Solid phases of cyclopentane: combined experimental and simulation study

The phase diagram of cyclopentane has been studied by powder neutron diffraction, providing diffraction patterns for phases I, II, and III, over a range of temperatures and pressures. The putative phase IV was not observed. The structure of the ordered phase III has been solved by single-crystal diffraction. Computational modeling reveals that there are many equienergetic ordered structures for cyclopentane within a small energy range. Molecular dynamics simulations reproduce the structures and diffraction patterns for phases I and III and also show an intermediate disordered phase, which is used to interpret phase II.     

Characterization and Application of Surface Plasmon-Enhanced Optical Diffraction from Electrodeposited Gold Nanowire Arrays

Arrays of gold nanowires formed by the process of lithographically patterned nanowire electrodeposition (LPNE) were characterized by a combination of SEM, polarized UV-visible absorption spectroscopy and optical diffraction measurements. A transverse localized surface plasmon resonance (LSPR) was observed for gold nanowire arrays with an absorption maximum (λ(max)) that varied with nanowire width. Transmission optical diffraction measurements were measured with the even and odd diffraction orders creating an alternating, out of phase sinusoidal intensity pattern characteristic of the LPNE nanowire arrays. The intensities of the even diffraction order maxima were the strongest for nanowires with a width of 115 ± 10 nm; nanowires of this width exhibit a λ(max) of 635 ± 10 nm, verifying that the transverse LSPR has enhanced the optical diffraction signal. Real time total internal reflection diffraction intensity measurements were used to monitor in situ the electrodeposition of silver monolayers onto the gold nanowire arrays.     

Study of X-ray diffraction patterns in Langmuir-Blodgett films using the few-slits model of diffraction

Multilayer films of cadmium 22-tricosenoiate were deposited by using the Langmuir-Blodgett technique in the Z-mode of deposition. The films were then irradiated with various γ-irradiation doses. Small-angle X-ray diffraction patterns of the films before and after γ-irradiation were studied by applying the model of diffraction by a few slits. The X-ray diffraction patterns of the films before γ-irradiation show nine equidistant peaks, indicating the presence of a regular periodic structure in the film. The intensities of the even-order diffraction peaks are relatively less than those from the neighbouring odd-order peaks. This phenomenon, known as even-odd intensity oscillation, was successfully explained by this model. The position of the X-ray diffraction peaks taken for films after different γ-irradiation doses does not change, indicating that the average spacing in the film is unaffected by γ-irradiation. However, the intensity of the diffraction peaks of the film does change with γ-irradiation dose. This change can be explained by the change of electron density along the molecular chain in the layer before and after various γ-irradiation doses.     

Metergoline II: structure solution from powder diffraction data with preferred orientation and from microcrystal

Metergoline is a dopamine agonist and serotonin antagonist used both in human and veterinary medicine. In addition to the previously known crystalline form, a new polymorph, which crystallizes from aqueous solution, was found. Since it was initially impossible to prepare a single crystal of quality suitable for single crystal X-ray diffraction measurements using a conventional laboratory source, the structure was solved from the powder diffraction data using synchrotron radiation. The structure determination also included solving the effects of preferred orientation. Characterization was simultaneously done by solid-state NMR spectroscopy. Finally, a small single crystal suitable for synchrotron diffraction was found after numerous tries. Crystal structure determination using this single crystal confirmed the powder-based solution. Comparison of information obtained by different experimental methods (powder diffraction, ssNMR, single crystal diffraction) was made.     

Thickness determination of TiN and TiAl coatings on steel substrates using X‐ray diffraction method and their composition measurements by GD‐OES

This paper presents a nondestructive X‐ray diffraction method for the accurate determination of thicknesses of polycrystalline TiN and amorphous‐like TiAl coatings deposited by DC magnetron sputtering onto thick polycrystalline stainless steel and carbon steel substrates. This method relies on the measurement of intensity loss of a substrate reflection caused by the deposition of the coating. The uncertainty of the thickness measurements by the X‐ray diffraction depends on the mass absorption coefficient of the coating material and the quality of the collected diffraction patterns. For the coatings considered, thicknesses determined by the X‐ray diffraction method show very good agreement with the thickness values measured by scanning electron microscopy and ball crater techniques.     

Effect of violations of the structure and layer packing on the diffraction pattern of gibbsite and bayerite

Using the simulation method for the diffraction patterns of one-dimensionally disordered materials, the effect of different violations in the layered structure of aluminum trihydroxides (gibbsite and bayerite) on their diffraction patterns is analyzed. The features of the diffraction patterns of a disordered gibbsite sample obtained by intercalation-deintercalation of lithium salts are considered.     

