改进的升华法制备氮化铝单晶体

采用改进的升华法在氮气环境下制备氮化铝单晶体.通过优化实验条件制备出了六角形的高质量的氮化铝单晶体.实验发现,在坩埚的不同区域得到的氮化铝晶体的大小和形态有所不同.讨论了温度梯度对氮化铝晶体尺寸大小和形态的影响.     

气相生长氮化铝单晶的新方法

通过在钨坩埚盖开小孔的方法改变氮化铝结晶衬底上的温度场分布,在开孔处形成局部低温区;由于孔的几何尺寸的限制和氮化铝晶体生长的各向异性,开孔处的氮化铝晶体单晶化;随后,开孔处的单晶起籽晶的作用,逐渐长成较大尺寸、较高质量的氮化铝单晶.目前用该方法已经制备出直径大于2mm的氮化铝单晶体.     

PVT法同质外延制备大尺寸Al极性氮化铝晶体生长工艺及其表征分析研究

本文基于自主设计的氮化铝生长炉,开展了四组不同工艺条件下Al极性面氮化铝籽晶同质外延生长氮化铝单晶的生长特征及其结晶质量表征研究。研究发现:不同工艺条件下生长的晶体的拉曼图谱E₂(high)特征峰峰位表明,晶体内部均存在较小的拉应力;在坩埚顶部在相对较高温度2 210 ℃、坩埚底部与顶部温差42 ℃的低过饱和度生长条件下,晶体表面光滑,呈现阶梯流生长形貌,并具有典型的氮化铝单晶生长习性面,晶体初始扩张角大于40°,高分辨率X射线衍射(HRXRD)测得0002、1012反射摇摆曲线及拉曼光谱检测结果表明,该条件下生长的氮化铝晶体结晶质量优异,并可实现快速扩径。基于该生长条件,通过外延生长后成功获得尺寸ϕ45~47 mm的氮化铝单晶锭,相关表征结果表明生长的氮化铝晶体具有优越的结晶性能。     

升华法生长氮化铝晶体的热场分析

本文使用有限元法模拟氮化铝晶体生长系统的温度场,分析了坩埚的位置、感应线圈的匝间距以及原料与晶体之间的距离对温度场分布的影响.结果表明:坩埚位置主要影响系统中最高温度的位置及温度梯度的大小原料与结晶体之间的距离仅对温度梯度有影响;感应线圈的匝间距则影响加热效率的高低.通过合理优化以上三个条件,可以获得适宜于高品质氮化铝晶体快速制备的理想热场.     

坩埚预处理技术在氮化铝晶体生长工艺中的应用

在氮化铝晶体生长工艺中,坩埚的使用寿命是主要技术难点之一.实验发现,在钨坩埚体和盖之间放置内径和外径与坩埚相同的石墨环,在氮气环境下进行一次高温处理,使钨坩埚体与盖接触的部位形成碳化钨保护层,可以有效地解决高温下钨坩埚体与盖相粘结的问题,大大提高了坩埚的使用寿命.使用经过预处理的钨坩埚,用物理气相法生长出φ0.8mm×1.5mm氮化铝单晶体和φ36mm×5mm氮化铝多晶片.     

自蔓延高温合成氮化铝晶须形态和生长机理研究(1)

采用自蔓延高温合成技术(SHS),在高压氮气中成功地合成了氮化铝晶须,并对它的显微结构进行了研究.研究结果表明,由于制备时的生长条件极不稳定,出现不同形态的晶须形貌,除了细长均匀的氮化铝晶须外,还出现了各种其它不规则形状的产物.过饱和度的不同,产生了枝蔓晶结构.按照VS生长方式,在均衡生长条件下,生长为本征结构的氮化铝晶须.晶须顶端的杂质小液滴,为VLS生长方式创造了条件.通过光学显微镜观察,合成出的氮化铝晶须是透明的.     

氮化铝晶须的形态与生长条件的关系

实验以氮化铝粉料为原料,在高纯氮气气氛下用物理气相法在密闭式和半开式钨坩锅内高温生长出氮化铝晶须;并对氮化铝晶须的结晶形态与生长条件的关系进行了分析和探讨。     

高温退火工艺对直流反应磁控溅射制备蓝宝石基氮化铝模板的影响

采用直流反应磁控溅射与高温退火工艺大批量制备了膜厚为200 nm、400 nm及800 nm的2英寸蓝宝石基氮化铝模板,并对高温退火前后不同膜厚模板使用各种表征手段进行对比分析.结果 表明:采用磁控溅射制备膜厚为200 nm的模板经高温退火后晶体质量得到显著提升,退火前后整片(0002)面和(10-12)面高分辨率X射线衍射摇摆曲线半高宽分别从632 ～ 658 arcsec和2 580 ～2 734 arcsec下降至70.9 ～ 84.5 arcsec和273.6 ～ 341.6 arcsec;模板5 μm×5μm区域内均方根粗糙度小于1 nm;紫外波段260 ～280 nm吸收系数为14 ～20 cm-1;高温退火前后拉曼图谱E2(high)声子模特征峰半高宽从13.5 cm-1降至5.2 cm-1,峰位从656.6 cm-1移动至657.6 cm-1,表明氮化铝模板内的拉应力经高温退火后得到释放,接近无应力状态.     

