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High temperature characteristics of A1GaN/GaN high electron mobility transistors
Authors:Yang Li-Yuan  Hao Yue  Ma Xiao-Hua  Zhang Jin-Cheng  Pan Cai-Yuan  Ma Ji-Gang  Zhang Kai  Ma Ping
Affiliation:(a) Key Laboratory for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, China ; b) School of Technical Physics, Xidian University, Xi'an 710071, China)
Abstract:
Keywords:A1GaN/GaN high electron mobility transistor  high temperature characteristics  traps  current collapse
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