DIFFRACTION AND HOLOGRAPHY WITH PHOTOELECTRONS AND FLUORESCENT X-RAYS

We consider studies of the atomic and magnetic structure near surfaces by photoelectron diffraction and by the holographic inversion of both photoelectron diffraction data and diffraction data involving the emission of fluorescent x-rays. The current status of photoelectron diffraction studies of surfaces, interfaces, and other nanostructures is first briefly reviewed, and then several recent developments and proposals for future areas of application are discussed. The application of full-solid-angle diffraction data, together with simultaneous characterization by low energy electron diffraction and scanning tunneling microscopy, to the epitaxial growth of oxides and metals is considered. Several new avenues that are being opened up by third-generation synchrotron radiation sources are also discussed. These include site-resolved photoelectron diffraction from surface and interface atoms, the possibility of time-resolved measurements of surface reactions with chemical-state resolution, and circular dichroism in photoelectron angular distributions from both non-magnetic and magnetic systems. The addition of spin to the photoelectron diffraction measurement is also considered as a method for studying short-range magnetic order, including the measurement of surface magnetic phase transitions. This spin sensitivity can be achieved through either core-level multiplet splittings or circular-polarized excitation of spin-orbit-split levels. The direct imaging of short-range atomic structure by both photoelectron holography and two distinct types of x-ray holography involving fluorescent emission is also discussed. Both photoelectron and x-ray holography have demonstrated the ability to directly determine at least approximate atomic structures in three dimensions. Photoelectron holography with spin resolution may make it possible also to study short-range magnetic order in a holographic fashion. Although much more recent in its first experimental demonstrations, x-ray fluorescence holography should permit deriving more accurate atomic images for a variety of materials, including both surface and bulk regions.     

Polymorph Identification and Crystal Structure Determination by a Combined Crystal Structure Prediction and Transmission Electron Microscopy Approach

Electron diffraction offers advantages over X‐ray based methods for crystal structure determination because it can be applied to sub‐micron sized crystallites, and picogram quantities of material. For molecular organic species, however, crystal structure determination with electron diffraction is hindered by rapid crystal deterioration in the electron beam, limiting the amount of diffraction data that can be collected, and by the effect of dynamical scattering on reflection intensities. Automated electron diffraction tomography provides one possible solution. We demonstrate here, however, an alternative approach in which a set of putative crystal structures of the compound of interest is generated by crystal structure prediction methods and electron diffraction is used to determine which of these putative structures is experimentally observed. This approach enables the advantages of electron diffraction to be exploited, while avoiding the need to obtain large amounts of diffraction data or accurate reflection intensities. We demonstrate the application of the methodology to the pharmaceutical compounds paracetamol, scyllo‐inositol and theophylline.     

X-ray diffraction of protein crystal grown in a nano-liter scale droplet in a microchannel and evaluation of its applicability

We describe the technical aspects of the in-situ X-ray diffraction of a protein crystal prepared by a nanodroplet-based crystallization method. We were able to obtain diffraction patterns from a crystal grown in a capillary without any manipulation. Especially in our experimental approach, the crystals that moved to the nanodroplet interface were fixed strongly enough to carry out X-ray diffraction measurements that could be attributed to the high surface tension of the nanodroplet. The crystal was damaged by an indirect action of the X-rays because our in-situ X-ray diffraction measurement was carried out in the liquid phase without freezing the crystal; however, the obtained several diffraction patterns were of sufficiently fine quality for the crystal structure factors to be generated. We consider the technical examination presented in this paper to represent a seamless coupling of crystallization to X-ray analysis.     

Understanding the structural properties of a dendrimeric material directly from powder X-ray diffraction data

Complete structure determination of an early-generation dendrimeric material has been carried out directly from powder X-ray diffraction data, using the direct-space genetic algorithm technique for structure solution followed by Rietveld refinement. This work represents the first application of modern direct-space techniques for structure determination from powder X-ray diffraction data in the case of a dendrimeric material and paves the way for the future application of this approach to enable complete structure determination of other dendrimeric materials that cannot be prepared as single crystal samples suitable for single crystal X-ray diffraction studies.     

Determination of nanoparticle sizes by X-ray diffraction

Different procedures for analysis of particle sizes by the X-ray diffraction method are compared by the example of nanoparticles of nickel and iron(3+) oxide (Fe₂O₃). A modified Warren-Averbach method is proposed for the analysis of the X-ray diffraction line profile based on the approximation by the Voigt function, which yields stable solutions, and the efficiency of the method is shown. The analysis within the frame-work of the Warren-Averbach method makes it possible to restore the distribution function of nanoparticles (crystallites) over true diameters, which satisfactorily correlates with electron microscopy data. The applicability of the Warren-Averbach method to the estimation of crystallite sizes by the analysis of a single diffraction line is substantiated. The range of the applicability of the Scherrer, Williamson-Hall, Warren-Averbach, and modified Warren-Averbach methods to the substructure analysis by the X-ray diffraction is determined as depending on the method of nanostructure formation.     

