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Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy |
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| Authors: | Fang Mei-Hua Wei Zhi-Yong Zhang Zi-Xia Zhu Li Fu Yu Shi Miao Li Guang-Wu Guo Gang |
| Affiliation: | [1]Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China [2]China Institute of Atomic Energy, Beijing 102413, China |
| Abstract: | micro-track structure, bulk etch rate, track etch rate, track core size |
| Keywords: | micro-track structure bulk etch rate track etch rate track core size |
| 本文献已被 CNKI 维普 等数据库收录！ | |