Deposition of Er:A12O3 Films and Photoluminescence Characteristics |
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作者姓名: | 李成仁 宋昌烈 李淑凤 饶文雄 |
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作者单位: | [1]DepartmentofPhysics,LiaoningNormalUniversity,Dalian116029 [2]DepartmentofPhysics‘DalianUniversityofTechnology,Dalian116024 |
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摘 要: | Er^3 -doped Al2O3 films were deposited on silicon substrates by reactive closed-field unbalanced magnetron sput-tering. The process parameters, such as target bias voltage, substrate bias voltage, O2 gas flows, sputtering gas pressure, were studied. The 1.53μm photoluminescence characteristics from Er^3 were measured. The relations among the PL peak intensity, annealing temperatures, and pump power were experimentally investigated.
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关 键 词: | Er:A12O3薄膜 二氧化二铝薄膜 铒掺杂 薄膜沉积 光致发光 光学性质 |
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