In-plane and out-of-plane diffraction of H2 from Ru(001)

H(2) diffraction from the Ru(001) surface has been measured for incident energies E(i) = 78-150 meV and incident angles Θ(i) = 22.1-64.1°. In-plane and out-of-plane angular distributions were measured for incidence along [110] and [100] directions. Out-of-plane diffraction channels were found to be predominant for the explored experimental conditions regardless of the incidence direction. An analysis of diffraction intensities reveals that diffraction out of the scattering plane is enhanced for high incidence angles. Diffractive transitions with wavevector change in the surface plane and transversal to the incidence direction ΔK(⊥) were observed to be favored among the out-of-plane diffractive transitions. These features could be reproduced by model calculations of diffraction intensities performed using a three-dimensional soft potential. This suggests that a kinematic effect is responsible for the large out-of-plane intensities observed in experiment, more than any other features of the six-dimensional H(2)-surface interaction potential.     

X-ray diffraction from the uniaxial and biaxial nematic phases of bent-core mesogens

X-ray diffraction patterns for the uniaxial and biaxial nematic phases exhibited by rigid bent-core mesogens were calculated using a simple model for the molecular form factor and a modified Lorentzian structure factor. The X-ray diffraction patterns depend strongly on the extent of the alignment of the molecular axes as well as the orientation of molecular planes. The X-ray diffraction can be unequivocally used to identify the biaxial nematic phase, study the uniaxial-biaxial phase transition, and estimate the order parameters of the nematic phase.     

APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM

Pure X-ray diffraction profiles have been analysed for polyamide 1010 and PA1010--BMI system by means of multipeak fitting resolution of X-ray diffraction.The methods ofvariance and fourth moment have been applied to determine the particle size and strainvalues for theparacrystalline materials.The results indicated that both variance and fourthmoment of X-ray diffraction line profile yielded approximately the same values of theparticle size and the strain.The particle sizes of(100)reflection have been found todecrease with increasing BMI content,whereas the strain values increased.     

Structural dynamics of surfaces by ultrafast electron crystallography: experimental and multiple scattering theory

Recent studies in ultrafast electron crystallography (UEC) using a reflection diffraction geometry have enabled the investigation of a wide range of phenomena on the femtosecond and picosecond time scales. In all these studies, the analysis of the diffraction patterns and their temporal change after excitation was performed within the kinematical scattering theory. In this contribution, we address the question, to what extent dynamical scattering effects have to be included in order to obtain quantitative information about structural dynamics. We discuss different scattering regimes and provide diffraction maps that describe all essential features of scatterings and observables. The effects are quantified by dynamical scattering simulations and examined by direct comparison to the results of ultrafast electron diffraction experiments on an in situ prepared Ni(100) surface, for which structural dynamics can be well described by a two-temperature model. We also report calculations for graphite surfaces. The theoretical framework provided here allows for further UEC studies of surfaces especially at larger penetration depths and for those of heavy-atom materials.     

A method for recording X-ray diffraction patterns of milligram quantities of particulates

A method for recording X-ray diffraction patterns of milligram quantities of particulates has been developed. The resulting diffraction patterns are similar to patterns obtained by standard methods. Application of this method to analysis of airborne particulates in the vicinity of a lead smelting operation has demonstrated the practical use of the method. Sample sizes as low as 1.1 mg have produced useful diffraction patterns.     

An x-ray diffraction study of some clay minerals of the eastern caribbean,west indies

X-Ray diffraction patterns were run on 12 soil-clays from Antigua, Dominica, Grenada, Trinidad and St. Vincent, West Indies. The d spacings of the diffraction maxima of these soil-clays saturated with Mg²⁺ and K⁺ cations were used for identification of the clay minerals present. The criteria for species differentiation was obtained by diagnostic diffraction maxima from clays specially treated with ethylene glycol and heat treatment up to 550°C.     

The precession technique in electron diffraction and its application to structure determination of nano-size precipitates in alloys.

Crystal structure of nano-scale precipitates in age-hardening aluminum alloys is a challenge to crystallography. The utility of selected area electron diffraction intensities from embedded precipitates is limited by double scattering via matrix reflections. This effect can be signally reduced by the precession technique, which we have used to collect extensive intensity data from the semicoherent, metastable eta-precipitate in the Al-Zn-Mg alloy system. A structure model in the space group P-62c is proposed from high-resolution microscopy and electron diffraction intensities. The advantages of using the precession technique for quantitative electron diffraction is discussed.