自蔓延高温合成氮化铝晶须形态和生长机理研究(2)

在对自蔓延高温合成方法制得的AIN晶须形态研究的基础上,采用高分辩电镜等技术,对AIN晶须进行了生长机理研究,结果表明,晶须头部的小液滴显示氮化铝晶须可由VLS机制生成.光滑晶须头部的出现、过饱和度与晶须直径的关系、侧面的二次生长、生长台阶的出现,这些都说明VS机制在起作用.虽然在AIN晶须中发现层错和位错,但经过分析认为,它们都不是氮化铝晶须的生长机制.     

退火温度对Ce:YAlO3单晶体的影响研究

将生长完成的Ce:YAlO2单晶体在1680℃的高温氢气气氛下退火,晶体颜色、吸收光谱和荧光光谱相对于未退火的样品均发生了变化.本文对此现象进行了分析.研究结果表明,1680℃高温氢气退火后,Ce:YAP晶体中同时包含YAP相和YAG相.     

AIN单晶生长研究进展

AlN是一种重要的半导体材料,由于具有宽带隙、高临界击穿电场、高热导率、高载流子饱和漂移速度等优越的特性,在微电子和光电子领域具有广泛的应用前景.本文综述了国际上AlN单晶生长的研究进展,对其结构特点、生长方法的选择、生长过程中的问题及存在的结构缺陷等方面进行了介绍.     

Growth of AlN single crystals on 6H‐SiC (0001) substrates with AlN MOCVD buffer layer

6H‐SiC (0001) deposited 300 nm thick AlN film by MOCVD was used as the substrate to grow AlN crystals by the physical vapour transport (PVT) method. It was confirmed that c‐axis oriented AlN films were grown and this material had a 3D growth mode. The root mean square (RMS) value for the film was measured to be 2.17 nm. Nucleation and further growth of AlN on so prepared substrate was investigated. Colorless and transparent AlN crystal with 1 mm thick and 40 mm in diameter was obtained after 4 h growth on this substrate. The transparent AlN showed strong (0001) texture XRD patterns, only the (0002) reflection was observed in symmetric θ‐2θ scans. The full width at half maximum for a (0002) X‐ray rocking curve was less than 0.1° indicating good crystalline quality. Anisotropic etchings in molten KOH shows that the growth (0001) plane exposed to the AlN source predominately has an aluminum polarity, no N‐polar inversion domains were observed. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

MOVPE growth of single-crystal hexagonal AlN on cubic diamond

We have obtained single-crystal aluminum nitride (AlN) layers on diamond (1 1 1) substrates by metalorganic vapor-phase epitaxy (MOVPE). When the thermal cleaning temperature of the substrate and growth temperature of the AlN layer were below 1100 °C, the AlN layer had multi-domain structures mainly consisting of rotated domains. An interface layer, consisting of amorphous carbon and poly-crystal AlN, was formed between the AlN layer and the diamond substrate. On the other hand, when the thermal cleaning temperature and growth temperature were above 1200 °C, a single-crystal AlN layer was grown and no interface layer was formed. Therefore, we attribute the multi-domain structures to the interface layer. Even at the growth temperature of 1100 °C, by performing the thermal cleaning at 1200 °C, the single-crystal AlN layer was obtained, indicating that the thermal cleaning temperature of the substrate is a critical factor for the formation of the interface layer. The epitaxial relationship between the single-crystal AlN layer and the diamond (1 1 1) substrate was determined to be [0 0 0 1]_AlN∥[1 1 1]_diamond and [1 0 1¯ 0]_AlN∥[1 1¯ 0]_diamond. The AlN surface had Al polarity and no inversion domains were observed in the AlN layer.     

Crystal growth of gallium nitride

A review is given of the methods which have been used to grow single crystals and epitaxial layers of gallium nitride. In view of the problems in growing bulk crystals, the main emphasis is on heteroepitaxy. Sapphire has been the most popular substrate material, but leads to severe stress because of lattice and expansion mismatch. The use of an intermediate AlN layer appears to alleviate this problem. Chemical vapor deposition using gallium chloride and ammonia has given the highest quality layers to date, but a native donor remains a persistent problem. The use of high pressures of nitrogen offers promise as a means of reducing the native donor concentration. Atomic layer epitaxy is an alternative technique which looks promising for film deposition under well-controlled conditions. The properties of GaN and device considerations are included briefly in this review.     

自发形核生长的AlN单晶湿法腐蚀研究

采用湿法腐蚀工艺,使用熔融态KOH和NaOH作为腐蚀剂,对一种物理气相传输(PVT)自发形核新工艺在2100~2250 ℃条件下生长的AlN单晶进行了腐蚀实验.通过实验及扫描电子显微镜(SEM)结果分析,得到了典型的AlN单晶c面、r系列面及m面最佳的腐蚀工艺参数及腐蚀形貌.另外,基于腐蚀形貌分析,发现了采用该自发形核新工艺生长的AlN晶体某些独特习性并计算出AlN单晶腐蚀坑密度(EPD).     

Effect of the seed crystallographic orientation on AlN bulk crystal growth by PVT method

The growth of AlN crystals by PVT method was investigated using TaC crucible in the temperature range of 2250‐2350 °C. AlN boules with 30 mm in diameter were successfully grown on the crucible lid by self‐seeded growth. The AlN boules consist of the spontaneously nucleated AlN single crystal grains with the {1010} natural crystalline face. The fast growth rate of more than 1 mm/h was achieved. AlN crystals grown on (11 0)‐, (10 0)‐, and (0001)‐face AlN seeds were investigated. Different experimental phenomena have been observed under particular condition. The crystal grown on (11 0)‐face seed has different natural crystalline face from the seed. For the crystal grown on (10 0) or (0001) seed, the crystal natural crystalline face is same as the crystallographic orientation of the seed. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)