro-structural properties of ZnO thin films for obtaining its favorable opto-electronic performance as a transparent conducting oxide suitable for devices. Present study demonstrates the growth of transparent conducting ZnO:Ga:Cu thin films, by low power RF magnetron sputtering at a low substrate temperature (100 °C). Highly crystalline ZnO:Ga:Cu film with preferred c-axis orientation has been obtained demonstrating a high magnitude of transmission ~85% in the visible range and a high electrical conductivity ~40 S cm^–1, facilitated by large crystallite size (~29 nm), introducing reduced grain boundary scattering. XPS O 1S spectrum reveals the presence of a significant fraction of oxygen atoms effectively increasing the optical transparency. Incorporation of Ga and Cu ions into the ZnO matrix promotes violation of the local translational symmetry as suggested by the relaxation of Raman selection rules for the network, evident by the presence of strong (B₁^high–B₁^low) modes which are typically Raman inactive. The consequences of Cu doping has been compared with identically prepared ZnO and ZnO:Ga films.     

Substitution mechanism of Ga for Zn site depending on deposition temperature for transparent conducting oxides

High quality transparent conductive gallium-doped zinc oxide (GZO) thin films were deposited on glass substrates using rf-magnetron sputtering system at the temperature ranging from room temperature (RT) to 500 °C. The temperature-dependence of Ga doping effect on the structural, optical and electrical properties in ZnO has been investigated. For the GZO thin films deposited at over 200 °C, (103) orientation was strongly observed by X-ray diffraction analysis, which is attributed to the substitution of Ga elements into Zn site. X-ray photoelectron spectroscopy measurements have confirmed that oxygen vacancies were generated at the temperature higher than 300 °C. This might be due to the effective substitution of Ga³⁺ for Zn site at higher temperature. It was also found that the optical band gap increases with deposition temperature. The optical transmittance of GZO thin films was above 87% in the visible region. The GZO thin films grown at 500 °C showed a low electrical resistivity of 4.50 × 10^?4 Ω cm, a carrier concentration of 6.38 × 10²⁰ cm^?3 and a carrier mobility of 21.69 cm²/V.     

The study of structure and optoelectronic properties of ZnS and ZnO films on porous silicon substrates

ZnS and ZnO films were prepared on porous silicon (PS) substrates with the same porosity by pulsed laser deposition (PLD), and the structural, optical and electrical properties of ZnS and ZnO films on PS were investigated at room temperature by X-ray diffraction (XRD), scanning electron microscope (SEM), optical absorption measurement, photoluminescence (PL) and I–V characteristic studies. The prepared ZnS was obtained in the cubic phase along β-ZnS (1 1 1) orientation which showed a perfect match with the earlier report while ZnO films were obtained in c-axis orientation. There appeared some cracks in the surface of ZnS and ZnO films due to the roughness of PS substrates. Luminescence studies of ZnS/PS and ZnO/PS composites indicated room temperature emission in a broad, intense, visible photoluminescence band, which cover the blue emission to red emission, exhibiting intensively white light emission. Based on the I–V characteristic, ZnS/PS heterojunction exhibited the rectifying junction behavior, while the I–V characteristic of ZnO/PS heterostructure was different from that of the common diode, whose reverse current was not saturated.     

Microstructure evolution of room-temperature-sputtered ITO films suitable for silicon heterojunction solar cells

Thickness influence on structural, optical and electrical properties of sputtered indium tin oxide (ITO) with thickness ranging from 60 up to 430 nm films has been studied. At the increase of the film thickness crystallinity degree and grain size increased, whereas tensile structural distortion as well as resistivity decreased. It was observed that a microstructure evolution takes place: the initial amorphous layer evolved in polycrystalline phase, with a grain–subgrain surface morphology. Carrier concentration increased at the increase of the film thickness and a general relationship between electrical characteristics and structural distortion has been found. In thinner films larger tensile distortion allowed to include larger amount of interstitial O and/or Sn atoms in the lattice. An appreciable impact of the thickness was also observed on electro-optical properties in terms of changes in energy gap, resistivity and optical absorption. Silicon heterojunction solar cells have been produced and J_sc as high as 33.0 mA/cm² has been obtained.     

