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Influences of supply voltage on single event upsets and multiple-cell upsets in nanometer SRAM across a wide linear energy transfer range |
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| Authors: | Yin-Yong Luo Wei Chen Feng-Qi Zhang Tan Wang |
| Abstract: | The influences of reducing the supply voltage on single event upset(SEU)and multiple-cell upset(MCU)in two kinds of 65-nm static random access memories(SRAMs)ar... |
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