Single event effect hardness for the front-end ASICs in the DAMPE satellite BGO calorimeter |
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| Authors: | Shan-Shan Gao Di Jiang Chang-Qing Feng Kai Xi Shu-Bin Liu Qi An |
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| Affiliation: | 1. State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China2. Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China3. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China |
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| Abstract: | The Dark Matter Particle Explorer(DAMPE) is a Chinese scientific satellite designed for cosmic ray studies with a primary scientific goal of indirect detection of dark matter particles. As a crucial sub-detector, the BGO calorimeter measures the energy spectrum of cosmic rays in the energy range from 5 Ge V to 10 Te V. In order to implement high-density front-end electronics(FEE) with the ability to measure 1848 signals from 616 photomultiplier tubes on the strictly constrained satellite platform, two kinds of 32-channel front-end ASICs, VA160 and VATA160,are customized. However, a space mission period of more than 3 years makes single event effects(SEEs) become threats to reliability. In order to evaluate SEE sensitivities of these chips and verify the effectiveness of mitigation methods, a series of laser-induced and heavy ion-induced SEE tests were performed. Benefiting from the single event latch-up(SEL) protection circuit for power supply, the triple module redundancy(TMR) technology for the configuration registers and the optimized sequential design for the data acquisition process, 52 VA160 chips and 32VATA160 chips have been applied in the flight model of the BGO calorimeter with radiation hardness assurance. |
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| Keywords: | space electronics single event effects radiation hardness heavy ion pulsed laser |
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