散斑错位干涉术条纹的形成与特性分析

通过相关计算及滤波分析,建立了散斑错位干涉术条纹强度的统计分布,从而得到了这类条纹更为一般的特征属性.     

激光电子散斑干涉测微小位移

介绍了利用激光电子散斑干涉测量微小位移的原理和方法，并对其测量范围和测量精度进行了分析，人出了具体的测量结果。     

大剪切电子散斑干涉的载频调制与位移场测量

将电子散斑干涉场的载波调制引入到大剪切电子散斑干涉中,通过对参考物的微小偏转引入载波条纹;利用傅里叶变换法,解调出了变形场的相位,从而实现了物体变形场的精确测量。讨论了大剪切载频的调制机理,理论分析表明,调制条纹的空间频率与参考面偏转的角度成正比;因此,控制参考面的偏转角度可实现不同位移量系统的调制。利用中心加载周边固定圆盘进行了典型实验,实验结果证明在大剪切电子散斑干涉技术中可以通过参考面的旋转高质量地实现电子散斑干涉条纹的调制,求解位移场。该系统具有系统简单,不需要专门引入参考光,条纹质量好等优点。该技术可扩展电子散斑干涉的应用范围,有一定的实际应用价值。     

可调实时时间差电子错位散斑技术及应用

本文首次提出一种可调实时时间差电子错位散斑干涉技术,并成功地用于热变形测量,该方法还可用于长时间连续变形和瞬态大变形的位移测量。叙述了该技术的原理,给出了一些应用的实验结果。     

光栅大错位数字散斑干涉术的研究

提出一种新的大借位数字散斑干涉术。它在成像物镜的像方空间放置光栅,利用光栅的衍射原理,使来自参考物和被测物的光波在像面发生干涉。用傅里叶光学原理详细讨论了该方法的基本原理,并对受均布载荷的周界固定方板这一典型试件的离面位移场进行了实测。结果表明,实验值和理论解吻合。报导了一些应用实例。理论和实验表明,该方法不仅具有全息干涉计量术达λ/4的高灵敏度,还具有防震要求低和能在明场环境下进行现场测量的显著优点。     

一种改进的载波电子散斑干涉处理方法

提出了一种新的载波电子散斑干涉的处理方法,该方法将载波所形成的直条纹和包含物体变形信息的弯曲条纹在频域直接比较, 避免了传统载波干涉方法中的载波频率计算和由此带来的误差. 因此在准确程度和方便性方面都有明显改进. 本文在给出理论分析的同时进行了实验验证.     

基于电子散斑干涉与数字剪切散斑干涉法的悬臂薄板振动分析

基于激光光路的光波随机相位扰动,分析了电子散斑干涉实时图像相减时模态条纹图的形成机理,提出了一种振幅涨落测量法。搭建了用于离面振动分析的电子散斑干涉和数字剪切散斑干涉测量系统,并对完整和含狭缝的悬臂铝板的振动特性进行了实验研究。实验结果表明,实时图像相减模式获得的模态条纹图对比度明显优于其他方法,得到的前10阶模态条纹图与有限元法计算结果具有良好的一致性。相比于电子散斑干涉法,数字剪切散斑干涉法对试样局部的刚度变化和缺陷更敏感。     

相位调制数字散斑干涉术

提出一种可绕Ｚ轴转动的粗糙平板（参考物体）实现相位调制，该方法在不改变电子散斑干涉术（ＥＳＰＩ）或数字散干涉术（ＤＳＰＩ）系统装置的情况下，可用于微小离而位移场（例如最大离面位移为λ）的测量，以及复杂形变的离面位移场的自动测量。     

一种新型的散斑干涉实验

本文介绍一个用ＣＣＤ摄像机代替常规的全息干版记录图像，并存储在计算机里进行计算机处理，在电视屏幕上实时观察到干涉散斑场的相关条纹，从而测量出物体微小位移。是一个光、电与计算机相结合的综合实验。     

偏振相位偏移电子散斑干涉术及其应用于变形测量

本文叙述了一种用于测量漫射表面变形的使用偏振相位偏移技术的电子散斑干涉术.由于采用共光路光学相位偏移技术,因而具有较高的稳定性;用计算机图像处理可精确地获得相位图;用去包裹技术(unwrapping)可直接得到表面变形的精确数据.     

载频调制大剪切电子散斑干涉系统

大剪切电子散斑干涉技术不需要引入参考光，具有条纹质量好等特点。提出将干涉场的载频调制技术引入到大剪切电子散斑干涉中，可形成具有载频调制功能的新的电子散斑干涉系统。该系统具有对测量环境的隔振振动要求低，能方便定量求解物体的变形场等优点。首先讨论大剪切载频的调制机理，然后利用中心加载、周边固定的圆盘进行典型实验，设计了可用计算机控制且可对参考物进行精确偏转的步进电机系统，进而实现了对电子散斑干涉场的自动控制调制。最后，利用傅里叶变换法对调制条纹进行解调，解调出变形场的相位，并通过相位与位移的转换计算，得到精确的物体变形场。实验结果证明，该系统能够调制电子散斑干涉场，求解物体的位移场。     