Growth characteristics and properties of ZnO:Ga thin films prepared by pulsed DC magnetron sputtering

Transparent conductive ZnO:Ga thin films were deposited on Corning 1737 glass substrate by pulsed direct current (DC) magnetron sputtering. The effects of process parameters, namely pulse frequency and film thickness on the structural and optoelectronic properties of ZnO:Ga thin films are evaluated. It shows that highly c-axis (0 0 2) oriented polycrystalline films with good visible transparency and electrical conductivity were prepared at a pulsed frequency of 10 kHz. Increasing the film thickness also enlarged the grain size and carrier mobility which will subsequently lead to the decrease in resistivity. In summary, ZnO:Ga thin film with the lowest electrical resistivity of 2.01 × 10⁻⁴ Ω cm was obtained at a pulse frequency of 10 kHz with 500 nm in thickness. The surface RMS (root mean square) roughness of the film is 2.9 nm with visible transmittance around 86% and optical band gap of 3.83 eV.     

Room temperature photoluminescence property of Mo-doped In2O3 thin films

Mo-doped In₂O₃ thin films have been prepared on glass substrates using an activated reactive evaporation method and systematically studied the effect of oxygen partial pressure on the structural, optical, electrical and photoluminescence properties of the films. The obtained films are highly transparent and conductive. The films exhibited the lowest electrical resistivity of 5.2 × 10⁻⁴ Ω cm, with an average optical transmittance of 90% in the visible region. An intensive photoluminescence emission peaks were observed at 415 and 440 nm.     

Effect of laser incident energy on the structural,morphological and optical properties of Cu2ZnSnS4 (CZTS) thin films

The polycrystalline Cu₂ZnSnS₄ (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5–3.0 J/cm². The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm². However, when the laser incident energy was further increased to 3.0 J/cm², leads to degrade the structural, morphological and optical properties of the CZTS thin films.     

Time-resolved spectroscopy in LiCaAlF6 doped with Cr3+ as a function of pressure and temperature: Excited-state crossover and phase-transition effects

This work investigates phase transition (PT) and excited-state-crossover (ESCO) effects on the photoluminescence (PL) properties of LiCaAlF₆: Cr³⁺. The structural requirements for changing the Cr³⁺ PL behavior from a broad-band emission at 1.59 eV (781 nm) at ambient conditions, to ruby-like narrow-line emission at 1.87 eV (663 nm) are analyzed in the 0–35 GPa range. We report a PL study on LiCaAlF₆: Cr³⁺ by means of time-resolved emission as a function of pressure and temperature. In particular we focus on the PL variations occurring around the pressure-induced trigonal-to-monoclinic first-order PT in LiCaAlF₆ at 7 GPa.     

Broadband 1.5-μm emission of high erbium-doped Bi2O3–B2O3–Ga2O3 glasses

High Erbium-doped glass showing the wider 1.5-μm emission band is reported in the Bi₂O₃–B₂O₃–Ga₂O₃ system and its thermal stability and optical properties such as absorption, emission spectra, absorption and stimulated emission cross-sections and fluorescence lifetime are investigated. Compared with other glass hosts, the gain bandwidth properties of high Er³⁺ content in BBG glass are better than those of tellurite, germanate, silicate and phosphate glasses. The broad and flat ⁴I_13/2→⁴I_15/2 emission and the larger stimulated emission cross-section of Er³⁺ ions around 1.5 μm enable it to be used as a host material for potential broadband optical amplifiers at C and L bands in the microchip configuration.     

Structural,optical and electrical properties of tin oxide thin films by electrostatic spray deposition

Tin oxide (SnO₂) thin films were deposited by electrostatic spray deposition (ESD). The structural, optical and electrical properties of the films for different solvents were studied. The morphology of the deposited thin films was investigated by scanning electron microscopy. The optical transmission spectra of the films showed 66–75% transmittance in the visible region of spectrum. The electrical resistivity of thin films deposited using the different solvents ranged 1.08 × 10^?3–1.34 × 10^?3 Ω-cm. Overall, EG and PG were good solvents for depositing SnO₂ thin films by the ESD technique with stable cone jet.     

Effect of composition and deposition temperature on the characteristics of Ga doped ZnO thin films

ZnO films doped with Ga (GZO) of varying composition were prepared on Corning glass substrate by radio frequency magnetron sputtering at various deposition temperatures of room temperature, 150, 250 and 400 °C, and their temperature dependent photoelectric and structural properties were correlated with Ga composition. With increasing deposition temperature, the Ga content, at which the lowest electrical resistivity and the best crystallinity were observed, decreased. Films with optimal electrical resistivity of 2-3 × 10⁻⁴ Ω cm and with good crystallinity were obtained in the substrate temperature range from 150 to 250 °C, and the corresponding C_Ga/(C_Ga + C_Zn) atomic ratio was about 0.049. GZO films grown at room temperature had coarse columnar structure and low optical transmittance, while films deposited at 400 °C yielded the highest figure of merit (FOM) due to very low optical absorption despite rather moderate electrical resistivity slightly higher than 4 × 10⁻⁴ Ω cm. The optimum Ga content at which the maximum figure of merit was obtained decreased with increasing deposition temperature.     

