超细Ni80Cr20合金丝冷拉拔烧头及穿模工艺 |
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引用本文: | 祁一东,周秀文,曹林洪,刘旭东,吴卫东. 超细Ni80Cr20合金丝冷拉拔烧头及穿模工艺[J]. 强激光与粒子束, 2015, 27(8): 082004. DOI: 10.11884/HPLPB201527.082004 |
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作者姓名: | 祁一东 周秀文 曹林洪 刘旭东 吴卫东 |
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作者单位: | 1.西南科技大学 材料科学与工程学院, 四川 绵阳 621 01 0; |
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摘 要: | 采用冷拉拔技术制备超细Ni80Cr20合金丝,探索了电化学法烧头和超景深显微镜辅助穿模方法,开展了直径25.60μm的超细丝拉拔至21.14μm的烧头和穿模工艺研究。实验结果表明:采用电解电压为5V,0.2mol/L的HCl溶液,烧头时间为1s,超景深显微镜200倍放大模式,成功拉制直径为21.14μm的微丝;电化学法可以精确控制烧头电压和时间,同时超景深显微镜可以放大金刚石模具孔径,解决了烧头时间控制不准确和人工穿模的难题,显著提高了穿模效率和成功率。
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关 键 词: | Ni80Cr20合金丝 冷拉拔 烧头 穿模 电化学腐蚀 Z箍缩 |
收稿时间: | 2015-04-28 |
Study of ultrafine Ni80Cr20 alloy wire corrosion-head and through-die technology in cold drawing |
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Affiliation: | 1.School of Materials Science and Engineering,Southwest University of Science and Technology,Mianyang 621010,China;2.Institute of Atomic and Molecular Physics,Sichuan University,Chengdu 610064,China;3.Research Center of Laser Fusion,CAEP,Mianyang 621900,China;4.Joint Laboratory for Extreme Condition Matter Properties,Southwest University of Science and Technology and Research Center of Laser Fusion,CAEP,Mianyang 621010,China |
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Abstract: | The ultrafine Ni80Cr20 alloy wire was prepared by cold drawing technology. To improve the through-die efficiency in ultrafine Ni80Cr20 alloy wire preparation, we explored a new ultrafine wire corrosion-head and through-die method, by which an electrochemical workstation provided precise corrosion time and a super depth of field microscope magnified apertures of diamond dies. Afterwards, we did experiments on the corrosion-head and through-die process of the 25.60 m ultrafine Ni80Cr20 alloy wire. The research process was also carried out for the 25.60 m diameter ultrafine wire cold drawn to 21.14 m. The experiment results show that the electrolysis with voltage of 5 V, 0.2 mol/L HCl solution as electrolyte, a second corrosion time and aperture of die magnified 200 times, successfully prepared the 21.14 m ultra-fine wire. This method resolves the issue of corrosion-head time inaccuracy and manual through-die difficulty, greatly improves the efficiency and success rate of through-die. |
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