电子散斑干涉载频调制形貌测量方法的分析

根据电子散斑干涉载频调制测量物体形貌的基本原理,物体表面的微小偏转可引入包含物体高度信息的载波干涉条纹。将物体的偏转视为变形,对物体变形与载波干涉条纹之间的关系进行了讨论,得出了离面位移引入载波和面内位移引入含有物体高度信息相位的结论。发现利用典型电子散斑干涉系统测量物体形貌效果最好,并通过实验得到了验证。     

Noise reduction in electronic speckle pattern interferometry fringes by merging orthogonally polarised speckle fields

The noise in sawtooth fringes generated by electronic speckle pattern interferometry (ESPI) is investigated. When deformations of depolarising objects are studied, the scattered object light can be decomposed into two orthogonal linearly polarised speckle patterns which are partially decorrelated. Their correlation coefficient decreases with increasing depolarisation coefficient of the object. By suitable merging of the phase distributions of these two speckle fields on the basis of a modulation depth analysis, the rms phase error in the ESPI sawtooth fringes can be reduced significantly.     

用电子散斑干涉法测量材料热膨胀系数

 利用双光束电子散斑干涉法（ESPI）对试件受热变形进行了实时观测，针对一次实验过程中得到的图片较多（300～500幅）的特点，在图像处理时摒弃了以往的手动识别等位移线的办法，用MATLAB语言编写了批处理程序，能够在采集的大量散斑图片中自动快速准确地标定等位移线，得到相应的位移和应变，并结合实时测量的温度值，获得了45钢和LY12铝合金在不同温升率下的热膨胀系数及其随温度的变化。实验结果表明，在涉及的温升率范围内，温升率的改变对材料热膨胀系数的影响不明显，材料的热膨胀系数随温度的升高略有上升。     

The design of a non-cube beam-splitter used for electronic speckle pattern interferometry

A non-cube beam-splitter (NCBS) is proposed, by which an incident beam can be separated largely in a direction and then the lights from the test object and the lights from a reference surface placed adjacently to the test object can be combined to construct a simple electronic speckle pattern interferometry (ESPI) system. Two mainly useful quantitative ways, to calculate the phase change of the test object, the phase-shift and the fringe carrier method with Fourier transform, can be achieved in the ESPI system with the NCBS. Experiments with phase-shifting and fringe carrier method are completed. The experimental results show that the monolithic design of the proposed NCBS is effective in ESPI measurement and immunity to vibrations.     

Improved evaluation of electronic speckle pattern interferograms by photogrammetric image analysis

Electronic speckle pattern interferometry (ESPI) is a well-established tool for non-destructive testing. It allows the quantitative determination of surface deformations and micro-movements with a sub-micrometer resolution. In the case of objects which are extended in depth, however, the evaluation and interpretation of the resulting correlation fringe patterns can be affected by perspective image distortions as well as by a varying image size. In this paper a method for combination of ESPI with a photogrammetric 3D coordinate measurement is presented. In this way, interferogram data are precisely allocated in 3D-space. Furthermore, it is possible to take into account a spatially varying sensitivity vector. The utilizability of the method is demonstrated by a deformation measurement on a stone sculpture.     

Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation

The thickness change of transparent plates was measured by electronic speckle pattern interferometry (ESPI) method and digital image correlation (DIC) method. An out-of-plane ESPI system was developed based on the Michelson interferometer, and a new thickness measurement method was designed, which is on the basis of Snell's law of refraction and DIC. The main principles and experimental procedures of these two methods were presented. The thickness change of polymethyl specimens under uniaxial tensile loading were measured by the optical techniques and compared with each other. The results reveal that the data obtained with DIC method achieve better linearity than ESPI.     

One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.     

Modulation analysis in spatial phase shifting electronic speckle pattern interferometry and application for automated data selection on biological specimens

In electronic speckle pattern interferometry (ESPI), for a fast and objective analysis of measurement data which occur with a high repetition rate, an automated data processing is of particular advantage. For this reason, investigations were carried out to determine if the modulation of speckle interferograms can be applied as a quality parameter for the selection of suitable interferogram data for further evaluation e.g. phase unwrapping when spatial phase shifting (SPS) is performed. Six methods for determining the modulation of speckle interferograms are characterised and compared. The applicability of the speckle interferogram modulation as a parameter for mask generation in the unwrapping process of the phase difference is demonstrated by the evaluation of measurement data obtained from experiments with a spatial phase shifting endoscopic ESPI system on a technical surface and on a human gastrectomy specimen.     

Comparison between instantaneous and integral intensities in dynamic speckle pattern interferometry

A new speckle measurement technique called temporal speckle pattern interferometry or time sequential speckle pattern interferometry has been developed recently. Its principle is that by capturing the temporal speckle patterns related to the object deformation or displacement, the whole-field displacement, the amplitude of the vibrating object and the shape of the tested object can be calculated through speckle intensity fluctuation scanning technique or Fourier-transforming method. In this paper, we combine the analytical and numerical methods to simulate the properties of the time demodulation in temporal speckle patterns interferometry techniques. The performance of three kinds of temporal phase sequences, power, exponential and harmonic phase sequences, are studied with the parameters of temporal speckle intensity fluctuation, the value of the spatial phase term, optical integral time of the recording camera and the initial phase of the temporal speckle intensities. The results indicate that the normalized value and period change of the instantaneous intensity are nearly coincident with that of the integral intensity for the harmonic temporal phase sequences and are different for the power and exponential temporal phase sequences.