The annealing effect on structural,optical and photoelectrical properties of CuInS2/In2S3 films

Successive Ionic Layer Adsorption and Reaction (SILAR) technique was used to deposit the CuInS₂/In₂S₃ multilayer thin film structure at room temperature. The as-deposited film was annealed at 100, 200, 300, 400 and 500 °C for 30 min in nitrogen atmosphere and the annealing effect on structural, optical and photoelectrical properties of the film was investigated. X-ray diffraction (XRD) and optical absorption spectroscopy were used for structural and optical studies. Current–Voltage (I–V) measurements were performed in dark environment and under 15, 30 and 50 mW/cm² light intensity to investigate the photosensitivity of the structure. Also, the electrical resistivity of the film was determined in the temperature range of 300–470 K. It was found that annealing temperature drastically affects the structural, optical and photoelectrical properties of the CuInS₂/In₂S₃ films.     

Synthesis of the wheat-like CdSe/CdTe thin film heterojunction and their photovoltaic applications

We report on the fabrication of wheat-like CdSe/CdTe thin film heterojunction solar cells made using a simple electrochemical deposition method and close-spaced sublimation technology on indium tin oxide (ITO) substrates. Structural, optical, and electrical properties of the wheat-like CdSe/CdTe thin film junctions were characterized by X-ray diffraction (XRD), field emission scanning electron microscope (FESEM), energy dispersive spectrometry (EDS), ultraviolet–visible (UV–vis) absorption spectrum and Keithley 2400 analysis. A significant red-shift of the absorption edge is observed in this heterojunction. The heterostructure is composed of the wheat-like CdSe array and CdTe thin film, showing optical properties typical of type II heterostructures that are suited for photovoltaic applications. A photocurrent density of 8.34 mA/cm² has been obtained under visible light illumination of 100 mW/cm². This study demonstrates that the electrochemical deposition and the close-spaced sublimation technology, which are easily adapted to other chemical systems, are promising techniques for large-scale fabrication of low-cost heterojunction solar cells.     

Optical and Structural Properties of Mn-Doped GaN Grown by Metal Organic Chemical Vapour Deposition

Mn-doped GaN epitaxial films were grown by metal organic chemical vapour deposition （MOCVD）. Microstructural properties of films are investigated using Raman scattering. It is found that with increasing Mn-dopants levels, longitudinal optical phonon mode A1 （LO） of films is broadened and shifted towards lower frequency. This phenomenon possibly derives from the difference in bonding strength between Ga-N pairs and Mn-N pairs in host lattice. In addition, optical properties of films are investigated using cathodoluminescence and absorption spectroscopy. Mn-related both emission band around 3.0eV and absorption bands around 1.5 and 2.95eV are observed. By studies on structural and optical properties of Mn-doped GaN, we find that Mn ions substitute for Ga sites in host lattice. However, carrier-mediated ferromagnetic exchange seems unlikely due to deep levels of Mn acceptors.     

Effects of substrates on structural and optical properties of Cu-poor CuGaSe2 thin films prepared by in-situ co-evaporation

We investigated the structural and optical properties of Cu-poor CuGaSe₂ (CGSe) films depending on the use of different substrates: indium-doped tin oxide (ITO) coated soda-lime glass (SLG) and fluorine-doped tin oxide (FTO) coated SLG as back contacts, widely used Mo-coated SLG, and pure SLG. The Cu-poor phase is chosen as a counterpart of Cu-poor Cu(In,Ga)Se₂ to show the highest efficiency in this class of materials, and also give a test board for parasitic phases which might influence on device properties. Although the Cu-poor CGSe thin-films were deposited on the four substrates at the same time in an identical condition, they showed differences in the morphology and grain size due to different CGSe/substrate interfaces and growth mechanisms depending on the substrates. These surface properties of the CGSe films were identified clearly by atomic force microscopy (AFM) measurements. X-ray diffraction (XRD) measurement also supported the result of the AFM analysis and showed that the preferred orientation of CGSe is (112), independent of the substrates. The existence of parasitic phases was examined by Raman and photoluminescence spectroscopic techniques. While defect compounds such as CuGa₃Se₅ and CuGa₅Se₈ were identified for all films, the signals related to these parasitic phases are strongest for the films on the pure SLG substrate. Furthermore, the absorption property was investigated by spectroscopic ellipsometry in a photon energy range of 0.7–5 eV. We found that the absorption coefficient values for the CGSe films are about 10⁴–10⁵ cm^?1 in the visible region. The absorption coefficient is also changed according to the use of different substrates. This difference comes from the parasitic phase formation, which leads to an increase of the bandgap and suppression of the optical absorption strength. Our systematic study suggests clearly that the difference in distribution of parasitic phases in the CGSe films could originate primarily from the different substrates used for the film deposition.     

