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Band Alignment and Band Gap Characterization of La2O3 Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering
Authors:LIU Qi-Ya  FANG Ze-Bo  JI Ting  LIU Shi-Yan  TAN Yong-Sheng  CHEN Jia-Jun  ZHU Yan-Yan
Affiliation:[1]College of Physics and Electronic Information, China West Normal University, Nanchong 637002 [2]Department of Physics, Shaoxing University, Shaoxing 312000 [3]Key Laboratory of Advanced Transducers and Intelligent Control System, College of Physics and Optoelectronics, Taiyuan University of Technology, Taiyuan 030024
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