Influence of the grain boundary barrier height on the electrical properties of Gallium doped ZnO thin films

The pulsed laser deposition (PLD) technique is used to deposit Gallium doped zinc oxide (GZO) thin films on glass substrates at 250 with different Gallium (Ga) doping concentration of 0, 1.0, 3.0 and 5.0%. The influence of Ga doping concentration on structure, chemical atomic compositions, electrical and optical properties was investigated by XRD, XPS, Hall measurement and UV spectrophotometer, respectively. The relationship between electrical properties and Ga doping concentration was clarified by analyzing the chemical element compositions and the chemical states on the GZO films. It is found that the carrier concentrations and oxygen vacancies in the GZO films increase with increasing Ga doping concentration. The lowest resistivity (3.63 × 10⁻⁴ Ω cm) and barrier height of grain boundaries (14 mV) were obtained with 3% Ga doping. In particular, we suppose the band gap of 5% Ga doping sample larger than that of 3% Ga doping sample is due to the quantum size effect from the amorphous structure rather than Moss-Burstein shift.     

Driving frequency dependency of gas species in the bubble formation for aqua-plasma generation

Effects of voltage driving frequency on the gas composition, electrical and optical emission properties of aqua-plasmas generated in electrolyte solution, are investigated and the experiment was carried out in the range of 10 Hz–50 kHz. In the range of 10–300 Hz, H₂ dominated bubbles are generated and it is attributed to electrolysis. With increasing frequency, the gas composition inside the bubble changes to the H₂O which can be determined from the observation of atomic H to OH(A-X) transition from the optical measurements of aqua-plasma. In higher frequency than 2 kHz, the boiling on the electrode dominates to the formation of the bubble. Consequently, the radicals and plasma properties are varied with the driving frequency.     

Optical and physical characteristics of In-doped ZnO nanorods

In this paper the effect of indium dopants on structure, optical, electrical and mechanical properties of ZnO nanorods are studied. The average surface potentials and the surface currents of ZnO:In nanorods were 0.25–0.84 mV and 2.2–200 MΩ-cm, respectively. The turn-on threshold field for the vertical ZnO nanorods was around 2–16 V μm⁻¹. Emission current densities of 3.3–911.4 mA cm⁻² were obtained for an electrical field of 60–160 V μm⁻¹. The photoluminescence (PL) spectrum measured at 15–300 K showed that the intensity of the peak at 2.06 eV increased with decreasing temperature, while the peak at 2.06 eV further red shifted and the peak at 3.39 eV blue shifted.     

Effect of Fe-doping on the structural,morphological and optical properties of ZnO nanoparticles synthesized by solution combustion process

The effect of Fe-doping on the structural, morphological and optical properties of ZnO nanoparticles synthesized by simple solution combustion process are reported. The powder XRD pattern indicates that the Fe-doped ZnO samples exhibit primary and secondary phases. The primary phase indicates the hexagonal wurtzite structure with the average crystalline size of around 25–50 nm and the secondary phase is associated with the face centered cubic structure of magnetite iron oxide. The elemental composition of pure and Fe-doped samples are evaluvated by EDX. The results of FE-SEM and HR-TEM cleary show that particles morphology have changed with respect to the incorporation of doping agent and particles are in aggregating nature. The vibrational properties of the synthesized ZnO nanoparticles are investigated by Raman scattering technique and it exhibits that the influence of Fe-doping significantly modify the lattice vibrational characteristics in ZnO sites. The optical properties of the Fe-doped ZnO nanoparticles are carried out by UV–vis absorption and PL spectra. The results of PL spectra show the near-band edge related emission as well as strong blue emissions in the Fe-doped ZnO nanoparticles.